• 제목/요약/키워드: TEM microstructure

검색결과 416건 처리시간 0.023초

Structural and Dielectric Studies of LLDPE/O-MMT Nanocomposites

  • Zazoum, Bouchaib;David, Eric;Ngo, Anh Dung
    • Transactions on Electrical and Electronic Materials
    • /
    • 제15권5호
    • /
    • pp.235-240
    • /
    • 2014
  • Nanocomposites made of linear low density polyethylene (LLDPE) and organo-modified montmorillonite (O-MMT) were processed by melt compounding from a commercially available premixed LLDPE/nanoclay masterbatch, at different nanoclay loadings, by co-rotating twin-screw extruder. The morphological and dielectric properties of LLDPE/O-MMT nanocomposites were investigated to understand the structure-dielectric properties relationship in the nanocomposites. The microstructures of the materials were characterized by wide angle X-ray diffraction (WAXD), scanning electron microscopy (SEM), transmission electron microscopy (TEM) and atomic force microscopy (AFM). Initial findings by FTIR spectroscopy characterization indicated the absence of any chemical interaction between LLDPE and nanoclay during the extrusion process, while DSC showed that a 1% wt loading of nanoclay particles increased the degree of crystallinity of the nanocomposites samples. On the other hand, XRD, SEM, TEM and AFM indicated that nanoclay layers were intercalated or exfoliated in the LLDPE matrix. A correlation between the structure and dielectric properties of LLDPE/O-MMT nanocomposites was found and discussed.

사파이어 {1120} 표면에 증착된 GaN 박막의 미세구조 (Microstructure of GaN films on sapphire{1120} surfaces)

  • 김유택;박진호;신건철
    • 한국결정성장학회지
    • /
    • 제8권3호
    • /
    • pp.377-382
    • /
    • 1998
  • 기존보다 낮은 온도에서 buffer layer를 도입하지 않고 직접 사파이어{1120} 기판위에 GaN 박막을 OMVPE방식으로 증착시킨 결과 양호한 계면상태를 가지는 양질의 GaN epilayer를 얻을 수 있었다. GaN epilayer의 주된 성장 방향은 <0002>로 밝혀졌고, 적어도 4개 종류 이상의 epilayer들이 서로 경쟁적으로 성장하는 것으로 판단되어진다. Buffer layer의 부재에도 불구하고 계면의 adhesion이 우수하였고 다만 계면으로부터 2~3nm이내의 lattice들에서 기판과의 lattice mismatch에 의한 distortion이 발견되어졌다. 따라서 일반적으로 GaN 박막 증착시에 가장 많이 사용되는 사파이어 basal plane 외에 {1120} plane 위에도 양질의 GaN epilayer가 buffer layer 없이 증착된다는 사실을 TEM 관찰을 통하여 알 수 있었다.

  • PDF

Effect of raw materials for the synthesis of TiO2 powders by a hydrothermal processing

  • Park, Jungju;Choi, Yeon Bin;Son, Jung Hun;Bae, Dong-Sik
    • 한국결정성장학회지
    • /
    • 제28권4호
    • /
    • pp.166-169
    • /
    • 2018
  • $TiO_2$ nanoparticles were prepared under high temperature and pressure conditions by precipitation from titanium tetrachloride ($TiCl_4$) and titanium isopropoxide (TTIP). $TiO_2$ powders were obtained in the temperature range of $150^{\circ}C{\sim}190^{\circ}C$ for 4 h. The microstructure and phase of the synthesized particles were studied by TEM and XRD. TEM and X-ray diffraction pattern shows that the synthesized particles were crystalline. The average sizes of the synthesized particles from titanium tetrachloride and titanium isopropoxide were below 20 nm and 10 nm, respectively. The average size of the synthesized particles increased with increasing reaction temperature. The effects of synthesis parameters, such as the reaction temperature and pH value are discussed.

Zinc Vacancy Ordering in BaTEX>$(Zn_1/3Ta2/3)O_3$Ceramics

  • Park, Seong-Jin;Sahn Nahm;Kim, Myong-Ho;Byun, Jae-Dong
    • The Korean Journal of Ceramics
    • /
    • 제2권4호
    • /
    • pp.242-245
    • /
    • 1996
  • The microstructure of $Ba (Zn_{1/3}Ta_{2/3})O_3$ (BZT) was investigated using X-ray diffractometry(XRD) and transmission electron microscopy (TEM). $Ba_{0.5}TaO_3$ and $Ba_3TaO_{5.5}$ (BT) phasses were observed on the surface of the sintered specimen by XRD. Furthermore, a new type of ordering along the [110] direction was found in sintered specimen by the XRD and TEM analysis. The wavelength of ordering was 0.9 nm which is three times larger than the interplanar distance of (110) plane and new type of ordering is considered to be a result of Zn vacancy ordering. The creation of Zn vacancies and formation of BT phases are attributed to the evaporation of volatile ZnO. A new mechanism for ZnO loss is suggested. In this mechanism, only Zn vacancies are created only when the amount of ZnO loss is small and as the amount of ZnO loss increases, BT phases are formed at the same time. A new unit cell of ordered structure is suggested as the superlattics containing three BZT unit cells.

  • PDF

A Correlative Approach for Identifying Complex Phases by Electron Backscatter Diffraction and Transmission Electron Microscopy

  • Na, Seon-Hyeong;Seol, Jae-Bok;Jafari, Majid;Park, Chan-Gyung
    • Applied Microscopy
    • /
    • 제47권1호
    • /
    • pp.43-49
    • /
    • 2017
  • A new method was introduced to distinguish the ferrite, bainite and martensite in transformation induced plasticity (TRIP) steel by using electron backscatter diffraction (EBSD) and transmission electron microscopy (TEM). EBSD is a very powerful microstructure analysis technique at the length scales ranging from tens of nanometers to millimeters. However, iron BCC phases such as ferrite, bainite and martensite cannot be easily distinguished by EBSD due to their similar surface morphology and crystallographic structure. Among the various EBSD-based methodology, image quality (IQ) values, which present the perfection of a crystal lattice, was used to distinguish the iron BCC phases. IQ values are very useful tools to discern the iron BCC phases because of their different density of crystal defect and lattice distortion. However, there are still remaining problems that make the separation of bainite and martensite difficult. For instance, these phases have very similar IQ values in many cases, especially in deformed region; therefore, even though the IQ value was used, it has been difficult to distinguish the bainite and martensite. For more precise separation of bainite and martensite, IQ threshold values were determined by a correlative TEM analysis. By determining the threshold values, iron BCC phases were successfully separated.

나노급 두께 니켈실리사이드의 적외선 흡수 특성 (IR Absorption Property in Nano-thick Nickel Silicides)

  • 윤기정;한정조;송오성
    • 한국재료학회지
    • /
    • 제17권6호
    • /
    • pp.323-330
    • /
    • 2007
  • We fabricated thermaly evaporated 10 nmNi/(poly)Si films to investigate the energy saving property of silicides formed by rapid thermal annealing (RTA) at the temperature of $300{\sim}1200^{\circ}C$ for 40 seconds. Moreover, we fabricated $10{\sim}50$ nm-thick ITO/Si films with a rf-sputter as reference films. A four-point tester was used to investigate the sheet resistance. A transmission electron microscope (TEM) and an X-ray diffractometer were used for the determination of cross sectional microstructure and phase changes. A UV-VISNIR and FT-IR (Fourier transform infrared rays spectroscopy) were employed for near-IR and middle-IR absorbance. Through TEM analysis, we confirmed $20{\sim}70nm-thick$ silicide layers formed on the single and polycrystalline silicon substrates. Nickel silicides and ITO films on the single silicon substrates showed almost similar absorbance in near-IR region, while nickel silicides on polycrystalline silicon substrate showed superior absorbance above 850 nm near-IR region to ITO films. Nickel silicide on polycrystalline substrate also showed better absorbance in middle IR region than ITO. Our result implies that nano-thick nickel silicides may have exellent absorbing capacity in near-IR and middle-IR region.

Texture of Al/Ti thin films deposited on low dielectric polymer substrates

  • Yoo, Se-Yoon;Kim, Young-Ho
    • 한국마이크로전자및패키징학회:학술대회논문집
    • /
    • 한국마이크로전자및패키징학회 2000년도 Proceedings of 5th International Joint Symposium on Microeletronics and Packaging
    • /
    • pp.103-108
    • /
    • 2000
  • The texture of Al/Ti thin films deposited on low-dielectric polymer substrates has been investigated. Fifty-nm-thick Ti films and 500-nm-thick Al-1%Si-0.5%Cu (wt%) films were deposited sequentially onto low-k polymers and SiO$_2$ by using a DC magnetron sputtering system. The texture of Al thin film was determined using X-ray diffraction (XRD) theta-2theta ($\theta$-2$\theta$) and rocking curve and the microstructure of Al/Ti films on low-k polymer and SiO$_2$ substrates was characterized by Transmission electron microscopy (TEM). hall thin films deposited on SiO$_2$ had stronger texture than those deposited on low-k polymer. The texture of Al thin films strongly depended on that of Ti films. Cross-sectional TEM resealed that Brains of Ti films on SiO$_2$ substrates had grown perpendicular to the substrate, while the grains of Ti films on SiLK substrates were farmed randomly. The lower degree of 111 texture of Al thin films on low-k polymer was due to Ti underlayer.

  • PDF

Microstructural Analysis of Epitaxial Layer Defects in Si Wafer

  • Lim, Sung-Hwan
    • 한국재료학회지
    • /
    • 제20권12호
    • /
    • pp.645-648
    • /
    • 2010
  • The structure and morphology of epitaxial layer defects in epitaxial Si wafers produced by the Czochralski method were studied using focused ion beam (FIB) milling, scanning electron microscopy (SEM), and transmission electron microscopy (TEM). Epitaxial growth was carried out in a horizontal reactor at atmospheric pressure. The p-type Si wafers were loaded into the reactor at about $800^{\circ}C$ and heated to about $1150^{\circ}C$ in $H_2$. An epitaxial layer with a thickness of $4{\mu}m$ was grown at a temperature of 1080-$1100^{\circ}C$. Octahedral void defects, the inner walls of which were covered with a 2-4 nm-thick oxide, were surrounded mainly by $\{111\}$ planes. The formation of octahedral void defects was closely related to the agglomeration of vacancies during the growth process. Cross-sectional TEM observation suggests that the carbon impurities might possibly be related to the formation of oxide defects, considering that some kinds of carbon impurities remain on the Si surface during oxidation. In addition, carbon and oxygen impurities might play a crucial role in the formation of void defects during growth of the epitaxial layer.

ARB가공된 인탈산동의 어닐링에 따른 미세조직 및 기계적 특성 변화 (Change in Microstructure and Mechanical Properties of Deoxidized Low-Phosphorous Copper Processed by Accumulative Roll-Bonding with Annealing)

  • 이성희;김춘수;김상식;한승전;임차용
    • 한국재료학회지
    • /
    • 제17권7호
    • /
    • pp.361-365
    • /
    • 2007
  • A deoxidized low-phosphorous copper processed by eight cycles of accumulative roll-bonding (ARB) was annealed at various temperatures ranging from 100 to $400^{\circ}C$. The annealed copper was characterized by transmission electron microscopy (TEM) and tensile & hardness test. TEM observation revealed that the ultrafine grains developed by the ARB still remained up to $350^{\circ}C$, however above $400^{\circ}C$ they were replaced by equiaxed and coarse grains due to an occurrence of the static recrystallization. The hardness of the copper decreased slightly with the annealing temperature up to $350^{\circ}C$, however they dropped largely above $400^{\circ}C$. Annealing characteristics of the copper were compared with those of an oxygen free copper processed by ARB and subsequently annealed.

타이어 보강용 고 탄소강 미세 강선의 굽힘 피로 성질에 미치는 미세 조직의 영향 (The Effects of Microstrucutral Parameters on Bending Fatigue Properties of Heavily Drawn Pearlitic Steel Filaments used for Automotive Tires)

  • 양요셉;임승호;반덕영;박찬경
    • 한국소성가공학회:학술대회논문집
    • /
    • 한국소성가공학회 2005년도 추계학술대회 논문집
    • /
    • pp.193-197
    • /
    • 2005
  • Influences of microstructure on high-cycle fatigue (HCF) limit of high carbon $(>0.7wt.\;\%)$ steel filaments used for tires have been investigated. A series of the fatigue tests was carried out depending on carbon content by using Hunter-type tester at a frequency of 60 Hz at a tension/compression stress of 900 to 1500 MPa. Microstructural changes of the filaments were identified in the lateral direction by using transmission electron microscopy (TEM). It was found that the mechanical properties, such as fatigue limit and tensile strength, were improved with increasing carbon content, which was mainly attributed to decreased lamellar spacing and cementite thickness. However, the fatigue ratio, which is defined as the ratio of the fatigue limit to the tensile strength, was reduced in a higher carbon range of 0.8 to $0.9\;wt.\%$, while the fatigue ratio was nearly constant in a lower carbon range of 0.7 to $0.8\;wt.\%$. Overall mechanical properties of the filaments, depending on carbon content, have been discussed in terms of the microstructural parameter change of lamellar spacing and cementite thickness. In addition, the variation of cementite morphology on the fatigue crack propagation of high carbon $(0.9wt.\;\%)$ filaments will be discussed.

  • PDF