• Title/Summary/Keyword: Wet chemical technique

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A Comparative Study on the Precursors for the Atomic Layer Deposition of Silicon Nitride Thin Films (원료물질에 따른 실리콘 질화막의 원자층 증착 특성 비교)

  • Lee Won-Jun;Lee Joo-Hyeon;Lee Yeon-Seong;Rha Sa-Kyun;Park Chong-Ook
    • Korean Journal of Materials Research
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    • v.14 no.2
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    • pp.141-145
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    • 2004
  • Silicon nitride thin films were deposited by atomic layer deposition (ALD) technique in a batch-type reactor by alternating exposures of precursors. XJAKO200414714156408$_4$ or$ SiH_2$$Cl_2$ was used as the Si precursor, $NH_3$ was used as the N precursor, and the deposited films were characterized comparatively. The thickness of the film linearly increased with the number of deposition cycles, so that the thickness of the film can be precisely controlled by adjusting the number of cycles. As compared with the deposition using$ SiCl_4$, the deposition using $SiH_2$$Cl_2$ exhibited larger deposition rate at lower precursor exposures, and the deposited films using $SiH_2$$Cl_2$ had lower wet etch rate in a diluted HF solution. Silicon nitride films with the Si:N ratio of approximately 1:1 were obtained using either Si precursors at $500^{\circ}C$, however, the films deposited using $SiH_2$$Cl_2$ exhibited higher concentration of H as compared with those of the $SiC_4$ case. Silicon nitride thin films deposited by ALD showed similar physical properties, such as composition or integrity, with the silicon nitride films deposited by low-pressure chemical vapor deposition, lowering deposition temperature by more than $200^{\circ}C$.

A Study on the Application with Limestone Sludge at Limestone-Gypsum Wet Flue Gas Desulfurization Process (석회석 슬러지의 석회석-석고 습식 배연탈황 공정적용에 관한 연구)

  • Seo, Sung Kwan;Chu, Yong Sik;Shim, Kwang Bo
    • Resources Recycling
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    • v.25 no.5
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    • pp.44-49
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    • 2016
  • Flue gas desulfurization(FGD) is an effective technique to remove $SO_2$ gases of coal-fired plants. Limestone is usually used as desulfurizing agent. In this study, we use the limestone sludge which is a by-product of steel industry in order to replace desulfurizing agent of FGD process. Physical and chemical characteristics analysis of desulfurizing agent was conducted. Desulfurizing agent using limestone sludge was fabricated by pre-treatment process and, then the agent was used on FGD process. Consequently, the tendency on the $SO_2$ concentration did not appear. And limestone sludge was considered as possible alternative agent for flue gas desulfurization process through absorber control system.

The Influence of the Commercial Flame Retardant to the Physical and Chemical Properties of Dancheong Pigments (시판용 방염제 도포에 의한 단청안료의 물리화학적 변화 연구)

  • Lee, Han Hyoung;Kim, Jin Gyu;Lee, Hwa Soo;Lee, Ha Rim;Chung, Yong Jae;Kim, Do Rae;Han, Gyu Seong
    • Journal of Conservation Science
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    • v.32 no.2
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    • pp.249-259
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    • 2016
  • Effect of the flame retardants on Dancheong is studied in the present work. Two kinds of flame retardants were applied on Dancheong specimens and compared with control groups on which distilled water was applied instead of the flame retardants. The flame retardants enhanced the hygroscopic property of the surface of Dancheong. Furthermore, the added flame retardants reacted with oyster shell white($CaCO_3$) and lead red($Pb_3O_4$), producing new chemical compounds like Calcium phosphate tribasic and Lead Phosphates which make the painted layer of Dancheong dissolving and whitening over certain period of time. When applied in excessive amount and exposed in repetitive wet and dry condition, especially, they aggravate the surface problems significantly. These results will provide a good reference on the study of the discoloring/whitening effect of Dancheong layers at many traditional wooden building in Korea.

The Effect of Mask Patterns on Microwire Formation in p-type Silicon (P-형 실리콘에서 마이크로 와이어 형성에 미치는 마스크 패턴의 영향)

  • Kim, Jae-Hyun;Kim, Kang-Pil;Lyu, Hong-Kun;Woo, Sung-Ho;Seo, Hong-Seok;Lee, Jung-Ho
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.11a
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    • pp.418-418
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    • 2008
  • The electrochemical etching of silicon in HF-based solutions is known to form various types of porous structures. Porous structures are generally classified into three categories according to pore sizes: micropore (below 2 nm in size), mesopore (2 ~ 50 nm), and macropore (above 50 nm). Recently, the formation of macropores has attracted increasing interest because of their promising characteristics for an wide scope of applications such as microelectromechanical systems (MEMS), chemical sensors, biotechnology, photonic crystals, and photovoltaic application. One of the promising applications of macropores is in the field of MEMS. Anisotropic etching is essential step for fabrication of MEMS. Conventional wet etching has advantages such as low processing cost and high throughput, but it is unsuitable to fabricate high-aspect-ratio structures with vertical sidewalls due to its inherent etching characteristics along certain crystal orientations. Reactive ion dry etching is another technique of anisotropic etching. This has excellent ability to fabricate high-aspect-ratio structures with vertical sidewalls and high accuracy. However, its high processing cost is one of the bottlenecks for widely successful commercialization of MEMS. In contrast, by using electrochemical etching method together with pre-patterning by lithographic step, regular macropore arrays with very high-aspect-ratio up to 250 can be obtained. The formed macropores have very smooth surface and side, unlike deep reactive ion etching where surfaces are damaged and wavy. Especially, to make vertical microwire or nanowire arrays (aspect ratio = over 1:100) on silicon wafer with top-down photolithography, it is very difficult to fabricate them with conventional dry etching. The electrochemical etching is the most proper candidate to do it. The pillar structures are demonstrated for n-type silicon and the formation mechanism is well explained, while such a experimental results are few for p-type silicon. In this report, In order to understand the roles played by the kinds of etching solution and mask patterns in the formation of microwire arrays, we have undertaken a systematic study of the solvent effects in mixtures of HF, dimethyl sulfoxide (DMSO), iso-propanol, and mixtures of HF with water on the structure formation on monocrystalline p-type silicon with a resistivity with 10 ~ 20 $\Omega{\cdot}cm$. The different morphological results are presented according to mask patterns and etching solutions.

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Microstructure evolution and effect on deuterium retention in oxide dispersion strengthened tungsten during He+ irradiation

  • Ding, Xiao-Yu;Xu, Qiu;Zhu, Xiao-yong;Luo, Lai-Ma;Huang, Jian-Jun;Yu, Bin;Gao, Xiang;Li, Jian-Gang;Wu, Yu-Cheng
    • Nuclear Engineering and Technology
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    • v.52 no.12
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    • pp.2860-2866
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    • 2020
  • Oxide dispersion-strengthened materials W-1wt%Pr2O3 and W-1wt%La2O3 were synthesized by wet chemical method and spark plasma sintering. The field emission scanning electron microscopy (FE-SEM) analysis, XRD and Vickers microhardness measurements were conducted to characterize the samples. The irradiations were carried out with a 5 keV helium ion beam to fluences up to 5.0 × 1021 ions/m2 under 600 ℃ using the low-energy ion irradiation system. Transmission electron microscopy (TEM) study was performed to investigate the microstructural evolution in W-1wt%Pr2O3 and W-1wt%La2O3. At 1.0 × 1020 He+/m2, the average loops size of the W-1wt%Pr2O3 was 4.3 nm, much lower than W-1wt% La2O3 of 8.5 nm. However, helium bubbles were not observed throughout in both doped W materials. The effects of pre-irradiation with 1.0 × 1021 He+/m2 on trapping of injected deuterium in doped W was studied by thermal desorption spectrometry (TDS) technique using quadrupole mass spectrometer. Compared with the samples without He+ pre-irradiation, deuterium (D) retention of doped W materials increased after He+ irradiation, whose retention was unsaturated at the damage level of 1.0 × 1022D2+/m2. The present results implied that irradiation effect of He+ ions must be taken into account to evaluate the deuterium retention in fusion material applications.