• Title/Summary/Keyword: drain switching

Search Result 73, Processing Time 0.028 seconds

Design of High Capacity Rectifier by Parallel Driving of MOSFET (MOSFET 병렬 구동을 이용한 대용량 정류기 구현)

  • Sun, Duk-Han;Cho, Nae-Su;Kim, Woo-Hyun
    • Journal of the Korean Society of Industry Convergence
    • /
    • v.10 no.4
    • /
    • pp.227-233
    • /
    • 2007
  • In case of design of a rectifier to supply high current, To select switching frequency of semiconductor switches affect absolutely the design of the LC filter value in an power conversion circuit. The conventional rectifier by using MOSFET is no use in high current equipments because of small drain-source current. To solve this problem, this paper proposes to design of high capacity rectifier by parallel driving of MOSFET in the single half bridge DC-DC converter. This method can be able to develop high current rectifier by distributed drain-source current. The proposed scheme is able to expect a decrease in size, weight and cost of production by decreasing the LC filter value and increasing maximumly the switching frequency. The validity of the proposed parallel driving strategy is verified through computer-aided simulations and experimental results.

  • PDF

A Study of Electromechanical Nanotube Memory Device using Molecular Dynamics

  • Lee Jun-Ha;Lee Hoong-Joo;Kwon Oh-Keun;Kang Jeong-Won
    • Proceedings of the Korean Society Of Semiconductor Equipment Technology
    • /
    • 2005.09a
    • /
    • pp.27-30
    • /
    • 2005
  • A nanoelectromechanical (NEM) switching device based on carbon nanotube (CNT) was investigated using atomistic simulations. The model schematics for a CNT based three-terminal NEM switching device fabrication were presented. for the CNT-based three-terminal NEM switch, the interactions between the CNT-lever and the drain electrode or the substrate were very important. When the electrostatic force applied to the CNT-lever was the critical point, the CNT-lever was rapidly bent because of the attractive foroe between the CNT-lever and the drain. The energy curves for the pull-in and the pull-out processes showed the hysteresis loop that was induced by the adhesion of the CNT on the copper, which was the interatomic interaction between the CNT and the copper.

  • PDF

A Fast-Switching Current-Pulse Driver for LED Backlight (LED 백라이트를 위한 고속 스위칭 전류-펄스 드라이버)

  • Yang, Byung-Do;Lee, Yong-Kyu
    • Journal of the Institute of Electronics Engineers of Korea SD
    • /
    • v.46 no.7
    • /
    • pp.39-46
    • /
    • 2009
  • A fast-switching current-pulse driver for light emitting diode (LED) backlight is proposed. It uses a regulated drain current mirror (RD-CM) [1] and a high-voltage NMOS transistor (HV-NMOS). It achieves the fast-response current-pulse switching by using a dynamic gain-boosting amplifier (DGB-AMP). The DGB-AMP does not discharge the large HV-NMOS gate capacitance of the RD-CM when the output current switch turns off. Therefore, it does not need to charge the HV-NMOS gate capacitance when the switch turns on. The proposed current-pulse driver achieves the fast current switching by removing the repetitive gate discharging and charging. Simulation results were verified with measurements performed on a fabricated chip using a 5V/40V 0.5um BCD process. It reduces the switching delay to 360ns from 700ns of the conventional current-pulse driver.

Large Signal Determination of Non-Linear Output Capacitance of Gallium-Nitride Field Effect Transistors from Switch-Off Voltage Transients - A Numerical Method

  • Pentz, David;Joannou, Andrea
    • Journal of Power Electronics
    • /
    • v.18 no.6
    • /
    • pp.1912-1919
    • /
    • 2018
  • The output capacitance of power semiconductor devices is important in determining the switching losses and in the operation of some resonant converter topologies. Thus, it is important to be able to accurately determine the output capacitance of a particular device operating at elevated power levels so that the contribution of the output capacitance discharge to switch-on losses can be determined under these conditions. Power semiconductor switch manufacturers usually measure device output capacitance using small-signal methods that may be insufficient for power switching applications. This paper shows how first principle methods are applied in a novel way to obtain more relevant large signal output capacitances of Gallium-Nitride (GaN) FETs using the drain-source voltage transient during device switch-off numerically. A non-linear capacitance for an increase in voltage is determined with good correlation. Simulations are verified using experimental results from two different devices. It is shown that the large signal output capacitance as a function of the drain-source voltage is higher than the small signal values published in the data sheets for each of the devices. It can also be seen that the loss contribution of the output capacitance discharging in the channel during switch-on correlates well with other methods proposed in the literature, which confirms that the proposed method has merit.

Balanced Buck-Boost Switching Converter to Reduce Commom-mode Conducted Noise

  • Shoyama, Masahito;Ohba, Masashi;Ninomiya, Tamotsu
    • Journal of Power Electronics
    • /
    • v.2 no.2
    • /
    • pp.139-145
    • /
    • 2002
  • Because conventional switching converters have been usually using unbalanced circuit topologies, parasitice between the drain/collertor of an active switch and frame ground through its heat sink may generate the commom-mode conducted noise. We have proposed a balanced switching converter circuit, whitch is an effective way to reduce the commom-mode converter version of the balanced switching converter was presented and the mechanism of the commom-mode noise reduction was explained using equivalent circuits. This paper extends the concept of the balanced switch converter circuit and presents a buck-boost converter version of the blanced switching converter. The feature of common-mode niose reduction is confirmed by experimental resuits and the mechanisem of the commom-mode niose reduction is explained using equivalent circuits.

Flyback switching loss analysis by capacitor charge and energy conservation

  • Jin, ChengHao;Chung, Bong-Geun;Moon, SangCheol;Koo, Gwan-Bon
    • Proceedings of the KIPE Conference
    • /
    • 2015.07a
    • /
    • pp.179-180
    • /
    • 2015
  • The task of measuring losses becomes more challenging with ever increasing efficiencies and operating frequencies in power electronics applications. Generally, the process of traditional switching loss calculation in flyback converter is very complicated. MOSFET drain-source voltage and current waveforms are needed to calculate switching loss. However, as we know in switched capacitor converter, switching loss can be easily calculated by charge and energy conservation law with known initial and final capacitor voltages. In this paper, the same method is applied to fly-back converter switching loss analysis to simplify calculation procedure.

  • PDF

THE CLAMP MODE FORWARD ZERO-VOLTAGE-SWITCHING MULTI-RESONANT-CONVERTER (CLAMP MODE에서 동작하는 ZVS-MRC FORWARD 콘버어터에 관한 연구)

  • Kim, Hee-Jun;Simun, Misri
    • Proceedings of the KIEE Conference
    • /
    • 1991.11a
    • /
    • pp.210-213
    • /
    • 1991
  • The clamp mode Zero-Volatge-Switched Multi-Resonant-Converter(ZVS-MRC) is proposed. In the converter, the performance of the conventional ZVS-MRC is improved by clamping the drain-to-source voltage of the power switch using a soft switching nondissipative active clamp network. The analysis for each stage of the converter operation modes is presented and is verified by experiments.

  • PDF

A Dual Gate AlGaN/GaN High Electron Mobility Transistor with High Breakdown Voltages (높은 항복 전압 특성을 가지는 이중 게이트 AlGaN/GaN 고 전자 이동도 트랜지스터)

  • Ha Min-Woo;Lee Seung-Chul;Her Jin-Cherl;Seo Kwang-Seok;Han Min-Koo
    • The Transactions of the Korean Institute of Electrical Engineers C
    • /
    • v.54 no.1
    • /
    • pp.18-22
    • /
    • 2005
  • We have proposed and fabricated a dual gate AlGaN/GaN high electron mobility transistor (HEMT), which exhibits the low leakage current and the high breakdown voltage for the high voltage switching applications. The additional gate between the main gate and the drain is specially designed in order to decrease the electric field concentration at the drain-side of the main gate. The leakage current of the proposed HEMT is decreased considerably and the breakdown voltage increases without sacrificing any other electric characteristics such as the transconductance and the drain current. The experimental results show that the breakdown voltage and the leakage current of proposed HEMT are 362 V and 75 nA while those of the conventional HEMT are 196 V and 428 nA, respectively.

Si Nanowire 크기에 따른 Gate-all-around Twin Si Nanowire Field-effect Transistors의 전기적 특성

  • Kim, Dong-Hun;Kim, Tae-Hwan
    • Proceedings of the Korean Vacuum Society Conference
    • /
    • 2014.02a
    • /
    • pp.303.1-303.1
    • /
    • 2014
  • 좋은 전기적 특성을 가지면서 소자의 크기를 줄이기에 용이한 Gate-all-around (GAA) twin Si nanowire field-effect transistors (TSNWFETs)의 연구가 많이 진행되고 있다. Switching 특성과 단채널 효과가 없는 TSNWFETs의 특성은 GAA 구조의 본질적인 특성이다. TSNWFETs는 기존의 single Si nanowire TSNWFETs와 bulk FET에 비하여 Drive current가 nanowire의 지름에 많은 영향을 받지 않는다. 그러나 TSNWFETs의 전체 on-current는 훨씬 작고 nanowire의 지름이 작아지면서 줄어들게 되면서 소자의 sensing speed와 sensing margin 특성의 악화를 가지고 온다. GAA TSNWFETs의 제작 및 전기적 실험에 대한 연구는 많이 진행되었으나, GAA TSNWFETs의 전기적 특성에 대한 이론적 연구는 매우 적다. 본 연구에서는 GAA TSNWFETs의 nanowire 크기에 따른 전기적 특성을 관찰하였다. GAA TSNWFETs와 bulk FET의 전기적 특성을 양자역학을 고려하여 3차원 TCAD 시뮬레이션을 툴을 이용하여 계산하였다. GAA TSNWFETs와 bulk FET의 전류-전압 특성 계산을 통해 on-current 크기, subthreshold swing, drain-induced barrier lowering (DIBL), gate-induced drain leakage를 보았다. 전류가 흐르는 경로와 전기적 특성의 물리적 의미에 대한 연구를 위해 TSNWFETs에서의 전류 밀도, conduction band edge, potential 특성을 분석하였다. 시뮬레이션 결과를 통해 Switching 특성, 단채널 효과에 대한 면역 특성, nanowire의 단면적에 따른 전류 흐름을 보았다. nanowire의 크기가 작아지면서 DIBL이 증가하고 문턱전압과 전체 on-current는 감소하면서 소자의 특성이 악화된다. 이러한 결과는 GAA TSNWFETs의 전기적 특성을 이해하고 좋은 소자 특성을 위한 구조를 연구하는데 많은 도움이 될 것이다.

  • PDF

Epitaxial Layer Design for High Performance GaAs pHEMT SPDT MMIC Switches

  • Oh, Jung-Hun;Mun, Jae-Kyoung;Rhee, Jin-Koo;Kim, Sam-Dong
    • ETRI Journal
    • /
    • v.31 no.3
    • /
    • pp.342-344
    • /
    • 2009
  • From a hydrodynamic device simulation for the pseudomorphic high electron mobility transistors (pHEMTs), we observe an increase of maximum extrinsic transconductance and a decrease of source-drain capacitances. This gives rise to an enhancement of the switching speed and isolation characteristics as the upper-to-lower planar-doping ratios (UTLPDR) increase. On the basis of simulation results, we fabricate single-pole-double-throw transmitter/receiver monolithic microwave integrated circuit (MMIC) switches with the pHEMTs of two different UTLPDRs (4:1 and 1:2). The MMIC switch with a 4:1 UTLPDR shows about 2.9 dB higher isolation and approximately 2.5 times faster switching speed than those with a 1:2 UTLPDR.

  • PDF