• 제목/요약/키워드: Statistical process

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Change Analysis with the Sample Fourier Coefficients

  • Jaehee Kim
    • Communications for Statistical Applications and Methods
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    • v.3 no.1
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    • pp.207-217
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    • 1996
  • The problem of detecting change with independent data is considered. The asymptotic distribution of the sample change process with the sample Fourier coefficients is shown as a Brownian Bridge process. We suggest to use dynamic statistics such as a sample Brownian Bridge and graphs as statistical animation. Graphs including change PP plots are given by way of illustration with the simulated data.

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A Technique and software of analysis and control for measurement process

  • Zhao, Fengyu;Xu, Jichao;Bergman, Bo
    • International Journal of Quality Innovation
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    • v.1 no.1
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    • pp.97-105
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    • 2000
  • In this paper, a two-section method for measuring is introduced and the variation sources of measurement process are analysed. Measuring is a special process in general process. Various variation source must be firstly decomposed so that the statistical distribution law of measuring process can be established, and then implement monitoring control of the measuring process. A special method to obtain the measuring variation is discussed, and a monitoring control technique for measuring process is studied based statistical distribution. Towards the end, we briefly introduce software design for the analysis and control of a measurement process.

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Applying Expert System to Statistical Process Control in Semiconductor Manufacturing (반도체 수율 향상을 위한 통계적 공정 제어에 전문가 시스템의 적용에 관한 연구)

  • 윤건상;최문규;김훈모;조대호;이칠기
    • Journal of the Korean Society for Precision Engineering
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    • v.15 no.10
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    • pp.103-112
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    • 1998
  • The evolution of semiconductor manufacturing technology has accelerated the reduction of device dimensions and the increase of integrated circuit density. In order to improve yield within a short turn around time and maintain it at high level, a system that can rapidly determine problematic processing steps is needed. The statistical process control detects abnormal process variation of key parameters. Expert systems in SPC can serve as a valuable tool to automate the analysis and interpretation of control charts. A set of IF-THEN rules was used to formalize knowledge base of special causes. This research proposes a strategy to apply expert system to SPC in semiconductor manufacturing. In analysis, the expert system accomplishes the instability detection of process parameter, In diagnosis, an engineer is supported by process analyzer program. An example has been used to demonstrate the expert system and the process analyzer.

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Optimization Methodology Integrated Data Mining and Statistical Method (데이터 마이닝과 통계적 기법을 통합한 최적화 기법)

  • Jung, Hey-Jin;Song, Suh-Ill
    • Proceedings of the Korean Society for Quality Management Conference
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    • 2006.11a
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    • pp.205-210
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    • 2006
  • Nowaday manufacture technology and manufacture environment are changing rapidly. By development of computer and enlargement of technique, most of manufacture field are computerized. It is measured automatically do much quality characteristics thereby and great many data happen in a day. corporations is important if have gotten fast information that are useful from wide data to go first in international competition according to these change. Statistical process control(SPC) techniques are used as a problem solution tool at manufacturing process until present. However, this statistical methods is not applied more extensively because have much restrictions in realistic problem. In this paper, wish to develop more realistic and scientific new statistical design techniques doing to integrate data mining(DM) and statistical methods by the alternative to cope these problem. First step selects significant factor using DM techniques from datas of manufacturing process including much factors and second step wish to find optimum of process after get the estimated response function through response surf ace methodology(RSM) that is statistical techniques.

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Semiparametric Inference for a Multistate Stochastic Survival Model

  • Sung Chil Yeo
    • Communications for Statistical Applications and Methods
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    • v.5 no.1
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    • pp.239-263
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    • 1998
  • In this paper, we consider a multistate survival model which incorporates covariates and contains two illness states and two death states. The underlying stochastic process is assumed to follow nonhomogeneous Markov process. The estimates of survival, transition and competing risks probabilities are given via the methods of partial likelihood and nonparametric maximum likelihood. Our discussion is based on the statistical theory of counting process. An illustration is given to the data of patients in a heart transplant program. The goodness of fit procedures are also discussed to check the adequacy of the model.

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A MARKOVIAN APPROACH TO THE FORWARD RECURRENCE TIME IN THE RENEWAL PROCESS

  • Kim, Jong-Woo;Lee, Eui-Yong;Shim, Gyoo-Cheol
    • Journal of the Korean Statistical Society
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    • v.33 no.3
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    • pp.299-302
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    • 2004
  • A Markovian approach is introduced to find the Laplace transform of the forward recurrence time in the renewal process at finite time t > 0. Until now, most works on the forward recurrence time have been done through renewal arguments.

THE CENTRAL LIMIT THEOREMS FOR THE MULTIVARIATE LINEAR PROCESS GENERATED BY WEAKLY ASSOCIATED RANDOM VECTORS

  • Kim, Tae-Sung;Ko, Mi-Hwa
    • Journal of the Korean Statistical Society
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    • v.32 no.1
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    • pp.11-20
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    • 2003
  • Let{Xt}be an m-dimensional linear process of the form (equation omitted), where{Zt}is a sequence of stationary m-dimensional weakly associated random vectors with EZt = O and E∥Zt∥$^2$$\infty$. We Prove central limit theorems for multivariate linear processes generated by weakly associated random vectors. Our results also imply a functional central limit theorem.

A Study on the Improvement Methods for Sausage Stuffing Process

  • Lee, Jae-Man;Cha, Young-Joon;Hong, Yeon-Woong
    • 한국데이터정보과학회:학술대회논문집
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    • 2005.04a
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    • pp.7-17
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    • 2005
  • Consider a stuffing process where sausage-casings are filled with sausage-kneading. One of the most important factors in the stuffing process is weights of stuffed sausages. Sausages weighting above the specified limit are sold in a regular market price for a fixed price, and underfilled sausages are reworked at the expense of reprocessing cost. In this paper, the sausage stuffing process is inspected for improving productivity and quality levels. Several statistical process control tools are suggested by using real data obtained from a Korean Vienna sausage company.

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A Study on the Improvement Methods for Sausage Stuffing Process

  • Lee, Jae-Man;Cha, Young-Joon;Hong, Yeon-Woong
    • Journal of the Korean Data and Information Science Society
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    • v.16 no.2
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    • pp.391-399
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    • 2005
  • Consider a stuffing process where sausage-casings are filled with sausage-kneading. One of the most important factors in the stuffing process is weights of stuffed sausages. Sausages weighting above the specified limit are sold in a regular market price for a fixed price, and underfilled sausages are reworked at the expense of reprocessing cost. In this paper, the sausage stuffing process is inspected for improving productivity and quality levels. Several statistical process control tools are suggested by using real data obtained from a Korean Vienna sausage company.

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Statistical Efficiency of VSSI $\bar{X}$ Control Charts for the Process with Two Assignable Causes (두 개의 이상원인이 존재하는 공정에 대한 VSSI $\bar{X}$ 관리도의 통계적 효율성)

  • Lee Ho-Jung;Lim Tae-Jin
    • Journal of Korean Society for Quality Management
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    • v.32 no.4
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    • pp.156-168
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    • 2004
  • This research investigates the statistical efficiency of variable sampling size & sampling interval(VSSI) $\bar{X}$ charts under two assignable causes. Algorithms for calculating the average run length(ARL) and average time to signal(ATS) of the VSSI $\bar{X}$ chart are proposed by employing Markov chain method. States of the process are defined according to the process characteristics after the occurrence of an assignable cause. Transition probabilities are carefully derived from the state definition. Statistical properties of the proposed chart are also investigated. A simple procedure for designing the proposed chart is presented based on the properties. Extensive sensitivity analyses show that the VSSI $\bar{X}$ chart is superior to the VSS or VSI $\bar{X}$ chart as well as to the Shewhart $\bar{X}$ chart in statistical sense, even tinder two assignable causes.