• Proceedings of the IEEK Conference
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• 1999.11a
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• pp.637-640
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• 1999

In this Paper we show the LCD simulator for defect inspection using image processing algorithm and neural network. The defect inspection algorithm of the LCD consists of preprocessing, feature extraction and defect classification. Preprocess removes noise from LCD image, using morphology operator and neural network is used for the defect classification. Sample images with scratch, pinhole, and spot from real LCD color filter image are used. The proposed algorithms show that defect detected and classified in the ratio of 92.3% and 94.6 respectively.

• Proceedings of the Korean Institute of Building Construction Conference
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• 2022.04a
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• pp.33-34
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• 2022

The Apartment Defect Dispute Mediation Committee of the Ministry of Land, Infrastructure, and Transport received as many as 7,686 complaints regarding defects in 2021, and the conflict caused by these disputes on the defects is worsening. A quality inspection team system was established in January 2021 to address the deepening conflict, and this system prevented the emergence of defects in apartment houses before the residents moved in. Quality inspections were conducted based on the Housing Act standards, but the reality is that the standards for the ordinances are not systematic. Based on the analysis of the ordinances by the apartment quality inspection team, 23 out of 226 local governments utilized the quality inspection teams, and they had different standards for the quality inspection subjects and inspection periods. In addition, the inspection standards for the defect checklists used by the apartment quality inspection teams operated by local governments varied. A survey was conducted by apartment quality experts to tackle this problem and proposed improvement plans for the defect checklists used for the quality inspection of apartment houses.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2004.10a
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• pp.585-589
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• 2004

This paper deals with the algorithm development that inspects defects such as Lens Focus, Black Defect, Dim Defect, Color Defect, White Balance, and Line Defect caused by the process of Compact Camera Module (CCM). These days the demand of CCM goes on increasing in various types like PDA, a cellular phone and PC camera every year. However, owing to the defect inspection of CCM by the semiskilled work the average inspection time of CCM takes about 40 to 50 seconds. As time goes by the efficiency takes a sudden turn for the worse because workers must inspect with seeing a monitor directly. In this paper, to solve these problems, we developed the imaging processing algorithm to inspect the defects in captured image of assembled CCM. The performances of the developed inspection system and its algorithm are tested on many samples. Experimental results reveal that the proposed system can focus the lens of CCM within 5s and we can recognize various types of defect of CCM modules with good accuracy and high speed.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2000.04a
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• pp.115-120
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• 2000

This study is on the application the image processing algorithm for inspection of the aluminium mill strip surface defect. The image of surface defect data was obtained using the CCD camera with the digital signal board. The edge was found from the difference of pixel intensity between the normal image and defect image. Two step were taken to find the edge in the image processing algorithm. First, noise was removed by using the median filter in the image. Second, the edge was sharpened in detail by using the sharpening convolution filter in the image. Canny algorithm was used to defect the exact edge. The defect section was separated from the original image is to find the coordination point p1 and p2 which include the defect image

• Proceedings of the KIEE Conference
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• 1999.07b
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• pp.668-670
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• 1999

We have developed a automatic surface inspection system for cold Rolled strips in steel making process for several years. We have experienced the various kinds of surface inspection systems, including linear CCD camera type and the laser type inspection system which was installed in cold rolled strips production lines. But, we did not satisfied with these inspection systems owing to insufficient detection and classification rate, real time processing performance and limited line speed of real production lines. In order to increase detection and computing power, we have used the Dark Field illumination with Infra_Red LED, Bright Field illumination with Xenon Lamp, Parallel Computing Processor with Area typed CCD camera and full software based image processing technique for the ease up_grading and maintenance. In this paper, we introduced the automatic inspection system and real time image processing technique using the Object Detection, Defect Detection, Classification algorithms. As a result of experiment, under the situation of the high speed processed line(max 1000 meter per minute) defect detection is above 90% for all occurred defects in real line, defect name classification rate is about 80% for most frequently occurred 8 defect, and defect grade classification rate is 84% for name classified defect.

• Journal of Institute of Control, Robotics and Systems
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• v.14 no.5
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• pp.444-452
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• 2008

This paper presents an overall image processing approach of defect inspection of patterned TFT-LCD panels for the real manufacturing process. A prototype of AOI(Automatic Optical Inspection) system which is composed of air floating stage and multi line scan cameras is developed. Adjacent pattern comparison algorithm is enhanced and used for pattern elimination to extract defects in the patterned image of TFT-LCD panels. New region merging algorithm which is based on border expansion is proposed to identify defects from the pattern eliminated defect image. Experimental results show that a developed AOI system has acceptable performance and the proposed algorithm reduces environmental effects and processing time effectively for applying to the real manufacturing process.

• IEMEK Journal of Embedded Systems and Applications
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• v.19 no.5
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• pp.259-265
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• 2024

In this paper, we propose an automatic display defect detection system using image processing. The existing inspection by operators has the disadvantage that human errors may occur due to the operator's skill level, fatigue, etc., and that standardization and quantification are difficult. It also has disadvantages such as the limited inspection speed and the cost of the operator's education. The proposed system automatically detects various display defects through image processing algorithms. It was developed based on the Jetson Nano, one of the most popular SBCs (Single Board Computers), and it has a conveyor belt to automatically moves the display to the inspection position. By providing a human machine interface (HMI), the operator can check the inspection information in real time, and control the inspection flow. By storing the inspection results as a log file, the operator can check the inspection results at any time, such as the time taken to perform each algorithm and the location of the detected defects. In addition, a multi-threaded structure was adopted. The camera's operations and inspection algorithms are executed in parallel in different threads, which can shorten the inspection time compared to the system based on a single-threaded structure. The experimental results prove the defect detection capability of the system and the efficiency of the inspection time.

• Journal of the Korean Institute of Intelligent Systems
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• v.19 no.2
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• pp.259-264
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• 2009

High level quality control is required for mobile TFT-LCD modules which are frequently used for fine observation. However, quantitative quality control is difficult. Defect inspection using naked eyes makes irregular inspection results. This paper developed desk type defect inspection equipment for mobile TFT-LCD modules using the same inspection criterion with that of naked eyes. From experiments using this equipments, possibilities of standardization in defect inspection equipment for mobile TFT-LCD modules are presented.

• Journal of Institute of Control, Robotics and Systems
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• v.19 no.11
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• pp.974-978
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• 2013

AVI (Automatic Vision Inspection) systems automatically detect defect features and measure their sizes via camera vision. AVI systems usually report different measurements on the same defect with some variations on position or rotation mainly because different images are provided. This is caused by possible variations from the image acquisition process including optical factors, nonuniform illumination, random noises, and so on. For this reason, conventional area based defect measuring methods have problems of robustness and consistency. In this paper, we propose a new defect size measuring method to overcome this problem, utilizing volume information that is completely ignored in the area based defect measuring method. The results show that our proposed method dramatically improves the robustness and consistency of defect size measurement.

• Journal of Korean Society of Water and Wastewater
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• v.30 no.6
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• pp.623-634
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• 2016

Sewer condition assessment involves the determination of defective points and status of aged sewers by a CCTV inspection according to the standard manual. Therefore, it is important to establish a reliable and effective standard manual for identifying the sewer defect. In this study, analytic reviews of the CCTV inspection manuals of the UK, New Zealand, Canada and South Korea were performed in order to compare the defect codes and the protocols of condition assessment. Through this, we also established the standardized method for defect code and revised the calculation method of assigning the condition grade. Analyses of the types and frequencies of sewer defects that obtained by CCTV inspection of 7000 case results, showed that the joint defect and lateral defect were the most frequent defects that occurred in Korea. Some defect codes are found to be modified because those did not occur at all. This study includes a proposed new sewer defect codes based on sewer characteristics.