• The Transactions of the Korean Institute of Electrical Engineers C
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• v.48 no.9
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• pp.672-675
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• 1999

Si-to-Si electrostatic bonding was carried out by employing LSG interlayer instead of conventional Corning #7740 interlayer in order to improve bonding properties. The surface roughness and dielectric breakdown field of the LSG interlayers deposited on Si substrates were investigated. Also, the bonding interface, bonding strength and bonding mechanism were discussed for the electrostatically-bonded Si-Si wafer pairs having LSG interlayers.

• Proceedings of the KAIS Fall Conference
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• 2001.11a
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• pp.169-172
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• 2001

다층 MEMS구조의 기초기판쌍 소재로 쓰일 수 있는 Si∥SiO₂/Si₃N₄∥Si 기판쌍의 직접접합 가능성을 확인하기 위해서 2000Å-SiO₂와 500Å-Si₃N₄층을 가진 직경 10cm의 실리콘 기판을 각각 친수성 및 소수성 표면세척을 하고 청정분위기에서 경면끼리 가접을 실시하였다. 가접된 기판쌍을 통상의 박스형 전기로를 이용하여 400, 600, 800, 1000, 1200℃ 범위에서 2시간 동안 가열하여 접합을 완료하였다. 완성된 기판쌍을 적외선분석기를 이용하여 접합면적을 확인하였고, 면도칼 삽입법으로 접합계면에너지를 측정하였다. 실험온도 범위 내에서 Si∥SiO₂/Si₃N₄∥Si 기판쌍은 1000℃ 이상에서 접합계면에너지는 2,344mJ/㎡을 나타냈으며, 이는 기존의 Si/Si의 동종접합기판쌍과 동등한 수준의 접합강도로서 부가가치가 큰 새로운 조합의 기판쌍 제조가 가능하였다.

• Journal of Electrical Engineering and Technology
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• v.5 no.2
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• pp.337-341
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• 2010

In this paper, an extremely low voltage operated micro corner cube retroreflector (CCR) was fabricated for free-space optical communication applications by using bulk silicon micromachining technologies. The CCR was comprised of an orthogonal vertical mirror and a horizontal actuated mirror. For low voltage operation, the horizontal actuated mirror was designed with two PZT cantilever actuators, torsional bars, hinges, and a mirror plate with a size of $400{\mu}m{\times}400{\mu}m$. In particular, the torsional bars and hinges were carefully simulated and designed to secure the flatness of the mirror plate by using a finite element method (FEM) simulator. The measured tilting angle was approximately $2^{\circ}$ at the applied voltage of 5 V. An orthogonal vertical mirror with an extremely smooth surface texture was fabricated using KOH wet etching and a double-SOI (silicon-on-insulator) wafer with a (110) silicon wafer. The fabricated orthogonal vertical mirror was comprised of four pairs of two mutually orthogonal flat mirrors with $400{\mu}m4 (length) $\times400{\mu}m$ (height) $\times30{\mu}m$ (thickness). The cross angles and surface roughness of the orthogonal vertical mirror were orthogonal, almost $90^{\circ}$ and 3.523 nm rms, respectively. The proposed CCR was completed by combining the orthogonal vertical and horizontal actuated mirrors. Data transmission and modulation at a frequency of 10 Hz was successfully demonstrated using the fabricated CCR at a distance of approximately 50 cm.

• Smart Structures and Systems
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• v.2 no.2
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• pp.101-113
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• 2006

Structural health monitoring results obtained with the electro-mechanical (E/M) impedance techniqueand Lamb wave transmission methods during fatigue crack propagation of an Arcan specimen instrumented with piezoelectric wafer active sensors (PWAS) are presented. The specimen was subjected in mixed-mode fatigue loading and a crack was propagated in stages. At each stage, an image of the crack and the location of the crack tip were recorded and the PWAS readings were taken. Hence, the crack-growth in the specimen could be correlated with the PWAS readings. The E/M impedance signature was recorded in the 100 - 500 kHz frequency range. The Lamb-wave transmission method used the pitch-catch approach with a 3-count sine tone burst of 474 kHz transmitted and received between various PWAS pairs. Fatigue loading was applied to initiate and propagate the crack damage of controlled magnitude. As damage progressed, the E/M impedance signatures and the waveforms received by receivers were recorded at predetermined intervals and compared. Data analysis indicated that both the E/M impedance signatures and the Lamb-wave transmission signatures are modified by the crack progression. Damage index values were observed to increase as the crack damage increases. These experiments demonstrated that the use of PWAS in conjunction with the E/M impedance and the Lamb-wave transmission is a potentially powerful tool for crack damage detection and monitoring in structural elements.

• Journal of the Microelectronics and Packaging Society
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• v.7 no.1
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• pp.7-12
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• 2000

As an essential technology for the FED, VFD and PDP packaging having merits of no glass frit and no glass tube usage, two sodalime glass substrates were electrostatically-bonded in a vacuum environment, and the bond properties were compared with the case of bonding in atmosphere. The glass wafer pairs bonded in vacuum using a-Si interlayer had a relatively lower bond strength than the ones bonded in atmosphere under same bonding conditions (temperature and voltage). And the bond strength was increased in the case of oxygen ambient. Through the XPS and SIMS analyses fur the surface region of a-silicon and bulk glass, it might be concluded that the lower bonding strength was originated from the inactive silicon oxide growth occurred during the electrostatic bonding process due to oxygen deficiency in vacuum.

• Smart Structures and Systems
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• v.19 no.4
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• pp.361-369
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• 2017

Electromechanical impedance method as an efficient tool in Structural Health Monitoring (SHM) utilizes the electromechanical impedance of piezoelectric materials which is directly related to the mechanical impedance of the host structure and will be affected by damages. In this paper, electromechanical impedance of piezoelectric patches attached to simply support rectangular plate is determined theoretically and experimentally in order to detect damage. A pairs of piezoelectric wafer active sensor (PWAS) patches are used on top and bottom of an aluminum plate to generate pure bending. The analytical model and experiments are carried out both for undamaged and damaged plates. To validate theoretical models, the electromechanical impedances of PWAS for undamaged and damaged plate using theoretical models are compared with those obtained experimentally. Both theoretical and experimental results demonstrate that by crack generation and intensifying this crack, natural frequency of structure decreases. Finally, in order to evaluate damage severity, damage metrics such as Root Mean Square Deviation (RMSD), Mean Absolute Percentage Deviation (MAPD), and Correlation Coefficient Deviation (CCD) are used based on experimental results. The results show that generation of crack and crack depth increasing can be detectable by CCD.

• Journal of the Korean institute of surface engineering
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• v.34 no.1
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• pp.33-38
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• 2001

10cm-diameter Si(100)∥$1.3\mu\textrm{m}$-X$1.3_2$X$1.3\mu\textrm{m}$-$SiO_2$∥Si(100) afers were prepared using a fast linear annealing (FLA) equipment. 1.3$\mu\textrm{m}$-thick $SiO_2$ films were grown by dry oxidation process. After cleaning and premating the wafers in a class 100 clean room, they were heat treated using with the FLA and conventional electric furnace. Bonded area and bond strength of wafer pairs were measured using a infrared (IR) camera and razor blade crack opening method, respectively. It was confinmed that the bonded area by FLA was around 99% and the bond strength value reached 2172mJ/$\m^2$, which is equivalent to theoritical bond strength. Our result implies that thick $SiO_2$ SOI may be prepared more easily by using $SiO_2$$SiO_2$ bonding interfaces then those of Si/$SiO_2$'s.

• 한국신재생에너지학회:학술대회논문집
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• 2006.06a
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• pp.228-231
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• 2006

This paper briefly introduces silicon based thin film solar cells: amorphous (a-Si:H), microcrystalline ${\mu}c-Si:H$ single junction and $a-Si:H/{\mu}c-Si:H$ tandem solar cells. The major difference of a-Si:H and ${\mu}c-Si:H$ cells comes from electro-optical properties of intrinsic Si-films (active layer) that absorb incident photon and generate electron-hole pairs. The a-Si:H film has energy band-gap (Eg) of 1.7-1.8eV and solar cells incorporating this wide Eg a-Si:H material as active layer commonly give high voltage and low current, when illuminated, compared to ${\mu}c-Si:H$ solar cells that employ low Eg (1.1eV) material. This Eg difference of two materials make possible tandem configuration in order to effectively use incident photon energy. The $a-Si:H/{\mu}c-Si:H$ tandem solar cells, therefore, have a great potential for low cost photovoltaic device by its various advantages such as low material cost by thin-film structure on low cost substrate instead of expensive c-Si wafer and high conversion efficiency by tandem structure. In this paper, the structure, process and operation properties of Si-based thin-film solar cells are discussed.

• Journal of Sensor Science and Technology
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• v.3 no.1
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• pp.40-45
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• 1994

$112^{\circ}$ rot. x-cut $LiTaO_{3}$ wafer was used as the substrate of SAW gas sensor. Dual delay line SAW device with IDTs which consist of the reference delay line and the sensing delay line was fabricated using photolithigraphy. Each IDTs had 10 finger pairs and finger spacing is 10 microns. One delay line channel is the reference, while the second is the sensing channel with Pb-phthalocyanine film in the propagation path. Pb-phthalocyanine film which is p-type organic semiconductor was evaporated in $10^{-5}$ torr vacuum using shadow mask selectively. Dual delay line oscillator was constructed by using the rf amplifier and AGC. Frequency of the IDTs had the range of $87{\sim}$89 MHz oscillation frequency. Oscillation frequency shifts were investigated as a function of the temperature and the concentration of $NO_{2}$ gas.

• Korean Journal of Materials Research
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• v.11 no.5
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• pp.427-430
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• 2001

We prepared 10cm-diameter Si(100)/500 $\AA$-Si$_3$N$_4$/Si(100) wafer Pairs adopting 500 $\AA$ -thick Si$_3$N$_4$layer as insulating layer between single crystal Si wafers. Si3N, is superior to conventional SiO$_2$ in insulating. We premated a p-type(100) Si wafer and 500 $\AA$ -thick LPCVD Si$_3$N$_4$∥Si (100) wafer in a class 100 clean room. The cremated wafers are separated in two groups. One group is treated to have hydrophobic surface and the other to have hydrophilic. We employed a FLA(fast linear annealing) bonder to enhance the bond strength of cremated wafers at the scan velocity of 0.1mm/sec with varying the heat input at the range of 400~1125W. We measured bonded area using a infrared camera and bonding strength by the razor blade crack opening method. We used high resolution transmission electron microscopy(HRTEM) to probe cross sectional view of bonded wafers. The bonded area of two groups was about 75%. The bonding strength of samples which have hydrophobic surface increased with heat input up to 1577mJ/$m^2$ However, bonding strength of samples which have hydrophilic surface was above 2000mJ/$m^2$regardless of heat input. The HRTEM results showed that the hydrophilic samples have about 25 $\AA$ -thick SiO layer between Si and Si$_3$N$_4$/Si and that maybe lead to increase of bonding strength.