• Journal of the Korea Institute of Information and Communication Engineering
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• v.11 no.12
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• pp.2311-2318
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• 2007

Finite failure NHPP models presented in the literature exhibit either constant, monotonic increasing or monotonic decreasing failure occurrence rates per fault. Accurate predictions of software release times, and estimation of the reliability and availability of a software product require Release times of a critical element of the software testing process : test coverage. This model called Enhanced non-homogeneous Poission process(ENHPP). In this paper, exponential coverage and S-shaped model was reviewed, proposes the Kappa coverage model, which make out efficiency application for software reliability. Algorithm to estimate the parameters used to maximum likelihood estimator and bisection method, model selection based on SSE statistics and Kolmogorov distance, for the sake of efficient model, was employed. Numerical examples using real data set for the sake of proposing Kappa coverage model was employed. This analysis of failure data compared with the Kappaa coverage model and the existing model(using arithmetic and Laplace trend tests, bias tests) is presented.

• Journal of Information Processing Systems
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• v.6 no.2
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• pp.197-208
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• 2010

Test scenarios can be derived based on some system models for requirements validation purposes. Model-based test suite reduction aims to provide a smaller set of test scenarios which can preserve the original test coverage with respect to some testing criteria. We are proposing to apply Formal Concept Analysis (FCA) in analyzing the association between a set of test scenarios and a set of transitions specified in a state machine model. By utilizing the properties of concept lattice, we are able to determine incrementally a minimal set of test scenarios with adequate test coverage.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.35C no.3
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• pp.1-15
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• 1998

In this paper, we propose a partial scan test method which can be applied to large VLSI designs. In this method, it is not necessary to hold neither scanned nor unscanned flip-flops during scan in, test application,or scan out. This test method requires almost identical design for testability modification and test wave form when compared to the full scan test method, and the method is applicable to large VLSI chips. The well known FAN algorithm has been modified to devise to sequential ATPG algorithm which is effective for the proposed test method. In addition, a partial scan algorithm which is effective for the proposed test method. In addition, a partial algorithm determined a maximal set of flip-flops which gives high fault coverage when they are unselected. The experimental resutls show that the proposed method allow as large as 20% flip-flops to remain unscanned without much decrease in the full scan fault coverage.

• Journal of the Semiconductor & Display Technology
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• v.22 no.1
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• pp.49-53
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• 2023

In this paper, we propose an antirandom pattern-based test method considering power consumption to compensate for the problem that the fault coverage through random test decreases or the test time increases significantly when the DUT circuit structure is complex or large. In the proposed method, a group unit test pattern generation process and rearrangement process are added to improve the problems of long calculation time and high-power consumption, which are disadvantages of the previous antirandom test.

• The Journal of the Korea Contents Association
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• v.12 no.11
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• pp.39-48
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• 2012

It is well known that software testing amounts for a significant portion of software development cost. In order to reduce the cost of software testing. a lot of researches on automated test data generation have been performed. Sophisticated tools for performing symbolic execution or solving a system of path constraints are required to support automated test data generation. Developing or purchasing those tools leads to another factor of increasing the cost involving software testing. In this paper, we propose a dynamic test data generation approach that does not depend on symbolic execution or constraint solving at all. The proposed approach extends Korel's path-oriented method to satisfy the branch coverage criterion effectively. We conducted an experiment to evaluate the effectiveness of the proposed technique with a triangle classification program to show that branch coverage can be easily achieved.

• Proceedings of the IEEK Conference
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• 2000.06b
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• pp.137-140
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• 2000

In this paper, we have proposed an efficient test generation method for asynchronous circuits. The test generation is based on specification level, especially on Signal Transition Graph(STG)〔1〕 which is a kind of specification method for asynchronous circuits. To conduct a high-level test generation, we have defined a high-level fault model, called single State Transition Fault(STF) model on STG and proposed a test generation algorithm for STF model. The effectiveness of the proposed fault model and its test generation algorithm is shown by experimental results on a set of benchmarks given in the form of STG. Experimental results show that the generated test for the proposed fault model achieves high fault coverage over single input stuck-at fault model with low cost. We have also proposed extended STF model with additional gate-level information to achieve higher fault coverage in cost of longer execution time.

• Journal of Institute of Control, Robotics and Systems
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• v.16 no.8
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• pp.786-793
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• 2010

This paper proposes a new method called the path-history coverage to generate a test suite to test the state transition behavior of the robot SW component. The proposed method generate a test suite which includes abnormal state transitions based on FSM of target component. Especially the proposed method covers the disadvantage of the mutation test method that the size of the test suite is explosively increasing. Examples including OPRoS Component[1] show the validity of the proposed method.

• Journal of Advanced Navigation Technology
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• v.24 no.3
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• pp.212-217
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• 2020

Recently, with the interest in the 4th industrial revolution, the demand for autonomous driving technology is increasing. V2X communication technology is a core technology for autonomous vehicles that exchanges information with objects such as vehicles, infrastructure, networks, and pedestrians through wired and wireless networks. In this paper, we present the results of the hybrid V2X communication system, which is a hybrid design of WAVE and LTE, and the coverage test to confirm the performance of the system. Through coverage measurement, we show that the hybrid V2X communication performance is superior to the existing LTE or WAVE single communication system in communication coverage, so it can be effectively applied to autonomous driving services.

• KIPS Transactions on Computer and Communication Systems
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• v.3 no.10
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• pp.365-370
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• 2014

Although Internet of Things already became a new paradigm on service on network, we should pay more effort for studying about its testing method, since humans, things and environments in IoT are connected to each other without any restrictions. Earlier researches based on emulators showed that such virtual devices on emulators had unavoidable gap between them and real things. Furthermore, growth of connection complexity between the devices and loosing of restrictions make the gap wider. Accordingly, in this paper, we suppose a method of test coverage measurement based on BitTorrent for IoT environment. It has cooperation features among homogeneous devices with avoiding the overlapping on each part of whole test process.

• Journal of the Korean Home Economics Association
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• v.33 no.1
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• pp.187-202
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• 1995

The purpose of the study was to suggest ways of improvement of the present sizing systems for the middle aged women's clothing. For this, a questionnaire survey for the aged group and calculating coverage rate of one garment item(suit) between the companies has been carried out. The data was analyzed with use of SPSS package. The statistics were based o frequency, X2-test, t-test and one-way ANOVA. The results of the study was as follows: 1. In case of survey for middle aged women, the problems concerning the length and abdominal girth were found, that is to say, the former too long and the latter too tight. 2. The sizing systems between companies were very different in size classification and standard deviation of each sizes. 3. In calculating coverage rate of the 10 companies's sizing systems, coverage rate of the smallest size in each were the highest and those of the biggest were 0%. It means the standard deviation of the present sizing systems are not enough to cover the various body form of the middle aged women, so that the more diverse sizing system is required for the better fitness of middle aged women's clothing.