Nuclear Engineering and Technology

Korean Nuclear Society (한국원자력학회)
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System-on-chip single event effect hardening design and validation using proton irradiation

  • Weitao Yang (School of Microelectronics, Xidian University) ;
  • Yang Li (School of Nuclear Science & Technology, Xi'an Jiaotong University) ;
  • Gang Guo (National Innovation Center of Radiation Application, China Institute of Atomic Energy) ;
  • Chaohui He (School of Nuclear Science & Technology, Xi'an Jiaotong University) ;
  • Longsheng Wu (School of Microelectronics, Xidian University)
  • Received : 2022.07.27
  • Accepted : 2022.10.24
  • Published : 2023.03.25
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Abstract

A multi-layer design is applied to mitigate single event effect (SEE) in a 28 nm System-on-Chip (SoC). It depends on asymmetric multiprocessing (AMP), redundancy and system watchdog. Irradiation tests utilized 70 and 90 MeV proton beams to examine its performance through comparative analysis. Via examining SEEs in on-chip memory (OCM), compared with the trial without applying the multi-layer design, the test results demonstrate that the adopted multi-layer design can effectively mitigate SEEs in the SoC.

Keywords

Acknowledgement

Project supported by National Natural Science Foundation of China (Grant Nos. 11575138, 11835006, 11690040, and 11690043). We thank the engineers of the accelerator center at the CIAE.

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