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http://dx.doi.org/10.9723/jksiis.2015.20.2.073

TFT-LCD Defect Blob Detection based on Sequential Defect Detection Method  

Lee, Eunyoung (경북대학교 전자공학부)
Park, Kil-Houm (경북대학교 전자공학부)
Publication Information
Journal of Korea Society of Industrial Information Systems / v.20, no.2, 2015 , pp. 73-83 More about this Journal
Abstract
This paper proposes a TFT-LCD defect blob detection algorithm using the sequential defect detection method. First, for every pixel, a defect possibility is determined by the intensity difference and the defect candidates are detected according to the sequential defect detection method. For detected candidate pixels, the defect probability that indicates a potential included in the defect according to the each step. By applying the morphological operation, blobs are comprised of the detected candidates and the defect blobs are detected using the defect possibility of blobs. The validity of the proposed method was demonstrated a simulated image and also then it was tested a real TFT-LCD image. By the experimental results, the proposed method is very effective in TFT-LCD detect detection.
Keywords
TFT-LCD; Defect detection; Sequential detection; Defect probability;
Citations & Related Records
Times Cited By KSCI : 4  (Citation Analysis)
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