• 한국재료학회지
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• 제19권5호
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• pp.253-258
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• 2009

Mn-substituted $BiFeO_3$(BFO) thin films were prepared by r.f. magnetron sputtering under an Ar/$O_2$ mixture of various deposition pressures at room temperature. The effects of the deposition pressure and annealing temperature on the crystallization and electrical properties of BFO films were investigated. X-ray diffraction patterns revealed that BFO films were crystallized for films annealed above $500^{\circ}C$. BFO films annealed at $550^{\circ}C$ for 5 min in $N_2$ atmosphere exhibited the crystallized perovskite phase. The (Fe+Mn)/Bi ratio decreased with an increase in the deposition pressure due to the difference of sputtering yield. The grain size and surface roughness of films increased with an increase in the deposition pressure. The dielectric constant of BFO films prepared at various conditions shows $127{\sim}187$ at 1 kHz. The leakage current density of BFO films annealed at $500^{\circ}C$ was approximately two orders of magnitude lower than that of $550^{\circ}C$. The leakage current density of the BFO films deposited at $10{\sim}30\;m$ Torr was about $5{\times}10^{-6}{\sim}3{\times}10^{-2}A/cm^2$ at 100 kV/cm. Due to the high leakage current, saturated P-E curves were not obtained in BFO films. BFO film annealed at $500^{\circ}C$ exhibited remnant polarization(2Pr) of $26.4{\mu}C/cm^2$ at 470 kV/cm.

• 한국정보통신학회:학술대회논문집
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• 한국해양정보통신학회 2001년도 추계종합학술대회
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• pp.660-664
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• 2001

$Zn_xSr_{1-x}S$ 박막을 sputtering법에 의해 제작하여 결정구조, 결합상태, 광학적 특성 등의 분석에 의해 고용체 유무를 판단하고 유전체 이론과 비교.검토하였다. 실험결과 $0.86~0.93{\leq}x{\leq}1$에서 zincblende 구조, $0{\leq}x{\leq}0.29$범위에서 rocksalt구조의 고용체로 되었으며, 이들 영역에서는 격자정수, 결합에너지 및 흡수단은 조성에 따라 거의 직선적으로 변화했다. 상분리 영역을 포함한 miscibility gap은 $0.3{\leq}x{\leq}0.86~0.91$범위에서 존재하고 이 영역에서의 격자정수, 결합에너지 및 흡수단은 경계 조성의 값으로 일정했다. 상전이에 관한 실험결과는 Phillips의 유전이론에 기초한 이온성과 일치하였다.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2007년도 제38회 하계학술대회
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• pp.1313-1314
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• 2007

This paper presents organic thin-film transistors (OTFTs) with poly(3-hexylthiophene)(P3HT) semiconductor and several polymeric dielectric materials of poly(vinyl phenol)(PVP), poly(vinyl alcohol)(PVA), and polyimide(PI) by using soluble process. The fabricated OTFT's have inverted staggered structure using transmission line method(TLM) pattern. In order to evaluate the electrical characteristics of the OTFT, capacitance-voltage(C-V) and current-voltage(I-V) were measured. C-V graphs were measured at several frequencies of 100 Hz, 1 kHz, and 1 MHz and ID-VDS graphs according to $V_{GS}$. The current on/off ratio and threshold voltage with each of PVP, PVA, and PI based OTFTs were measured to $10^3$, and -0.36, -0.41, and -0.62 V. Also, the calculated mobility with each of PVP, PVA, and PI was 0.097, 0.095, and 0.028 $cm^{2}V^{-1}s^{-1}$, respectively. In the cases of PVP and PVA, the hole mobility of P3HT was in excellent agreement with the published value of 0.1 $cm^{2}V^{-1}s^{-1}$.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 추계학술대회 논문집 Vol.16
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• pp.271-274
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• 2003

[ $Sr_xBa_{1-x}Nb_2O_6$ ] (SBN, $0.25{\leq}x{\leq}0.75$) ceramic is a ferroelectric material with tetragonal tungsten bronze (TTB) type structure, which has a high pyroelectric coefficient and a nonlinear electro-optic coefficient value. In spite of its advantages, SBN has not been investigated well compared to other ferroelectric materials with perovskite structure. In this study, SBN thin film was manufactured by ion beam sputtering technique using the prepared SBN target in $Ar/O_2$ atmosphere. SBN30 thin films of different thickness were pre-deposited as a seed layer on $Pt(100)/TiO_2/SiO_2/Si$ substrate followed by SBN60 deposition up to $4500\;{\AA}$ in thickness. As-deposited SBN60/SBN30 layer was heat-treated at different temperatures of 650, 700, 750, and $800\;^{\circ}C$ in air, respectively, The crystallinity and orientation behavior as well as electric properties of SBN60/SBN30 multi-layer were examined. The deposited layer was uniform and the orientation was shown primarily along (001) plane from XRD pattern. There was difference in the crystal structure with heat-treatment temperature, and the electric properties depended on the heating temperature and the seed-layer thickness. In electric properties of Pt/SBN60/SBN30/Pt thin film capacitor prepared, the remnant polarization (2Pr) value was $15\;{\mu}C/cm^2$, the coercive field (Ec) 65 kV/cm, and the dielectric constant 1492, respectively.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2006년도 하계학술대회 논문집 Vol.7
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• pp.169-170
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• 2006

In this study, ultra thin films of ferroelectric vinylidene fluoride-trifluoroethylene (VF2-TrFE) copolymer were fabricated on degenerated Si (n+, $0.002\;{\Omega}{\cdot}cm$) using by spin coating method. A 1~5 wt% diluted solution of purified vinylidene fluoride-trifluoroethylene (VF2:TrFE=70:30) in a dimethylformamide (DMF) solvent were prepared and deposited on silicon wafers at a spin rate of 2000~5000rpm for 30 seconds. After annealing in a vacuum ambient at $200^{\circ}C$ for 60 min, upper gold electrodes were deposited by vacuum evaporation for electrical measurement. X-ray diffraction results showed that the VF2-TrFE films on Si substrates had $\beta$-phase of copolymer structures. The capacitance on $n^+$-Si(100) wafer showed hysteresis behavior like a butterfly shape and this result indicates clearly that the dielectric films have ferroelectric properties. The typical measured remnant polarization (2Pr) and coercive filed (EC) values measured using a computer controlled a RT-66A standardized ferroelectric test system (Radiant Technologies) were about $0.54\;C/cm^2$ and 172 kV/cm, respectively, in an applied electric field of ${\pm}0.75\;MV/cm$.

• 한국전기전자재료학회논문지
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• 제22권2호
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• pp.101-106
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• 2009

In this paper, Thin films of $HfO_2$/Hf were deposited on p-type wafer by Atomic Layer Deposition (ALD). We studied the electrical and material characteristics of $HfO_2$/Hf/Si MOS capacitor depending on thickness of Hf metal layer. $HfO_2$ films were deposited using TEMAH and $O_3$ at $350^{\circ}C$. Samples were then annealed using furnace heating to $500^{\circ}C$. Round-type MOS capacitors have been fabricated on Si substrates with $2000\;{\AA}$-thick Pt top electrodes. The composition rate of the dielectric material was analyzed using TEM (Transmission Electron Microscopy), XRD (X-ray Diffraction) and XPS (X-ray Photoelectron Spectroscopy). Also the capacitance-voltage (C-V), conductance-voltage (G-V), and current-voltage (I-V) characteristics were measured. We calculated the density of oxide trap charges and interface trap charges in our MOS device. At the interface between $HfO_2$ and Si, both Hf-Si and Hf-Si-O bonds were observed, instead of Si-O bond. The sandwiched Hf metal layer suppressed the growing of $SiO_x$ layer so that $HfSi_xO_y$ layer was achieved. And finally, the generation of both oxide trap charge and interface trap charge in $HfO_2$ film was reduced effectively by using Hf metal layer.

• 한국전기전자재료학회논문지
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• 제22권6호
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• pp.470-475
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• 2009

We deposited $Al_2O_3$ thin films on GaN by remote plasma atomic layer deposition (RPALD) technique, trimethylaluminum(TMA) and oxygen were used as precursors, at fixed process condition, the number of cycle were changed. Growth rate per cycle was $1.2\;{\AA}$/cycle. and Growth rate was in proportion to a number of cycle, the GaN MIS capacitors that $Al_2O_3$ thin film were deposited above 12 nm, have excellent electrical properties, a low electrical leakage current density(${\sim}10^{-10}\;A/cm^2$ at 1.5 MV), but below 12 nm, we can see the degradation of the leakage current density. After post deposition annealing, Dielectric constant was estimated by 1 MHz high-frequency C-V method, it was varied with the anealing temperature from 6.9 at no post anealed to 7.6 at $800^{\circ}C$, and we can see a improvement of the leakage current density and breakdown voltage by post deposition anealing below $700^{\circ}C$, but, after anealed at $800^{\circ}C$, we can see the degradation of the leakage current density and breakdown voltage.

• 폴리머
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• 제28권5호
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• pp.361-366
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• 2004

가해준 하중에 따라 폴리(비닐리덴 플루오라이드) (PVDF) 필름에서 발생하는 전압을 측정하며 분포형 촉각센서로서의 특성을 연구하였다. PVDF 필름에 전기장과 온도를 달리하면서 극화 (poling)의 변화를 주었고 이에 따른 필름의 압전성을 나타내는 $\beta$-결정상의 피크를 FT-IR. DSC와 XRD를 사용하여 확인하였다. 본 연구에서 사용된 온도와 전압의 영역에서는 극화 온도가 증가함에 따라 그리고 극화 전압이 증가함에 따라 $\beta$-결정상은 증가하였으며, 이에 따라 유전상수가 역시 증가하였다. 8$\times$8어레이 (array)로 제작된 촉각센서에 힘을 가하여 극화에 따른 전압 발생량을 측정한 결과, 극화가 많이 된 시편의 경우 높은 전압이 발생하는 것을 확인하였다.

• 한국진공학회지
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• 제9권3호
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• pp.254-257
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• 2000

MBE 법으로 GaAs 기판 위에 성장시킨 $Cd_{1-x}Mg_x/Te$ 박막시료를 조성비(x=0, 0.23, 0.43)에 따라 타원편광 분석기로 측정하여 연구하였다. 기존에 보고된 고상시료(bulk)의 결과와 비교한 결과, 첫째 $E_0$ 밴드갭 에너지 아래에서 나타나는 간섭무늬를 확인할 수 있었고, 이는 박막이 투명함을 보여주는 사실이며 그 결과 이번 시료의 우수성을 확인할 수 있었다. 둘째 $E_2$밴드갭 에너지 영역에서 종전의 고상시료에서 측정 발표된 값보다도 매우 높고 명확한 <$\varepsilon_2$> 값이 측정되어, $E_2$와 $E_0$' 밴드갭 에너지가 명확히 분리되는 것을 보았다. 간섭무늬를 제거하기 위해 다층구조계산(multilayer calculation)을 수행하여 x=0.23일 때의 $E_0$ 밴드갭 에너지를 볼 수 있었다.

• 공업화학
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• 제23권6호
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• pp.515-520
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• 2012

이 총설에서는 개별인식 태그와 바이오센서 등에 사용가능성이 높은 실리콘 기반의 캐패시터와 유기 박막트랜지스터 소자의 제작과 차이점이 논하여 진다. 금속이나 혹은 비금속의 나노입자는 화학물질이나 혹은 바이오분자, 즉, 단백질과 올리고 DNA 등에 표면이 싸여질 수 있으며, 상응하는 목표 바이오분자가 결합되어져 있는 절연체에 자기조립 단일층을 형성할 수 있다. 단일층으로 형성된 나노입자는 정전하 기본단위로서 유기 메모리 소자의 나노 플로팅 게이트로서 역할을 하는 것이다. 특히, 바이오분자의 선택적이고 강한 결합 메카니즘을 통하여도, 메모리 캐패시터나 유기 메모리 박막트랜지스터가 성공적으로 시연되었다. 더불어, 이러한 유기 메모리 소자는 차후 유연기판의 유기전자소자 영역의 발전을 촉진할 것으로 기대된다. 또한, 유기 메모리 박막트랜지스터는 앞으로 새로운 개념의 소자로의 적용이 가능하다.