• Journal of Korean Society for Quality Management
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• v.38 no.2
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• pp.171-179
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• 2010

Pearn et al.(2002) supposed the $C_{pp}$ multiple process performance analysis chart. This chart displays multiple processes with the process variation and process departure on one single chart. But, this chart can not display the distribution of the process variation and process departure and is inappropriate for processes with non-normal distributions. With bootstrapping method, we can display the distribution of the process variation and process departure on the $C_{pp}$ multiple process performance analysis chart.

• Industrial Engineering and Management Systems
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• v.16 no.1
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• pp.109-117
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• 2017

In this article, a control chart based on multiple dependent (or deferred) state sampling for the gamma distributed quality characteristic is proposed using the gamma to normal transformation. The proposed control chart has two pairs of control limits, which can be determined by considering the in-control average run length (ARL). The shift in the scale parameter of a gamma distribution is considered and the out-of-control ARL is evaluated. The performance of the proposed chart has been shown for different levels of the parameters of the proposed control chart. It is also shown that the proposed chart is better than the Shewhart chart in terms of ARLs. A case study with a real data has been included for the practical usage of the proposed scheme.

• Journal of the Korean Operations Research and Management Science Society
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• v.39 no.1
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• pp.1-12
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• 2014

This article proposes a variable sampling interval (VSI) $\bar{X}$ control chart using weighted standard deviation (WSD) method for skewed populations. The WSD method decomposes the standard deviation of a quality characteristic into upper and lower deviations and adjusts control limits and warning limits of a control chart in accordance with the direction and degree of skewness. A control chart constant is derived for estimating the standard deviation of skewed distributions with the mean of sample standard deviations. The proposed chart is compared with the conventional VSI $\bar{X}$ control chart under some skewed distributions. Simulation study shows that the proposed WSD VSI chart can control the in-control average time to signal (ATS) as an adequate level better than the conventional VSI chart, and the proposed chart can detect a decrease in the process mean of a quality characteristic following a positively skewed distribution more quickly than the standard VSI chart.

• Journal of Korean Society for Quality Management
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• v.45 no.2
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• pp.209-225
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• 2017

Purpose: Since traditional p chart is unable to deal with the variation of attribute data, this paper proposes a new attribute control chart for nonconforming proportions incorporating overdispersion with a beta-binomial model. Methods: Statistical theories for control chart developed under the beta-binomial model and a new approach using this control chart are presented Results: False alarm probabilities of p chart with the beta-binomial model are evaluated and demerits of p chart under overdispersion are discussed from three examples. Hence a concrete procedure for the proposed control chart is provided and illustrated with examples Conclusion: The proposed chart is more useful than traditional p chart, individual chart to treat observed proportions nonconforming as variable data and Laney p' chart.

• Journal of Korean Society for Quality Management
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• v.33 no.1
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• pp.1-10
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• 2005

This paper develops a new VSI $\={X}-CRL$ synthetic control chart that considers convenience of use in the field, and perception of change of process applying VSI techniques to synthetic control chart, simultaneously. We found the optimal sampling interval and various control limit factor of the suggested chart using markov chain. Comparison and analysis is carried out between synthetic VSI $\={X}-CRL$ chart and other chart in the statistical aspect; $\={X}$ control chart, VSI $\={X}$ chart, another synthetic chart. In case that the process follows normal distribution, the proposed VSI $\={X}-CRL$ synthetic control chart in detecting process mean shift showed the best performance in aspect of statistical performance, regardless of control limit L of CRL/S control chart.

• Proceedings of the Korean Society for Quality Management Conference
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• 1998.11a
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• pp.198-207
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• 1998

The p chart approximate to the normal distribution has a difficulty to analyze the process condition precisely when the negative LCL is occurred. Furthermore, the probability of Type I error increases compared with using its original binomial distribution. For a long time the p chart has been used as approximated to the normal distribution because of its easy use. However, it becomes rapid and convenient to calculate the binomial distribution through the development of computer and software, so it is strongly suggested to use the binomial distribution determining control limits to reduce the probability of Type I error. In this study, I suggest that the control limits can be designed in use of binomial distribution and they can be utilized without special software by illustrating the certain work for establishing p-chart with the commercial one(EXCEL).

• Journal of Korean Society for Quality Management
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• v.14 no.2
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• pp.2-8
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• 1986

This thesis is concerned with the design of control chart based on the sample median which is easy to use in practical situations and to analyze the properties for non-normally distributed Weibull process. In this cases are use to the quality characteristics of the process are not normally distributed but skewed due to the intermitted production, small lot size and sample size is small one n=3 or n=5, etc. And when it relates unsymmetrically distributed process, model designed median control chart is more effective than Shewhart $\bar{x}$-chart which assumed on normal distribution, when we exactly should be known Weibull distribution or estimated. The median control chart in this thesis is more robustness compared with other conventionally developed control chart.

• Proceedings of the Korean Society for Quality Management Conference
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• 2007.04a
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• pp.287-296
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• 2007

Pearn et al.(2002) supposed the $C_{pp}$ multiple process performance analysis chart. This chart display multiple processes with the process variation and process departure on one single chart. But, this chart can not display the distribution of the process variation and process departure. With bootstrapping method, we can display the distribution of the process variation and process departure on the $C_{pp}$ multiple process performance analysis chart.

• Journal of Korean Society for Quality Management
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• v.14 no.1
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• pp.11-18
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• 1986

Whereas in non-symmetrical distribution manufacturing process they are not plotted relatively on the centeral line but plotted on the skew of right-hand side or left-hand side. That is to say, for the prupose of producing either upper-specification-oriented items or lower-specification-oriented items, and when we carry out tighter control so as to have them pass only its specifications, the distribution shape naturally has a non-normal distribution. In these cases, we could use either compressed control limits or variable transformed logarithm control charts. It the above mentioned methods were not available, we should use special purpose control chart-Mode control chart or Gram-Charlier control chart. These are proper methods for manufacturing process control which uses control chart method. In spite of these methods, domestic manufacturing and mining companies are utterly ignorant about these methods. That invites practical problems in their companies. To enhance this improvements, I proved the property of practical applications of control chart method by comparing and analyzing the case studies of practical application of speical purpose control chart method, and also by introducing the application methods.

• Journal of Korean Society for Quality Management
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• v.25 no.3
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• pp.62-73
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• 1997

Previous VSI control chart works have been done on quality variable whose distribution is normal. But there are many situations in which hte assumption of not a, pp.opriate. Also, in many industrial processes, the interest is to monitor the number of defectives. In this paper, we will take the existing properties of VSI control chart developed for the normal distribution and a, pp.y them to the np-chart based on the discrete binomial distribution. We will consider the CUSUM chart for the number of defectives. Here, the interesting object is to compute the VSI ATS for CUSUM control chart using Markov chain a, pp.oach and to compare FSI ATS and VSI ATS.