• Title/Summary/Keyword: Ti 전극

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열처리에 따른 Mo 박막의 잔류응력 완화에 관한 연구

  • Kim, Gang-Sam;Jo, Yong-Gi;Song, Yeong-Sik;Im, Tae-Hong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.02a
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    • pp.192-192
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    • 2011
  • Mo 박막은 열적 안전성과 전기 전도성이 우수한 소재로 CIGS 태양전지의 배면전극으로 사용되고 있다. 스퍼터링법에 의한 Mo 박막의 전도성은 공정압력에 민감하여 높은 압력과 낮은 압력에서 이중박막으로 제조되고 있다. 연구에서는 압력에 크게 영향을 받지 않으면서 전도성이 $10{\mu}{\Omega}-cm$ 이하로 우수한 Mo 박막을 얻을 수 있는 아크 이온플레이팅법으로 Mo 박막을 제조하였다. 그러나 Mo 박막 증착시에 나타나는 높은 압축응력은 기재(Soda lime Glass; SLG)와의 밀착성을 떨어뜨렸다. 기재(SLG)와의 밀착성을 확보하기 위해 Ti 중간층($0.3{\mu}m$, $0.9{\mu}m$)을 증착하고 그 위에 Mo 박막을 증착하여 전도성이 우수한 박막을 제조하였으나 여전히 압축잔류응력의 문제점을 보였다. 압축응력의 완화를 위해 CIGS 박막이 제조되는 $550^{\circ}C$의 온도에서 열처리를 1시간 수행하였다. 열처리를 통해 열처리 전과 후에 나타나는 전도성과 잔류응력의 변화를 공정압력(5 mTorr~30 mTorr)별로 알아보았다. 사용된 시험편은 Si wafer, SLG, SUS계 소재를 이용하였으며 공정압력별로 아크 타겟에 인가되는 전류는 100 A로 고정하였고, 바이어스 전압은 0V, -50V를 인가하였다. 열처리 전과 후에 전도성은 크게 변화가 관찰되지 않았으나 잔류응력에는 많은 변화가 관찰 되었다. 잔류응력은 공정압력(5mTorr~30mTorr)별로 응력 완화가 일어났으며, 바이어스 전압이 0V에서 공정압력이 5 mTorr일 때 열처리 전에 측정된 1346 MPa 압축응력이 열처리 후에는 188 MPa의 인장응력을 나타내었다. 이러한 응력 변화에 대해 XRD와 SEM으로 구조분석을 통해 Mo 박막의 결정성과 전도성 및 잔류응력의 상관관계에 대해 알아보았다.

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The Study on the Characteristics of ReRAM with Annealing Temperature and Oxide Thickness (열처리 온도 및 산화층 두께에 따른 ReRAM 특성 연구)

  • Choi, Jin-hyung;Lee, Seung-cheol;Cho, Won-Ju;Park, Jong-tae
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2013.10a
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    • pp.722-725
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    • 2013
  • In this work, we have been analyzed the characteristics of ReRAM with different annealing condition and temperature. The ReRAM devices with top electrode=150nm, bottom electrode=150nm, oxide thickness=70nm and annealing temperature=$500^{\circ}C$, $850^{\circ}C$ have been used in characterization. The Set/Reset voltage, sensing window and resistivity have been characterized. From the measurement results, the Set/Reset voltage and sensing window have been enhanced as the annealing temperature has been increased. But it has been decreased as the temperature performance has been increased. In case of the annealing temperature=$850^{\circ}C$, the variation of Set/Reset voltage was lower than that of other condition. But the variation of sensing window was the lowest when the annealing temperature was $500^{\circ}C$. With considering the variation of Set/Reset voltage and sensing window, the devices annealed at $850^{\circ}C$ showed the best performance to ReRAM.

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MOCVD 법에 의한 Ruthenium 박막의 증착 및 특성 분석

  • 강상열;최국현;이석규;황철성;석창길;김형준
    • Proceedings of the Korean Vacuum Society Conference
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    • 1999.07a
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    • pp.152-152
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    • 1999
  • 1Gb급 이상 기억소자의 캐패시터 재료로 주목받고 있는 (Ba,Sr)TiO3 [BST] 박막의 전극재료로는 Pt, Ru, Ir과 같은 금속전극과 RuO2, IrO2와 산화물 전도체가 유망한 것으로 알려져 있다. 그런데, DRAM의 집적도가 증가하게 되면, BST같은 고유전율 박막을 유전재료로 사용한다 하더라도, 3차원적인 구조가 불가피하게 때문에 기존의 sputtering 방법으로는 우수한 단차피복성을 얻기 힘들므로, MOCVD법이 필수적이다. 본 연구에서는 기존에 연구되었던 Pt에 비해 식각특성이 우수하고, 비교적 낮은 비저항을 갖는 Ru 박막증착에 대한 연구를 행하였다. 본 연구에서는 수직형의 반응기와 저항 가열 방식의 susceptor로 구성된 저압 유기금속 화학증착기를 사용하여 최대 6inch 직경을 갖는 기판 위에 Ru박막을 증착하였다. Precursor로는 기존에 연구된 적이 없는 bis-(ethyo-$\pi$-cyclopentadienyl)Ru (Ru(C5H4C2H5)2, [Ru(EtCp)2])를 사용하였으며, bubbler의 온도는 85$^{\circ}C$로 하였다. Si, SiO2/Si를 사용하였으며, 증착온도 25$0^{\circ}C$~40$0^{\circ}C$, 증착압력 3Torr의 조건에서 Ru 박막을 증착하였다. Presursor를 운반하는 수송기체로는 Ar을 사용하였으며, carbon과 같은 불순물의 제거를 위해 O2를 첨가하였다. 증착된 박막은 XRD, SEM, 4-point probe등을 통해 구조적, 전기적 특성을 평가하였으며, 열역학 계산을 위해서는 SOLGASMIX-PV프로그램을 사용하였다. Ru 박막의 증착에 있어서 산소의 첨가는 필수적이었으며, Ru 박막의 증착속도는 30$0^{\circ}C$~40$0^{\circ}C$의 온도 영역에서 200$\AA$/min으로 일정하였으며, 첨가된 산소의 양이 적을수록 더 치밀하고 평탄한 표면형상을 보였으며, 또한 더 낮은 전기 전도도를 보였다. 그리고 증착된 박막은 12~15$\mu$$\Omega$cm 정도의 낮은 비저항 값을 나타냈으며 이것은 기존의 sputtering 법에 의해 증착된 Ru 박막의 비저항 값들과 비교될만하다. 한편, 높은 온도, 높은 산소분압 조건에서 RuO2의 형성을 관찰하였으며, 이것은 열역학적인 계산을 통해서 잘 설명할 수 있었다.

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Study on Color and Oxidation Thickness for Titanium Spectacle Frames Colored by Anodization (양극산화방법으로 착색한 티타늄 안경테의 산화막 두께에 따른 색상 연구)

  • Hyun, Seung-Cheol;Jin, Moon-Seog;Kim, Yong-Geun
    • Journal of Korean Ophthalmic Optics Society
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    • v.14 no.4
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    • pp.33-37
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    • 2009
  • Purpose: To examine the coloring condition of titanium spectacle frames with various colors by using anodization method. Methods: We made an anodization coater. Platinum plate with $3{\times}3cm^2$ was used for a cathode and titanium spectacle frame specimens was mounted on an anode in an electrolyte. An electric source device were designed to supply steady state current. The color of the coated spectacle frame specimens were measured by a spectrophotometer equipped with an integrating sphere. We use CIE $L^*a^*b$ color system as chromaticity coordinates. Results: The thickness of $TiO_2$ of titanium spectacle frame specimens was varied as controlling current flow time for electrodes. The specimens with various kinds of color as a walnut, a yellow brown, a navy blue, a blue, a light blue, a mung bean, a yellowish green, a light purple, a purple, a flower pink, a bluish green, an emerald, and a green color etc. were obtained. The values of CIE $L^*a^*b^*$ for these specimens were measured and analyzed to be changed clockwise in chromaticity coordinates as the thickness of $TiO_2$ increases. Conclusions: We identified the coloring mechanism by anodization method in titanium spectacle frame specimens.

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$Ta_{2}O_{5}/SiO_{2}$ Based Antifuse Device having Programming Voltage below 10 V (10 V이하의 프로그래밍 전압을 갖는 $Ta_{2}O_{5}/SiO_{2}$로 구성된 안티휴즈 소자)

  • Lee, Jae-Sung;Oh, Seh-Chul;Ryu, Chang-Myung;Lee, Yong-Soo;Lee, Yong-Hyun
    • Journal of Sensor Science and Technology
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    • v.4 no.3
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    • pp.80-88
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    • 1995
  • This paper presents the fabrication of a metal-insulator-metal(MIM) antifuse structure consisting of insulators sandwiched between top electrode, Al, and bottom electrode, TiW and additionally studies on antifuse properties depending on the condition of insulator. The intermetallic insulators, prepared by means of sputter, comprised of silicon oxide and tantalum oxide. In such an antifuse structure, silicon oxide layer is utilized to decrease the leakage current and tantalum oxide layer, of which the dielectric strength is lower than that of silicon oxide, is also utilized to lower the breakdown voltage near 10V. Finally sufficient low leakage current, below 1nA, and low programming voltage, about 9V, could be obtained in antifuse device comprising $Al/Ta_{2}O_{5}(10nm)/SiO_{2}(10nm)/TiW$ structure and OFF resistance of 3$3.65M{\Omega}$ and ON resistance of $7.26{\Omega}$ could be also obtained. This $Ta_{2}O_{5}/SiO_{2}$ based antifuse structures will be promising for highly reliable programmable device.

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Fabrication of pyroelectric IR sensors with PLT thin plates compensating for piezoelectric effect (PLT 박편을 이용한 압전특성이 보상된 초전형 적외선 센서의 제작)

  • Kim, Young-Eil;Roh, Yong-Rae;Choi, Sie-Young
    • Journal of Sensor Science and Technology
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    • v.6 no.1
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    • pp.1-5
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    • 1997
  • Highly sensitive pyroelectric IR sensors were fabricated with La-modified $PbTiO_{3}(PLT)$ thin plates compensating for piezoelectric effect. The device was fabricated in a dual form by placing two PLT cells, each of $1{\times}2\;mm^{2}$, side by side with appropriate electrode configuration. The dual element sensor had a signal to noise ratio of about 350 that was much larger than that of single element sensors. Further the dual element sensors exhibited excellent pyroelectric properties such as a large voltage responsivity of 2400 V/W, a pyro-coefficient of $4.6{\times}10^{-8}\;C/cm^{2}K$, a voltage figure of merit of $4.2{\times}10^{-11}\;Ccm/J$, and a small thermal time constant of 8.7 msec. It was confirmed through experiments that the dual element sensor was applicable to detect the two-dimensional moving direction of human beings.

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Terahertz Generation and Detection Characteristics of InGaAs

  • Park, Dong-U;Han, Im-Sik;Kim, Chang-Su;No, Sam-Gyu;Ji, Yeong-Bin;Jeon, Tae-In;Lee, Gi-Ju;Kim, Jin-Su;Kim, Jong-Su
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.08a
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    • pp.161-161
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    • 2012
  • 본 연구에서는 InGaAs을 이용한 테라헤르쯔(THz) 발생과 검출 특성을 GaAs에 의한 특성과 비교, 조사하였다. 고온성장(HTG, $530^{\circ}C$) InGaAs를 이용하여 photo-Dember (pD) 효과(표면방출)에 의한 THz 발생 특성을 조사하였으며, THz 검출 특성에는 저온성장(LTG, $530^{\circ}C$) InGaAs: Be을 이용하였다. HTG-InGaAs 기판 위에 패턴한 금속전극 (Ti/Au, ${\sim}500{\times}500{\mu}m$)의 가장자리에 Ti: Sapphire fs 펄스 레이저(30 ps/90 MHz)를 조사하여 LTG-GaAs 수신기(Rx)로 THz를 검출, 전류신호(a)와 Fourier transform (FT) 주파수 스펙트럼(b)을 얻었다. HTG-InGaAs에서 얻은 파형은 SI-GaAs에서와 거의 비슷한 모양이었으나, 주파수 범위(0.5~2 THz)는 SI-GaAs의 1~3 THz 보다 좁고 FT 스펙트럼의 세기는 약 1/8 정도로 낮았다. LTG-InGaAs 수신기 (Rx)의 안테나는 쌍극자 ($5/20{\mu}m$) 형태를 가지고 있으며, SI-GaAs Tx로 발생시킨 광원을 사용하여 THz 영역의 검출 특성을 조사하였다. HTG-InGaAs Tx 및 LTG-InGaAs Rx의 이득은 각각 약 $5{\times}10^{-8}$ A/W과 $2.5{\times}10^{-8}$ A/W인 것으로 분석되었다.

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A Study on the Switching and Retention Characteristics of PLT(5) Thin Films (PLT(5) 박막의 Switching 및 Retention 특성에 관한 연구)

  • Choi Joon Young;Chang Dong Hoon;Kang Seong Jun;Yoon Yung Sup
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.42 no.1
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    • pp.1-8
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    • 2005
  • We fabricate PLT(5) thin film on Pt/TiO/sub x/SiO₂/Si substrate by using sol-gel method and investigate leakage current, switching and retention properties. The leakage current density of PLT(5) thin film is 3.56×10/sup -7/A/㎠ at 4V. In the examination of switching properties, pulse voltage and load resistance were 2V~5V and 50Ω~3.3kΩ, respectively. Switching time has a tendency to decrease from 0.52㎲ to 0.14㎲ with the increase of pulse voltage, and also the time increases from 0.14㎲ to 13.7㎲ with the increase of load resistance. The activation energy obtained from the relation of applied pulse voltage and switching time is about 135kV/cm. The error of switched charge density between hysteresis loop and experiment of polarization switching is about 10%. Also, polarization in retention decreases as much as about 8% after l0/sup 5/s.

Humidity Sensitive Characterization by Electrode Pattern on the Capacitive Humidity Sensor Using Polyimide (폴리이미드 용량형 습도센서의 전극 패턴에 따른 감습 특성)

  • Park, Sung-Back;Shin, Hoon-Kyu;Lim, Jun-Woo;Chang, Sang-Mok;Kwon, Young-Soo
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.27 no.9
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    • pp.566-570
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    • 2014
  • Electrode pattern effects on the capacitive humidity sensor were investigated. The fabrication of the capacitive humidity sensor was formed with three steps. The bottom electrode was formed on the silicon substrate with Pt/Ti thin layer by using shadow mask and e-beam evaporator. The photo sensitive polyimide was formed on the bottom electrode by using photolithography process as a humidity sensitive thin film. The upper electrode was formed on the polyimide thin film with Pt/Ti thin layer by using e-beam evaporator and lift-off method. Three electrode patterns, such as circle, square, and triangle pattern, were used and changed the sizes to investigate the effects. The capacitances of the sensors were decreased 622 to 584 pF with the area decreament of patterns 250,000 to $196,250{\mu}m^2$. From these results, a capacitive humidity sensor with photo sensitive polyimide is expected to be applied to a high sensitive humidity sensor.

Investigation of Ni/Cu Contact for Crystalline Silicon Solar Cells (결정질 실리콘 태양전지에 적용하기 위한 도금법으로 형성환 Ni/Cu 전극에 관한 연구)

  • Kim, Bum-Ho;Choi, Jun-Young;Lee, Eun-Joo;Lee, Soo-Hong
    • 한국신재생에너지학회:학술대회논문집
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    • 2007.06a
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    • pp.250-253
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    • 2007
  • An evaporated Ti/Pd/Ag contact system is most widely used to make high-efficiency silicon solar cells, however, the system is not cost effective due to expensive materials and vacuum techniques. Commercial solar cells with screen-printed contacts formed by using Ag paste suffer from a low fill factor and a high shading loss because of high contact resistance and low aspect ratio. Low-cost Ni and Cu metal contacts have been formed by using electroless plating and electroplating techniques to replace the Ti/Pd/Ag and screen-printed Ag contacts. Ni/Cu alloy is plated on a silicon substrate by electro-deposition of the alloy from an acetate electrolyte solution, and nickel-silicide formation at the interface between the silicon and the nickel enhances stability and reduces the contact resistance. It was, therefore, found that nickel-silicide was suitable for high-efficiency solar cell applications. The Ni contact was formed on the front grid pattern by electroless plating followed by anneal ing at $380{\sim}400^{\circ}C$ for $15{\sim}30$ min at $N_{2}$ gas to allow formation of a nickel-silicide in a tube furnace or a rapid thermal processing(RTP) chamber because nickel is transformed to NiSi at $380{\sim}400^{\circ}C$. The Ni plating solution is composed of a mixture of $NiCl_{2}$ as a main nickel source. Cu was electroplated on the Ni layer by using a light induced plating method. The Cu electroplating solution was made up of a commercially available acid sulfate bath and additives to reduce the stress of the copper layer. The Ni/Cu contact was found to be well suited for high-efficiency solar cells and was successfully formed by using electroless plating and electroplating, which are more cost effective than vacuum evaporation. In this paper, we investigated low-cost Ni/Cu contact formation by electroless and electroplating for crystalline silicon solar cells.

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