• Journal of Korea Society of Industrial Information Systems
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• v.20 no.2
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• pp.73-83
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• 2015

This paper proposes a TFT-LCD defect blob detection algorithm using the sequential defect detection method. First, for every pixel, a defect possibility is determined by the intensity difference and the defect candidates are detected according to the sequential defect detection method. For detected candidate pixels, the defect probability that indicates a potential included in the defect according to the each step. By applying the morphological operation, blobs are comprised of the detected candidates and the defect blobs are detected using the defect possibility of blobs. The validity of the proposed method was demonstrated a simulated image and also then it was tested a real TFT-LCD image. By the experimental results, the proposed method is very effective in TFT-LCD detect detection.

• Journal of the Institute of Electronics Engineers of Korea SP
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• v.44 no.5
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• pp.20-27
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• 2007

Generally, the TFT-LCD image signal have nonuniform brightness and are composed of largely varying background signal, noise signal and abruptly changing Mura signal within Mura region. In this paper, Mura region enhancing algorithms using the proposed modified-MTF, which describes how human-visual-system's sensitivity varies in frequency domain, is proposed. The validity of the proposed algorithm was demonstrated ideal 1-dimensional signal and also then it was also tested TFT-LCD image. By the experimental results, the proposed algorithm is very effective in TFT-LCD image Mura enhancement.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2008.05a
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• pp.734-737
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• 2008

This paper presents a new automatic TFT-LCD image quality optimization system. We also have developed new algorithms using 6-point programmable matching technique with reference gamma curve, and automatic power setting sequence. It optimizes automatically gamma adjustment and power setting registers in mobile TFT-LCD driver IC to reduce gamma correction error, adjusting time, and flicker. Developed algorithms and programs are generally applicable for most of the TFT-LCD modules. The proposed optimization system contains module-under-test (MUT, TFT-LCD module), control program, multimedia display tester for measuring luminance and flicker, and control board for interface between PC and TFT-LCD module. The control board is designed with DSP, and it supports various interfaces such as RGB and CPU. Developed automatic image quality optimization system showed significantly reduced gamma adjusting time, reduced flicker, and much less average gamma error than competing system. We believe that the proposed system is very useful to provide high image quality TFT-LCD and to reduce developing process time using optimized gamma-curve setting and automatic power setting.

• 한국정보디스플레이학회:학술대회논문집
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• 2006.08a
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• pp.597-600
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• 2006

The silver gate and source/drain electrodes for an a-Si thin film transistor were fabricated by the selective electroless plating (SELP) process. Relevant physical properties including taper angle, uniformity and resistivity are investigated. The Ag layer was about 150nm to 250nm thick, the resistivity less than $3{\times}10^{-6}$ Ohm-cm and the taper angle 45'-60' and the nonuniformity less than 10% on G2 substrates. The transfer characteristics with the Ag gate, and source/drain electrodes respectively possessed good field effect mobility similar to conventionally fabricated a-Si TFTs. This process provided low resistivity, low cost and ease of processing.

• 한국정보디스플레이학회:학술대회논문집
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• 2008.10a
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• pp.250-253
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• 2008

A touch screen panel embedded 12.1-inch TFT LCD employing a standard a-Si:H TFT process has been successfully developed. Compared with conventional external touch screen panels, the new internal TSP exhibits a clearer image and improved touch feeling. Our new internal proposed TSP can be fabricated with low cost.

• Journal of KIISE:Software and Applications
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• v.34 no.5
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• pp.447-454
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• 2007

TFT-LCD(Thin Film transistor liquid crystal display) has become actively used front panel display technology with increasing market. Intrinsically there is region of non uniformity with low contrast that to human eye is perceived as defect. As the gray level difference between the defect and the background is hardly distinguishable, conventional thresholding and edge detection techniques cannot be applied to detect the defect. Between the patterned and un-patterned LCD defects, this paper deals with un-patterned LCD defects by using independent component analysis, adaptive thresholding and skewness. Our method showed strong results even on noised LCD images and worked successfully on the manufacturing line.

• Journal of the Korean Data and Information Science Society
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• v.16 no.4
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• pp.823-833
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• 2005

This paper deals the TFT-LCD process and quality, process control problems of the process. For improvement of the process quality and yield, we apply a data mining technique to the LCD industry. And some unique quality features of the LCD process are also described. We describe some preceding researches first and relate to the TFT-LCD process and the problems of data mining in the process. Also we tried to observe the problems which need to solve first and the features from description below hazard must be considered a quality mining in LCD industry.

• Proceedings of the IEEK Conference
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• 2003.07e
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• pp.1783-1786
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• 2003

In this paper, an automated line-defect detection method for TFT-LCD panel is presented. A DFB(Directional Filter Bank) and line-projection method are used to find line-defect which is one of the major defects occurred in TFT-LCD panel. The experimental results show that the proposed algorithm gave promising results for applying automated inspection technique for TFT-LCD panel.

• 한국정보디스플레이학회:학술대회논문집
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• 2005.07a
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• pp.317-320
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• 2005

We report experimental and simulation results of L0 state using inner retarder film compared with normal retardation film. In short wavelength range, the reflectance of inner retardation film is three times compared with that of normal retardation film. This results in blue color of L0 state, as retardation decreases or polar angle increases, the color shifts toward purple, finally yellow color, as expected in the simulation results.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.32A no.12
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• pp.149-158
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• 1995

This paper describes the development of a software tool LCD FRAME that may guide the analyzing process for the electrical characteristics and the design procedure for constructing the thin film transistor liquid crystal display(TFT/LCD) packages. LCD FRAME can analyze its electrical characteristics from the TFT/LCD system package configuration, and provide the design variables to meet the user's requirements. These analysis and design procedure can be done in real time according to the model at simplified package level of TFT/LCD. LCD_FRAME is an object-oriented expert system which considers package elements as objects. With this LCD_FRAME software tool, we analyzed the I-V characteristics of a-Si TFT and its signal distortion which has maximum 1.58 $\mu$s delay along the panel scan line of the package containing 480 ${\times}$ 240 pixels. We designed the package structure of maximum 6.35 $\mu$s signal delays and 3360 ${\times}$ 780 pixels, and as a result we showed that the proper structure of 20 $\mu$m scan line width, 60$\mu$m panel TFT gate width and 8 $\mu$m gate length. This LCD_FRAME software tool provides results of the analysis and the design in the form of input files of the SPICE program, text data files, and graphic charts.