• 제목/요약/키워드: accelerated failure time model

검색결과 81건 처리시간 0.022초

Necessity of step-stress accelerated life testing experiment at higher steps

  • Chandra, N.;Khan, Mashroor Ahmad;Pandey, M.
    • International Journal of Reliability and Applications
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    • 제15권2호
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    • pp.85-98
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    • 2014
  • Accelerated life testing (ALT) is a well famous technique in life testing and reliability studies, this is particularly used to induce so high stress leading to failure of the highly reliable units quickly under stipulated duration of time. The step-stress ALT is one of the systematic experimental strategy of ALT applied to fail the units in steps. In this article we focus on two important issues (i) necessity of life tests at higher steps with relevant causes (ii) to develop a new optimum test plan for 3-step SSALT under the modified cumulative exposure model proposed by Khamis and Higgins (1998). It is assumed that the lifetime of test units follows Rayleigh distribution and its scale parameter at constant stress level is assumed to be a log-linear function of the stress. The maximum likelihood estimates of the parameters involved in the step-stress ALT model are obtained. A simulation study is performed for numerical investigation of the proposed new optimum plan 3-step, step-stress ALT. The necessity of the life test units at 3-step step-stress is also numerically examined in comparison to simple step-stress setup.

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가속 열 노화시험에 의한 탄성받침용 합성고무의 수명 예측에 관한 연구 (Accelerated Heat Aging Test for Predicting Useful Lifetime of Elastomeric Rearing)

  • 박광화;박준형;이하영;권영일
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제4권2호
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    • pp.73-90
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    • 2004
  • We performed the heat aging test to predict the useful lifetime of Elastomeric Bearing Chloroprene Rubber (CR) used for supporting bridge. During the test, we measured elongation that are influenced by temperature and aging time. The failure of a test piece is defined as the point at which the elongation reaches to 75% of the initial value. This failure criterion is based on KS F 4420: 1998 (Elastomeric Bearing for bridge). Through the accelerated heat aging test, we found that the Arrhenius relationship and the Weibull lifetime distribution are appropriate as the life-temperature relationship and lifetime distribution of the CR, respectively. Using the Arrhenius -Weibull model, the parameters of the model are estimated and the lifetime of the CR at use condition is predicted.

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국회 법안 검토 기간의 생존함수 추정: 제 17, 18, 19대 국회의 사례를 바탕으로 (Estimation of the survival function of the legislative process in Korea: based on the experiences of the 17th, 18th, and 19th National Assembly of Korea)

  • 윤영규;조윤수;정혜영
    • 응용통계연구
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    • 제32권4호
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    • pp.503-515
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    • 2019
  • 본 연구는 제 17, 18, 19대 국회에 제출된 법안의 검토 기간의 생존함수를 추정하고, 정치상황적 요인들이 법안 검토 기간에 미치는 영향을 분석했다. 본 연구는 입법 데이터에 존재하는 절단과 사건 종료의 종속성 문제를 완화하고자 새로운 관점에서 입법 과정 종료를 정의했다. 또한 비례위험 가정이 분석 대상 데이터에 대해 성립하지 않는다는 것을 보이고, 이에 따라 로그정규분포 가정 하의 가속종료시간모형을 통해 정치상황 상의 요인들이 법안 검토 기간에 미치는 영향을 분석했다. 분석 결과 정책 분야별로 법안 검토 기간이 상이하게 나타났고, 여소야대 시기에 발의된 법안이 그렇지 않은 시기에 발의된 법안보다 신속하게 검토된 것으로 나타났다.

Lifespan assessment of piezoelectric sensors under disposal condition of high-level nuclear waste repository

  • Changhee Park;Hyun-Joong Hwang;Chang-Ho Hong;Jin-Seop Kim;Gye-Chun Cho
    • Geomechanics and Engineering
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    • 제38권5호
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    • pp.529-539
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    • 2024
  • A high-level nuclear waste (HLW) repository is designed for the long-term disposal of high-level waste. Positioned at depths of 500-1000 meters, it offers an alternative to the insufficient storage space for spent fuels, providing a long-term solution. High-level waste emits heat and radiation, causing structural deterioration, including strength reduction and cracks. Therefore, the use of piezoelectric sensors for structural health monitoring is essential for evaluating the safety of the structure over time. Unlike other structures, the HLW repository restricts human access after the disposal of HLW, rendering sensor replacement impossible. Therefore, it is necessary to assess both the lifespan and suitability of sensors under the disposal conditions in the HLW repository. This study employed an accelerated life test (ALT) to assess the sensor's lifespan under disposal conditions. Failure modes, failure mechanisms, and operational limits were analyzed through accelerated stress test (AST). Additionally, the parameters of the Weibull life probability distribution and the Arrhenius accelerated life model were estimated through statistical methods, including the likelihood ratio test, maximum likelihood estimation, and hypothesis testing. Results confirmed that the sensor's lifespan decreases significantly with the increase in the temperature limit of the HLW repository. The findings of this study can be used for improving sensor lifespan through shielding, development of alternative sensors, or lifespan evaluation of alternative monitoring sensors.

일정스트레스 가속수명시험의 경제적 설계 (An Economic Design of Constant Stress Accelerated Life Tests)

  • 윤원영;반한석
    • 한국경영과학회지
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    • 제19권1호
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    • pp.145-152
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    • 1994
  • This paper deals with an economic design of acelerated life test under constant stresses where failure times are exponentially distributed. In this case the optimization criterion is the information amount per unit cost. Fisher's information matrix of exponential distribution's parameters and expected cost considering fixed and variable costs are obtained. The decision variable is the censoring time in the model. In the 2-level constant stress case, it is proved that the optimal solution exists and is unique under some condition. Numerical examples are also included.

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ALT 통합모형의 적용 및 응용 (Implementation and Application of Integrated Model for ALT(Accelerated Life Test))

  • 최성운
    • 대한안전경영과학회:학술대회논문집
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    • 대한안전경영과학회 2008년도 추계학술대회
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    • pp.153-160
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    • 2008
  • This paper presents the log likelihood function for integrated models for ALT such as exponential-general Eyring, Weibull-temperature and specific heat, lognormal-temperature and specific heat. Additionally this paper estimates the system reliability and mean time to failure(MTTF) for series, parallel, k of n, and standby system using ALT linkage parameter. Lastly this study designs three variable reliability acceptance sampling(RAS) plans such as type I, II censored test, sequential test by the use of integrated models for ALT.

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Life prediction of IGBT module for nuclear power plant rod position indicating and rod control system based on SDAE-LSTM

  • Zhi Chen;Miaoxin Dai;Jie Liu;Wei Jiang;Yuan Min
    • Nuclear Engineering and Technology
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    • 제56권9호
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    • pp.3740-3749
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    • 2024
  • To reduce the losses caused by aging failure of insulation gate bipolar transistor (IGBT), which is the core components of nuclear power plant rod position indicating and rod control (RPC) system. It is necessary to conduct studies on its life prediction. The selection of IGBT failure characteristic parameters in existing research relies heavily on failure principles and expert experience. Moreover, the analysis and learning of time-domain degradation data have not been fully conducted, resulting in low prediction efficiency as the monotonicity, time correlation, and poor anti-interference ability of extracted degradation features. This paper utilizes the advantages of the stacked denoising autoencoder(SDAE) network in adaptive feature extraction and denoising capabilities to perform adaptive feature extraction on IGBT time-domain degradation data; establishes a long-short-term memory (LSTM) prediction model, and optimizes the learning rate, number of nodes in the hidden layer, and number of hidden layers using the Gray Wolf Optimization (GWO) algorithm; conducts verification experiments on the IGBT accelerated aging dataset provided by NASA PCoE Research Center, and selects performance evaluation indicators to compare and analyze the prediction results of the SDAE-LSTM model, PSOLSTM model, and BP model. The results show that the SDAE-LSTM model can achieve more accurate and stable IGBT life prediction.

마이카 고전압 커패시터의 환경시험과 가속 수명시험을 통한 신뢰성 평가 (Reliability assessment of mica high voltage capacitor through environmental test and accelerated life test)

  • 박성환;함영재;김정석;김경훈;소성민;전민석
    • 한국결정성장학회지
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    • 제29권6호
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    • pp.270-275
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    • 2019
  • 마이카 커패시터는 세라믹 커패시터에 비해 내고충격 특성이 우수하여 다양한 유도무기체계의 고전압 기폭장치에 적용된다. 본 연구에서는 국산화된 마이카 고전압 커패시터의 고전압 기폭장치 적용을 위해 단자강도시험, 내습성시험, 열충격시험과 같은 환경시험과 함께 가속 수명 시험을 진행하였다. 마이카 고전압 커패시터의 고장모드는 절연저항 감소 및 이를 통한 절연 파괴이다. 가속수명모델의 중요 상수를 실험적으로 도출하였으며 전압계수 n 및 활성화 에너지 Ea는 각각 5.28 및 0.805 eV이었다. 가속모델식을 이용하여 도출한 가속계수는 496이었으며 가속수명시험을 통해 도출된 정상 사용 조건에서의 마이카 고전압 커패시터의 수명은 38.5년으로 기폭장치 적용에 문제가 없는 것으로 확인되었다.

한국형고속철도 열차제어시스템 하부구성요소 신뢰도입증에 관한 연구 (A Study on the Reliability Demonstration for Korea High Speed Train Control System)

  • 이재호;이강미;김용규;신덕호
    • 한국철도학회논문집
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    • 제9권6호
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    • pp.732-738
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    • 2006
  • This research provides a scheme for Highly Accelerated Stress Test that is necessary to demonstrate reliability prediction of Korean Rapid Transit Railway Train Control System sub-equipment, which is calculated by a relevant standard for failure rate prediction of electronic products. Although determining failure information generated in the process of trial running by statistic analysis is widely accepted as a measure of confirmation for reliability prediction, this research suggests the modeling for System Life Test determined by accelerating stress factors as a measure of confirmation for reliability prediction of sub-equipment unit that is generated ahead of a trial running in System Life Cycle. Consequently, the research demonstrates sub-equipment unit reliability test, which is based on the model derived from Accelerated Stress Test, according to accuracy level and the number of samples, and conducts an official experiment by making out a reliability test procedure sheet based on test time as well.

전동차 인버터 구동용 전해콘덴서의 신뢰도예측과 수명 연구 (A Study on the Reliability Prediction and Lifetime of the Electrolytic Condenser for EMU Inverter)

  • 한재현;배창한;구정서
    • 한국안전학회지
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    • 제29권1호
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    • pp.7-14
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    • 2014
  • Inverter module, which feeds the converted power to the traction motor for EMU. Consists of the power semiconductors with their gate drive unit(GDU)s and the control computer for driving, voltage, current and speed controls. Electrolytic condenser, connected to the gate drive unit and a core component to drive the power semiconductor, has problems such as reduction in lifetime and malfunction caused by electrical and mechanical characteristic changes from heat generation during high speed switching for generation of stable power. In this study, To check the service life of electrolytic condenser, the test was carried out in two ways. First, In the case of accelerated life testing of condenser, the Arrhenius model is a way of life testing. Another way is to analyze the reliability of the failure data by the method of parametric data analysis. Eventually, life time by accelerated life test than a method of failure data analysis(Weibull distribution) was found to be slightly larger output.