• Proceedings of the KIEE Conference
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• 1995.07a
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• pp.30-32
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• 1995

The model interrupters of $SF_6$ gas electromagnetic contactor whose ratings are the voltage of 7.2kV and the short circuit current of 4.0kA have been designed and manufactured on the basis of theoretical and computational analysis for its development. The eddy current analysis, the magnetic field analysis and the calculation of the rotational force on arcs have been conducted using FLUX2D package. The short circuit current interrupting tests have been conducted to the model interrupters using the simplified capacitive synthetic test circuit in KERI. The results show that the model interrupters have a sufficient interrupting capability and the new design concept is proper for a good interrupting performance.

• Journal of Welding and Joining
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• v.29 no.5
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• pp.95-98
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• 2011

Recently, there is a growing tendency that fine-pitch electronic devices are increased due to higher density and very large scale integration. Finer pitch printed circuit board(PCB) is to be decrease insulation resistance between circuit patterns and electrical components, which will induce to electrical short in electronic circuit by electrochemical migration when it exposes to long term in high temperature and high humidity. In this research, the effect of soldering flux acting as an electrical carrier between conductors on electrochemical migration was investigated. The PCB pad was coated with OSP finish. Sn3.0Ag0.5Cu solder paste was printed on the PCB circuit and then the coupon was treated by reflow process. Thereby, specimen for ion migration test was fabricated. Electrochemical migration test was conducted under the condition of DC 48 V, $85^{\circ}C$, and 85 % relative humidity. Their life time could be increased about 22% by means of removal of flux. The fundamentals and mechanism of electrochemical migration was discussed depending on the existence of flux residues after reflow process.

• Journal of The Korean Association For Science Education
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• v.22 no.5
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• pp.944-956
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• 2002

The purpose of this study was to investigate students' conceptions of the simple electric circuit using a battery and a bulb. 19 fourth grade students from a rural elementary school in Korea participated in this study. Data on the children's understandings of electric circuit were collected through three sources; prediction tests, drawing tests and individual interviews. The prediction tests were paper and pencil tests composed of 10 problems, predicting whether bulbs in 10 simple circuit diagrams would light. For each prediction, the children were asked to provide a written explanation of their thinking. The drawing tests consisted of 6 problems. One was to draw the inside of the bulb base, and the others were to make the wire connections between a battery and a bulb in the diagrams, to light the bulb. The interviews were conducted with seven children who showed differing degrees of understanding. No student was aware of the wire connections inside the bulb base. Many students stated whether the bulb would light or not, according to the tip of the bulb contacting the positive battery terminal and an end of wire contacting the negative battery terminal. Most of them thought that the tip of the bulb should contact the positive battery terminal, so that the bulb would light. In short, students did not use a scientific conception of electric current to predict and explain the electric circuit.

• Proceedings of the KIEE Conference
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• 1995.07a
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• pp.160-164
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• 1995

In order to develop a medium voltage class gas circuit breaker by our own technology, we designed and manufactured the model interrupters using the hybrid arc extinguishing principle which adopts the thermal expansion principle in the large current region and the arc rotation principle by permanent magnet in the small current region. As the results of the first year research out of three years' research period, the main design parameters such as the volume of thermal expansion chamber, the distance between fixed contact and nozzle, the length of nozzle throat, the nozzle expansion angle and the magnitude of permanent magnet etc. have been determined. 4 types of model interrupters have been designed and manufactured considering the main design parameters. The 25kA short-circuit test and capacitive current breaking test have been performed for the model interrupters and the test results analyzed to improve the model interupters.

• The Transactions of the Korean Institute of Electrical Engineers B
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• v.54 no.2
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• pp.94-100
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• 2005

Korea Electrotechnology Research Institute(KERI) has successfully developed a 100hp-1800rpm-class high temperature superconducting(HTS) motor with high efficiency under partnership with Doosan Heavy Industries & Construction Co. Ltd. This motor has a HTS field winding and an air-cooled stator. The advantages of HTS motor can be represented by a reduction of 50% in both losses and size compared to conventional motors of the same rating. The cooling system is based on the heat transfer mechanism of the thermosyphon by using GM cryocooler as cooling source. The cold head is in contact with the condenser of a Ne-filled thermosyphon. Independently, the rotor assembly was tested at the stationary state and combined with stator. The HTS field winding could be cooled into below 30K. Test of open-circuit characteristics(OCC) and short-circuit characteristics(SCC) and load test with resistive load bank were conducted in generator mode. Also, load tests in motor mode driven by inverter were finished at KERI. Maximum operating current of field winding at 30K was 120A. From OCC and SCC test results synchronous inductance and synchronous reactance were 2.4mH, 0.49pu, respectively. Efficiency of this HTS machine was 93.3% in full load(100hp) test. This paper will present design, construction. and experimental test results of the 100hp HTS machine.

• The Transactions of the Korean Institute of Electrical Engineers D
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• v.53 no.11
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• pp.768-775
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• 2004

The SSA technique in the digital circuit test is required to be repeated the input pattern stream to n bits output nodes n times in case of using a multiplexor. Because the method adopting a parallel/serial bit convertor to remove this inefficiency has disadvantage of requiring the test time n times for a pattern, the test strategy is required, which can enhance the test productivity by reducing the test time based on simplified fault detection mechanism. Accordingly, this paper proposes a test strategy which enhances the test productivity and efficiency by appling PAS (Parallel Signature Analysis) technique to those after analyzing the structure and characteristics of the digital devices including TTL and CMOS family ICs as well as ROM and RAM. The PSA technique identifies the faults by comparing the reminder from good device with reminder from the tested device. At this time, the reminder is obtained by enforcing the data stream obtained from output pins of the tested device on the LFSR(Linear Feedback Shift Resister) representing the characteristic equation. Also, the method to obtain the optimal signature analyzer is explained by furnishing the short bit input streams to the long bit input streams to the LFSR having 8, 12, 16, 20bit input/output pins and by analyzing the occurring probability of error which is impossible to detect. Finally, the effectiveness of the proposed test strategy is verified by simulating the stuck at 1 errors or stuck at 0 errors for several devices on typical 8051 digital board.

• Journal of Applied Reliability
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• v.12 no.3
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• pp.153-163
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• 2012

Recently, as a electronic components are becoming more high-density, so that electronic circuits have smaller pitches between the leads and are more vulnerable to insulation failure. And the reliability of electric insulation has become an ever important issue as device contact pitches and print patterns shrink. Ion migration occurs in highly humid environment as voltage is applied to an installed print circuit. Under highly humid and voltage applied circumstances, electronic components respond to applied voltages by electrochemical ionization of metals, and a conducting filament forms between the anode and cathode across a nonmetallic medium. This leads to short-circuit failure of the electronic component. In thesis, we study acceleration test of ion migration in FR-4 PCB plated with Sn. Voltage applied test of FR-4 PCB circuits plated with Sn was tested in the temperature and humidity environments. As a result of this test, equation of acceleration model was derived.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.62 no.9
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• pp.1313-1317
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• 2013

With increasing demand of power, the equipment of power system is enlarging and the absolute capacity is going up. As a result, when a fault occurs, the fault current is consistently increasing. Therefore, I suggested some solution for limiting the fault current more efficiently. This study shows the characteristics of superconducting limiting elements and normal conducting elements combined with a transformer. We performed a short-circuit test about the fault current by using SCR switching control system operated from a CT. When short circuit accidents happened in the secondary side of a transformer, fault currents flowed and a SCR switching control system was operated. It resulted in a decrease of the fault current in the limited elements of third winding connected in parallel. For this test, we used YBCO thin films and normal conducting elements as the limited elements. Within a cycle, a superconducting fault current limiter with YBCO thin films reduced more than 90% of fault current because the resistance of superconducting elements sustainedly grew. On the other hand, the limiter with normal conductors limited as much as a set value because its resistance characteristic was linear. Consequently, in case of the limiter with superconductor, limiting range of the circuit was wide but the range of protective detection was undefined. In contrast, as for the limiter with normal conductors, limiting range and protection duty were appropriate.

• The Journal of the Korea institute of electronic communication sciences
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• v.19 no.2
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• pp.361-370
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• 2024

In this paper, a method was studied for applying a series resonant type fault current limiter that can be manufactured at low cost to the smart grid distribution system. First, the impact of the harmonic components of the short-circuit fault current injected into the series resonance circuit of the fault current limiter on the peak value of the transient response was analyzed, and a methodology for determining the steady-state response was studied using percent impedance-based fault current computation method. Next, the effectiveness of the method was verified by applying it to a test distribution line. The test distribution system using the designed current limiter was modeled using EMTP_RV, and a three-phase short-circuit fault was simulated. In the fault simulation results, it was confirmed that the steady-state response of the fault current accurately followed the design target value after applying the fault current limiter. In addition, by comparing the fault current waveform before and after applying the fault current limiter, it was confirmed that the fault current was greatly suppressed, confirming the effect of applying the series resonance type current limiter to the distribution system.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.31A no.10
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• pp.173-184
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• 1994

BiCMOS circuits mixed with CMOS and bipolar technologies show peculiar fault characteristics that are different from those of other technoloties. It has been reported that because most of short faults in BiCMOS circuits cause logically intermediate level at outputs, current monitoring method is required to detect these faluts. However current monitoring requires additional hardware capabilities in the testing equipment and evaluation of test responses can be more difficult. In this paper, we analyze the characteristics of faults in BiCMOS circuit together with their test methods and propose a new design technique for testability to detect the faults by logic monitoring. An effective method to detect the transition delay faults induced by performance degradation by the open or short fault of bipolar transistors in BiCMOS circuits is presented. The proposed design-for-testability methods for BiCMOS circuits are confirmed by the SPICE simulation.