• 제목/요약/키워드: abrasive material

검색결과 319건 처리시간 0.02초

어브레이시브 워터제트를 이용한 알루미나 세라믹스의 가공 (Abrasive Water Jet Machining of Alumina Ceramics)

  • 최기상;최기흥;김정수
    • 대한기계학회논문집
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    • 제18권8호
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    • pp.2073-2080
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    • 1994
  • In this paper, a model of material removal in abrasive water jet machining of brittle material is developed, and experimentally evaluated. Abrasive water jet machining proved to yield better material removal rate than other machining techniques for hard and brittle material (alumina ceramics). It was also found that large scale fracture may develop at the exit of the jet from the material. The fracture size was predicted as a function of water jet pressure and size of the hole. Finally, the feasibility of using acoustic emission signals for in-process monitoring of the abrasive water jet machining process is investigated.

Magnetic Abrasive Polishing for Internal Face of Stainless Steel Tube using Sludge Abrasive Grain

  • Kim, Hee-Nam;Soh, Dea-Wha;Hong, Sang-Jeen
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2004년도 추계학술대회 논문집 Vol.17
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    • pp.77-80
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    • 2004
  • In this paper, we have investigated the characteristics of the magnetic abrasive using sludge on polishing of internal finishing of seamless stainless steel (STS304) tube applying magnetic abrasive polishing. Either white alumina (WA) or green carborundum (GC) grain was used to resin sludge at a low temperature, and the sludge of magnetic abrasive powder was synthesized and crushed into 200 meshes. Surface roughness was measured before and after polishing, and more than 40% of improvement of surface roughness was achieved when WA grain was used under a specific condition. Even though some degree of surface roughness due to deeper scratches still exist, but the result showed a prospective magnetic abrasive polishing using sludge with WA or GC grains.

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AE신호 분석을 통한 비자성체의 자기연마 모니터링에 관한 연구 (A Study on Monitoring of the MAP for Non-magnetic Material by AE Signal Analysis)

  • 이성호;김상오;곽재섭
    • 한국생산제조학회지
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    • 제20권3호
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    • pp.304-309
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    • 2011
  • A monitoring system for magnetic abrasive polishing process is necessary to ensure the polishing products the high quality and integrity. Acoustic emission (AE) signal is known to reflect the material removal phenomena in other machining processes. In a case of the magnetic abrasive polishing of non-magnetic materials, application of AE method is very difficult because of lower machining force on the surface of workpiece and the level of AE signal is extremely lower. In this study, AE sensor-based monitoring system is applied to the magnetic abrasive polishing. The relation between the level of the AE RMS and the surface roughness during the magnetic abrasive polishing of magnesium alloy steel is investigated.

산화막 CMP 슬러리의 연마 입자 재활용에 관한 연구 (A Study on Recycle of Abrasive Particles in One-used Chemical Mechanical Polishing (CMP) Slurry)

  • 박성우;서용진;김기욱;최운식;김철복;김상용;이우선
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2003년도 춘계학술대회 논문집 센서 박막재료 반도체 세라믹
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    • pp.145-148
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    • 2003
  • Recently, the recycle of CMP (chemical mechanical polishing) slurries have been positively considered in order to reduce the high COO (cost of ownership) and COC (cost of consumables) in CMP process. Among the composition of slurries (buffer solution, bulk solution, abrasive particle, oxidizer, inhibitor, suspension, antifoaming agent, dispersion agent), the abrasive particles are one of the most important components. Especially, the abrasive particles of slurry are needed in order to achieve a good removal rate. However, the cost of abrasives, is still very high. In this paper, we have collected the silica abrasive powders by filtering after subsequent CMP process for the purpose of abrasive particle recycling. And then, we have studied the possibility of recycle of reused silica abrasive through the analysis of particle size and hardness. Also, we annealed the collected abrasive powders to promote the mechanical strength of reduced abrasion force. Finally, we compared the CMP characteristics between self-developed KOH-based silica abrasive slurry and original slury, As our experimental results, we obtained the comparable removal rate and good planarity with commercial products. Consequently, we can expect the saving of high cost slurry.

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연마패드 압력에 따른 연마입자 이동속도 변화의 분자동역학적 시뮬레이션 연구 (Molecular Dynamics Simulations Study on Abrasive's Speed Change Under Pad Compression)

  • 이규영;이준하;김태은
    • 한국전기전자재료학회논문지
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    • 제25권7호
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    • pp.569-573
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    • 2012
  • We investigated the speed change of the diamond spherical abrasive during the substrate surface polishing under the pad compression by using classical molecular dynamics modeling. We performed three-dimensional molecular dynamics simulations using the Morse potential functions for the copper substrate and the Tersoff potential function for the diamond abrasive. As the compressive pressure increased, the indented depth of the diamond abrasive increased and then, the speed of the diamond abrasive along the direction of the pad moving was decreased. Molecular simulation result such as the abrasive speed decreasing due to the pad pressure increasing gave important information for the chemical mechanical polishing including the mechanical removal rate with both the pad speed and the pad compressive pressure.

취성소재 연삭마멸에서의 측면균열에 관한 연구 (Lateral Crack in Abrasive Wear of Brittle Solids)

  • 안유민;박상신;최상현
    • Tribology and Lubricants
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    • 제15권1호
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    • pp.46-51
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    • 1999
  • An analytical model about lateral crack occurring in abrasive wear of brittle solids is developed. Stress field around the lateral crack and stress intensity factor at the crack tip are analytically modeled. Abrasive wear by abrasive particle is experimentally studied. In soda-lime glass, it is observed that chipping by lateral crack occurs and produces the greatest material removal when normal load applied by the abrasive particle is about 1.5∼3.0 N. The prediction of lateral crack length from the model is compared with the experimentally measured length in soda-lime glass.

CMP시 연마입자에 작용하는 마찰력에 관한 연구 (A study on the friction force caused by abrasives in chemical mechanical polishing)

  • 김구연;김형재;박범영;정영석;정해도
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2004년도 하계학술대회 논문집 Vol.5 No.2
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    • pp.1312-1315
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    • 2004
  • Chemical Mechanical Polishing is referred to as a three body tribological system, because it includes two solids in relative motion and the slurry. On the assumption that the abrasives between the pad and the wafer could be a major reason of not only the friction force but also material removal during polishing. The friction force generated by the abrasives was inspected with the change of abrasive size and concentration in this paper. The variation of coefficient of friction with abrasive concentration and size could result from the condition of contact and load balance between wafer and abrasives carried by pad asperity. The simulation was performed in this paper and compared with the result of experiment. The material removal rate also estimated with abrasive concentration and size increasement.

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마이크로 마스크를 가진 미세입자분사가공을 위한 가공경로의 생성 (Tool Path Generation for Micro-Abrasive Jet Machining Process with Micro-Mask)

  • 김호찬;이인환;고태조
    • 한국기계가공학회지
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    • 제10권6호
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    • pp.95-101
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    • 2011
  • Micro-abrasive jet machining(${\mu}AJM$) using mask is a fine machining technology which can carve a figure on a material. The mask should have holes exactly same as the required figure. Abrasive particles are jetted into the holes of the mask and it collide with the material. The collision break off small portion of the material. And the ${\mu}AJM$ nozzle should move all over the machining area. However, in general the carving shape is modeled as in a bitmap figure, because it often contains characters. And the mask model is also often modeled from the bitmap image. Therefore, the machining path of the ${\mu}AJM$ also efficient if it can be generated from the bitmap image. This paper suggest an algorithm which can generate ${\mu}AJM$ tool path directly from the bitmap image of the carving figure. And shows some test results and applications.

구리 CMP 적용을 위한 산성 콜로이드 실리카를 포함한 준무연마제 슬러리 연구 (A Study on Semi Abrasive Free Slurry including Acid Colloidal Silica for Copper Chemical Mechanical Planarization)

  • 김남훈;김상용;서용진;김태형;장의구
    • 한국전기전자재료학회논문지
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    • 제17권3호
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    • pp.272-277
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    • 2004
  • The primary aim of this study is to investigate new semi-abrasive free slurry including acid colloidal silica and hydrogen peroxide for copper chemical-mechanical planarization (CMP). In general, slurry for copper CMP consists of colloidal silica as an abrasive, organic acid as a complex-forming agent, hydrogen peroxide as an oxidizing agent, a film forming agent, a pH control agent and several additives. We developed new semi-abrasive free slurry (SAFS) including below 0.5% acid colloidal silica. We evaluated additives as stabilizers for hydrogen peroxide as well as accelerators in tantalum nitride CMP process. We also estimated dispersion stability and Zeta potential of the acid colloidal silica with additives. The extent of enhancement in tantalum nitride CMP was verified through anelectrochemical test. This approach may be useful for the application of single and first step copper CMP slurry with one package system.

절삭용 구형나노입자와 기판 상호작용에 관한 원자단위 모델링 (Atomistic Modeling of Spherical Nano Abrasive-Substrate Interaction)

  • 강정원;송기오;최원영;변기량;이재경;황호정
    • 한국전기전자재료학회논문지
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    • 제16권12S호
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    • pp.1157-1164
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    • 2003
  • This paper shows the results of atomistic modeling for the interaction between spherical nano abrasive and substrate in chemical mechanical polishing processes. Atomistic modeling was achieved from 2-dimensional molecular dynamics simulations using the Lennard-Jones 12-6 potentials. The abrasive dynamics was modeled by three cases, such as slipping, rolling, and rotating. Simulation results showed that the different dynamics of the abrasive results the different features of surfaces. This model can be extended to investigate the 3-dimensional chemical mechanical polishing processes.