• Journal of Radiation Protection and Research
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• 제43권3호
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• pp.97-106
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• 2018

Background: A cargo container scanner using a high-energy X-ray generates a fan beam X-ray to acquire a transmitted image. Because the generated X-rays by LINAC may affect the image quality and radiation protection of the system, it is necessary to acquire accurate information about the generated X-ray beam distribution. In this paper, a diode-based multi-channel spatial dose measuring device for measuring the X-ray dose distribution developed for measuring the high energy X-ray beam distribution of the container scanner is described. Materials and Methods: The developed high-energy X-ray spatial dose distribution measuring device can measure the spatial distribution of X-rays using 128 diode-based X-ray sensors. And precise measurement of the beam distribution is possible through automatic positioning in the vertical and horizontal directions. The response characteristics of the measurement system were evaluated by comparing the signal gain difference of each pixel, response linearity according to X-ray incident dose change, evaluation of resolution, and measurement of two-dimensional spatial beam distribution. Results and Discussion: As a result, it was found that the difference between the maximum value and the minimum value of the response signal according to the incident position showed a difference of about 10%, and the response signal was linearly increased. And it has been confirmed that high-resolution and two-dimensional measurements are possible. Conclusion: The developed X-ray spatial dose measuring device was evaluated as suitable for dose measurement of high energy X-ray through confirmation of linearity of response signal, spatial uniformity, high resolution measuring ability and ability to measure spatial dose. We will perform precise measurement of the X-ray beamline in the container scanning system using the X-ray spatial dose distribution measuring device developed through this research.

• 한국진공학회지
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• 제17권3호
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• pp.240-246
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• 2008

수십에서 수백 ${\mu}m$ 영역의 필름 두께 측정에 적용하기 위한 Ag-target 투과양극형 x-ray tube를 개발하고 특성을 조사하였다. 10kV 부근의 관전압에서 x-ray 에너지의 분포 및 선량특성을 조사하고 W-target tube와 비교하여 논의하였다. 또한 Ag-target tube와 W-target tube를 이용하여 Ny film과 PP film의 두께변화에 따른 x-ray의 투과 특성으로 조사하였고, 그 결과 개발된 x-ray tube는 필름두께 측정용으로 적용할 수 있을 만큼 충분히 좋은 특성을 나타내었다.

• Nuclear Engineering and Technology
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• 제53권4호
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• pp.1297-1303
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• 2021

Most thickness measurement techniques using X-ray radiation are unsuitable in field processes involving fast-moving organic films. Herein, we propose a Compton scattering X-ray radiation method, which probes the light elements in organic materials, and a new simple, non-destructive, and non-contact calibration-free real-time film thickness measurement technique by setting up a bench-top X-ray thickness measurement system simulating a field process dealing with thin flexible organic films. The use of X-ray fluorescence and Compton scattering X-ray radiation reflectance signals from films in close contact with a roller produced accurate thickness measurements. In a high-thickness range, the contribution of X-ray fluorescence is negligible, whereas that of Compton scattering is negligible in a low-thickness range. X-ray fluorescence and Compton scattering show good correlations with the organic film thickness (R² = 0.997 and 0.999 for X-ray fluorescence and Compton scattering, respectively, in the thickness range 0-0.5 mm). Although the sensitivity of X-ray fluorescence is approximately 4.6 times higher than that of Compton scattering, Compton scattering signals are useful for thick films (e.g., thicker than ca. 1-5 mm under our present experiment conditions). Thus, successful calibration-free thickness monitoring is possible for fast-moving films, as demonstrated in our experiments.

• 암석학회지
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• 제9권4호
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• pp.205-210
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• 2000

암석중에 미립(직경 0.3mm내외)으로 존재하는 조암광물의 동정 및 결정학적인 배향도를 미소부 X선 회절분석기를 이용하여 측정하였다. 실험에 사용된 표품들은 $A1_{2}SiO_{5}$ 3상디형(규선석, 남정석, 홍주석)으로서 모든 표품들은 박편상의 것을 측정대상으로 하였다 측정에 이용된 X선 회절분석기는 3(${\omega}\;{\chi}\;{\phi}$)축 회전 측각기 및 위치민감형 검출기로 구성되어 있으며 X선원으로는 $CuK_{\alpha}$를 사용하였으며 직경 $50\;\mu\textrm{m}$의 시준기를 사용하였다. 광물 동정은 3(${\omega}\;{\chi}\;{\phi}$)축 회전 측정법에 의해 시행되었으며, 박편표면에 우세하게 나타나는 광물상의 격자면을 알아보기 위해 2(${\omega}\;{\phi}$)축 회전 측정을 실시하였고 2축 회전 측정법에 의해 우세하게 나타난 회절선에 대한 격자방향의 배향도와 극분포를 확인하기 위하여 X-선 극점도 측정을 시행하였다. 3축 회전 측정결과 측정대상 광물상에 대해 동정이 가능하였으며 2축 회전 측정과 X-선 극점도 측정결과 규선석(310), 남성석(200), 홍주석(122)극이 절단면, 즉 박편표면의 법선방향으로 잘 발달하고 있음을 확인할 수 있었다. 본 측정법은 편광현미경을 사용하여 식별이 용이하지 않은 미립조암광물의 동정과 배향도를 알아보는데 유용하게 사용될 수 있는 분석기법이다.

• Journal of Radiation Protection and Research
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• 제41권3호
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• pp.229-236
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• 2016

Background: In order to manage the patient exposure dose in X-ray diagnosis, it is preferred to evaluate the entrance skin dose; although there are some evaluations about entrance skin dose, a small number of report has been published for direct measurement of patient. We think that a small-type optically stimulated luminescence (OSL) dosimeter, named nanoDot, can achieve a direct measurement. For evaluations, the corrections of angular and energy dependences play an important role. In this study, we aimed to evaluate the angular and the energy dependences of nanoDot. Materials and Methods: We used commercially available X-ray diagnostic equipment. For angular dependence measurement, a relative response of every 15 degrees of nanoDot was measured in 40-140 kV X-ray. And for energy dependence measurement, mono-energetic characteristic X-rays were generated using several materials by irradiating the diagnostic X-rays, and the nanoDot was irradiated by the characteristic X-rays. We evaluated the measured response in an energy range of 8.1-75.5 keV. In addition, we performed Monte-Carlo simulation to compare experimental results. Results and Discussion: The experimental results were in good agreement with those of Monte-Carlo simulation. The angular dependence of nanoDot was almost steady with the response of 0 degrees except for 90 and 270 degrees. Furthermore, we found that difference of the response of nanoDot, where the nanoDot was irradiated from the randomly set directions, was estimated to be at most 5%. On the other hand, the response of nanoDot varies with the energy of incident X-rays; slightly increased to 20 keV and gradually decreased to 80 keV. These results are valuable to perform the precise evaluation of entrance skin dose with nanoDot in X-ray diagnosis. Conclusion: The influence of angular dependence and energy dependence in X-ray diagnosis is not so large, and the nanoDot OSL dosimeter is considered to be suitable dosimeter for direct measurement of entrance surface dose of patient.

• 한국의학물리학회지:의학물리
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• 제23권4호
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• pp.279-284
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• 2012

X선은 방사선 진단과 치료 분야에 있어서 다양하고 광범위하게 이용되고 있으며, 최근에는 방사선 치료용 초소형 X선관이 개발되었다. 초소형 X선관은 조사 목적 부위에 직접 삽입하여 사용되므로 제작 시준기에 따라 다양한 각도로 X선 조사가 가능하고, 검사 목적 외의 환자 피폭선량을 최소화한다. 이러한 초소형 X선관의 장점을 이용해서 X선 영상을 획득하는데 적용한다면 X선 진단 분야의 새로운 장을 열 것으로 기대된다. 하지만 초소형 X선관은 본래 치료용으로 설계되었기 때문에 진단용 장비에 적합한 시준기, 필터(added filter) 등이 필요하다. 따라서 자체 제작한 시준기와 필터를 적용하여 초소형 X선관의 빔 특성이 진단용에 적합한지 평가 하였고, 이를 위해서 다이오드 검출기를 이용하여 반가층을 측정하고 측정의 가능성을 평가하였다. 본 연구에서는 Si PIN Photodiode type인 Piranha 검출기(Piranha, RTI, Sweden)를 사용하여 필터 적용 유무에 따른 초소형 X선관의 반가층을 측정하고, 알루미늄 필터를 사용한 측정을 통하여 Piranha 검출기의 반가층 측정의 정확성을 평가하였다. 측정 결과에 따르면 초소형 X선관의 반가층은 필터의 장착에 따라 약 1.9배 증가하여 진단용 방사선 발생 장치의 적합성을 확인하였다. Piranha 검출기의 반가층 자동 측정값은 필터를 미장착한 경우에 실제 반가층 측정값에 비해 50% 높게 측정되어 적용이 불가능하나, 필터를 장착한 경우에는 실제 반가층 측정값과 약 15%의 차이로 감소되었다. 따라서 진단용 필터를 적용했을 경우는 Piranha 검출기의 반가층 자동측정이 가능하여 kV-X선 특성평가를 수월하게 수행할 것으로 기대된다.

• 대한방사선기술학회지:방사선기술과학
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• 제21권2호
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• pp.5-10
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• 1998

In the mammography, X-ray beam quality is one of the most important factors. Using X-ray mammography unit model GE/CGR Senography 600T Senix H.F, Authors studied four subjects. 1. The aluminum attenuation rate in 30 kVp when used with or without compression plate. 2. HVLs at 5 different area of the X-ray field of $26{\sim}32kVp$. 3. HVLs to know the influence of corrected measurement or parallel measurement. 4. Film density with microdensitometer along and cross to the long axis of X-ray tube, in terms of the Heel effect in the X-ray field. The following results were obtained. 1. Beam quality of anode area was harder than cathode area. 2. The dose reduction rate of compression plate was approximately $65.5%{\sim}88.1%$ and the beam quality with compression plate was hardened up to 4kVp accordingly. 3. If the X-ray beam enters the attenuation plate obliquely, HVL was $2.6{\sim}2.9%$ harder than perpendicular to it. 4. Because of heel effect, the film density of cathode area is higher than anode area to film density of 0.5.

• 한국자동차공학회논문집
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• 제10권6호
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• pp.150-157
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• 2002

In textured material, diffraction angle $2{\theta}$ usually shows a nonlinear relation against $sin^2{\psi}$ due to elastic anisotropy of crystals. SPHD and SPCD steel is cold-rolled carbon steel for automobile. The characteristics X-ray for stress measurement is Cr $K_{\alpha}\;and\;Mo\;K_{\alpha}$ characteristic X-ray. The $2{\theta}-sin^2{\psi}$ diagram under elastic strain seems to have a linear behavior using regression line of data but has a nonlinear behavior in distribution of data by Cr $K_{\alpha}$ characteristic X-ray. As the plastic strain of specimen increases, the nonlinearity of $2{\theta}$ with respect to $sin^2{\psi}$ increases remarkably. On the other hand, the diffraction angle $2{\theta}$ by Mo $K_{\alpha}$ characteristic X-ray shows a good linearity on $2{\theta}-sin^2{\psi}$ diagram under plastic strain as well as elastic strain. Therefore, this paper presents the measurement of residual stress in cold-rolled carbon steel for automobile using penetration depth of Mo $K_{\alpha1}$ characteristic X-ray and multiplicity factor of crystal diffraction plane.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2013년도 제44회 동계 정기학술대회 초록집
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• pp.181-181
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• 2013

Recently, nanostructure and the molecular orientation of organic thin films have been largely paid attention due to its importance in organic electronics such as organic thin film transistors (OTFTs), organic light emitting diodes (OLEDs), and organic photovoltaics (OPVs). Among various methods, the diffraction and scattering techniques based on synchrotron x-rays have shown powerful results in organic thin film systems. In this work, we introduce the in-situ annealing system installed at PLS-II (Pohang Light Source II) for organic thin films by simultaneously conducting various x-ray scattering measurements of x-ray reflectivity, conventional x-ray scattering, grazing incidence wide angle x-ray scattering (GI-WAXS) and so on. Using the in-situ measurement, we could obtain real time variation of nanostructure as well as molecular orientation during thermal annealing in metal-phthalocyanine thin films. The variation of surface and interface also could be simultaneously investigated by the x-ray reflectivity measurement.

• Journal of Radiation Protection and Research
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• 제41권2호
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• pp.93-99
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• 2016

Background: Industrial X-ray CT system is normally applied to non-destructive testing (NDT) for industrial product made from metal. Furthermore there are some special CT systems, which have an ability to inspect nuclear fuel assemblies or rocket motors, using high power and high energy (more than 6 MeV) pulsed X-ray source. In these case, pulsed X-ray are produced by the electron linear accelerator, and a huge number of photons with a wide energy spectrum are produced within a very short period. Consequently, it is difficult to measure the X-ray energy spectrum for such accelerator-based X-ray sources using simple spectrometry. Due to this difficulty, unexpected images and artifacts which lead to incorrect density information and dimensions of specimens cannot be avoided in CT images. For getting highly precise CT images, it is important to know the precise energy spectrum of emitted X-rays. Materials and Methods: In order to realize it we investigated a new approach utilizing the Bayesian estimation method combined with an attenuation curve measurement using step shaped attenuation material. This method was validated by precise measurement of energy spectrum from a 1 MeV electron accelerator. In this study, to extend the applicable X-ray energy range we tried to measure energy spectra of X-ray sources from 6 and 9 MeV linear accelerators by using the recently developed method. Results and Discussion: In this study, an attenuation curves are measured by using a step-shaped attenuation materials of aluminum and steel individually, and the each X-ray spectrum is reconstructed from the measured attenuation curve by the spectrum type Bayesian estimation method. Conclusion: The obtained result shows good agreement with simulated spectra, and the presently developed technique is adaptable for high energy X-ray source more than 6 MeV.