• Title/Summary/Keyword: Zn-based oxide

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Fabrication and Characterization of a Thermoelectric pn Couple Made of Electrospun Oxide Nanofibers (전기방사로 제작된 산화물 나노사 열전 pn 커플의 제작 및 특성)

  • Lee, Donghoon;Cho, Kyoungah;Choi, Jinyoung;Kim, Sangsig
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.28 no.4
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    • pp.252-256
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    • 2015
  • In this study, we propose a novel fabrication of an oxide-based lateral thermoelectric pn couple and investigate the characteristics of the thermoelectric couple. Electrospun ZnO and $LaSrCoO_3$ nanofibers are used as n- and p-legs of the couple, respectively. The Seebeck coefficients of the n- and p-type nanofibers and the pn couple are $-98.1{\mu}V/K$, $42.4{\mu}V/K$, and $118.8{\mu}V/K$, respectively. The thermoelectric couple generates an output voltage of $484.7{\mu}V$ at a temperature difference of 4.1 K.

Effect of Post Annealing in Oxygen Ambient on the Characteristics of Indium Gallium Zinc Oxide Thin Film Transistors

  • Jeong, Seok Won
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.27 no.10
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    • pp.648-652
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    • 2014
  • We have investigated the effect of electrical properties of amorphous InGaZnO thin film transistors (a-IGZO TFTs) by post thermal annealing in $O_2$ ambient. The post-annealed in $O_2$ ambient a-IGZOTFT is found to be more stable to be used for oxide-based TFT devices, and has better performance, such as the on/off current ratios, sub-threshold voltage gate swing, and, as well as reasonable threshold voltage, than others do. The interface trap density is controlled to achieve the optimum value of TFT transfer and output characteristics. The device performance is significantly affected by adjusting the annealing condition. This effect is closely related with the modulation annealing method by reducing the localized trapping carriers and defect centers at the interface or in the channel layer.

$H_2S$ Desulfurization Using Iron Oxide Sorbent (산화철을 이용한$H_2S$ 제거)

  • B.K. Kho;Lee, W.R.;Kim, H.J.;Lee, W.M.
    • Proceedings of the Korea Society for Energy Engineering kosee Conference
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    • 2000.11a
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    • pp.73-77
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    • 2000
  • A great deal of research has been carried out in the last twenty some years to develop high temperature desulfurization. For example, the efficiency of advanced power generation processes based on the integrated gasification combined cycle (IGCC) can be increased significantly with high temperature desulfurization. Much of the recent high temperature desulfurization research has concentrated on zinc-based sorbents such as zinc ferrite(ZnFe$_2$O$_4$) and zinc titanate(ZnO.xTiO$_2$) due to its thermodynamic advantage in capturing H$_2$S molecules.(omitted)

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Metal-Semiconductor Contact Behavior of Solution-Processed ZnSnO Thin Film Transistors (용액법으로 제작된 ZnSnO 박막트랜지스터의 전극 물질에 따른 계면 접촉특성 연구)

  • Jeong, Young-Min;Song, Keun-Kyu;Woo, Kyoo-Hee;Jun, Tae-Hwan;Jung, Yang-Ho;Moon, Joo-Ho
    • Korean Journal of Materials Research
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    • v.20 no.8
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    • pp.401-407
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    • 2010
  • We studied the influence of different types of metal electrodes on the performance of solution-processed zinc tin oxide (ZTO) thin-film transistors. The ZTO thin-film was obtained by spin-coating the sol-gel solution made from zinc acetate and tin acetate dissolved in 2-methoxyethanol. Various metals, Al, Au, Ag and Cu, were used to make contacts with the solution-deposited ZTO layers by selective deposition through a metal shadow mask. Contact resistance between the metal electrode and the semiconductor was obtained by a transmission line method (TLM). The device based on an Al electrode exhibited superior performance as compared to those based on other metals. Kelvin probe force microscopy (KPFM) allowed us to measure the work function of the oxide semiconductor to understand the variation of the device performance as a function of the types metal electrode. The solution-processed ZTO contained nanopores that resulted from the burnout of the organic species during the annealing. This different surface structure associated with the solution-processed ZTO gave a rise to a different work function value as compared to the vacuum-deposited counterpart. More oxygen could be adsorbed on the nanoporous solution-processed ZTO with large accessible surface areas, which increased its work function. This observation explained why the solution-processed ZTO makes an ohmic contact with the Al electrode.

The Effect of Thickness on Flexible, Electrical and Optical properties of Ti- ZnO films on Flexible Glass by Atomic Layer Deposition

  • Lee, U-Jae;Yun, Eun-Yeong;Gwon, Se-Hun
    • Proceedings of the Korean Vacuum Society Conference
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    • 2016.02a
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    • pp.196.1-196.1
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    • 2016
  • TCO(Transparent Conducting Oxide) on flat glass is used in thin-film photovoltaic cell, flat-panel display. Nowadays, Corning(R) Willow Glass(R), known as flexible substrate, has attracted much attention due to its many advantages such as reliable roll-to-roll glass processing, high-quality flexible electronic devices, high temperature process. Also, it can be an alternative to flexible polymer substrates which have their poor stability and degradation of electrical and optical qualities. For application on willow glass, the flexibility, electrical, optical properties can be greatly influenced by the TCO thin film thickness due to the inherent characterization of thin film in nanoscale. It can be expected that while thick TCO layer causes poor transparency, its sheet resistance become low. Also, rarely reports were focusing on the influence of flexible properties by varying TCO thickness on flexible glass. Therefore, it is very important to optimize TCO thickness on flexible Willow glass. In this study, Ti-ZnO thin films, with different thickness varied from 0 nm to 50 nm, were deposited on the flexible willow glass by atomic layer deposition (ALD). The flexible, electrical and optical properties were investigated, respectively. Also, these properties of Ti-doped ZnO thin films were compared with un-doped ZnO thin film. Based on the results, when Ti-ZnO thin films thickness increased, resistivity decreased and then saturated; transmittance decreased. The Figure of Merit (FoM) and flexibility was the highest when Ti-ZnO thickness was 40nm. The flexible, electrical and optical properties of Ti-ZnO thin films were better than ZnO thin film at the same thickness.

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Chemical Speciations of Elements in the Fe-Mn Crusts by Sequential Extraction (단계별 추출법을 이용한 망간각 구성 원소의 존재 형태)

  • Kim, Jong-Uk;Moon, Jai-Woon;Chi, Sang-Bum;Ko, Young-Tak;Lee, Hyun-Bok
    • Ocean and Polar Research
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    • v.26 no.2
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    • pp.231-243
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    • 2004
  • Sequential extraction was carried out on twenty two subsamples of three ferromanganese crusts from three seamounts (Lemkein, Lomilik, and Litakpooki) near the Marshall Islands in the western Pacific. The extraction was designed to fractionate Fe-Mn crust forming elements into low defined groups: (1) exchangeable and carbornate, (2) Mn-oxide, (3) Fe-oxyhyd.oxide, and (4) residual fraction. X-ray diffraction result shows that target material were well removed by each extraction step except for CFA in phosphatized crusts generation. According to chemical analysis of each leachate, most of elements in the Fe-Mn crusts are bound with two major phases. Mn, Ba, Co, Ni, Zn, (Fe, Sr, Cu, and V) are strongly bounded with Mn-oxide $({\delta}-MnO_2)$ phase, whereas Fe, Ti, Zr, Mo, Pb, Al, Cu,(V, P, and Zn) show chemical affinity with Fe-oxyhydroxide phase. This result indicates that significant amount of Al, Ti, and Zr can not be explained by detrital origin. Ca, Mg, K, and Sr mainly occur as exchangeable elements and/or carbonate phase. Outermost layer 1 and inner layer 2 which are both young crusts generations are similar in chemical speciations of elements. However, some of Fe-oxyhydroxide bounded elements (Pb, Y, Mo, Ba, Al, and V) in phosphatized innermost layer 3 are released during phosphatization and incorporated into phosphate (Pb, Y, Mo, and Ba) or Mn-oxide phase (Al and V). Our sequential extraction results reveal that chemical speciations of elements in the hydrogenetic crusts are more or less different from interelemental relationship calculated by statistical method based on bulk chemistry.

Interface Functional Materials for Improving the Performance and Stability of Organic Solar Cell (유기태양전지의 효율 및 수명 향상을 위한 기능성 계면 소재 연구)

  • Hong, Kihyon;Park, Sun-Young;Lim, Dong Chan
    • Applied Chemistry for Engineering
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    • v.25 no.5
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    • pp.447-454
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    • 2014
  • Organic solar cells (OSCs) have intensively studied in recent years due to their advantages such as cost effectiveness and possibility of applications in flexible devices. In spite of the high power conversion efficiency (PCE) of 10 %, the OSCs still have a draw back of their low environmental stability due to the oxidization of aluminum cathode and etching of transparent conducting oxide as electrode. To solve these problems, the inverted structured OSCs (I-OSCs) having greatest potential for achieving an improvement of device performances are suggested. Therefore, there are a lot of studies to develope of interface layer based on organic/inorganic materials for the electron transport layer (ETL) and passivation layer, significant advancements in I-OSCs have driven the development of interface functional materials including electron transport layer. Recent efforts to employing 2D/3D zinc oxide (ZnO) based ETL into I-OSCs have produced OSCs with a power conversion efficiency level that matches the efficiency of ~9 %. In this review, the technical issues and recent progress of ZnO based ETL in I-OSCs to enhancement of device efficiency and stability in terms of materials, process and characterization have summarized.

Electrical and Dielectric Characteristics of Zn-Pr-Co-Dy-M(M=Ni, Mg, Cr) Oxides-Based Varistors (Zn-Pr-Co-Dy-M(M=Ni, Mg, Cr) 산화물계 바리스터의 전기적, 유전적 특성)

  • 남춘우;박종아
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.17 no.9
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    • pp.924-929
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    • 2004
  • The microstructure, electrical and dielectric characteristics of $ZnO-{Pr}_6{O}_11-{CoO}-{Dy}_2{O}_3$-based varistors were investigated without and with various metal oxide additives(NiO, MgO, Cr$_2$O$_3$). The average grain size decreased in the range of 18.4 $\backsim$ 11.5 $\mu$m, in order of NiO\longrightarrowMgO\longrightarrow{Cr}_2{O}_3$ and the density decreased in the range of 5.62 \backsim 5.33 $g/{cm}^3$ in order of NiO\longrightarrowCr$_2$O$_3$\longrightarrowMgO. While, the nonlinear exponent increased In the range of 19.8$\backsim$67.4 in order of NiO\longrightarrowMgO\longrightarrow${Cr}_2{O}_3$ and the leakage current decreased in the range of 25.6 $\backsim$ 1.2 $\mu$A in order of NiO\longrightarrow${Cr}_2{O}_3$\longrightarrowMgO. Among all varistors, the Cr$_2$O$_3$-added varistor exhibited the highest nonlinearity, with a nonlinear exponent of 67.4 and a leakage current of 1.2 $\mu$A. Furthermore, this varistor exhibited the lowest dielectric dissipation factor of 0.0407.

Resistive Switching Properties of N and F co-doped ZnO

  • Kim, Minjae;Kang, Kyung-Mun;Wang, Yue;Chabungbam, Akendra Singh;Kim, Dong-eun;Kim, Hyung Nam;Park, Hyung-Ho
    • Journal of the Microelectronics and Packaging Society
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    • v.29 no.2
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    • pp.53-58
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    • 2022
  • One of the most promising emerging technologies for the next generation of nonvolatile memory devices based on resistive switching (RS) is the resistive random-access memory mechanism. To date, RS effects have been found in many transition metal oxides. However, no clear evidence has been reported that ZnO-based resistive transition mechanisms could be associated with strong correlation effects. Here, we investigated N, F-co-doped ZnO (NFZO), which shows bipolar RS. Conducting micro spectroscopic studies on exposed surfaces helps tracking the behavioral change in systematic electronic structural changes during low and high resistance condition of the material. The significant difference in electronic conductivity was observed to attribute to the field-induced oxygen vacancy that causes the metal-insulator Mott transition on the surface. In this study, we showed the strong correlation effects that can be explored and incorporated in the field of multifunctional oxide electrons devices.

Electrical and Dielectric Characteristics of Zn-Pr-Co-Er-M(M=Ni, Mg, Cr) Oxides-Based Varistors (Zn-Pr-Co-Er-M(M=Ni, Mg, Cr)산화물계 바리스터의 전기적, 유전적 특성)

  • 남춘우;김명준
    • Journal of the Korean Ceramic Society
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    • v.41 no.8
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    • pp.605-609
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    • 2004
  • The microstructure, electrical and dielectric characteristics of ZnO varistors were investigated at various metal oxide (NiO, MgO, and Cr$_2$O$_3$) additives. The average grain size was increased with addition of NiO while that was decreased with addition of Cr$_2$O$_3$-Thereby, the varistor voltage was higher in Cr$_2$O$_3$-added composition. Among varistors, the varistor added with Cr$_2$O$_3$ exhibited the highest nonlinearity, with 40.5 in the nonlinear exponent and 2.7 ${\mu}$A in the leakage current and its dielectric dissipation factor was relatively low value of 0.0589.