• 대한조선학회논문집
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• 제43권4호
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• pp.494-503
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• 2006

Inherent damage zone model is presented to explain the fatigue properties near the fatigue limit and the crack growth threshold consistently Inherent damage zone model assumes that the stress at a point which is located at a small distance, $r_0$, an inherent length of the material that represents the size of effective damage zone, from the crack initiation position governs the fatigue characteristics regardless of the geometric configuration of the specimen; smooth specimen, notched specimen or cracked specimens with short and long crack length. A special feature of the paper is using the exact stress distributions of notched and cracked specimens at the strength evaluations. Analytical elastic solutions by Neuber and Westergaard are employed for this purpose Relationship between fatigue limit of smooth specimen and threshold stress of cracked specimen, occurrence condition of non-propagating crack at the root of elliptic notch and circular hole and relationship between stress concentration factor and fatigue notch factor are discussed quantitatively based on the proposed model.

• Composites Research
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• 제17권5호
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• pp.61-67
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• 2004

본 연구에서는 전자파 차폐용 도전성 개스킷 소재로 활용할 수 있는 은입자 충전 실리콘 복합 페이스트에 대한 전기전도성 및 응력-변형율 특성을 분석하였다. 불규칙한 구형의 은(Ag)입자와 상온습기경화형(RTV) 실리콘수지를 도입하여 복합 페이스트의 퍼콜레이션 농도(임계 농도)를 전기전도도 측정 결과로부터 결정하였다. 약 28%의 은입자 함량에서 퍼콜레이션 현상이 발생하였으며, 이 농도에서 급격한 감소를 보이는 은입자/실리콘 복합 페이스트의 체적 비저항, 인장강도 및 연신률의 특성 변화에 관하여 고찰하였다. 또한, 커플링제의 선택적 방법을 통해 퍼콜레이션 농도 이상으로 충전된 복합 페이스트의 응력-변형율 특성을 효과적으로 개선할 수 있음을 제시하여 주었다.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2007년도 7th International Meeting on Information Display 제7권2호
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• pp.1176-1178
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• 2007

A novel integrated a-Si:H gate driver with high reliability has been designed and simulated. Since the a-Si:H TFT is easily degraded by gate bias stress, we should optimize the circuit considering the threshold voltage shift. The conventional circuit shows voltage drop at the input stage by threshold voltage of the TFT, however, the proposed circuit dose not shows voltage drop and keeps constant regardless of threshold voltage shift of the TFT.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2003년도 하계종합학술대회 논문집 II
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• pp.1105-1108
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• 2003

In this paper, we have fabricated the hydrogenated n-channel polysilicon thin film transistor (TFT) with LDD structure and have analyzed the hot carrier degradation characteristics by electrical stress. We have compared the threshold voltage (Vth), sub-threshold slope (S), and trans-conductance (Gm) for devices with LDD (Lightly Doped Drain) structure and non-LDD at same active sizes. We have analyzed the hot carrier effects by the hydrogenation in devices. As a analyzed results, the threshold voltage, sub-threshold slope for n-channel poly-si TFT were increased, trans-conductance was decreased. The effects of hydrogenation in n-channel poly-si TFT with LDD structure were shown the lower variations of characteristics than devices of the non-LDD structure with nomal process.

• 한국해양공학회지
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• 제35권5호
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• pp.327-335
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• 2021

Microcracks can rapidly grow and develop in high-strength steels used in offshore structures. It is important to render these microcracks harmless to ensure the safety and reliability of offshore structures. Here, the dependence of the aspect ratio (As) of the maximum depth of harmless crack (a_hlm) was evaluated under three different conditions considering the threshold stress intensity factor (Δk_th) and residual stress of offshore structural steel F690. The threshold stress intensity factor and fatigue limit of fatigue crack propagation, dependent on crack dimensions, were evaluated using Ando's equation, which considers the plastic behavior of fatigue and the stress ratio. a_hlm by peening was analyzed using the relationship between Δk_th obtained by Ando's equation and Δk_th obtained by the sum of applied stress and residual stress. The plate specimen had a width 2W = 12 mm and thickness t = 20 mm, and four value of As were considered: 1.0, 0.6, 0.3, and 0.1. The a_hlm was larger as the compressive residual stress distribution increased. Additionally, an increase in the values of As and Δk_th(l) led to a larger a_hlm. With a safety factor (N) of 2.0, the long-term safety and reliability of structures constructed using F690 can be secured with needle peening. It is necessary to apply a more sensitive non-destructive inspection technique as a non-destructive inspection method for crack detection could not be used to observe fatigue cracks that reduced the fatigue limit of smooth specimens by 50% in the three types of residual stresses considered. The usefulness of non-destructive inspection and non-damaging techniques was reviewed based on the relationship between a_hlm, a_NDI (minimum crack depth detectable in non-destructive inspection), a_{cr N} (crack depth that reduces the fatigue limit to 1/N), and As.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2006년도 6th International Meeting on Information Display
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• pp.1701-1703
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• 2006

Here we describe a novel driving scheme in the form of negative AC bias stress (NAC) to compensate shift in the threshold voltage for hydrogenated amorphous silicon (${\alpha}$-Si:H) thin film transistor (TFT) for AMOLED applications. This scheme preserves the threshold voltage shift of ${\alpha}$-Si:H TFT for infinitely long duration of time(>30,000 hours) and thereby overall performance, without using any additional TFTs for compensation. We briefly describe about the possible driving schemes in order to implement for real time AMOLED applications. We attribute most of the results based on concept of plugging holes and electrons across the interface of the gate insulator in a controlled manner.

• E2M - 전기 전자와 첨단 소재
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• 제8권3호
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• pp.357-361
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• 1995

An experiment on characteristics of nMOSFET's in the long stress condition with the maximum of the substrate current has been carried out in order to study on the degradation due to the hot-carrier effect. Based on the measured result of the threshold voltage, the damage is mostly due to the hole injection into the oxide. After long stress, it was shown that the drain current increased at low gate voltages and hence decreased at high gate voltages.

• Asian-Australasian Journal of Animal Sciences
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• 제28권7호
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• pp.943-950
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• 2015

Heat stress has adverse effects on fertility of dairy animals. Decline in fertility is linearly associated with an increase in combination of both temperature and humidity. The purpose of this study was to investigate the relationship between temperature humidity index (THI) and the pregnancy rate of Murrah buffaloes in a subtropical climate. The effects of genetic and non-genetic factors viz., sire, parity, period of calving and age group at first calving were found non-significant on pregnancy rate. The effect of THI was found significant (p<0.001) on pregnancy rate of Murrah buffaloes calved for first time and overall pregnancy rate. The threshold THI affecting the pregnancy rate was identified as THI 75. The months from October to March showed THI<75 and considered as non heat stress zone (NHSZ), while months from April to September were determined as heat stress zone (HSZ) with $THI{\geq}75$. The lowest overall pregnancy rate (0.25) was obtained in July with THI 80.9, while the highest overall pregnancy rate (0.59) was found in November with THI 66.1. May and June were identified as critical heat stress zone (CHSZ) within the HSZ with maximum decline (-7%) in pregnancy rate with per unit increase in THI. The highest overall pregnancy rate was estimated as 0.45 in NHSZ with THI value 56.7 to 73.2. The pregnancy rate was found to have declined to 0.28 in HSZ with THI 73.5 to 83.7. However, the lowest pregnancy rate was estimated as 0.27 in CHSZ with THI value 80.3 to 81.6.

• 한국자동차공학회논문집
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• 제16권5호
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• pp.1-7
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• 2008

A study of new materials that are light-weight, high in strength has become vital to the machinery of auto industries. But then, there are a lot of problems with developing such materials that require expensive tools, and a great deal of time and effort. Therefore, the improvement of fatigue strength and fatigue life are mainly focused on by adopting residual stress. And Influence of corrosive condition for corrosion fatigue crack was investigated, after immersing in 3.5%NaCl, $10%HNO_3$+3.5%HF, $6%FeCl_3$. The immersion period was performed for 365days. The compressive residual stress was imposed on the surface according to each shot velocity based on shot peening, which is the method of improving fatigue life and strength. Fatigue life shows more improvement in the shot peened material than in the un peened material in corrosion conditions. The threshold stress intensity factor range was decreased in corrosion environments over ambient. Compressive residual stress of surface on the Shot-peen processed operate resistance force of fatigue crack propagation. The fatigue crack growth rate of the Shot-peened material was lower than that of the un peened material. Also m, fatigue crack growth exponent and number of cycle of the shot peened material was higher than that of the un peened material. That is concluded from effect of da/dN.

• 한국해양공학회:학술대회논문집
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• 한국해양공학회 2002년도 추계학술대회 논문집
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• pp.341-346
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• 2002

In this study, an effect that compressive residual stress formed by shot-peening the surface of spring steel(JISG SUP-9) at each shot velocity(1800, 2200, 2600, 3000rpm) on the fatigue crack growth property and threshold stress intensity factor, ${\Delta}K_{th}$, was examined. Followings are the result (1) Compressive residual stress on surface of specimen was determined at each -601 MPa(1800rpm), -638 MPa(2200rpm), -587 MPa (2600rpm), -550 MPa(3000rpm) by shot velocity of shot peening and threshold stress intensity factor, ${\Delta}K_{th}$, fatigue crack growth rate, da/dN, on fatigue crack growth is obstructed by the compressive residual stress was determined at each $5.619\;MPa\sqrt{m}$(Un-peening), $8.319\;MPa\sqrt{m}$(1800rpm), $8.797\;MPa\sqrt{m}$(2200rpm), $7.835\;MPa\sqrt{m}$(2600rpm), $7.352\;MPa\sqrt{m}$(3000rpm) (2) Existing compressive residual stress by effect of shot velocity of shot-peening on relation of crack length. a, and number of cycle, N, was 2 times progressed in case of 2200rpm than specimen of Un-peening on fatigue life. And fatigue life was 1.6 times progressed incase of 3000rpm by Over peening. (3) Fatigue life of Material on Paris' law, $da/dN=C({\Delta}K)^m$, that effect of material constant, C, and fatigue crack growth exponent, m, was influenced by effect of. C and m.