• ETRI Journal
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• v.29 no.1
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• pp.124-126
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• 2007

In this letter, we study the impact of single event upsets (SEUs) in space or defense electronic systems which use memory devices such as EEPROM, and SRAM. We built a microcontroller test board to measure the effects of protons on electronic devices at various radiation levels. We tested radiation hardening at beam current, and energy levels, measured the phenomenon of SEUs, and addressed possible reasons for SEUs.

• Journal of Astronomy and Space Sciences
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• v.18 no.2
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• pp.163-173
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• 2001

In this paper, space radiation environment and single event effect(SEE) have been analyzed for the KOMPSAT-2 operational orbit. As spacecraft external and internal space environment, trapped proton, SEP(solar energetic particle) and GCR(galactic cosmic ray) high energy Protons and heavy ions spectrums are analyzed. Finally, SEU and SEL rate prediction has been performed for the Intel 80386 microprocessor CPU that is planned to be used in the KOMPSAT-2. As the estimation results, under nominal operational condition, it is predicted that trapped proton and high energetic proton induced SBU effect will not occur. But, it is predicted that heavy ion induced SEU can occur several times during KOMPSAT-2 3-year mission operation. KOMPSAT-2 has been implementing system level design to mitigate SEU occurrence using processor CPU error detection function of the on-board flight software.

• Nuclear Engineering and Technology
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• v.55 no.3
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• pp.1015-1020
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• 2023

A multi-layer design is applied to mitigate single event effect (SEE) in a 28 nm System-on-Chip (SoC). It depends on asymmetric multiprocessing (AMP), redundancy and system watchdog. Irradiation tests utilized 70 and 90 MeV proton beams to examine its performance through comparative analysis. Via examining SEEs in on-chip memory (OCM), compared with the trial without applying the multi-layer design, the test results demonstrate that the adopted multi-layer design can effectively mitigate SEEs in the SoC.

• Journal of the Institute of Electronics Engineers of Korea TC
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• v.45 no.10
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• pp.10-16
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• 2008

Generally, the satellite circling round in a low orbit goes through Van Allen belt connecting with the magnetic fold, in which electronic components are easily damaged and shortened by charged particles moving in a cycle between the South Pole and the North Pole. In particular, Single Event Upset(SEU) by radiation could cause electronic device on satellite to malfunction. Based on the idea mentioned above, this study considersabout SEU effect on the On-board Computer(OBC) of STSAT-1 in the space environment radiation, and shows algorithm to cope with SEUs. In this experiment, it also is shown that the repetitive memory read/write operation called memory wash is needed to prevent the accumulation of SEUs and the choice for the period of memory wash is examined. In conclusion, it is expected that this research not only contributes to understand low capacity of On-board Computer(OBC) on Low Earth Orbit satellite(LEOS) and SaTReC Technology satellite(STSAT) series, but also makes good use of each module development of Korea Multi-Purpose Satellite(COMPSAT) series.

• Journal of the Korean Society for Aeronautical & Space Sciences
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• v.39 no.12
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• pp.1174-1180
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• 2011

Field Programmable Gate Array(FPGA)s are replacing traditional integrated circuits for space applications due to their lower development cost as well as reconfigurability. However, they are very sensitive to single event upset (SEU) caused by space radiation environment. In order to mitigate the SEU, on-board computer of STSAT-3 employed a triple modular redundancy(TMR) and scrubbing scheme. Experimental results showed that upset threshold energy was improved from 10.6 MeV to 20.3 MeV when the TMR and the scrubbing were applied to the on-board computer. Combining the experimental results with the orbit simulation results, calculated bit-flip rate of on-board computer is 1.23 bit-flips/day assuming in the worst case of STSAT-3 orbit.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.3
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• pp.1-5
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• 2008

This paper analyzes on the radiation effect of silicon solar cells in a low Earth orbit satellite by using high energy electron beams. Generally, the satellite circling round in a low orbit go through Van Allen belt, in which electronic components are easily damaged and shortened by charged particles moving in a cycle between the South Pole and the North Pole. For example, Single Event Upset (SEU) by radiation could cause electronic devices on satellite to malfunction. From the ground experiment in which we used the high energy electron beam facility at Knrea Atomic Energy Research Institute (KAERI), we tried to explain sun sensor degradations on orbit could he caused by high energy electrons. While we focused on the solar cells used for light detectors, We convince our research also contributes to understand the radiation effect of solar cells generating electric powers on satellites.

• Journal of Korean Society of Forest Science
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• v.99 no.5
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• pp.755-761
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• 2010

This study analyzed water quality data from a coniferous forest catchment in order to quantify the contributions of runoff components to stormflow, and to understand the effects of antecedent moisture conditions within catchment on the contributions of runoff components. Hydrograph separation by the twocomponent mixing model analysis was used to partition stormflow discharge into pre-event and event components for total 10 events in 2005 and 2008. To simplify the analysis, this study used single geochemical tracer with Na+. The result shows that the average contributions of event water and pre-event water were 34.8% and 65.2% of total stormflow of all 10 events, respectively. The event water contributions for each event varied from 18.8% to 47.9%. As the results of correlation analysis between event water contributions versus some storm event characteristics, 10 day antecedent rainfall and 1 day antecedent streamflow are significantly correlated with event water contributions. These results can provide insight which will contribute to understand the importance of antecedent moisture conditions in the generation of event water, and be used basic information to stormflow generation process in forest catchment.

• Journal of Astronomy and Space Sciences
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• v.18 no.2
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• pp.109-118
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• 2001

KITSAT-1, launched in 1992, passes through Inner Van Allen Radiation Belt in which high energy Protons cause single event upsets(SBUs) in the main memory of KITSAT-1 OBC(On-Board Computer) 186. The present paper compares SEU data from the OBC186 with the AP-8 model of NASA/NSSDC using the Chi-Square method to estimate the SEU threshold energy. Shielding effect by the satellite body has been taken into account to model the proton fluxes at the position of OBC186, and SEUs recorded during the high solar activities have been removed to avoid the spurious result. The result shows that the SEU threshold energy of the main memory of KITSAT-1 OBC186 is estimated to be about $110{pm}10MeV$.

• Nuclear Engineering and Technology
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• v.34 no.4
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• pp.358-369
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• 2002

Abundant information about analyses of single steam generator tube rupture (SGTR) events is available because of its importance in terms of safety. However, there are few literatures available on analyses of multiple steam generator tube rupture (MSGTR) events. In addition, knowledge of transients and consequences following a MSGTR event are very limited as there has been no occurrence of MSGTR event in the commercial operation of nuclear reactors. In this study, a postulated MSGTR event in an APR1400 is analyzed using thermal-hydraulic system code MARSI.4. The present study aims to examine the effects of affected steam generator selection. The main steam safety valve (MSSV) lift time for four cases are compared in order to examine how long operator response time is allowed depending on which steam generate. (S/G) is affected. The comparison shows that the cases where two steam generators are simultaneously affected allow longer time for operator action compared with the cases where a single steam generator is affected. Furthermore, the tube ruptures in the steam generator where a pressurizer is connected leads to the shortest operator response time.

• Journal of the Korea Safety Management & Science
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• v.2 no.4
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• pp.91-102
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• 2000

Nowadays, every kind of system is changed so complex and enormous, it is necessary to assure system reliability, product liability and safety. Fault tree analysis(FTA) is a reliability/safety design analysis technique which starts from consideration of system failure effect, referred to as “top event”, and proceeds by determining how these can be caused by single or combined lower level failures or events. So in fault tree analysis, it is important to find the combination of events which affect system failure. Minimal cut sets(MCS) and minimal path sets(MPS) are used in this process. FTA-I computer program is developed which calculates MCS and MPS in terms of Gw-Basic computer language considering Fussell's algorithm. FTA-II computer program which analyzes importance and function cost of VE consists. of five programs as follows : (l) Structural importance of basic event, (2) Structural probability importance of basic event, (3) Structural criticality importance of basic event, (4) Cost-Failure importance of basic event, (5) VE function cost analysis for importance of basic event. In this study, a method of initiation such as failure, function and cost in FTA is suggested, and especially the priority rank which is calculated by computer-aided decision analysis program developed in this study can be used in decision making determining the most important basic event under various conditions. Also the priority rank can be available for the case which selects system component in FMEA analysis.