• Journal of Radiation Protection and Research
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• v.43 no.3
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• pp.97-106
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• 2018

Background: A cargo container scanner using a high-energy X-ray generates a fan beam X-ray to acquire a transmitted image. Because the generated X-rays by LINAC may affect the image quality and radiation protection of the system, it is necessary to acquire accurate information about the generated X-ray beam distribution. In this paper, a diode-based multi-channel spatial dose measuring device for measuring the X-ray dose distribution developed for measuring the high energy X-ray beam distribution of the container scanner is described. Materials and Methods: The developed high-energy X-ray spatial dose distribution measuring device can measure the spatial distribution of X-rays using 128 diode-based X-ray sensors. And precise measurement of the beam distribution is possible through automatic positioning in the vertical and horizontal directions. The response characteristics of the measurement system were evaluated by comparing the signal gain difference of each pixel, response linearity according to X-ray incident dose change, evaluation of resolution, and measurement of two-dimensional spatial beam distribution. Results and Discussion: As a result, it was found that the difference between the maximum value and the minimum value of the response signal according to the incident position showed a difference of about 10%, and the response signal was linearly increased. And it has been confirmed that high-resolution and two-dimensional measurements are possible. Conclusion: The developed X-ray spatial dose measuring device was evaluated as suitable for dose measurement of high energy X-ray through confirmation of linearity of response signal, spatial uniformity, high resolution measuring ability and ability to measure spatial dose. We will perform precise measurement of the X-ray beamline in the container scanning system using the X-ray spatial dose distribution measuring device developed through this research.

• Journal of the Korean Vacuum Society
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• v.17 no.3
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• pp.240-246
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• 2008

The x-ray transmission anode Ag-target tube was developed to apply for the thickness measurement of film in the thickness range of several tens$\sim$several hundreds ${\mu}m$ and its characteristics were evaluated. The energy distribution and dose of x-ray from Ag-target tube was investigated at the tube voltage near 10 kV, and discussed in comparition with that from W-target tube. The energy distribution and dose of x-rays passing through film were measured with various thickness of Ny and PP film. From these results, it was confirmed that our x-ray tube can be applied for the thickness measurement of film.

• Nuclear Engineering and Technology
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• v.53 no.4
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• pp.1297-1303
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• 2021

Most thickness measurement techniques using X-ray radiation are unsuitable in field processes involving fast-moving organic films. Herein, we propose a Compton scattering X-ray radiation method, which probes the light elements in organic materials, and a new simple, non-destructive, and non-contact calibration-free real-time film thickness measurement technique by setting up a bench-top X-ray thickness measurement system simulating a field process dealing with thin flexible organic films. The use of X-ray fluorescence and Compton scattering X-ray radiation reflectance signals from films in close contact with a roller produced accurate thickness measurements. In a high-thickness range, the contribution of X-ray fluorescence is negligible, whereas that of Compton scattering is negligible in a low-thickness range. X-ray fluorescence and Compton scattering show good correlations with the organic film thickness (R² = 0.997 and 0.999 for X-ray fluorescence and Compton scattering, respectively, in the thickness range 0-0.5 mm). Although the sensitivity of X-ray fluorescence is approximately 4.6 times higher than that of Compton scattering, Compton scattering signals are useful for thick films (e.g., thicker than ca. 1-5 mm under our present experiment conditions). Thus, successful calibration-free thickness monitoring is possible for fast-moving films, as demonstrated in our experiments.

• The Journal of the Petrological Society of Korea
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• v.9 no.4
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• pp.205-210
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• 2000

Measurements of phase identification and degree of orientation for fine-grained (about 0.3 mm in diameter) minerals in rock samples performed by micro-area X-ray diffractometer.$Al_{2}SiO_{5}$ polymorphs (andalusite, kyanite and sillimanite) were chosen for the measurements and target minerals were existed on thin sections. Micro-area X-ray diffractometer is composed of 3(${\omega}\;{\chi}\;{\phi}$)-circle oscillating goniometer and position sensitive proportional counter (PSPC). $CuK_{\alpha}$ radiation was used as X-ray source and a pin hole ($50\;\mu\textrm{m}$$ in diameter) collimator was selected to focus radiation X-ray onto the target minerals. Phase identification and diffracted X-ray peak indexing were carried out by 3(${\omega}\;{\chi}\;{\phi}$)-circle oscillation measurement. Then, 2(${\omega}\;{\phi}$)-circle oscillation measurement was made for the purpose of searching the prevailing lattice plane of the minerals on thin section surface. Finally, for a selected peak by 2-circle oscillation measurement, X-ray pole figure measurement was executed for the purpose of check the degree of orientation of the single lattice direction and examine its pole distribution. As a result of 3-circle oscillation measurement, it was possible that phase identification among $Al_{2}SiO_{5}$ polymorphs. And from the results of 2-circle oscillation measurement and X-ray pole figure measurement, we recognized that poles of andalusite (122), kyanite (200) and sillimanite (310) lattice plances were well developed with direction normal to each mineral surface plane respectively. Therfore, the measurements used with micro-area X-ray diffractometer in this study will be a useful tool of phase identification and degree of orientation measurement for fine-grained rock forming minerals.

• Journal of Radiation Protection and Research
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• v.41 no.3
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• pp.229-236
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• 2016

Background: In order to manage the patient exposure dose in X-ray diagnosis, it is preferred to evaluate the entrance skin dose; although there are some evaluations about entrance skin dose, a small number of report has been published for direct measurement of patient. We think that a small-type optically stimulated luminescence (OSL) dosimeter, named nanoDot, can achieve a direct measurement. For evaluations, the corrections of angular and energy dependences play an important role. In this study, we aimed to evaluate the angular and the energy dependences of nanoDot. Materials and Methods: We used commercially available X-ray diagnostic equipment. For angular dependence measurement, a relative response of every 15 degrees of nanoDot was measured in 40-140 kV X-ray. And for energy dependence measurement, mono-energetic characteristic X-rays were generated using several materials by irradiating the diagnostic X-rays, and the nanoDot was irradiated by the characteristic X-rays. We evaluated the measured response in an energy range of 8.1-75.5 keV. In addition, we performed Monte-Carlo simulation to compare experimental results. Results and Discussion: The experimental results were in good agreement with those of Monte-Carlo simulation. The angular dependence of nanoDot was almost steady with the response of 0 degrees except for 90 and 270 degrees. Furthermore, we found that difference of the response of nanoDot, where the nanoDot was irradiated from the randomly set directions, was estimated to be at most 5%. On the other hand, the response of nanoDot varies with the energy of incident X-rays; slightly increased to 20 keV and gradually decreased to 80 keV. These results are valuable to perform the precise evaluation of entrance skin dose with nanoDot in X-ray diagnosis. Conclusion: The influence of angular dependence and energy dependence in X-ray diagnosis is not so large, and the nanoDot OSL dosimeter is considered to be suitable dosimeter for direct measurement of entrance surface dose of patient.

• Progress in Medical Physics
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• v.23 no.4
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• pp.279-284
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• 2012

The X ray has been widely used in both diagnosis and treatment. Recently, a miniature X ray tube has been developed for radiotherapy. The miniature X ray tube is directly inserted into the body irradiated, so that X rays can be guided to a target at various incident angles according to collimator geometry and, thus, minimize patient dose. If such features of the miniature X ray tube can be applied to development of X ray imaging as well as radiation treatment, it is expected to open a new chapter in the field of diagnostic X ray. However, the miniature X ray tube requires an added filter and a collimator for diagnostic purpose because it was designed for radiotherapy. Therefore, a collimator and an added filter were manufactured for the miniature X ray tube, and mounted on. In this study, we evaluated beam characteristics of the miniature X ray tube for diagnostic X ray system and accuracy of measuring the HVL. We used the Si PIN Photodiode type Piranha detector (Piranha, RTI, Sweden) and estimated the HVL of the miniature X ray tube with added filter and without added filter. Through an another measurement using Al filter, we evaluated the accuracy of the HVL obtained from a direct measurement using the automatic HVL calculation function provided by the Piranha detector. As a result, the HVL of the miniature X ray tube was increased around 1.9 times with the added filter mounted on. So we demonstrated that the HVL was suitable for diagnostic X ray system. In the case that the added filter was not mounted on, the HVL obtained from use of the automatic HVL calculation function provided by Piranha detector was 50% higher than the HVL estimated using Al filter. Therefore, the HVL automatic measurement from the Piranha detector cannot be used for the HVL calculation. However, when the added filter was mounted on, the HVL automatic measurement value using the Piranha detector was approximately 15% lower than the estimated value using Al filter. It implies that the HVL automatic measurement can be used to estimate the HVL of the miniature X ray tube with the added filter mounted on without a more complicated measurement method using Al filter. It is expected that the automatic HVL measurement provided by the Piranha detector enables to make kV-X ray characterization easier.

• Journal of radiological science and technology
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• v.21 no.2
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• pp.5-10
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• 1998

In the mammography, X-ray beam quality is one of the most important factors. Using X-ray mammography unit model GE/CGR Senography 600T Senix H.F, Authors studied four subjects. 1. The aluminum attenuation rate in 30 kVp when used with or without compression plate. 2. HVLs at 5 different area of the X-ray field of $26{\sim}32kVp$. 3. HVLs to know the influence of corrected measurement or parallel measurement. 4. Film density with microdensitometer along and cross to the long axis of X-ray tube, in terms of the Heel effect in the X-ray field. The following results were obtained. 1. Beam quality of anode area was harder than cathode area. 2. The dose reduction rate of compression plate was approximately $65.5%{\sim}88.1%$ and the beam quality with compression plate was hardened up to 4kVp accordingly. 3. If the X-ray beam enters the attenuation plate obliquely, HVL was $2.6{\sim}2.9%$ harder than perpendicular to it. 4. Because of heel effect, the film density of cathode area is higher than anode area to film density of 0.5.

• Transactions of the Korean Society of Automotive Engineers
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• v.10 no.6
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• pp.150-157
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• 2002

In textured material, diffraction angle $2{\theta}$ usually shows a nonlinear relation against $sin^2{\psi}$ due to elastic anisotropy of crystals. SPHD and SPCD steel is cold-rolled carbon steel for automobile. The characteristics X-ray for stress measurement is Cr $K_{\alpha}\;and\;Mo\;K_{\alpha}$ characteristic X-ray. The $2{\theta}-sin^2{\psi}$ diagram under elastic strain seems to have a linear behavior using regression line of data but has a nonlinear behavior in distribution of data by Cr $K_{\alpha}$ characteristic X-ray. As the plastic strain of specimen increases, the nonlinearity of $2{\theta}$ with respect to $sin^2{\psi}$ increases remarkably. On the other hand, the diffraction angle $2{\theta}$ by Mo $K_{\alpha}$ characteristic X-ray shows a good linearity on $2{\theta}-sin^2{\psi}$ diagram under plastic strain as well as elastic strain. Therefore, this paper presents the measurement of residual stress in cold-rolled carbon steel for automobile using penetration depth of Mo $K_{\alpha1}$ characteristic X-ray and multiplicity factor of crystal diffraction plane.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.02a
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• pp.181-181
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• 2013

Recently, nanostructure and the molecular orientation of organic thin films have been largely paid attention due to its importance in organic electronics such as organic thin film transistors (OTFTs), organic light emitting diodes (OLEDs), and organic photovoltaics (OPVs). Among various methods, the diffraction and scattering techniques based on synchrotron x-rays have shown powerful results in organic thin film systems. In this work, we introduce the in-situ annealing system installed at PLS-II (Pohang Light Source II) for organic thin films by simultaneously conducting various x-ray scattering measurements of x-ray reflectivity, conventional x-ray scattering, grazing incidence wide angle x-ray scattering (GI-WAXS) and so on. Using the in-situ measurement, we could obtain real time variation of nanostructure as well as molecular orientation during thermal annealing in metal-phthalocyanine thin films. The variation of surface and interface also could be simultaneously investigated by the x-ray reflectivity measurement.

• Journal of Radiation Protection and Research
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• v.41 no.2
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• pp.93-99
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• 2016

Background: Industrial X-ray CT system is normally applied to non-destructive testing (NDT) for industrial product made from metal. Furthermore there are some special CT systems, which have an ability to inspect nuclear fuel assemblies or rocket motors, using high power and high energy (more than 6 MeV) pulsed X-ray source. In these case, pulsed X-ray are produced by the electron linear accelerator, and a huge number of photons with a wide energy spectrum are produced within a very short period. Consequently, it is difficult to measure the X-ray energy spectrum for such accelerator-based X-ray sources using simple spectrometry. Due to this difficulty, unexpected images and artifacts which lead to incorrect density information and dimensions of specimens cannot be avoided in CT images. For getting highly precise CT images, it is important to know the precise energy spectrum of emitted X-rays. Materials and Methods: In order to realize it we investigated a new approach utilizing the Bayesian estimation method combined with an attenuation curve measurement using step shaped attenuation material. This method was validated by precise measurement of energy spectrum from a 1 MeV electron accelerator. In this study, to extend the applicable X-ray energy range we tried to measure energy spectra of X-ray sources from 6 and 9 MeV linear accelerators by using the recently developed method. Results and Discussion: In this study, an attenuation curves are measured by using a step-shaped attenuation materials of aluminum and steel individually, and the each X-ray spectrum is reconstructed from the measured attenuation curve by the spectrum type Bayesian estimation method. Conclusion: The obtained result shows good agreement with simulated spectra, and the presently developed technique is adaptable for high energy X-ray source more than 6 MeV.