• Polymer(Korea)
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• v.34 no.5
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• pp.424-429
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• 2010

The hybrid composites of aliphatic polyester-silica were prepared via a sol-gel reaction and their potential application using as a buffer coating layer in the thermoelectric device were investigated. When aliphatic polyesters were thermally treated at a high temperature of $240^{\circ}C$, the polymer showed an increases in thermal degradation temperature by $30{\sim}90^{\circ}C$ according to the thermal treatment time. The polyester-silica composites showed an increases in thermal degradation temperature by $30{\sim}50^{\circ}C$ according to the content of the added silica. Polyester-silica composite showed neither discoloration nor change in optical properties because Knoevenagel condensation reaction was hindered by silica structure. The thermal conductivity of the composites increased linearly according to the content of added silica.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.39C no.11
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• pp.1167-1176
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• 2014

In this paper, a relay communication scheme for enhancing the WiMedia network performance by device's mobility is proposed. WiMedia protocol is suitable for the application that supports the real-time multimedia service in Ship Area Network since it supports high speed data transfer. However, the device's mobility is caused the dramatic change of link state and network topology, and is occurred the degradation of network performance. Therefore, a relay communication scheme for WiMedia network is proposed in this paper. The proposed technique can intelligently treat the change of link state, and solve the degradation of network performance.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.39C no.11
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• pp.1159-1166
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• 2014

In this paper, a resource management scheme for enhancing the network connectivity and reliability in wireless USB system is proposed. Wireless USB protocol is suitable for the application that supports the real-time multimedia service in Ship Area Network since it supports high speed data transfer. However, the device's mobility is caused the dramatic change of link state and network topology, and is occurred the degradation of network performance. Therefore, a resource management scheme for wireless USB system is proposed in this paper. The proposed technique can intelligently treat the change of link state, and solve the degradation of network performance. The simulation results show that proposed protocol can enhance the throughput and delay performance by selecting relay device with better link state.

• KIPS Transactions on Computer and Communication Systems
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• v.9 no.9
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• pp.189-196
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• 2020

Recently, GPU cloud computing technology applying GPU(Graphics Processing Unit) devices to virtual machines is widely used in the cloud environment. In a cloud environment, GPU devices assigned to virtual machines can perform operations faster than CPUs through massively parallel processing, which can provide many benefits when operating high-performance computing services in a variety of fields in a cloud environment. In a cloud environment, a GPU device can help improve the performance of a virtual machine, but the virtual machine scheduler, which is based on the CPU usage time of a virtual machine, does not take into account GPU device usage time, affecting the performance of other virtual machines. In this paper, we test and analyze the performance degradation of other virtual machines due to the virtual machine that performs GPGPU(General-Purpose computing on Graphics Processing Units) task in the direct path based GPU virtualization environment, which is often used when assigning GPUs to virtual machines in cloud environments. Then to solve this problem, we propose a GPGPU task management method for a virtual machine.

• Journal of the Korean Vacuum Society
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• v.14 no.4
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• pp.229-237
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• 2005

The degradation phenomena in SiGe hetero-junction bipolar transistors(SiGe HBTs) induced by bias stress are investigated in this review. If SiGe HBTs are stressed over a specific time interval, the device parameters deviate from their nominal values due to the internal changes in the devices. Reverse-bias stress on emitter-base(EB) junctions causes base current increase and current gain decrease because carriers accelerated by the electrical field generate recombination centers. When forward-bias current stress is conducted at an ambient temperature above $140^{\circ}C$ , hot carriers produced by Auger recombination or avalanche multiplication induce current gain fluctuation. Mixed-mode stressing, where high emitter current and high collector-base voltage are simultaneously applied to the device, provokes base current rise as EB reverse-bias stressing does.

• Database Research
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• v.34 no.3
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• pp.124-136
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• 2018

There have been active research activities to use neural networks to analyze OCT images and make medical decisions. One requirement for these approaches to be promising solutions is that the trained network must be generalized to new devices without a substantial loss of performance. In this paper, we use a deep convolutional neural network to distinguish AMD from normal patients. The network was trained using a data set generated from an OCT device. We observed a significant performance degradation when it was applied to a new data set obtained from a different OCT device. To overcome this performance degradation, we propose an image normalization method which performs segmentation of OCT images to identify the retina area and aligns images so that the retina region lies horizontally in the image. We experimentally evaluated the performance of the proposed method. The experiment confirmed a significant performance improvement of our approach.

• Journal of the Korean Physical Society
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• v.73 no.11
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• pp.1764-1773
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• 2018

A-PET is a quad-head PET scanner developed for use in small-animal imaging. The dimensions of its volumetric field of view (FOV) are $46.1{\times}46.1{\times}46.1mm^3$ and the gap between the detector modules has been minimized in order to provide a highly sensitive system. However, such a small FOV together with the quad-head geometry causes image quality degradation. The main factor related to image degradation for the quad-head PET is the mispositioning of events caused by the penetration effect in the detector. In this paper, we propose a precise method for modelling the system at the high spatial resolution of the A-PET using a LOR (line of response) based ML-EM (maximum likelihood expectation maximization) that allows for penetration effects. The proposed system model provides the detection probability of every possible ray-path via crystal sampling methods. For the ray-path sampling, the sub-LORs are defined by connecting the sampling points of the crystal pair. We incorporate the detection probability of each sub-LOR into the model by calculating the penetration effect. For comparison, we used a standard LOR-based model and a Monte Carlo-based modeling approach, and evaluated the reconstructed images using both the National Electrical Manufacturers Association NU 4-2008 standards and the Geant4 Application for Tomographic Emission simulation toolkit (GATE). An average full width at half maximum (FWHM) at different locations of 1.77 mm and 1.79 mm are obtained using the proposed system model and standard LOR system model, which does not include penetration effects, respectively. The standard deviation of the uniform region in the NEMA image quality phantom is 2.14% for the proposed method and 14.3% for the LOR system model, indicating that the proposed model out-performs the standard LOR-based model.

• Proceedings of the KSRS Conference
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• 2005.10a
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• pp.586-588
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• 2005

The MSC (Multi Spectral Camera) system is a remote sensing payload to obtain high resolution ground image. This system uses lossy image compression method for &Direct mission& that transmit whole image during one contact. But some image degradation occurred especially at high compression ratio. To reduce this degradation, the MSC uses NUC (Non-uniformity Correction) Unit. This unit correct CCD (Charge Coupled Device)'s high-frequency non-uniformity. So high frequency contents of image can be minimized and whole system SNR can be maximized. But NUC has some disadvantage either. It decreases entire system reliability by adding one electronic system. Adding NUC also led to difficulty of electronic design, assembly and testability. In this paper, the comparison is performed between on-orbit non-uniform correction and on ground correction. by evaluating NUC advantage for the point of view of image quality. Using real MSC parameter and proper model, considerable reference point for the system design came to possible.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.27 no.6
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• pp.343-349
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• 2014

It is summarized that potential causes of performance degradations and failure mechanisms of crystalline silicon photovoltaic (PV) modules installed in Middle East area. In addition, we also reviewed current PV module qualification test (IEC 61215) and the methods for detection of wear-out fault. The failure of PV modules in the extreme environmental conditions such as deserts is mainly due to high temperature, humidity, and dust storms. In particular, cementation phenomenon caused by combination of sand and moisture leads to rapid degradation in the performance of PV modules. In order to evaluate and guarantee the long term reliability of PV modules, specific qualification tests such as sand dust test, salt mist test and potential induce degradation test considering operating environment of PV module should be carried out.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.3 s.345
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• pp.9-14
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• 2006

The dependence of NBTI lifetime on the BEOL processes such as sintering gas type and passivation layer has been characterized in depth. Then, optimized BEOL process scheme is proposed to improve NBTI lifetime. NBTI showed degradation due to the plasma enhanced nitride (PE-SiN) passivation film and $H_2$ sintering anneal. Then, new process scheme of $N_2$ annealing instead of $H_2$ annealing prior to PE-SiN deposition is proposed. The proposed BEOL process flow showed that NBTI lifetime can be improved a lot without degradation of device performance and NMOS hot carrier reliability.