• Title/Summary/Keyword: Threshold model

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A Perceptual Rate Control Algorithm with S-JND Model for HEVC Encoder (S-JND 모델을 사용한 주관적인 율 제어 알고리즘 기반의 HEVC 부호화 방법)

  • Kim, JaeRyun;Ahn, Yong-Jo;Lim, Woong;Sim, Donggyu
    • Journal of Broadcast Engineering
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    • v.21 no.6
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    • pp.929-943
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    • 2016
  • This paper proposes the rate control algorithm based on the S-JND (Saliency-Just Noticeable Difference) model for considering perceptual visual quality. The proposed rate control algorithm employs the S-JND model to simultaneously reflect human visual sensitivity and human visual attention for considering characteristics of human visual system. During allocating bits for CTU (Coding Tree Unit) level in a rate control, the bit allocation model calculates the S-JND threshold of each CTU in a picture. The threshold of each CTU is used for adaptively allocating a proper number of bits; thus, the proposed bit allocation model can improve perceptual visual quality. For performance evaluation of the proposed algorithm, the proposed algorithm was implemented on HM 16.9 and tested for sequences in Class B and Class C under the CTC (Common Test Condition) RA (Random Access), Low-delay B and Low-delay P case. Experimental results show that the proposed method reduces the bit-rate of 2.3%, and improves BD-PSNR of 0.07dB and bit-rate accuracy of 0.06% on average. We achieved MOS improvement of 0.03 with the proposed method, compared with the conventional method based on DSCQS (Double Stimulus Continuous Quality Scale).

Electrical Characteristics of IGBT for Gate Bias under ${\gamma}$ Irradiation (게이트바이어스에서 감마방사선의 IGBT 전기적특성)

  • Lho, Young-Hwan;Lee, Sang-Yong;Kim, Jong-Dae
    • Proceedings of the KIEE Conference
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    • 2008.10b
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    • pp.165-168
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    • 2008
  • The experimental results of exposing IGBT (Insulated Gate Bipolar Transistor) samples to gamma radiation source show shifting of threshold voltages in the MOSFET and degradation of carrier mobility and current gains. At low total dose rate, the shift of threshold voltage is the major contribution of current increases, but for more than some total dose, the current is increased because of the current gain degradation occurred in the vertical PNP at the output of the IGBTs. In the paper, the collector current characteristics as a function of gate emitter voltage (VGE) curves are tested and analyzed with the model considering the radiation damage on the devices for gate bias and different dose. In addition, the model parameters between simulations and experiments are found and studied.

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Network Effect and the Late Take-off Phenomenon in the Diffusion of Telecommunication Services (통신 서비스의 늦은 수요확산 현상과 네트워크 효과)

  • 임병락;최문기
    • Proceedings of the Korean Operations and Management Science Society Conference
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    • 2001.10a
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    • pp.342-345
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    • 2001
  • Telecommunication services are distinctive in that their adoptions are influenced by network effect resulting in 'the late take-off Phenomenon' and the 'critical mass' problem. In this paper we examined, so called, 'the late take-off phenomenon' in the diffusion process of telecommunication services. We compared the parameters of the diffusion process of consumer durables with those of fax services in the US and Korea. By analyzing the parameters of a new diffusion model based on the threshold model proposed by Markus, We found that 'the late take-off phenomenon' resulted from the low heterogeneity of the threshold distribution for the potential adopters.

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Nonlinear approach to modeling heteroscedasticity in transfer function analysis (시계열 전이함수분석 이분산성의 비선형 모형화)

  • 황선영;김순영;이성덕
    • The Korean Journal of Applied Statistics
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    • v.15 no.2
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    • pp.311-321
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    • 2002
  • Transfer function model(TFM) capturings conditional heteroscedastic pattern is introduced to analyze stochastic regression relationship between the two time series. Nonlinear ARCH concept is incorporated into the TFM via threshold ARCH and beta- ARCH models. Steps for statistical analysis of the proposed model are explained along the lines of the Box & Jenkins(1976, ch. 10). For illustration, dynamic analysis between KOSPI and NASDAQ is conducted from which it is seen that threshold ARCH performs the best.

Development of customized control modules for the model forecasting the occurrence of potato late blight (감자역병 예측모델을 위한 맞춤통보용 방제모듈 개발에 대한 고찰)

  • Shim, Myung Syun;Lim, Jin Hee;Kim, Jeom-Soon;Yoo, Seong Joon
    • Korean Journal of Agricultural Science
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    • v.41 no.1
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    • pp.23-27
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    • 2014
  • Potato late blight occurrence is caused by various environmental factors, and the progress can be regularly predicted so that several predictive models have been developed. The models predict the timing of the disease occurrence, but they do not include the methods of the disease control. Effective fungicide control, economic threshold, prediction models were investigated in the study to reflect on customized control modules for the model forecasting the occurrence of potato late blight.

Development of customized control modules for the model forecasting the occurrence of phytophthora blight on hot pepper (고추역병 예측모델을 위한 맞춤통보용 방제모듈 개발에 대한 고찰)

  • Shim, Myung Syun;Lim, Jin Hee;Kim, Jeom-Soon;Yoo, Seong Joon
    • Korean Journal of Agricultural Science
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    • v.41 no.1
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    • pp.29-34
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    • 2014
  • Phytophthora blight occurrence is caused by various environmental factors, and the progress can be regularly predicted so that several predictive models have been developed. The models predict the timing of the disease occurrence, but they do not include the methods of the disease control. Effective fungicide control, control threshold, prediction models were investigated in the study to reflect on customized control modules for the model forecasting the occurrence of Phytophthora blight on hot pepper.

An Intelligent Iris Recognition System (지능형 홍채 인식 시스템)

  • Kim, Jae-Min;Cho, Seong-Won;Kim, Soo-Lin
    • Journal of the Korean Institute of Intelligent Systems
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    • v.14 no.4
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    • pp.468-472
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    • 2004
  • This paper presents an intelligent iris recognition system which consists of quality check, iris localization, feature extraction, and verification. For the quality check, the local statistics on the pupil boundary is used. Gaussian mixture model is used to segment and localized the iris region. The feature extraction method is based on an optimal waveform simplification. For the verification, we use an intelligent variable threshold.

A New Semi-Empirical Model for the Backgating Effect on the Depletion Width Modulation in GaAs MESFET's

  • Murty, Neti V.L. Narasimha;Jit, S.
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.8 no.1
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    • pp.104-109
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    • 2008
  • A simple and efficient way of modeling backgating in GaAs MESFET's is presented through depletion width modulation of Schottky junction and channel-substrate interface. It is shown semi-empirically that such a modulation of depletion widths causes serious troubles in designing precision circuits since backgating drastically reduces threshold voltage of MESFET as well as drain current. Finally, some of the results are compared with reported experimental results. This model may serve as a starting point for rigorous characterization of backgating effect on various device parameters of GaAs MESFET's.

Nonlinear Noise-Induced Transitions in Active Rotator Model

  • Kim, Seung-Hwan;Park, Seon-Hee;Ryu, Chang-Su
    • ETRI Journal
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    • v.20 no.2
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    • pp.214-230
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    • 1998
  • We investigate noise-induced transitions in active rotator model with a fluctuating threshold in the presence of an additive noise. The fluctuation of the threshold depends on the additive noise in a nonlinear fashion. In the white-noise limit of the fluctuation, the Fokker-Planck equation of the system reduces to that of the system with correlated linear fluctuation implying that the nonlinearity may be transformed into the correlation of linear noises. We also investigate the system with a nonlinear colored noise which depends on the additive noise as its square. The system shows a single peak, two peaks, and three peaks in its steady state probability distribution according to the noise intensities and the correlation time whose change leads to peak-creating, peak-splitting, and peak-merging transitions.

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Periodic Inspection of a Random Shock Model

  • Lee, Eui Yong;Lee, Jiyeon;Sohn, Joong Kweon
    • Journal of Korean Society for Quality Management
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    • v.24 no.3
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    • pp.31-36
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    • 1996
  • A Markovian stochastic model for a system subject to random shocks is considered. Each shock arriving according to a Poisson process decreases the state of the system by a random amount. A repairman arrives at the system periodically for inspection and repairs the system only if the state is below a threshold. Costs are assigned to each inspection of the repairman, to each repair, and to the system being in bad states below the threshold. The expected long run average cost is obtained and compared with that of the random inspection introduced by Lee and Lee(1994).

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