• Title/Summary/Keyword: X-ray Scattering

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Melting Behavior of Uni-Axially Deformed Polyethylenes Containing Comonomers as Studied by in-situ Small and Wide Angle X-ray Scattering (실시간 소각 밑 광각 X-선 산란을 이용한 일축 변형된 공단량체 함유 폴리에틸렌의 용융 거동)

  • Cho, Tai-Yon;Jeon, Hye-Jin;Ryu, Seok-Gn;Song, Hyun-Hoon
    • Polymer(Korea)
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    • v.33 no.2
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    • pp.183-188
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    • 2009
  • Structural rearrangements of uni-axially deformed polyethylenes containing 1-octene comonomer and HDPE upon heating were investigated by time-resolved small and wide angle X-ray scattering techniques. During heating, structural changes including crystal transformation and lamellar rearrangement noted were very different depending on the comonomer contents. At low comonomer content below 2 wt%, inverse martensitic transformation of crystal lattice from monoclinic to orthorhombic cell and the rearrangement of broken lamellar units into more ordered and perfect lamellar stacks were noted with the temperature increase. At high contents above 9.5 wt%, however, polyethylene copolymers showed neither the crystal transformation nor lamellar rearrangement that can be attributed to low crystallinity and high content of branch units.

X-Ray Spectrum Modulation for Mammography (X-선 스펙트럼 변조 기술 연구)

  • Kim, Gwang-Hyeon;Kim, Gyeong-Rak;O, Chang-Hyeon
    • Proceedings of the KIEE Conference
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    • 2003.11c
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    • pp.600-603
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    • 2003
  • Energy spectrum modulation of X-ray source in digital mammography has been studied. In this study, we calculated various filtered spectra using the scattering data. Primary spectra were generated by Molybdenum (Mo) and Tungsten (W) targets. The materials of added filters are Molybdenum and Rhodium (Rh) for 40 kVp Mo. primary spectrum, the amounts of photons over whole energy ranges are attenuated to 0.43 with 0.03 mm Mo filter and 0.38 with 0.06 mm Mo filter while the photons of energy ranged from 17 keV to 20 keV. The photons of low energy ranged below 17 keV are considerably attenuated. This effect brings out reducing the scattered radiation and dose to the patient, and enhancing subject contrast in the image. The results show that filtered spectra are not seriously affected by X-ray tube loadability. Because the energy range from 17 keV to 20 keV is directly transmitted although low and high energies are mainly filtered.

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Morphology Development in a Range of Nanometer to Micrometer in Sulfonated Poly(ethylene terephthalate) Ionomer

  • Lee, Chang-Hyung;Inoue, Takashi;Nah, Jae-Woon
    • Bulletin of the Korean Chemical Society
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    • v.23 no.4
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    • pp.580-586
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    • 2002
  • We investigated the effect of ionic component on crystalline morphology development during isothermal annealing in a sodium neutralized sulfonated poly(ethylene terephthalate) ionomer (Ion-PET) by time-resolved small-angle x-ray scattering (TR-SAX S) using synchrotron radiation. At early stage in Ion-PET, SAXS intensity at a low annealing temperature (Ta = 120 $^{\circ}C)$ decreased monotonously with scattering angle for a while. Then SAXS profile showed a peak and the peak position progressively moved to wider angles with isothermal annealing time. Finally, the peak intensity decreased, shifting the peak angle to wider angle. It is revealed that ionic aggregates (multiplets structure) of several nm, calculated by Debye-Bueche plot, are formed at early stage. They seem to accelerate the crystallization rate and make fine crystallites without spherulite formation (supported by optical microscopy observation). From decrease of peak intensity in SAXS,it is suggested that new lamellae are inserted between the preformed lamellae so that the concentration of ionic multiplets in amorphous region decreases to lower the electron density difference between lamellar crystal and amorphous region. In addition, analysis on the annealing at a high temperature (Ta = 210 $^{\circ}C)$ by optical microscopy, light scattering and transmission electron microscopy shows a formation of spherulite, no ionic aggregates, the retarded crystallization rate and a high level of lamellar orientation.

UHV x-ray scattering system for surface structural studies (표면원자구조 연구를 위한 초고진공 X-선 산란 장치)

  • 김효정;강현철;노도영;강태수;제정호;김남동;이성삼;정진욱
    • Journal of the Korean Vacuum Society
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    • v.10 no.1
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    • pp.93-97
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    • 2001
  • We introduce the structure and the capability of a UHV x-ray scattering system constructed for surface structural studies. The system consists of vacuum parts required for surface preparation and a vertical-horizontal diffractometer using the S2D2 geometry. To illustrate the capability of the system, we measured the 7$\times$7 reconstruction peak of a Si (111) surface. The peak count rate was 216 counts/sec and the domain size of the 7$\times$7 reconstruction was larger than 1600 $\AA$. This demonstrates that the system is capable of providing surface structural information.

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The Intensity Scale of Multiple Scattering of X-rays in Non-Crystalline Solids (비정질 고체에 대한 X선의 다중 산란 강도)

  • 박성수;장윤식;류봉기;박희찬
    • Journal of the Korean Ceramic Society
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    • v.34 no.1
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    • pp.109-113
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    • 1997
  • When the intensity of X-rays scattered from amorphous materials (very weakly absorbing materials) is measured using standard diffractometric technique, the intensity caused by multiple scattering is obtained in the measured X-ray intensity. Computer programs have been developed to estimate the intensity of the mul-tiple scattering obtained in vitreous SiO2 and B2O3 with various X-rays. Using the above computer program, the intensity ratios of multiple scattering to single scattering in vitreous SiO2 were 0.10~0.16% at CuK$\alpha$, 0.98~5.87% at MoK$\alpha$, and 1.88~17.86% at AgK$\alpha$ in the range of 2$\theta$=0~180$^{\circ}$. Therefore, pri-or to the structural analysis of vitreous SiO2 and B2O3 performed experimentally using X-ray diffractometric technique, the intensity data measured in MoK$\alpha$ and AgK$\alpha$ radiations must be corrected for multiple scattering effect.

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A study on radiation safety education, knowledge, and practice in using portable intraoral X-ray equipment of dental hygienist's (치과위생사의 이동형 구내방사선 촬영에 관한 방사선 방어 교육, 지식, 수행에 관한 연구)

  • Ryu, Jeong-Min;Kang, Bo-Sun;Kim, Seol-Hee
    • Journal of Korean society of Dental Hygiene
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    • v.17 no.6
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    • pp.1053-1065
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    • 2017
  • Objectives: The purpose of this study is to evaluate radiation safety education, knowledge and practice of dental hygienists in using handheld portable intraoral X-ray equipment and to suggest the need for radiation safety education in using handheld portable intraoral X-ray equipment. Methods: We surveyed 223 dental hygienists from July, 2017 to August in the dental clinics of Daejeon, Seoul and Gyeonggi area. Results: Radiation safety educational experience was higher in a year's career (72.9%), than 3 years experience (32.5%) (p<0.05). 82.7% of dental clinic workers took university education for radiation safety education while 55.6% of dental hospital workers took company training (p<0.05). More than 70% of the subjects did not have experience of radiation safety education about using portable intraoral X-ray. Radiation safety knowledge was highest in a year's career (p<0.05). The cumulative dose, radiation sensitivity, and lead defense knowledge were high in all subjects, but knowledge related to scattering radiation and scattering radiation sources was low. Practice of portable intraoral X-ray safety was significantly lower than knowledge. Conclusions: Knowledge of portable intraoral radiography safety is available, but performance is poor. Even with the small amount of radiation exposure, the risk is perceivable. There is a need to actively utilize the provided radiation protection products. In order to do this, efforts should be made to improve knowledge and performance of radiation safety through not only college education but also postemployment training.

Initial Growth and Surface Stability of 1,4,5,8,9,11-Hexaazatriphenylene-exanitrile (HATCN) Thin Film on an Organic Layer

  • Kim, Hyo Jung;Lee, Jeong-Hwan;Kim, Jang-Joo;Lee, Hyun Hwi
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.08a
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    • pp.192.2-192.2
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    • 2013
  • Crystalline order and surface stability of 1,4,5,8,9,11-hexaazatriphenylene-hexanitrile (HATCN) thin films on organic surface were investigated using grazing incidence wide angle x-ray scattering and x-ray reflectivity measurements. In the initial growth regime (less than 20 nm), HATCN molecules were stacked to low crystalline order with substantial amorphous phase. Meanwhile, a thicker film with 50 nm thickness showed high crystalline order of hexagonal phase with three different orientational domains. The domain distribution was quantitatively obtained as a function of tilted angle. By an organic-inorganic interface formation of IZO/HATCN thin film from an indium zinc oxide (IZO) electrode deposition, the surface stability of HATCN film was investigated and the sharp interface was confirmed by the x-ray reflectivity measurement.

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Crystallization of α-Fe2O3/AI2O3(0001) Thin films Studied by Synchrotron X-ray Scattering (α-Fe2O3/AI2O3(0001) 박막 결정화의 방사광 X-선 산란 연구)

  • 조태식
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.15 no.8
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    • pp.708-712
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    • 2002
  • The crystallization of amorphous $\alpha$-Fe$_2$O$_3$/$\alpha$-AI$_2$O$_3$(0001) thin films during thermal annealing in air has been studied using real-time synchrotron x-ray scattering. The well aligned (0.02$^{\circ}$/ FWHM) $\alpha$-Fe$_2$O$_3$and Fe$_3$O$_4$interfacial crystallites (50- -thick) coexist on the $\alpha$-AI$_2$O$_3$(0001) in the sputter-grown amorphous films at room temperature. The amorphous precursor is crystallized to the epitaxial $\alpha$-Fe$_2$O$_3$grains in three steps with annealing temperature; i ) the growth of the well aligned $\alpha$-Fe$_2$O$_3$interfacial crystallites, together with the transformation of the Fe$_3$O$_4$crystallites to the $\alpha$-Fe$_2$O$_3$ crystallites, ii ) the growth of the less aligned (3.08$^{\circ}$ FWHM)$\alpha$-Fe$_2$O$_3$grains on the well aligned grains (>40$0^{\circ}C$), and iii) the nucleation of the other less aligned (1.39$^{\circ}$ FWHM) $\alpha$-Fe$_2$O$_3$grains directly on the $\alpha$-AI$_2$O$_3$substrate (>$600^{\circ}C$). The effective thickness thinner than 230 may be very useful for enhancing the epitaxial quality of $\alpha$-Fe$_2$O$_3$/AI$_2$O$_3$(0001) thin films.