• 한국윤활학회:학술대회논문집
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• 한국윤활학회 2001년도 제33회 춘계학술대회 개최
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• pp.281-286
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• 2001

TiAIN was deposited onto ISO P2O Cutting Insert Tip substrate by FVAS at the substrate temperature of 80$^{\circ}C$. Cutting and wear test have been performed with TiAIN coated and uncoated WC cutting tools, respectively. Uncoated WC cutting tool has been tested under similar cutting condition for comparison. Cutting force and tool wear of coated and uncoated carbide cutting tools were investigated by cutting length. In cutting test, cutting force of the coated insert tip was larger than the uncoated insert tip by tool wear. Configuration and wear of the coated tool were more stable and resistant than the uncoated. In tool life by the tool wear, the coated cutting tool life was rather longer than the uncoated when tested at high speed (V=250 m/min) than low speed (V=200 m/min), Cutting force, tool wear and life were analysised by tool dynamometer amp(3ch) and oscilloscope.

• 한국결정성장학회지
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• 제10권6호
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• pp.378-380
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• 2000

The epitaxial $BaTiO_{3}$ thin film was prepared on the MgO substrate by the coating-pyrolysis process using a mixed solution of Ba-naphthenate and Ti-naphthenate. The crystal structure of the epitaxial $BaTiO_{3}$ thin film was characterized by XRD ${\theta}/2{\theta}$ scan and asymmetric {303} rocking curve scan. The epitaxial $BaTiO_{3}$ thin film had the cubic phase with the lattice parameter of a = c = 0.4018 nm.

• 한국세라믹학회:학술대회논문집
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• 한국세라믹학회 2004년도 추계총회 및 연구발표회 초록집
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• pp.99.1-99.1
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• 2004

• 공업화학
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• 제18권5호
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• pp.438-443
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• 2007

본 연구에서는 티타늄 산화막을 상온에서 HCP (hollow cathode plasma) 반응기에 의하여 증착하였다. HCP 반응기에 대한 시뮬레이션 결과, 전극에서의 열 발생에 관계없이 기판 표면에서의 온도분포는 일정하였다. 그리고 전극과의 거리가 증가하면서 기판 표면에서의 유체는 일정한 것으로 나타났으며, 표면 조도는 거리에 따라 감소하였다. 출력이 증가할수록 산소의 조성은 증가하는 것으로 나타났으며, 출력이 240 watt와 반응 거리가 3 cm에서 Ti와 O의 비율이 1 : 2에 가깝게 결합이 이루어졌다.

• 한국세라믹학회지
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• 제31권8호
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• pp.886-892
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• 1994

Structural and electrical properties of BaTiO3 thin films deposited on Pt/SiO2/Si substrates by RF magnetron sputtering method have been investigated. Crystallization behavior and electrical properties were studied for the films deposited under various sputtering gas compositions (Ar+O2 gas mixture) and substrate temperatures. All the films deposited above 50$0^{\circ}C$ were all crystallized and their preferred orientation changed from (001) to (111) with the addition of oxygen gas. The dielectric constant of films deposited in pure argon was about 110 and showed little dependence on the substrate temperature. But that was increased as the ratio of O2/Ar increased and its substrate temperature dependence was discernible. The highest dielectric constant reached to 550. In addition, the films deposited in mixed gas showed stable dielectric properties against the frequency and temperature.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2002년도 하계학술대회 논문집 Vol.3 No.2
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• pp.694-698
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• 2002

Ti films were deposited onto $100{\times}100$ mm alumina substrates using dc magnetron sputtering under the following conditions; substrate temperature of R.T. ${\sim}400^{\circ}C$, annealing temperature of $100{\sim}400^{\circ}C$ and sputtering gas pressure of $1.3{\sim}3.0{\times}10^{-2}$ Torr. And the films were examined by X-ray diffraction analysis (XRD), scanning electron microscopy(SEM) and 4-point measurement system. The best electrical and structural properties obtained by substrate temperature of ${\sim}200^{\circ}C$, target-substrate distance of ~14 cm and sputtering pressure of $1.3{\sim}1.7{\times}10^{-2}$ Torr. Also at that condition the most excellent adhesion was observed.

• 한국전기전자재료학회논문지
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• 제18권4호
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• pp.327-329
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• 2005

Pb(Zr/sub 0.52/Ti/sub 0.48/)O₃(PZT) thin films were deposited by using a pulsed laser deposition method on a Pt/Ti/SiO₂/Si substrate with (Pb/sub 0.72/La/sub 0.28/)Ti/sub 0.93/O₃ (PLT) buffer and on a Pt/Ti/SiO₂/Si substrate without buffer. These films were annealed in H₂-contained ambient for 30 minutes at the substrate temperature of 400。C to evaluate the forming gas annealing effects. The comparative studies on the ferroelectric properties of these two films were carried out, which are shown that ferroelectric properties, such as remanent polarization didn't change in the case of PLT buffered PZT film while remanent polarization value of PZT film degraded from 20.8 C/㎠ to 7.3 C/㎠. The leakage current became higher in both cases, but that of the more-oriented PZT film had the moderate value of the 10/sup -6/ order of A/㎠. This is mainly because the hydrogen atoms which make the degradation of PZT films cannot infiltrate into the more -oriented PZT film as well as the less-oriented PZT film.

• 한국수소및신에너지학회논문집
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• 제10권4호
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• pp.211-217
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• 1999

수소저장합금 전극을 이용하는 박막전지의 제조를 위하여, TiNi 수소저장합금박막의 적정제조조건에 대하여 연구하였다. TiNi합금박막은 직류 스퍼터링을 이용하여 제조하였다. 증착변수인 아르곤유속, 타겔-기판거리, 직류 전력량등을 변화시키면서, 증착속도를 조사하였으며, Ti와 Ni의 화학조성비, 결정구조등을 조사하였다. 증착속도는 아프곤유속, 타겔 기판거리와 반비례하였으며, 직류전력량의 증가에는 정비례하여 증가하였다. 상온에서 증착후에는 비정질구조를 나타냈으나, 진공열처리 후에 결정질로 바뀌었다.

• 한국수소및신에너지학회논문집
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• 제14권1호
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• pp.8-16
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• 2003

$TiO_2$ thin films were deposited by DC reactive magnetron sputtering with variations in sputtering parameter such as Ar and $O_2$ flow rate, DC power, substrate temperature and magnetic field. Deposition rate, crystal structure, chemical bond of $TiO_2$ films on the deposition conditions were investigated by Alpha-step, X-ray Diffractometer(XRD), X-ray Photoelectron Spectroscopy(XPS). When the DC power was applied at 500watt, deposition rate of $TiO_2$ film was about 480A/min. $TiO_2$ films coated under the deposition condition of 15sccm Ar and 7~10sccm $O_2$ flow rate was only observed anatase phase. With increasing substrate temperature from RT to $300^{\circ}C$, crystal orientation of $TiO_2$ films variously became.

• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제48권6호
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• pp.429-435
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• 1999

The $SrTiO_3$ thin films were prepared on Ag/TiN-coated and p-type bare Si(100) substrates by r.f. magnetron sputtering deposition technique. The electrical properties of the deposited films were investigated, which controlling deposition parameters such as substrate temperature and film thickness. The electrical properties ofthe $SrTiO_3$ films were measured using the capacitance-voltage(C-V) technique. The thickness dependence of the electrical properties of the $SrTiO_3$ films was analyzed of the connection with the films in series. The substrate affected the crystal structure and texture characteristics of the $SrTiO_3$ films. The resistivity of the film, sandwiched between Al and Ag films was measured, as a function of the temperature.