• Journal of the Semiconductor & Display Technology
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• v.20 no.2
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• pp.126-130
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• 2021

The ball grid array is one of the packaging methods that used in high density printed circuit board. Solder void defects caused by voids in the solder ball during the BGA process do not directly affect the reliability of the product, but it may accelerate the aging of the device on the PCB layer or interface surface depending on its size or location. Void inspection is important because it is related in yields with products. The most important process in the optical inspection of solder void is the segmentation process of solder and void. However, there are several segmentation algorithms for the vision inspection, it is impossible to inspect all of images ideally. When X-Ray images with poor contrast and high level of noise become difficult to perform image processing for vision inspection in terms of software programming. This paper suggests the solution to deal with the suggested problem by means of using Mask R-CNN instead of digital image processing algorithm. Mask R-CNN model can be trained with images pre-processed to increase contrast or alleviate noises. With this process, it provides more efficient system about complex object segmentation than conventional system.

• Journal of Digital Convergence
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• v.16 no.3
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• pp.303-309
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• 2018

Computer vision technology is a component inspection to obtain a video image from the camera to the machine to perform the capabilities of the human eye with a field of artificial intelligence, and then analyzed by the algorithm to determine to determine the good and bad of production parts It is widely applied. Shape inspection method was used as how to identify the location of the start point and the end point of the search range, measure the height to the line scan method, in such a manner as to determine the presence or absence of the bolt tabs average brightness of the inspection area in a circular scan type value And the degree of similarity was calculated. The total time it takes to test in the test performance tests of two types of bolts tab enables test 300 min, and demonstrated the accuracy and efficiency of the inspection on the production line represented a complete inspection accuracy.

• Journal of Institute of Control, Robotics and Systems
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• v.19 no.12
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• pp.1072-1080
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• 2013

In a the present day, many vision inspection techniques are used in productive industrial areas. In particular, in the semiconductor industry the vision inspection system for wafers is a very important system. Also, inspection techniques for semiconductor wafer production are required to ensure high precision and fast inspection. In order to achieve these objectives, parallel processing of the inspection algorithm is essentially needed. In this paper, we propose the GPU (Graphical Processing Unit)-based parallel processing algorithm for the fast inspection of semiconductor wafers. The proposed algorithm is implemented on GPU boards made by NVIDIA Company. The defect detection performance of the proposed algorithm implemented on the GPU is the same as if by a single CPU, but the execution time of the proposed method is about 210 times faster than the one with a single CPU.

• Proceedings of the Korea Contents Association Conference
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• 2003.05a
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• pp.177-184
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• 2003

Protection of digital properties such as computer S/W, digital contents is the most important topics. For this, this paper describes the domestic and foreign trends for protecting digital properties and S/W tools for inspecting of plagiarism is compared and analyzed. The analysis of research activities of foreign inspection institutes such as JISC and domestic institutes and communities has done. Also, S/W tools for inspecting of natural language plagiarism is analyzed.Having been speed development of The Content Technology,

• The monthly packaging world
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• s.291
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• pp.77-81
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• 2017

• Journal of Korean Society for Geospatial Information Science
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• v.5 no.2 s.10
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• pp.13-27
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• 1997

For the National Geo-Spatial Information System the development of the National Digital Basemap database is actively underway in Korea. For the National Digital Basemap database to be truly useful for various applications development it is essential to maintain its reliability. To maintain the reliability of the database it is necessary to understand the nature and the frequency of the errors in it. In general, a data inspection under the standardized quality control process is required to maintain the quality of a large database. In addition, it is important to maintain complete and detailed records of the inspection results so as to understand the relationship between the m and other factors causing errors. These records can be used as a reference for map updates and future application development. The goal of this study is to count the frequency of errors based on the typology of errors found in the digitized map inspection process and to analyze the correlation between errors and topographic composite quotient This study also provides guidelines for the inspection process regarding the error-prone cartographic elements in the digital map generation process.

• Journal of Digital Convergence
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• v.11 no.8
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• pp.213-218
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• 2013

In this paper, when vehicle inspection is made, the check way is recommended based on the intelligent and personalized in the workplace, education, and other space-time according to the current situation. These results increase productivity, reduce costs, and improve performance. So we designed vehicle inspection recommendation system using ontology. Recommendation method is that components connected concept are shown according to weight value. if components are connected with other concept, the components are extended.

• International Journal of Internet, Broadcasting and Communication
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• v.11 no.4
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• pp.49-58
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• 2019

3D scanners are needed in various fields, and their usage range is greatly expanded. In particular, it is being used to reduce costs at various stages during product development and production. Now, the importance of quality inspection in the manufacturing industry is increasing. Structured optical system applied in this study is suitable for measuring high precision of mold, press work, precision products, etc. and economical and effective 3D scanning system for measuring inspection in manufacturing industry can be implemented. We developed Structured light 3D scanner which can measure high precision by using Digital Light Processing (DLP) projector and camera. In this paper, 3D image scanner based on structured optical system can realize 3D scanning system economically and effectively when measuring inspection in the manufacturing industry.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.46 no.6
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• pp.14-20
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• 2009

The goal of image processing is to improve the visual appearance of images for human viewers. The histogram is an important tool which can be used as basic data of digital image processing. Therefore, to effectively manage a histogram in digital image processing is very important. Currently machine vision systems are used in many appearance inspection fields instead of inspection by human. However, the appearance inspection result by machine vision system is mainly influenced by illumination of workplace. In this paper, we propose a histogram transform method for improving accuracy of machine visual inspection. The enhancement effect of area feature is obtained by performing proposed histogram transformation in area that needs improvement The proposed algorithm is verified by appearance inspection of jig plate samples.

• Journal of the Korean Society for Precision Engineering
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• v.14 no.10
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• pp.28-34
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• 1997

This paper describes an automatic measurement method for the in-line inspection of assembly tolerances of cathod ray electron guns. The method uses an optical microscope with a CCD camera as a probe. An automatic gap recognition algorthm with digital image processing and a new software autofocus algorithm based on using an optimal edge detector have been developed to improve the measuring accuracy. An inspection system has been proposed and practically implemented for in-line inspection to a real factory automation line. The inspection system consists of a gap inspection part and an eyelet. Total time consumed for inspecting all measuring items is about 10 seconds and the repeatability is below .+-. 5 .mu. m