• Title/Summary/Keyword: breakdown potential

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Influence of the Conduction Properties on ZnO-Based Ceramic Varistor with $TiO_2$ Additives ($TiO_2$의 첨가가 ZnO계 세라믹 바리스타에 미치는 전기적인 영향)

  • Lee, S.S.;Jang, K.U.;Lee, J.U.
    • Proceedings of the KIEE Conference
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    • 1987.11a
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    • pp.234-238
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    • 1987
  • In this paper, the used specimen composition was added basic additives ($Bi_2O_3\;lmol%$, $Sb_2O_3\;lmol%$, CoO 0.5 mol%, MnO 0.5mol%) to ZnO powder, and $TiO_2$ (1,2,3,4 mol%) to the above basic composition. It appears that there are four regions of conduction current depended upon the strength of the applied electric field ; Ohimic region, Poole-Frenkel region, Schottky region and Tunneling region. Increasing of $TiO_2mol%$, the breakdown voltages of ZnO ceramic varistors are decreased. The decrease of breakdown voltages was explained with the decrease of potential barrier height. Moreover, V-I characteristics with temperature dependence are decreased with increasing of $TiO_2mol%$.

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A Study on the prevention of edge effect reducing dielectric strength (절연내력에 미치는 주변효과의 방지에 관한 연구)

  • Kwak, Hee-Ro;Shin, Hee-Yong
    • Proceedings of the KIEE Conference
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    • 1987.11a
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    • pp.267-271
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    • 1987
  • The test cell for preventing the edge effect reducing the intrinsic breakdown strength of polypropylene film and measuring the intrinsic breakdown strength of the film was developed. The new approach was to develope an electrode system with an edge region which is carefully graded over an extended distance. The new test arrangement employed a central circular electrode at high voltage and a set of nine concentric surrounding rings each controlled in potential by external grading resistors to be at decreasing potentials from that at the center in 10% increments. Two different size structures using the same basic principle were tried and were both found to be successful. The test electrodes were manufactured using standard printed circuit technology and were chosen to be copper on high dielectric constant GIO board.

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Finite Element Analysis of Gas Discharge in Transient State Considering Secondary Electron Emission Effects (2차 전자방출 효과를 고려한 기체방전의 과도상태 유한요소해석)

  • Kim, Nam-Kyung;Jeung, Gi-Woo;Choi, Nak-Sun;Lee, Se-Hee;Kim, Dong-Hun
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.59 no.7
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    • pp.1276-1281
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    • 2010
  • To analyze the gas discharge phenomena in parallel-plane electrodes, the fully coupled finite element method (FEM) considering secondary electron emission effects in discharge column was adopted in this paper. Two coupled equations of the hydrodynamic diffusion-drift equations for three carriers and the Poisson's equation for electric scalar potential should be solved as a system equation. The proposed method including two secondary electron processes of the photoemission and background ionization has been successfully applied to evaluating the breakdown voltage in parallel-plane electrodes and is verified by comparing its numerical results with the experimental ones. From the obtained results, it is inferred that the proposed numerical scheme will be useful for predicting and understanding streamer transient phenomena.

LIGBT with Dual Cathode for Improving Breakdown Characteristics

  • Kang, Ey-Gook;Moon, Seung-Hyun;Sung, Man-Young
    • Transactions on Electrical and Electronic Materials
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    • v.1 no.4
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    • pp.16-19
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    • 2000
  • Power transistors to be used in Power Integrated Circuits(PIC) are required to have low on resistance, fast switching speed, and high breakdown voltage. The lateral IGBTs(LIGBTs)are promising power devices for high voltage PIC applications, because of its superior device characteristics. In this paper, dual cathode LIGBT(DCIGBT) for high voltage is presented. We have verified the effectiveness of high blocking voltage in the new device by using two dimensional devices simulator. We have analyzed the forward blocking characteristics , the latch up performance and turn off characteristics of the proposed structure. Specially, we have focused forward blocking of LIGBT. The forward blocking voltage of conventional LIGBT and the proposed LIGBT are 120V and 165V, respectively. . The forward blocking characteristics of the proposed LIGBT is better than that of the conventional LIGBT. This forward blocking comparison exhibits a 1.5 times improvement in the proposed LIGBT.

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Effects of Low-Temperature Sintering on Varistor Properties and Stability of VMCDNB-Doped Zinc Oxide Ceramics

  • Nahm, Choon-W.
    • Journal of the Korean Ceramic Society
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    • v.56 no.1
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    • pp.84-90
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    • 2019
  • The varistor properties and stability against dc-accelerated stress of $V_2O_5-Mn_3O_4-Co_3O_4-Dy_2O_3-Nb_2O_5-Bi_2O_3$ (VMCDNB)-doped zinc oxide ceramics sintered at $850-925^{\circ}C$ were investigated. Increasing the sintering temperature increased the average grain size from 4.6 to 8.7 mm and decreased the density of the sintered pellet density from 5.54 to $5.42g/cm^3$. The breakdown field decreased from 5919 to 1465 V/cm because of the increase in the average grain size. Zinc oxide ceramics sintered at $875^{\circ}C$ showed the highest nonlinear coefficient (43.6) and the highest potential barrier height (0.96 eV). Zinc oxide ceramics sintered at $850^{\circ}C$ showed the highest stability: the variation rate of the breakdown field was -2.0% and the variation rate of the nonlinear coefficient was -23.3%, after application of the specified stress (applied voltage/temperature/time).

Improved Breakdown Voltage Characteristics of $In_{0.5}Ga_{0.5}P/In_{0.22}Ga_{0.78}As/GaAs$ p-HEMT with an Oxidized GaAs Gate

  • I-H. Kang;Lee, J-W.;S-J. Kang;S-J. Jo;S-K. In;H-J. Song;Kim, J-H.;J-I. Song
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.3 no.2
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    • pp.63-68
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    • 2003
  • The DC and RF characteristics of $In_{0.5}Ga_{0.5}P/In_{0.22}Ga_{0.78}As/GaAs$ p-HEMTs with a gate oxide layer of various thicknesses ($50{\;}{\AA},{\;}300{\;}{\AA}$) were investigated and compared with those of a Schottky-gate p-HEMT without the gate oxide layer. A prominent improvement in the breakdown voltage characteristics were observed for a p-HEMT having a gate oxide layer, which was implemented by using a liquid phase oxidation technique. The on-state breakdown voltage of the p-HEMT having the oxide layer of $50{\;}{\AA}$was ~2.3 times greater than that of a Schottky-gate p-HEMT. However, the p-HEMT having the gate oxide layer of $300{\;}{\AA}$ suffered from a poor gate-control capability due to the drain induced barrier lowering (DIBL) resulting from the thick gate oxide inspite of the lower gate leakage current and the higher on-state breakdown voltage. The results for a primitive p-HEMT having the gate oxide layer without any optimization of the structure and the process indicate the potential of p-HEMT having the gate oxide layer for high-power applications.

Suggestion of Risk Assessment Methodology for Decommissioning of Nuclear Power Plant (원자력발전소 해체 위험도 평가 방법론 개발)

  • Park, ByeongIk;Kim, JuYoul;Kim, Chang-Lak
    • Journal of Nuclear Fuel Cycle and Waste Technology(JNFCWT)
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    • v.17 no.1
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    • pp.95-106
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    • 2019
  • The decommissioning of nuclear power plants should be prepared by quantitative and qualitative risk assessment. Radiological and non-radiological hazards arising during decommissioning activities must be assessed to ensure the safety of decommissioning workers and the public. Decommissioning experiences by U.S. operators have mainly focused on deterministic risk assessment, which is standardized by the U.S. Nuclear Regulatory commission (NRC) and focuses only on the consequences of risk. However, the International Atomic Energy Agency (IAEA) has suggested an alternative to the deterministic approach, called the risk matrix technique. The risk matrix technique considers both the consequence and likelihood of risk. In this study, decommissioning stages, processes, and activities are organized under a work breakdown structure. Potential accidents in the decommissioning process of NPPs are analyzed using the composite risk matrix to assess both radiological and non-radiological hazards. The levels of risk for all potential accidents considered by U.S. NPP operators who have performed decommissioning were estimated based on their consequences and likelihood of events.

Corrosion Behavior of Titanium for Implant in Simulated Body Fluids (인공 체액 조건에서 임플랜트용 티타늄 소재의 부식 특성)

  • 이중배;최기열
    • Journal of the Korean institute of surface engineering
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    • v.37 no.2
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    • pp.110-118
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    • 2004
  • The corrosion of pure titanium (CP- Ti Grade 2) and titanium alloy (Ti6Al4V ELI) were studied under various conditions of simulated body fluids. The static immersion test and the electrochemical test were performed in accordance with ISO 10271 : 2001. For the electrochemical test, the open circuit potential was monitored as a function of time, and the cyclic polarization curve was recorded. The corrosion resistance was evaluated from the values of corrosion potential, passivation current density, breakdown potential, and the shape of hysteresis etc. The effects of alloy type, surface condition, temperature, oxygen, and constituents in the fluids such as acid, chloride were estimated. Both specimens had extremely low dissolution rate in the static immersion test. They showed strong passivation characteristics in the electrochemical test. They maintained negligible current density throughout the wide anodic potential range. The passive layer was not broken up to 2.0 V (vs. SCE). The hysteresis and the shift of passivation potential toward the anodic direction was observed during the reversed scan. The passivation process appeared to be accelerated by oxygen in air or that dissolved in the fluids. The passivation also proceeded without oxygen by the reaction of constituents in the fluids. Acid or chloride in the fluids, specially later weakened the passive layer, and then induced higher passivation current density and less shift of passivation potential in the reversed scan. CP-Ti Grade 2 was more reactive than Ti6Al4V ELI in the fluids containing acid or chloride, but thicker layer produced on its surface provided higher corrosion resistance.

THE EFFECT OF WILTING ON SILAGE MAKING FROM THE VIEWPOINT IN CONNECTION WITH MONSOON ASIA (A REVIEW)

  • Uchida, S.;Kim, K.H.;Yun, I.S.
    • Asian-Australasian Journal of Animal Sciences
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    • v.2 no.1
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    • pp.43-49
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    • 1989
  • In spite of the well confirmed advantages of wilting on the fermentation quality, wilting silages are difficult to make at optimum dry matter content. The prolonged wilting, especially in humid condition, result in lower water soluble carbohydrate (WSC) contents, extensive protein breakdown and sometimes higher total volatile fatty acid (VFA) during wilting an ensilage. Apart from difficulty of controlling moisture content, another problem associated with wilted silages is different evaluation on the potential productivity. In temperature climate of Asia, therefore further researches on the effects of wilting on the silage fermentation and potential productivity seen to be necessary.

Potential barrier height of Metal/SiC(4H) Schottky diode (Metal/SiC(4H) 쇼트키 다이오드의 포텐셜 장벽 높이)

  • 박국상;김정윤;이기암;남기석
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.8 no.4
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    • pp.640-644
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    • 1998
  • We have fabricated Sb/SiC(4H) Schottky barrier diode (SBD) of which characteristics compared with that of Ti/SiC(4H) SBD. The donor concentration of the n-type SiC(4H) obtained by capacitance-voltage (C-V) measurement was about $2.5{\times}10 ^{17}{\textrm}cm^{-3}$. The ideality factors of 1.31 was obtained from the slope of forward current-voltage (I-V) characteristics of Sb/SiC(4H) SBD at low current density. The breakdown field of Sb/SiC(4H) SBD under the reverse bias voltage was about $4.4{\times}10^2V$/cm. The built-in potential and the Schottky barrier height (SBH) of Sb/SiC(4H) SBD were 1.70V and 1.82V, respectively, which were determined by the analysis of C-V characteristics. The Sb/SiC(4H) SBH of 1.82V was higher than Ti/SiC(4H) SBH of 0.91V. However, the current density and reverse breakdown field of Sb/SiC(4H) were low as compared with those of Ti/SiC(4H). The Sb/SiC(4H), as well as the Ti/SiC(4H), can be utilized as the Shottky barrier contact for the high-power electronic device.

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