Calibration-free real-time organic film thickness monitoring technique by reflected X-Ray fluorescence and compton scattering measurement |
Park, Junghwan
(Nuclear Chemistry Research Team, Korea Atomic Energy Research Institute)
Choi, Yong Suk (Nuclear Chemistry Research Team, Korea Atomic Energy Research Institute) Kim, Junhyuck (Nuclear Chemistry Research Team, Korea Atomic Energy Research Institute) Lee, Jeongmook (Nuclear Chemistry Research Team, Korea Atomic Energy Research Institute) Kim, Tae Jun (Nuclear Chemistry Research Team, Korea Atomic Energy Research Institute) Youn, Young-Sang (Department of Chemistry, Yeungnam University) Lim, Sang Ho (Nuclear Chemistry Research Team, Korea Atomic Energy Research Institute) Kim, Jong-Yun (Nuclear Chemistry Research Team, Korea Atomic Energy Research Institute) |
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