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http://dx.doi.org/10.9717/kmms.2019.22.2.117

Implementing a Simultaneous Pattern Measurement System for Measuring the Size of the Standard Pattern and the Deposition Pattern of an OLED Panel  

Kwak, Byeong Ho (Dept. of Computer Science, Chungbuk National University)
Cheoi, Kyung Joo (Dept. of Computer Science, Chungbuk National University)
Publication Information
Journal of Korea Multimedia Society / v.22, no.2, 2019 , pp. 117-127 More about this Journal
Abstract
Simultaneous pattern measurement system is new research subject for OLED panel inspection. It is defect inspection of OLED panel after deposition. This research suggests the system that calculates the size and center point of each patterns after obtaining standard and deposition pattern as one image. This system could be applied to OLED manufacturing process. The research result shows that the size and center point of each patterns could be obtained by displaying the standard pattern and deposition pattern in one image.
Keywords
OLED Fluorescence Microscope; Deposition System;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
연도 인용수 순위
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