• Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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• 2002.11a
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• pp.341.2-341
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• 2002

As the data storage device market demands higher data transfer rate with higher track density, TMR budget is to be tighter so that even minor improvement is sought in HDD development fields. Disk flutter associated with the turbulent air flow inside the chamber becomes of great interest for the reduction of PES especially at OD. A comparative transient turbulent flow study is presented in this paper for the reduction of disk flutter with different housing designs.

• Journal of the Korean Magnetics Society
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• v.13 no.3
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• pp.97-102
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• 2003

Synthetic ferrimagnetic layer (SyFL) with structure NiFe/Ru/NiFe which can be applied high density TMR device in free layer were prepared by an inductively coupled plasma (ICP) helicon-sputter. We proposed a model of predicting coercivity (H$\_$c/), spin-flopping field (H$\_$sf/), and saturation field (H$\_$s/) as a function of Ru thicknesses, from the equilibrium state of energies of Zeeman, exchange, and uniaxial anisotropy. We fabricated the samples of Ta(50 ${\AA}$)/NiFe(50${\AA}$)nu(4∼20${\AA}$)NiFe(30 ${\AA}$)/Ta(50${\AA}$), and measured the M-H loops with a superconduction quantum interference device (SQUID) applying the external field up to ${\pm}$ 15 kOe. The result was well agreed with the proposed model, and reveal K$\_$u = 1000 erg/㎤, J$\_$ex/ =0.7 erg/$\textrm{cm}^2$. We report that H$\_$c/ below 10 Oe is available, and R$\_$u/ thickness range should be in 4-10 ${\AA}$ for MRAM application. Our result implies that permalloy layers may lead to considerable magnetostriction effect in SyFL and intermixing in NiFe/Ru interfaces.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.18 no.3
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• pp.276-283
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• 2005

Magnetic tunneling transistor (MTT) device using the amorphous n-type Si semiconductor film for base and collector consisting of the [CoFe/NiFe](free layer) and Si(top layer) multilayers was used to study the spin-dependent hot electron magnetocurrent (MC) and tunneling magnetoresistance (TMR) at room temperature. A large MC of 40.2 % was observed at the emitter-base bias voltage ( $V_{EB}$ ) of 0.62 V. The increasing emitter hot current and transfer ratio ( $I_{C}$/ $I_{E}$) as $V_{EB}$ are mainly due to a rapid increase of the number of conduction band states in the Si collector. However, above the $V_{EB}$ of 0.62 V, the rapid decrease of MC was observed in amorphous Si-based MTT because of hot electron spin-dependent elastic scattering across CoFe/Si interfaces.

• Journal of the Korean Magnetics Society
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• v.13 no.5
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• pp.216-220
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• 2003

In this work, transmission characteristics of read and write signal were calculated when a MRAM (magnetic random access memory) cell is operated up to 10 GHz. Test device having long read and write lines was modeled in 3 dimensions to perform a simulation. The simulation was divided into two parts, read and write operations, and S-parameters were computed utilizing FEM (finite element method) algorithm. Transmission coefficients, S$\sub$21/, for read and write operations of MRAM device which was designed for a single cell test configuration were analyzed from DC to 1 GHz and DC to 10 GHz, respectively. When the insulator thickness between the bit and sense lines was increased from 500 to 1500 ${\AA}$, 3 dB attenuation frequency was increased by 3.3 times, from 135 to 430 MHz. The length of the bit and sense lines were 600 ${\mu}$m. In addition, access time was estimated by calculating the propagation delay utilizing S-parameters.