• Title/Summary/Keyword: Simultaneous measurement

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Quantitative Measurements of Soot Particles in a Laminar Diffusion Flame Using a LII/LIS Technique (LII/LIS 기법을 이용한 층류확산화염 매연입자의 정량화)

  • Chung, J.W.;Lee, W.;Han, Y.T.;Kim, B.S.;Lee, C.B.;Kim, D.J.;Lee, K.H.
    • 한국연소학회:학술대회논문집
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    • 2002.11a
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    • pp.113-121
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    • 2002

  • The distribution of volume fraction, mean diameter and number density of soot particles are measured quantitatively in a co-flow ethylene diffusion flame using a simultaneous LII/LIS measurement technique. The LII/LIS system and the measured values are, respectively, calibrated and evaluated by comparing to the informations obtained from laser light. extinction/scattering experiments, LII signal shows some sensitivity to the laser light intensity when laser power density exceeds a certain value(threshold). It is also found that there is an optimal laser intensity and a delay time in order to obtain the best result using the simultaneous LII/LIS measurement technique.

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A Novel OLED Inspection Process Method with Simultaneous Measurement for Standard and Deposition Pattern (기준패턴과 증착패턴의 동시 측정을 통한 OLED 공정 검사 방법)

  • Kwak, Byeongho;Cheoi, Kyungjoo
    • Journal of Korea Society of Digital Industry and Information Management
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    • v.15 no.4
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    • pp.63-70
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    • 2019

  • The subject of the simultaneous measuring system of base pattern and deposition pattern is a new research topic on a defect inspection of OLED. In this paper, we propose a new OLED inspection method that simultaneously measures standard and deposition pattern images. This method reduces unnecessary processes and tac time during OLED inspection. For an additional reduction of the tac time during pattern measurement, the ROI was configured to measure only in the designated ROI area instead of measuring the entire area of an image. During the ROI set-up, the value of effective deposition pattern area is included so that if the deposition pattern is out of the ROI zone, it would be treated as a defect before measuring the size and center point of the pattern. As a result, the tac time and inspection process could be shortened. The proposed method also could be applied to the OLED manufacturing process. Production of OLED could be increased by reducing tac time and inspection process.

  • https://doi.org/10.17662/ksdim.2019.15.4.063 인용 PDF KSCI

Implementing a Simultaneous Pattern Measurement System for Measuring the Size of the Standard Pattern and the Deposition Pattern of an OLED Panel (OLED 패널의 기준패턴과 증착패턴의 크기 측정을 위한 패턴 동시 측정 시스템의 구현)

  • Kwak, Byeong Ho;Cheoi, Kyung Joo
    • Journal of Korea Multimedia Society
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    • v.22 no.2
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    • pp.117-127
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    • 2019

  • Simultaneous pattern measurement system is new research subject for OLED panel inspection. It is defect inspection of OLED panel after deposition. This research suggests the system that calculates the size and center point of each patterns after obtaining standard and deposition pattern as one image. This system could be applied to OLED manufacturing process. The research result shows that the size and center point of each patterns could be obtained by displaying the standard pattern and deposition pattern in one image.

  • https://doi.org/10.9717/kmms.2019.22.2.117 인용 PDF KSCI HTML