Nondestructive Measurement on Electrical Characteristics of Amorphous Silicon by Using the Laser Beam (레이저 빔을 이용한 비정질실리콘 전기적 특성의 비파괴 측정)
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- Proceedings of the Korean Institute of Navigation and Port Research Conference
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- 2000.11a
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- pp.36-39
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- 2000