• Title/Summary/Keyword: Weibull lifetime

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An Accelerated Life Test for Burnout of Tungsten Filament of Incandescent Lamp (텅스텐 백열전구의 필라멘트 단선에 대한 가속수명시험)

  • 이재국;김진우;신재철;김명수
    • Proceedings of the Korean Reliability Society Conference
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    • 2004.07a
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    • pp.129-137
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    • 2004
  • This paper presents an accelerated life test for burnout of tungsten filament of incandescent lamp. From failure analyses of field samples, it is shown that their root causes are local heating or hot sports in the filament caused by tungsten evaporation and wire sag. Finite element analysis is performed to evaluate the effect of vibration and impact for burnout, but any points of stress concentration or structural weakness are not found in the sample. To estimate the burnout life of lamp, an accelerated life test is planned by using quality function deployment and fractional factorial design, where voltage, vibration, and temperature are selected as accelerating variables. We assumed that Weibull lifetime distribution and a generalized linear model of life-stress relationship hold through goodness of fit test and test for common shape parameter of the distribution. Using accelerated life testing software, we estimated the common shape parameter of Weibull distribution, life-stress relationship, and accelerating factor.

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Reliability Assessment of Elevators Using Life Data of the Components (부품의 수명 데이터를 이용한 승강기의 신뢰성 평가)

  • Sohn, S.H.;Sohn, H.J.;Kim, S.J.;Yang, B.S.;Yoon, M.C.
    • Journal of Power System Engineering
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    • v.14 no.6
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    • pp.61-66
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    • 2010
  • Engineering asset management (EAM) requires the accurate assessment of current and the prediction of future asset health condition. Suitable mathematical models that are capable of predicting time-to-failure and the probability of failure in future time are essential. In general reliability models, lifetime of component and system is estimated using failure time data. This paper deals with the reliability assessment of elevators using life of main components. Especially this work is concerned with the stochastic nature of life of elevator components. First, we investigate the Weibull statistical analysis of lifetime data for the components. The final goal is to establish the mathematical model for reliability assessment. This work provides more perspectives to future research in the fields of reliability and maintainability.

Development of Life Test Specification for Catalytic Gas Sensor (접촉연소식 가스센서의 수명시험기준 개발)

  • Kang Jun-Ku;Park Jung-Won;Hwang Dong-Hoon;Ham Jung-Keol
    • Journal of Applied Reliability
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    • v.6 no.1
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    • pp.37-50
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    • 2006
  • The accelerated life tests of the catalytic gas sensor were performed at three different gas concentration conditions. From the test data, the power-Weibull model was estimated and the acceleration factor between test condition 25%LEL(Lowe Explosive Limit) and use condition 5%LEL was about 3 according to this acceleration model. Using this acceleration factor, life test specification for qualifying that B10 lifetime of the catalytic gas sensor meets the goal lifetime (5 years) was designed.

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Optimal Designs of Partially Accelerated Life Tests for Weibull Distributions (와이블 분포에서 부분가속수명시험의 최적설계)

  • Chung, Sang-Wook;Bai, Do-Sun
    • Journal of Korean Institute of Industrial Engineers
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    • v.24 no.3
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    • pp.367-379
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    • 1998
  • This paper considers two modes of partially accelerated life tests for items having Weibull lifetime distributions. In a use-to-acclerated mode each item is first run at use condition and, if it does not fail for a specified time, then it is run at accelerated condition until a predetermined censoring time. In an accelerated-to-use mode each one is first run at accelerated condition and, if it does not fail for a specified time, then it is run at use condition. Maximum likelihood estimators of the parameters of the lifetime distribution at use condition, and the 'acceleration factor' are obtained. The stress change time for each mode is determined to minimize the asymptotic variance of the acceleration factor, and the two modes are compared. For selected values of the design parameters the optimum plans are obtained, and the effects of the incorrect pre-estimates of the design parameters are investigated. Minimizing the generalized asymptotic variance of the estimators of the model parameters is also considered as an optimality criterion.

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THE LOGARITHMIC KUMARASWAMY FAMILY OF DISTRIBUTIONS: PROPERTIES AND APPLICATIONS

  • Ahmad, Zubair
    • Communications of the Korean Mathematical Society
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    • v.34 no.4
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    • pp.1335-1352
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    • 2019
  • In this article, a new family of lifetime distributions by adding two additional parameters is introduced. The new family is called, the logarithmic Kumaraswamy family of distributions. For the proposed family, explicit expressions for some mathematical properties are derived. Maximum likelihood estimates of the model parameters are also obtained. This method is applied to develop a new lifetime model, called the logarithmic Kumaraswamy Weibull distribution. The proposed model is very flexible and capable of modeling data with increasing, decreasing, unimodal or modified unimodal shaped hazard rates. To access the behavior of the model parameters, a simulation study has been carried out. Finally, the potentiality of the new method is proved via analyzing two real data sets.

A Study on Inventory Control according to the Authorized Days for Supply Level (보급수준 인가일수에 따른 재고수준 산출에 관한 연구)

  • Jeong, Hai-Sung
    • Journal of Applied Reliability
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    • v.7 no.3
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    • pp.119-126
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    • 2007
  • This paper deals with (s, S) spare part inventory model. Maintaining appropriate spare parts is one of the most important military affairs related to the readiness of military forces. In the problem under consideration, a military unit possesses n equipments and all the n equipments should be in operational readiness for the military purpose. The lifetime distribution of a part has been assumed to be exponential. This paper suggests the reorder point and order quantity under the assumption that the lifetime distribution of a part is weibull.

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Weibull Step-Stress Type-I Model Predict the Lifetime of Device (소자의 수명 예측을 위한 Weibull Step-Stress Type-I Model)

  • 정재성;오영환
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.32A no.6
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    • pp.67-74
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    • 1995
  • This paper proposes the step-stress type-I censoring model for analyzing the data of accelerated life test and reducing the time of accelerated life test. In order to obtain the data of accelerated life test, the step-stress accelerated life test was run with voltage stress to CMOS Hex Buffer. The Weibull distribution, the Inverse-power-law model and Maximum likelihood method were used. The iterative procedure using modified-quasi-linearization method is applied to solve the nonlinear equation. The proposed Weibull step-stress type-I censoring model exactly estimases the life time of units, while reducting the time of accelerated life test and the equipments of test.

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The Bivariate Kumaraswamy Weibull regression model: a complete classical and Bayesian analysis

  • Fachini-Gomes, Juliana B.;Ortega, Edwin M.M.;Cordeiro, Gauss M.;Suzuki, Adriano K.
    • Communications for Statistical Applications and Methods
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    • v.25 no.5
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    • pp.523-544
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    • 2018
  • Bivariate distributions play a fundamental role in survival and reliability studies. We consider a regression model for bivariate survival times under right-censored based on the bivariate Kumaraswamy Weibull (Cordeiro et al., Journal of the Franklin Institute, 347, 1399-1429, 2010) distribution to model the dependence of bivariate survival data. We describe some structural properties of the marginal distributions. The method of maximum likelihood and a Bayesian procedure are adopted to estimate the model parameters. We use diagnostic measures based on the local influence and Bayesian case influence diagnostics to detect influential observations in the new model. We also show that the estimates in the bivariate Kumaraswamy Weibull regression model are robust to deal with the presence of outliers in the data. In addition, we use some measures of goodness-of-fit to evaluate the bivariate Kumaraswamy Weibull regression model. The methodology is illustrated by means of a real lifetime data set for kidney patients.

Lifetime Assessments on 154 kV Transmission Porcelain Insulators with a Bayesian Approach (베이지안 방법론을 적용한 154 kV 송전용 자기애자의 수명 평가 개발)

  • Choi, In-Hyuk;Kim, Tae-Kyun;Yoon, Yong-Beum;Yi, Junsin;Kim, Seong Wook
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.30 no.9
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    • pp.551-557
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    • 2017
  • It is extremely important to improve methodologies for the lifetime assessment of porcelain insulators. While there has been a considerable amount of work regarding the phenomena of lifetime distributions, most of the studies assume that aging distributions follow the Weibull distribution. However, the true underlying distribution is unknown, giving rise to unrealistic inferences, such as parameter estimations. In this article, we review several distributions that are commonly used in reliability and survival analysis, such as the exponential, Weibull, log-normal, and gamma distributions. Some properties, including the characteristics of failure rates of these distributions, are presented. We use a Bayesian approach for model selection and parameter estimation procedures. A well-known measure, called the Bayes factor, is used to find the most plausible model among several contending models. The posterior mean can be used as a parameter estimate for unknown parameters, once a model with the highest posterior probability is selected. Extensive simulation studies are performed to demonstrate our methodologies.

The Consideration of Electrical Characteristics and Breakdown Lifetime in 22.9[kV] Underground Distribution Power Cables (22.9[kV] 지중배전용 전력케이블의 전기적 특성과 파괴수명 고찰)

  • Kim, Chung-Bae;Hong, Gyeong-Jin;Im, Jang-Seop;Jeong, U-Seong;Kim, Sang-Jun;Kim, Tae-Seong
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.48 no.9
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    • pp.628-633
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    • 1999
  • Degradation diagnosis of XLPE insulated URD cables was accomplished through out new method, which was to be analyzed by non-electrical experiments and synthesized by degradation points. To supplement this method, It was also carried out using several electrical analyses. Tan$\delta$ had commonly a different tendency by means oftemperature and frequency and also appeared higher at the outer part rather than innerpart of insulator. PD-q increased generally in proportion to the applied voltage andshowed regular patterns in relation to the thickness of insulator. Breakdown voltageswere measured and breakdown lifetimes were predicted appling for Weibull distribution function. As a result, breakdown lifetime in failure cables was shorter up to$\fraction one-third$ times than that in general cables. It was very available to estimate cable degradation using above method, but it needs further study on XLPE insulated URD cables in order to improve reliability.

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