• 한국재료학회지
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• 제16권5호
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• pp.285-291
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• 2006

Copper powders have been widely used in electrically conductive coatings, electrode materials et al. and are very prospective since they are cheaper than noble metal powders such as silver or palladium. In this study, copper powders for metal filler of EMI shielding have been prepared using a solvothermal process from $CuSO_4$, NaOH, Glucose, mixed solvent ($H_2O$: Ethanol) and hydrazine which was used as a reducing agent at various reaction conditions. The prepared copper powders showed finely dispersed spherical shape without agglomerate, uniform morphology, narrow size distribution, high purity and were about 400-700 nm in size. The prepared powders were characterized using XRD, SEM, TGA, XPS, particle size measurement and EMI shielding efficiency.

• 열처리공학회지
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• 제20권1호
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• pp.17-21
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• 2007

In this study, brazing characteristics of the dissimilar Ti and Cu metals using a Zr-base amorphous filler ($Zr_{41.2}Ti_{13.8}Cu_{12.5}Ni_{10.0}Be_{22.5}$ in at.%) have been investigated for various bonding temperatures. In the sample brazed at $790^{\circ}C$ for 10 min., the Ti-rich phases in the joint were observed, while the Cu-rich phases were obtained in the sample brazed at $825^{\circ}C$ for 10 min.. Such a different microstructure and composition in the joints could be explained by the degree of the dissolution reaction. At $790^{\circ}C$, the reaction between the Zr-rich liquid phase and the Ti base metal was actively occurred to form Ti-rich liquid phase in the joint. As the temperature increased to $825^{\circ}C$, however, the reaction between the Ti-rich liquid phase and the Cu base metal was promoted to form the Cu-rich liquid phase in the joint finally. Such a different interface reaction is attributed to the reactivity or solubility between the Zr as a main element in the filler and the Ti and Cu as a base metal element.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2000년도 하계학술대회 논문집
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• pp.798-801
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• 2000

For the performance enhancement of communication system, high quality filters are required. Also a minimization of size of filter is required for the interation of devices in the limited area. Conventional metal filters made of copper can be substituted by high quality high temperature superconducting(HTS) films for better performance. Hairpin type filters have been designed with the center frequency 14 GHz for the size reduction. 3-pole and 4-pole filters centered at 14 GHz with the bandwidth of about 300 MHz were designed and fabricated. With the simulation results, the frequency responses showed low insertion loss and sharp skirts characteristics. The frequency response of HTS 14 GHz fi1ter was measured at 77 K and compared with the simulation results. We have compared YBCO filters and copper filters which were made with the same design rules. Simulated and measured frequency responses reveal that HTS YBCO hairpin type bandpass filters show better performance than copper filters.

• 공업화학
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• 제23권6호
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• pp.554-560
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• 2012

전자 통신 산업이 발달하면서 도전성 재료의 사용이 증가하게 되었다. 그에 따라 주로 사용되어오던 귀금속들을 대신할 저렴한 재료들이 필요하게 되었다. 그 중 구리는 귀금속에 비해 값이 저렴하고, 유사한 열 전기적 특성을 가졌지만 대기 중에서 쉽게 산화가 되는 문제점이 있다. 산화를 방지하기 위해서는 제조공정이 복잡해져 사용에 제한이 되어왔다. 구리의 산화 방지를 위한 방법 중 하나로 산화에 강한 금속을 Core-Shell 구조로 도금시켜 고유의 특성을 유지하며 산화를 방지하는 방법이 있다. 본 연구에서는 무전해 도금법으로 구리분말에 주석(Sn) 도금을 했고, 도금에 영향을 주는 인자들에 대해서 연구했다. XRD, FE-SEM, FIB, 4-Point Probe 등의 분석결과 구리 표면에 치밀한 주석피막이 도금되었고, 대기 중에서 산화가 되지 않았다. 분석결과를 바탕으로 최적의 도금 조건을 도출했고, 추가적으로, 도전성 필러 응용 가능성에 대한 실험을 했다. 합성된 분말을 pellet 형태로 압분 성형한 후 저온 열처리 전과 후의 변화를 분석했다. 그 결과 저온 치밀화를 통해 용융된 주석이 구리 입자들을 상호연결 시켰고, 전기 전도가 향상되었다.

• 대한용접접합학회:학술대회논문집
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• 대한용접접합학회 2004년도 추계학술발표대회 개요집
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• pp.243-245
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• 2004

가속기의 저장링 및 빔라인에는 방사광을 차단 혹은 일부 통과 둥의 목적으로 Photon Absorber와 같은 진공 부품이 사용되고 있으며, 이는 일반적으로 구리와 스테인리스 스틸 등의 이종재료를 브레이징 공정을 이용하여 제작함으로써 부품이 구조적 건성의 확보와 더불어 진공환경 및 수밀을 유지하고 있다. 그러나, Photon Absorber는 사용 용도에 따라 구조적 형상이 서로 다르기 때문에 브레이징 공정을 적용하는 경우, 상대적으로 제품 생산가격의 상승, 유지보수 및 제작불량에 따른 공정 제어의 어려움이 나타나고 있다. 본 연구에서는 스테인리스 스틸 (STS 304)과 구리(OFHC Copper)의 이종금속에 접합에 GTAW 용접 공정 기술을 적용하여 제반 용접공정에 따른 용접부 성능 및 진공 특성 등을 검토하였다. 용접봉 (ER CuSi-A)을 직접 사용하여 이종 재료의 시험편에 GTAW 용접을 적용한 결과, 진공 누설율은 $1{\times}10^{-10}\;Torr{\cdot}l/s$ 이하를 얻을 수 있었으며, 용접 접합부의 인장강도 210 MPa로써 구리 모재와 유사한 기계적 특성을 나타내었다.

• 한국재료학회지
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• 제3권6호
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• pp.668-677
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• 1993

Cu-P계, 4종의 Cu-P-Pn계 및 3종의 Cu-P-Sn-Ag계 용가재를 사용해 Ar분위기 하에서 1003 및 1033K로 1.2Ks동안 노브레이징한 ST304, STS430 및 저탄소강과 동 접합체들을 전단시험 및 조직시험하였다. 계면에서의 미세조직은 제 종류 즉 첫째,균열을 포함하는 반응층 둘째, 분산층 세째, 균열을 포함하는 반응층과 분산층으로 분류된다. 분산층만이 존재할때 40-60MPa 이상의 상대적으로 높은 전단강도가 얻어지며, 동모재파단을 일으킨다. 이 반응층이 형성되었을때는 반드시 균열이 형성되며, 낮은 전단강도를 나타내고 접합부파단을일으킨다. 이 반응층은 Fe-P계의 화합물이다. 이러한 미소조직 및 강도 경향은 용가재내 Sn의 존재 및 모재내 Ni(또한 Cr)의 존재 유무에 따라 변화한다.

• Journal of Welding and Joining
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• 제13권3호
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• pp.134-146
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• 1995

Aluminium nitride(AlN) is currently under investigation as potential candidate for replacing alumium oxide(Al$_{2}$ $O_{3}$) as a substrate material for for electronic circuit packaging. Brazing of aluminium nitride(AlN) to Cu with Ag base active alloy containing Ti has been investigated in vacuum. Binary Ag$_{98}$ $Ti_{2}$(AT) and ternary At-1wt.%Al(ATA), AT-1wt.%Ni(ATN), AT-1wt.% Mn(ATM) alloys showed good wettability to AlN and led to the development of strong bond between brate alloy and AlN ceramic. The reaction between AlN and the melted brazing alloys resulted in the formation of continuous TiN layers at the AlN side iterface. This reaction layer was found to increase by increase by increasing brazing time and temperature for all filler metals. The bond strength, measured by 4-point bend test, was increased with bonding temperature and showed maximum value and then decreased with temperature. It might be concluded that optimum thickness of the reaction layer was existed for maximum bond strength. The joint brazed at 900.deg.C for 1800sec using binary AT alloy fractured at the maximum load of 35kgf which is the highest value measured in this work. The failure of this joint was initiated at the interface between AlN and TiN layer and then proceeded alternately through the interior of the reaction layer and AlN ceramic itself.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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• pp.379.1-379.1
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• 2016

Recently, new types of wearable devices such as textile electronics are considered as the next generation wearable electronics. To realize the textile electronics, conductive fibers are required to supply the power and for signal processing. Conventionally, silver nanowires (Ag NWs) have been attracted as one of the conductive additives in the fibers, however, using the Ag NWs may lead to high production cost since it is a noble metal. Many researches have been done to replace the Ag NWs into a cheaper materials such as copper nanowires (Cu NWs). Here, we synthesized ultra-long Cu NWs for a conductive filler material in conductive fibers, taking advantages of their structural features. To investigate the effect of capping agents on the aspect ratio of the synthesized Cu NWs, we used various capping agents such as hexadecylamine, butylamine, ethylenedilamine and oleylamine in the Cu NW synthesis. In this research, the effects of capping agents on the structure and the synthesis of Cu NWs are presented.

• Journal of Welding and Joining
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• 제13권3호
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• pp.106-115
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• 1995

To know the bonding phenomena of Ti/Cu brazed joint, a characteristic of microstructures in bonding interlayer of vacuum brazed pure Ti to Cu has been studied in the temperature range from 1088 to 1133K for various bonding times using Ag-28wt%Cu filler metal. Also intermediate phases formed in bonded interlayer and behavior of layer growth have been investigated. The obtained results in this study are as follows: 1) Liquid insert metal width at the each brazing temperature was proportional to the square root of brazing time, and it was considered that the liquid insert metal width was controlled by the diffusion rate process of primary .alpha.-Cu formed at the Ti side. 2) Intermediate phases formed near the Ti interface were .betha.-Ti and intermetallic compounds TiCu, Ti$_{2}$Cu, Ti$_{3}$Cu, and TiCu. 3) .betha.-Ti formed in Ti base metal durig brazing transformed to lamellar structure, .alpha.-Ti + Ti$_{2}$Cu. The structure came from the eutectoil decomposition reaction in cooling. And the width of .betha.-Ti layer was proportional to the square root of brazing time, and it was considered that the growth of .betha.-Ti layer was controlled by interdiffusion rate process in .betha.-Ti. 4) The layer growth of TiCu, Ti$_{3}$Cu$_{4}$ and TiCu, phases formed near the Ti interface was linerface was linearly proportional to the brazing time, and it was considered that the layer growth of these phases was controlled by the chemical reaction rate at the interface.

• 한국분말재료학회지
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• 제30권4호
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• pp.339-345
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• 2023

This study investigates the melting point and brazing properties of the aluminum (Al)-copper (Cu)-silicon (Si)-tin (Sn) alloy fabricated for low-temperature brazing based on the alloy design. Specifically, the Al-20Cu-10Si-Sn alloy is examined and confirmed to possess a melting point of approximately 520℃. Analysis of the melting point of the alloy based on composition reveals that the melting temperature tends to decrease with increasing Cu and Si content, along with a corresponding decrease as the Sn content rises. This study verifies that the Al-20Cu-10Si-5Sn alloy exhibits high liquidity and favorable mechanical properties for brazing through the joint gap filling test and Vickers hardness measurements. Additionally, a powder fabricated using the Al-20Cu-10Si-5Sn alloy demonstrates a melting point of around 515℃ following melting point analysis. Consequently, it is deemed highly suitable for use as a low-temperature Al brazing material.