• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.25 no.5
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• pp.559-575
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• 2014

In this paper, we propose a horizontal/vertical calibration kit for calibrating a vector network analyzer(VNA) to measure the vertical connector pin. If the conventional calibration kit is used, we should change the arm for a probe or need an assistant device and it takes a long time. In addition there is a risk of precision degradation caused by the position change of the probe tip sensitive to the surroundings. We suggest a 4-port vertical calibration kit to make up for the aforementioned shortcomings. The calibration kit was manufactured for the SOLT calibration method. 'Short', 'Open', and 'Load' are available in the horizontal plane, 'Thru' is available not only in the horizontal plane on the two planes of a PCB, but in the vertical plane between the two planes according to the positions of the probes. We complemented the conventional calibration kit to make a vertical calibration kit to be used for the vertical measurement method. We compared and analysed their reflection/transfer characteristics of the SOLT calibration standards of the proposed calibration kit and conventional one, we get a ${\pm}0.1$ dB differences of transfer characteristics in the range from 300 kHz to 8.5 GHz. In order to demonstrate usefulness, and we performed a case study for horizontal and vertical cases, and compared the results of the proposed calibration kit and conventional one.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.02a
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• pp.559-559
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• 2012

We developed a new scheme for the highly sensitive near-field scanning optical microscope (NSOM) by using a dithering sample stage rather than a dithering probe. In the proposed scheme, the sample is directly loaded on one prong surface of a dithering bare tuning fork. Gap control between probe and sample is performed by detecting the shear force between an immobile fiber probe and the dithering sample. In a conventional NSOM, the Q factor drastically decreases from 7783 to 1000 or even to 100 by attaching a probe to the tuning fork. In our proposed NSOM, on the contrary, the Q factor does not change significantly, 7783 to 7480, when the sample is loaded directly to the tuning fork instead of attaching a probe. Consequently, the graphene sheets that cannot be observed by a conventional NSOM were clearly observed by the proposed method with sub-nanometer vertical resolution due to the extremely high Q factor.

• Journal of the Korean Society of Combustion
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• v.6 no.2
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• pp.65-70
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• 2001

To investigate statistics of flamelet in a turbulent premixed flame and to obtain components of their burning velocities in a vertical plane above a pipe-flow burner, the local motion of flamelets with respect to gas are measured by specially arranged diagnostics, composed of an electrostatic probe with four identical sensors and a two-color four-beam LDV system. With this technique, the three-dimensional local flame-front-velocity vector is measured by the electrostatic probe for the first time, and simultaneously the axial and radial components of the local gas-velocity vector in a vertical plane above the vertically oriented burner are measured by the LDV system. Two components of burning velocities of planar flamelets can be obtained from these results and are found to be distributed over different directions and to range in magnitude from nearly zero to a few times the planar, unstrained adiabatic laminar burning velocity measured in the unburnt gas. It may be concluded from these results that turbulence exerts measurable influences on flamelets and causes at least some of them to exhibit increased burning velocity.

• Journal of the Korean Society of Combustion
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• v.7 no.2
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• pp.62-68
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• 2002

To investigate statistics of flamelet in a turbulent premixed flame and to obtain components of their burning velocities in a vertical plane above a pipe-flow burner, the local motion of flamelets with respect to gas are measured by specially arranged diagnostics, composed of an electrostatic probe with four identical sensors and a two-color four-beam LDV system. With this technique, the three-dimensional local flame- front-velocity vector is measured by the electrostatic probe for the first time, and simultaneously the axial and radial components of the local gas-velocity vector in a vertical plane above the vertically oriented burner are measured by the LDV system. Two components of burning velocities of planar flamelets can be obtained from these results and are found to be distributed over different directions and to range in magnitude from nearly zero to a few times the planar, un strained adiabatic laminar burning velocity measured in the unburnt gas. It may be concluded from these results that turbulence exerts measurable influences on flamelets and causes at least some of them to exhibit increased burning velocity.

• International Journal of Precision Engineering and Manufacturing
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• v.2 no.2
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• pp.73-80
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• 2001

The objective of this research is to develop a measurement error model for sculptured surface in On-Machine Measurement(OMM) process based on a closed-loop configuration. The geometric error model of each axis of a vertical CNC machining center is derived using a 4$\times$4 homogeneous transformation matrix. The ideal locations of a touch-type probe for the sculptured surface measurement are calculated from the parametric surface representation and X-, Y- directional geometric errors of the machine. Also the actual coordinates of the probe are calculated by considering the pre-travel variation of a probe and Z-directional geometric errors. Then, the step-by-sep measurement error analysis method is suggested based on a closed-loop configuration of the machining center including workpiece and probe errors. The simulation study shows the simplicity and effectiveness of the proposed error modeling strategy.

• Journal of the Korean Society for Precision Engineering
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• v.16 no.10
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• pp.172-181
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• 1999

The objective of this research is to develop a measurement error model for sculptured surfaces in On-Machine Measurement (OMM) process based on a closed-loop configuration. The geometric error model of each axis of a vertical CNC Machining center is derived using a 4${\times}$4 homogeneous transformation matrix. The ideal locations of a touch-type probe for the scupltured surface measurement are calculated from the parametric surface representation and X-, Y- directional geometric errors of the machine. Also, the actual coordinates of the probe are calculated by considering the pre-travel variation of a probe and Z-directional geometric errors. Then, the step-by-step measurement error analysis method is suggested based on a closed-loop configuration of the machining center including workpiece and probe errors. The simulation study shows the simplicity and effectiveness of the proposed error modeling strategy.

• The Magazine of the Society of Air-Conditioning and Refrigerating Engineers of Korea
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• v.15 no.3
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• pp.283-291
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• 1986

An experimental study has been conducted to investigate characteristics of the flow patterns, its transitions and the mean local void fraction obtained from which the probe was traversed diametrically from center to wall of the test section in the vertical upward air-water flow for isothermal condition using the electrical conductivity probe. It has been shown that the probability density function of the mean local void fraction measured statistically from a Fast Fourier Transform becomes a criterion for the flow patterns and the mean local void fraction profile is a highly function of the flow patterns.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.11 no.4
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• pp.1210-1215
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• 2010

The probe card are test modules which are to classify the good semiconductor chips and thin film before the packaging process. In the rapid growth a technology of semiconductor, the number of pads per unit area is increasing and pad arrays are becoming irregular. Therefore, the technology of probe card needs narrow width and lots of probe tip. In this paper, the probe tip based on the MEMS(Micro Electro Mechanical System)technology was developed a new MEMS probe tip for vertical probe card applications. For the structural designs of probe tip were performed to mechanical characteristics and structural analysis using FEM(Finite Element Method). Also, the contact force of MEMS probe tip compared with FEM results and experimental results. Finally, the MEMS probe card was developed a fine pitch smaller than $50{\mu}m$.

• Journal of Computational Design and Engineering
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• v.1 no.2
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• pp.128-139
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• 2014

This study investigates the effects of machining parameters as they relate to the quality characteristics of machined features. Two most important quality characteristics are set as the dimensional accuracy and the surface roughness. Before any newly acquired machine tool is put to use for production, it is important to test the machine in a systematic way to find out how different parameter settings affect machining quality. The empirical verification was made by conducting a Design of Experiment (DOE) with 3 levels and 3 factors on a state-of-the-art Cincinnati Hawk Arrow 750 Vertical Machining Center (VMC). Data analysis revealed that the significant factor was the Hardness of the material and the significant interaction effect was the Hardness + Feed for dimensional accuracy, while the significant factor was Speed for surface roughness. Since the equally important thing is the capability of the instruments from which the quality characteristics are being measured, a comparison was made between the VMC touch probe readings and the measurements from a Mi-tutoyo coordinate measuring machine (CMM) on bore diameters. A machine mounted touch probe has gained a wide acceptance in recent years, as it is more suitable for the modern manufacturing environment. The data vindicated that the VMC touch probe has the capability that is suitable for the production environment. The test results can be incorporated in the process plan to help maintain the machining quality in the subsequent runs.

• Journal of Applied Reliability
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• v.7 no.1
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• pp.23-29
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• 2007

Probe card is a test component which is to classify the known good die with electrical contact before the packaging in the ATE (automatic testing equipment). Conventional probe tip was mostly needle type, it has been difficult to meet with conventional type, because of decreasing chip size, pad to pad pitch and pads size increasingly. For that reason, probe cards using MEMS (micro electro mechanical system) technology have been developed for various semiconductor chips. In this paper, Area Array type MEMS Probe tip was designed,, fabricated, and characterized its mechanical and electrical properties. The authors found that good electrical characteristics under $1{\Omega}$ were acquired with gold (Au) and aluminium (Al) pad contact test over 0.5gf and 4gf respectively. And, contact resistance variation under $0.1{\Omega}$ were achieved with 100,000 times of repetition test. And, insertion loss (IS) for high frequency operation was ascertained over 300MHz at -3dB loss.