• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2003.10a
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• pp.537-541
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• 2003

The a-Si:H TFTs using ferroelectric of SrTiO$_3$, as a gate insulator is fabricated on glass. Dielectric characteristics of ferroelectric is better than SiO$_2$, SiN. Ferroelectric increases ON-current, decreases threshold voltage of TFT and also breakdown characteristics. The a-Si:H deposited by PECVD shows absorption band peaks at wavenumber 2,000 $cm^{-1}$ /, 635 $cm^{-1}$ / and 876 $cm^{-1}$ / according to FTIR measurement. Wavenumber 2,000 $cm^{-1}$ /, 635 $cm^{-1}$ / are caused by stretching and rocking mode SiH1. The wavenumber of weaker band, 876 $cm^{-1}$ / is due to SiH$_2$ vibration mode. The a-SiN:H has optical bandgap of 2.61 eV, refractive index of 1.8 - 2.0 and resistivity of 10$^{11}$ - 10$^{15}$ aim respectively. Insulating characteristics of ferroelectric is excellent because dielectric constant of ferroelectric is about 60 - 100 and breakdown strength is over 1 MV/cm. TFT using ferroelectric has channel length of 8 - 20 $\mu$m and channel width of 80 - 200 $\mu$m. And it shows drain current of 3 $\mu$A at 20 gate voltages, Ion/Ioff ratio of 10$^{5}$ - 10$^{6}$ and Vth of 4 - 5 volts.

• Journal of the Korean Society for Heat Treatment
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• v.5 no.2
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• pp.95-102
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• 1992

In this study, we tried to describe the quantitative model of TiN film structure which was deposited by PECVD process. The macro-grain growth behavior was studied at the various deposition pressures and times. As a result, It was confirmed that TiN films had the typical Zone 1 structure, and macro-columnar grains were, without reference to the deposition pressure, grown ballistic type by the growth-death competition following the equation, $Y=aX^2$, approximately obtained by regression analysis. Also, the thickness and the crystallization of TiN thin films were increased, the chlorine contents were decreased according to the decreasing of deposition pressure.

• Korean Journal of Materials Research
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• v.6 no.3
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• pp.333-340
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• 1996

p-type(100) 실리콘 기판과 TiN(50nm)/Si 기판에 dimethylethylamine alane(DMEAA)을 반응소스로 하여 알루미늄을 증착시켜 증착온도와 유량, 반송가스 종류에 따른 방향성, 증착속도, 미세구조 변화에 대해 연구하였다. 알루미늄의 증착속도는 기판온도, 반송가스 종류 및 유량에 따라 100-650mn/min으로 다양하게 조절되었다. DMEAA의 증착 활성화에너지는 TiN 기판에서는 약 0.leV이었고 Si와 SiO2 기판에서는 각각 약 0.23eV, 0.24eV이었다. 알루미늄 박막의 방향성은 증착속도의 감소에 따라 (200)에서 (111)방향으로 변하였다. 증착된 알루미늄 박막의 불순물 함량은 산소의 경우 0.2at%, 탄소의 경우 1.8at.%이었다. DMEAA 소스에 의한 알루미늄의 증착속도는 반송가스가 Ar 일 때 보다 H2 가스를 사용하면 증착속도가 크게 증가하였으며 이는 반송가스에 의해 SiO2표면의 흡착 H 농도가 증가하고 흡착 H가 소스 가스와 반응하여 핵생성 site 로 작용하는 것으로 생각된다. 알루미늄 박막의 비저항은 표면 미세조직에 크게 영향을 받으며 그 값은 약 3-7$\mu$$\Omega$cm이었다.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2016.11a
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• pp.116.2-116.2
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• 2016

n-type 반도체의 성질을 가지고 있는 $TiO_2$는 화학적 안정성, 3.2 eV의 밴드갭 에너지 등에 의하여 다양한 형태의 에너지 변환 및 저장 소재로 많이 연구되어지고 있다. 특히, Fujishima-Honda의 발견에 의한 광촉매적 특성은 $TiO_2$의 가장 대표적인 응용 분야라 할 수 있다. 이런 $TiO_2$는 솔-겔, 수열합성법, 침전법 등의 화학적 방법을 통하여 제조 한다. 하지만 이런 방법은 $TiO_2$를 전극으로 사용하기 위한 추가적인 공정이 필수적일 뿐 아니라 그 구조를 제어하기가 쉽지 않다. 이에 약 10여 년 전부터 많은 연구자, 과학자들은 금속 기판위에 $TiO_2$를 형성하는 양극산화 법에 대한 관심을 가지고 꾸준히 연구되어져 왔다. 양극산화법을 통한 $TiO_2$는 그 조건에 따라 박막, 기공(포어)구조, 튜브 구조 및 다양한 나노 구조를 형성할 수 있게 한다. 그렇지만 대표적인 구조는 기공간의 공간을 유지하는 나노 튜브의 형태라 할 수 있다. $TiO_2$ 나노 튜브를 형성하기 위해서는 극미량의 fluoride 이온이 첨가된 전해질에서 이루어진다고 알려져 왔다. 본 발표에서는 이런 전해질의 조건에 따른 나노튜브 구조의 변화를 보고 그 변화에 따른 광전기화학적 차이점에 대하여 논하고자 한다.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.11 no.11
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• pp.984-989
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• 1998

The ($Sr_{1-x}Ca_x)TiO_3$(SCT) thin films are deposited on Pt-coated electrode($Pt/TiN/SiO_2/Si$) using RF sputtering method with substitutional contents of Ca. The maximum grain of thin films is obtained by substitution of Ca at 15[mol%]. All SCT thin films had (111) preferred orientation. The dielectric constant was increased with increasing the substitutional contents of Ca, while it was decreased if the substitutional contents of Ca exceeded over 15[mol%]. The dielectric constant changes almost linearly in temperature ranges of -80~+90[$^{\circ}C$]. The temperature properties of the dielectric loss have a stable value within 0.02 independent of the substitutional contents of Ca. All SCT thin films used in this study show the phenomena of dielectric relaxation with the increase of frequency, and the relaxation frequency is observed above 200[kHz].

• Applied Chemistry for Engineering
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• v.17 no.5
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• pp.471-475
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• 2006

$VO_x$ thin films with the thickness of 450 nm were prepared on a $Pt/Ti/SiO_{2}/Si$ substrate at room temperature by a reactive radio frequency (rf) magnetron sputtering method. The deposition rates of $VO_x$ thin films were investigated as a function of $O_{2}$ concentration and rf power. As the $O_{2}$ concentration in a $O_{2}/Ar$ mixture increased, the deposition rate decreased. However, the deposition rate increased with increasing rf power. The deposited $VO_x$ thin films were annealed at $450^{\circ}C$ for 2, 4, and 6 h in $O_{2}$ and $N_{2}$ ambient. After annealing, the phase changes of $VO_x$ thin films were investigated using X-ray diffraction analysis. The plane and cross-sectional views of $VO_x$ thin films before and after annealing were observed by field emission scanning electron microscopy. The metal-insulator transition (MIT) properties of $VO_x$ thin films were measured using current-voltage measurement. The excellent MIT properties were observed in $VO_x$ thin films annealed in $O_{2}$ ambient.

• Applied Chemistry for Engineering
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• v.20 no.4
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• pp.402-406
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• 2009

$TiO_2$ thin films were surface-modified with atmospheric plasma and their photocatalytic activities were evaluated. The films were deposited on glass plates by dip-coating in a $TiO_2$ sol-gel solution and sintered at various temperatures for various times. Nitrogen plasma was used for the modification and the experiments were carried out varying operational parameters such as discharge power and treatment time. Photocatalytic activity was evaluated based on the degradation efficiency of methylene blue (MB) under irradiation of UV-A and fluorescent light. According to XPS analysis, a little amount of nitrogen was found to be doped in the film surface after the modification. As a result, photocatalytic activity increased under irradiation of UV-A and fluorescent light, especially fluorescent light.

• The Transactions of the Korean Institute of Electrical Engineers C
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• v.48 no.6
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• pp.429-435
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• 1999

The $SrTiO_3$ thin films were prepared on Ag/TiN-coated and p-type bare Si(100) substrates by r.f. magnetron sputtering deposition technique. The electrical properties of the deposited films were investigated, which controlling deposition parameters such as substrate temperature and film thickness. The electrical properties ofthe $SrTiO_3$ films were measured using the capacitance-voltage(C-V) technique. The thickness dependence of the electrical properties of the $SrTiO_3$ films was analyzed of the connection with the films in series. The substrate affected the crystal structure and texture characteristics of the $SrTiO_3$ films. The resistivity of the film, sandwiched between Al and Ag films was measured, as a function of the temperature.

• Journal of Surface Science and Engineering
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• v.31 no.3
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• pp.142-150
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• 1998

Stainless steel is being used widely for various purposes due to its good corrosion resistance. There has been much research to produce colored stainless steel by several methods such as anodizing and ion plating. In this experiment, we coated TiN(C,O,H)films SUS304 substraate with the DC magnetron spttering system made by Leybold Heraeus and studied the interlater structure and abhesive strength of the films as a function of additional gases, acetylene, hydrogen and oxygen. When the acetylene gas was added into the chamber, the specimen with the interlayer phase had good adhesion due to the toughness of the $\gamma'-Fe_4N$ plase induced from a solid solution of carbon atoms, while low adhesion appeared on the specimen of the non interlayer phase. The formation of the interlayer phase($\gamma'-Fe_4N$) was due to hydrogen embrittlement and internal stress induced by $\gamma'-Fe_4N$ formation in the interlayer. We could fine the interlayer phase ($\gamma'-Fe_4N$) at the interface between the film and the substrate of the TEM image when $\gamma'-Fe_4N$ was detected by the X-ray duffraction metheod.

• Journal of Surface Science and Engineering
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• v.41 no.5
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• pp.189-193
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• 2008

In this study, we carried out an investigation of the etching characteristics (etch rate, selectivity to $SiO_2$ and $HfO_2$) of TiN thin films in the $CH_4$/Ar inductively coupled plasma. The maximum etch rate of $274\;{\AA}/min$ for TiN thin films was obtained at $CH_4$(80%)/Ar(20%) gas mixing ratio. At the same time, the etch rate was measured as function of the etching parameters such as RF power, Bias power, and process pressure. The X-ray photoelectron spectroscopy analysis showed an efficient destruction of the oxide bonds by the ion bombardment as well as showed an accumulation of low volatile reaction products on the etched surface. Based on these data, the ion-assisted chemical reaction was proposed as the main etch mechanism for the $CH_4$ containing plasmas.