• Proceedings of the Korean Society of Tribologists and Lubrication Engineers Conference
• /
• 2004.11a
• /
• pp.99-107
• /
• 2004

Lubrication characteristics between a cylinder block and a valve plate for high speed bent-axis type hydraulic pump play an important role in volumetric efficiency and durability of pump. In this paper, a finite element method is presented for the computation of the pressure distribution between a cylinder block and a valve plate for high speed bent-axis type hydraulic pump. Also, a Runge-Kutta method is applied to simulate the cylinder block dynamics of three-degrees of freedom motion. From the results of computation, we can draw two major conclusions. One is related to the fluid film characteristics between a cylinder block and a valve plate and the other is related to the average leakage that is determined by the pressure gradient and the clearance near the discharge port. The numerical results of cylinder block dynamics were compared with the experimental results using eddy-current type gap sensors those are fixed at a pump housing.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.18 no.12
• /
• pp.1111-1116
• /
• 2005

ZnO varistor ceramics added a glass-frit 0.03 $wt\%$ were fabricated with variation of sintering temperature. The sintering temperature and time were $1125^{\circ}C\~1200^{\circ}C$ and 2 h. The average grain sizes increased and the varistor voltage decreased with increasing the sintering temperature. The values of the specimen sintered at $1200^{\circ}C$ were $23.7\;{\mu}m$ and 329 V, respectively. The leakage current of all specimens was less than $1\;{\mu}A$ at DC $82\%$ of varistor voltage. The clamping voltage ratio of the specimen sintered at $1175^{\circ}C$ was 1.37. The endurance of surge current and the deviation of varistor voltage of the specimen sintered at $1175^{\circ}C$ were 6400 $A/cm^2$ and ${\Delta}-2.81\%$, respectively. After the High Temperature Load Test(HTLT) at $85^{\circ}C$ for 1000 h, the specimen sintered at $1175^{\circ}C$ showed the lowest deviation of varistor voltage of ${\Delta}-1.92\%$.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2004.07b
• /
• pp.603-606
• /
• 2004

ZnO varistor ceramics were fabricated with variation of addition of $Nd_2O_3$ amount and the sintering temperature was $l150^{/circ}C$. The average grain sizes were showed decreased from $13.8{\mu}m$ to $4.7{\mu}m$, and varistor voltages were increased from 398 V to 657 V by added amount of $Nd_2O_3$. Nonlinear coefficient a of all were with increasing the amount of $Nd_2O_3$ more than 60, in case of added on 0.1mol% $Nd_2O_3$ was 87. And leakage current were less than $1_{\mu}A$ with applied at 82% of varistor voltage. The clamping voltage ratio of the specimes added 0.1mol% $Nd_2O_3$ was 1.38 at applied 25A [$8/20{\mu}s$]. In the specimen added 0.1mol% $Nd_2O_3$, endurence of surge current and deviation of varistor voltage were 7000A/$cm^2$, $\Delta-2.08%$, respectively.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2004.11a
• /
• pp.375-378
• /
• 2004

ZnO varistor ceramics were fabricated with variation of addition of glass-frit amount and the sintering temperature was $1150^{\circ}C$. The average grain sizes were showed decreased from $8.6\;{\mu}m$ to $10\;{\mu}m$, and varistor voltages were decreased from 506 V to 460 V by added amount of glass-frit. Nonlinear coefficient ${\alpha}$, of all were with increasing the amount of glass-frit more than 60, in case of added on 0.03wt% glass-frit was 83. And leakage current were less than $1{\mu}A$ with applied at 82% of varistor voltage. The clamping voltage ratio of the specimes added 0.03wt% glass-frit was 1.41 at applied 25A $[8/20{\mu}s]$. In the specimen added 0.03wt% glass-frit, endurence of surge current and deviation of varistor voltage were $6200A/cm^2$, $\Delta-1.67%$, respectively.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2005.07a
• /
• pp.307-308
• /
• 2005

ZnO varistor ceramics were fabricated as a function of the sintering temperature from $1125^{\circ}C$ to $1200^{\circ}C$ with glass-frit 0.03wt% addition. The average grain size was increased from 10.4 ${\mu}m$ to 23.7 ${\mu}m$, and varistor voltage was decreased from 538 V to 329 V with rising of the sintering temperature. The nonlinear coefficient a showed similar value from 75 to 80 and leakage current of all specimens exhibited the result of $1{\mu}A$ at 82% of varistor voltage. But the clamping voltage ratio of the specimens sintered at $1175^{\circ}C$ was 1.37 at 25A [$8/20{\mu}s$]. Also, endurance of surge current and deviation of varistor voltage of sintered specimens at $1175^{\circ}C$ were $6400A/cm^2$, $\Delta$-3.32%, respectively.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2002.07b
• /
• pp.625-628
• /
• 2002

The electrical properties of the praseodymium-based ZnO varistor ceramics, which are composed of Zn-Pr-Co-Cr-Dy oxides were investigated with $Dy_2O_3$ amount. The average grain size of varistor ceramics was greatly decreased from 18.2 to 4.6 pm with increasing $Dy_2O_3$ amount. The calculated nonlinear exponent$({\alpha})$ in varistor ceramics without $DY_2O_3$ was only 4.9, whereas the a value of the varistors with $DY_2O_3$ was abruptly increased in the range of 48.8 to 58.6. In particular, the maximum value of a was obtained by doping of 1.0 mol% $DY_2O_3$, reaching 58.6. The measured leakage current$(I_l)$ value in varistors without $DY_2O_3$ was $85.45{\mu}A$, whereas the $I_{\ell}$ value of the varistors with $DY_2O_3$ was very abruptly decreased in the range of 1.10 to $0.12{\mu}A$. In particular, the minimum value of $I_{\ell}$ was obtained by doping of 0.5 mol% $DY_2O_3$, reaching $0.12{\mu}A$. The tan $\delta$ varied in V-shape, with minimum 2.28% at 0.5 mol% $DY_2O_3$. The donor concentration and the density of interface states were decreased in the range of $(4.66{\sim}0.25){\times}10^{18}cm^3$ and $(5.70{\sim}1.39){\times}10^{12}/cm^2$, respectively, as $DY_2O_3$ amount is increased.

• Transactions on Electrical and Electronic Materials
• /
• v.10 no.5
• /
• pp.152-155
• /
• 2009

The microstructure and the electrical properties of a ZnO varistor, which was composed of a ZnO-$Bi_2O_3$-$Sb_2O_3$-CoO- $MnO_2$ -NiO-$Nd_2O_3$ system, were investigated at various $Y_2O_3$ addition concentrations. $Y_2O_3$ played a role in the inhibition of the grain growth. As the $Y_2O_3$ content increased, the average grain size decreased from $6.8{\mu}m$ to $4{\mu}m$, and the varistor voltage($V_{1mA}$) greatly increased from 275 to 400 V/mm. The nonlinearity coefficient ($\alpha$) decreased from 72 to 65 with increasing $Y_2O_3$ amount. On the other hand, the leakage current ($I_L$) increased from 0.2 to 0.9 ${\mu}A$. These results confirmed that doping the varistors with $Y_2O_3$ is a promising production route for production of a higher fine-grained varistor voltage ($V_{1mA}$) which can dramatically reduce the size of the varistors.

• Journal of the Korea Safety Management & Science
• /
• v.12 no.4
• /
• pp.73-80
• /
• 2010

The purpose of this study was to investigate the actual conditions of radiation safety supervision in animal clinics using inspection standard of X-ray generator for diagnosis. The surveys for inspection standard system, equipment condition, and safety supervision were carried out in 18 animal clinics randomly. The inspection standard included reproducibility of dose exposure, kVp, mAs, collimator accuracy test, collimator luminance test, X-ray view box luminance test, grounding system equipment test and external leakage current test. The surveys of equipment condition and safety supervision used one-on-one interview with 5 points measurement. As a result, 44.44% of reproducibility of dose exposure was proper, 81.25% of kVp test was good, and 100% of mAs test was appropriate. Also, 66.66% of collimator accuracy test was proper, 61.11% of collimator luminance test was good, 53.13% of X-ray view box luminance test was suitable. In addition, only 5.55% of grounding system equipment and ground resistance was proper, 63.64% of external leakage current test was appropriate in grounding system equipment test. The 100mA electric capacity of X-ray generator for diagnosis was popular with 44.44%, and its 55.56% was purchased used equipment. Monthly average of less than 50 times (61.11%) was top frequency in use, and no animal clinic had a thermo-luminescence dosimeter(TLD). The 16 animal clinics with radiation safety zone and 2 without radiation safety zone were appeared.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.13 no.3
• /
• pp.206-213
• /
• 2000

The microstructure and electrical properties of Pr$_{6}$/O sub 11/-Based ZnO varistors with Nd$_2$O$_3$ was doped in the range of 0.0 to 2.0 mol% were investigated. Most of the added Nd$_2$O$_3$were segregated at the nodal points and grain boundaries and were found to form the Nd-rich phase. In addition the bulk intergranular layer at the grain boundaries and nodal points was consisted of Nd-rich phase and Pr-rich phase. the average grain size was decreased in the range of 7.8 to 5.6${\mu}{\textrm}{m}$ with increasing Nd$_{2}$/O sub 3/ additive content. The nonlinearity of ZnO varistors sintered at 130$0^{\circ}C$ was much more excellent than that at 135$0^{\circ}C$ ZnO varistors doped with 1.0mol% Nd$_{2}$/O sub 3/ exhibited the best nonlinearity. which is 65.2 in the nonlinear exponent and 4.5$\mu$A in the leakage current. Consequently. it is estimated that Pr$_{6}$/O sub 11/ -based ZnO varistors doped with 1.0 mol% Nd$_{2}$/O sub 3/ are to be sufficiently used as basic composition to fabricate good varistors in the future.ure.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.19 no.9
• /
• pp.825-831
• /
• 2006

As an increase of chip complexity and level of chip integration, chip input/output (I/O) pad pitches are also drastically reduced. With arrival of high complexity SoC (System on Chip) and SiP (System in Package) products, conventional horizontal type probe card showed its limitation on probing density for wafer level test. To enhance probing density, we proposed new vertical type probe card that has the $70{\mu}m$ probe needle with tungsten wire in $80{\mu}m$ micro-drilled hole in ceramic board. To minimize alignment error, micro-drilling conditions are optimized and epoxy-hardening conditions are also optimized to minimize planarity changes. To apply wafer level test for target devices (T5365 256M SDRAM), designed probe card was characterized by probe needle tension for test, contact resistance measurement, leakage current measurement and the planarity test. Compare to conventional probe card with minimum pitch of $50{\sim}125{\mu}m\;and\;2\;{\Omega}$ of average contact resistance, designed probe card showed only $22{\mu}$ of minimum pitch and $1.5{\Omega}$ of average contact resistance. And also, with the nature of vertical probing style, it showed comparably small contact scratch and it can be applied to bumping type chip test.