• 제목/요약/키워드: annealing temperatures

검색결과 731건 처리시간 0.023초

상변화 메모리 소자 동작 특성에 미치는 열처리 온도 효과 (Effect of Annealing Temperature on the Operation of Phase-Change Memory)

  • 이승윤;박영삼
    • 한국진공학회지
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    • 제19권2호
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    • pp.155-160
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    • 2010
  • 상변화 메모리 소자 제작 공정의 단위 스텝인 최종 열처리의 온도가 상변화 메모리 소자 특성에 미치는 영향을 고찰하였다. $Ge_2Sb_2Te_5$ (GST) 박막을 활성 물질로 하는 기공(pore) 구조의 단위 상변화 메모리 소자를 제작하고, $160^{\circ}C$에서 $300^{\circ}C$까지의 온도 범위에서 최종 열처리를 실시하였다. 상변화 메모리 소자의 SET 저항에서 RESET 저항으로의 셀 저항 변화 양상은 최종 열처리 온도에 따라 큰 차이를 나타내었다. 정상적인 상변화 메모리 동작 특성을 얻을 수 있는 임계 열처리 온도가 존재하며, 열처리 온도가 그 온도에 비해 상대적으로 높거나 낮은 경우에는 소자가 오동작하거나 불안정하게 동작하는 것을 확인하였다. 이러한 열처리 온도의 효과는 열에너지에 따른 상부전극-GST 박막-발열층 다층 구조의 열적 안정성과 밀접한 관련이 있는 것으로 보인다.

Effects of Deposition Temperature and Annealing Process on PZT Thin Films Prepared by Pulsed Laser Deposition

  • Kim, Min-Chul;Choi, Ji-Won;Kang, Chong-Yun;Yoon, Seok-Jin;Kim, Hyun-Jai;Yoon, Ki-Hyun
    • Transactions on Electrical and Electronic Materials
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    • 제3권1호
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    • pp.14-17
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    • 2002
  • The effects of substrate temperatures and annealing temperatures on the microstructures and ferroelectric properties of PbZ $r_{0.52}$ $Ti_{0.48}$ $O_3$(PZT) thin fims prepared by pulsed laser deposition (PLD) were investigated. For this purpose, the PZT films were deposited at various substrate temperatures (400~$600^{\circ}C$) with post annealing process in oxygen atmosphere. The single perovskite phase was formed at the deposition temperature of 500 to 55$0^{\circ}C$ without post annealing and the PZT films deposited below 50$0^{\circ}C$ formed the single phase with post annealing at $650^{\circ}C$. The grain size of the films increased and the grain boundary of the films was clearly defined as the substrate temperature increased from 400 to 55$0^{\circ}C$. The remnant polarization (Pr) and the coercive field (Ec) of the films deposited at 55$0^{\circ}C$ and annealed at $650^{\circ}C$ were 34.3 $\mu$C/c $m^2$and 60.2 kV/cm, respectively.y.y.

세그먼트된 폴리우레탄 블렌드의 열이력에 따른 열적 성질과 분자량 변화 (Thermal Properties and Molecular Weight Variations due to Thermal History in Segmented Polyurethane Copolymer Blends)

  • 차윤종;박대운;김학림;이한섭;마석일;최순자
    • 공업화학
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    • 제10권1호
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    • pp.35-40
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    • 1999
  • Hard segment 함량이 35%와 53%로 서로 다른 두 개의 열가소성 폴리우레탄 시료 (각각 TPU-35와 TPU-35)와 이들을 70/30, 50/50, 30/70 wt%로 용융 블렌딩한 조성들이 annealing 온도와 시간에 따라 변화할 수 있는 유리전이온도와 용융피이크, 분자량 및 분자량 분포도의 변화를 관찰하였다. TPU의 $T_g$는 hard segment 함량이 많을수록 높은 값을 보였으며 annealing 온도와 시간에 따라 hard microdomain 구조의 미약한 관계에 의한 용융피이크의 크기와 온도 등이 변하였다. 이는 annealing에 의한 열이 long-range 혹은 short-range segmental motion의 거동, 비결정 microphase 구조의 order-disorder 전이, domain의 크기 및 결정구조의 질서도 등 여러 가지 복합적인 영향을 끼친 결과로 사료된다. 미세 결정의 용융 결과로 나타나는 $T_3$단일 피이크만이 존재하는 annealing 온도는 TPU-35, TPU-44와 TPU-53에 대해 각각 130, 170 및 $180^{\circ}C$이었다. Annealing 온도와 시간에 따른 분자량 및 분자량 분포도 변화 측정에서 TPU-35는 $135^{\circ}C$에서, TPU-44(TPU-35/TPU-53=50/50 블랜드)는 $170^{\circ}C$, 그리고 TPU-53은 $180^{\circ}C$에서 수평균 및 중량평균 분자량의 증가와 더불어 polydispersity(PI)는 감소를 보였다. 이 변화는 같은 조건의 annealing 온도에 따른 용융피이크 변화에서 $T_3$단일 피이크만 남게 되는 annealing온도와 일관성을 보이고 있는데, 이는 이들 시료가 특정한 annealing 온도에서 chain dissociation과 recombination이 동시에 일어나므로써 빚어진 결과로 추측된다.

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열처리 방법에 따른 이종절연층 실리콘 기판쌍의 직접접합 (Direct Bonding of Heterogeneous Insulator Silicon Pairs using Various Annealing Method)

  • 송오성;이기영
    • 한국전기전자재료학회논문지
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    • 제16권10호
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    • pp.859-864
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    • 2003
  • We prepared SOI(silicon-on-insulator) wafer pairs of Si II SiO$_2$/Si$_3$N$_4$ II Si using wafer direct bonding with an electric furnace annealing(EFA), a fast linear annealing(FLA), and a rapid thermal annealing(RTA), respectively, by varying the annealing temperatures at a given annealing process. We measured the bonding area and the bonding strength with processes. EFA and FLA showed almost identical bonding area and theoretical bonding strength at the elevated temperature. RTA was not bonded at all due to warpage, We report that FLA process was superior to other annealing processes in aspects of surface temperature, annealing time, and bonding strength.

이주속압연된 무산소동 판재의 어닐링 특성 (Annealing Characteristics of Oxygen Free Copper Sheet Processed by Differential Speed Rolling)

  • 이성희;윤대진;어광준;김수현;한승전
    • 대한금속재료학회지
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    • 제48권1호
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    • pp.77-84
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    • 2010
  • Annealing characteristics of an oxygen free copper (OFC) processed by differential speed rolling (DSR) were investigated in detail. An OFC sample with a thickness of hum was rolled to 35% reduction at ambient temperature without lubrication, varying the differential speed ratio from 1.0:1 to 2.2:1, and then annealed for 0.5h at various temperatures from 100 to $400^{\circ}C$. Different recrystallization behavior was observed depending on the differential speed ratio, especially in the case of annealing at $200^{\circ}C$ Complete recrystallization occurred in the specimens annealed at temperatures above $250^{\circ}C$ regardless of the differential ratios. The hardness distribution in the thickness direction of the rolled OFC sheets varied depending on the differential speed ratios. These annealing characteristics were explained by the magnitude of shear strain introduced during rolling.

반복겹침접합 압연공정에 의해 제조한 초미세립 AA1050/AA5052 복합알루미늄합금판재의 어닐링 특성 (Annealing Characteristics of Ultrafine Grained AA1050/AA5052 Complex Aluminum Alloy Sheet Fabricated by Accumulative Roll-Bonding)

  • 이성희;이광진
    • 한국재료학회지
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    • 제21권12호
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    • pp.655-659
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    • 2011
  • An ultrafine grained complex aluminum alloy was fabricated by an accumulative roll-bonding (ARB) process using dissimilar aluminum alloys of AA1050 and AA5052 and subsequently annealed. A two-layer stack ARB process was performed up to six cycles without lubricant at an ambient temperature. In the ARB process, the dissimilar aluminum alloys, AA1050 and AA5052, with the same dimensions were stacked on each other after surface treatment, rolled to the thickness reduction of 50%, and then cut in half length by a shearing machine. The same procedure was repeated up to six cycles. A sound complex aluminum alloy sheet was fabricated by the ARB process, and then subsequently annealed for 0.5h at various temperatures ranging from 100 to $350^{\circ}C$. The tensile strength decreased largely with an increasing annealing temperature, especially at temperatures of 150 to $250^{\circ}C$. However, above $250^{\circ}C$ it hardly decreased even when the annealing temperature was increased. On the other hand, the total elongation increased greatly above $250^{\circ}C$. The hardness exhibited inhomogeneous distribution in the thickness direction of the specimens annealed at relatively low temperatures, however it had a homogeneous distribution in specimens annealed at high temperatures.

초기조직 및 이상역열처리가 저합금 고강도강의 저온기계적 성질에 미치는 영향 (Effect of Strarting Structures and Intercritical Annealing on Low Temperatures Mechanical Properties of a HSLA Steel)

  • 조현권;박광균;신동혁;맹선재
    • 열처리공학회지
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    • 제7권1호
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    • pp.53-60
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    • 1994
  • Austenite formation and Low temperatures mechanical properties of HSLA steel of different starting structures have been studied by intercritical annealing(IA). The different starting structures are: ferrite+pearlite(FP1), martensite(M1), cold worked ferrite+pearlite(FP2) and cold worked martensite(M2). In most cases tensile strength and elongation was increased by decreasing the testing temperatures regardless of the IA time. Tensile strength of the cold worked starting structures was higher than that of the non-cold worked starting structures. However not any noticeable difference in elongation was found between two cases. Low temperatures impact properties were affected by the starting structures. Charpy V-notch impact transition temperatures of the M-starting structures were around $-40^{\circ}C$, and those of the FP starting structures were around $-10^{\circ}C$. Impact energy was lower in the cold worked specimens than in the non-cold worked specimens at the same starting structures. DP structure obtained from the M-starting structure has shown superior low temperatures mechanical properties than the DP structure obtained from the FP-starting structure.

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Site-selective Photoluminescence Spectroscopy of Er-implanted Wurtzite GaN under Various Annealing Condition

  • Kim, Sangsig;Sung, Man Young;Hong, Jinki;Lee, Moon-Sook
    • Transactions on Electrical and Electronic Materials
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    • 제1권1호
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    • pp.26-31
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    • 2000
  • The ~1540 nm $^4$ $I_{13}$ 2/ longrightarro $w^4$ $I_{15}$ 2/ emissions of E $r^{3+}$ in Er-implanted GaN annealed at temperatures in the 400 to 100$0^{\circ}C$ range were investigated to gain a better understanding of the formation and dissociation processes of the various E $r^{3+}$ sites and the recovery of damage caused by the implantation with increasing annealing temperature ( $T_{A}$).The monotonic increase in the intensity of the broad defect photoluminescence(PL) bands with incresing $T_{A}$ proves that these are stable radiative recombination centers introduced by the implantation and annealing process. Theser centers cannot be attributed to implantation-induced damage that is removed by post-implantation annealing. Selective wavelength pumpling of PL spectra at 6K reveals the existence of at least nine different E $r^{3+}$ sites in this Er-implanted semiconductor. Most pf these E $r^{3+}$ PL centers are attributed to complexed of Er atoms with defects and impurities which are thermally activated at different $T_{A}$. Only one of the nine observed E $r^{3+}$ PL centers can be pumped by direct 4f absorption and this indicates that it is highest concentration E $r^{3+}$ center and it represents most of the optically active E $r^{3+}$ in the implanted sample. The fact that this E $r^{3+}$ center cannot be strongly pumped by above-gap light or broad band below-gap absorption indicates that it is an isolated center, i.e not complexed with defects or impurities, The 4f-pumped P: spectrum appears at annealing temperatures as low as 40$0^{\circ}C$, and although its intensity increase monotonically with increasing $T_{A}$ the wavelengths and linewidths of its characteristic peaks asre unaltered. The observation of this high quality E $r_{3+}$PL spectrum at low annealing temperatures illustrates that the crystalline structure of GaN is not rendered amorphous by the ion implantation. The increase of the PL intensities of the various E $R_{3+}$sites with increasing $T_{A}$is due to the removal of competing nonradiative channels with annealing. with annealing.annealing.

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Ga doped ZnO 박막의 열처리 조건에 따른 구조 및 전기적 특성에 관한 연구 (Effect of Annealing on the Structural, Electrical and Optical Characteristics of Ga-doped ZnO(GZO)films)

  • 오수영;김응권;이태용;강현일;김봉석;송준태
    • 한국전기전자재료학회논문지
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    • 제20권9호
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    • pp.776-779
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    • 2007
  • In this study we present the effect of annealing temperatures on the structural, electrical and optical characteristics of Ga-doped ZnO (GZO) films. GZO target is deposited on coming 7059 glass substrates by DC sputtering. and then GZO films are annealed at temperatures of 400, 500, $600^{\circ}C$ in air ambient for 20 min. in this case of as-grown film, it shows the resistivity of $6{\times}10^{-1}{\Omega}{\cdot}cm$ and transmittance under 85%, whereas the electrical and optical properties of film annealed at $500^{\circ}C$ are enhanced up to $1.9{\times}10^{-3}{\Omega}{\cdot}cm$ and 90%, respectively.

용접부의 열처리에 따른 잔류응력의 파양거동에 미치는 영향 (On the Effect of Residual Stress on Fracture Behavior at the Welded Zone According to Annealing Temperature)

  • 정석주
    • 한국안전학회지
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    • 제2권3호
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    • pp.5-11
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    • 1987
  • In this study, a mild steel (SS41) of the carbon steel, a spring steel (SUP-9), and stainless steel (SUS 304) of the special gceel, etc, are adopted as the experimental materrials and are weded by $CO_2$(SS41, SUP-9), TIG (SUS304), respectively. And the residual stress distribution and fracture behavior at the welded zone are examined according to annealing temperatures of four section involving as welded. As a consequence, the best annealing temperatures that the residual stress is removed enough and mechanical properties are very suitable are at 90$0^{\circ}C$ (SS41), 75$0^{\circ}C$ (SUP-9), 110$0^{\circ}C$ (SUS 304), respectively.

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