• Journal of the Korean Institute of Telematics and Electronics
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• v.24 no.5
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• pp.896-904
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• 1987

In this paper, a design method for sequential circuit which is easy to have Built-in Self Test is kproposed using the functional advantages of multifunctional BILBO and LSSD. To achieve the hardware reduction, it is designed that a multifunctional BILBO has double operational functions of NLFSR and LFSR, when neccessary, and that test signal could be used as an input-output signal in the same line. By applying the proposed multifunctional BILBO to the sequential PLA, the test patterns and the additional circuit could be reduced in test operation and the propagation delay is vanished in normal operation, as we expected. Above them, the partitioned method for large scale sequential circuit is also suggested and it is observed that test patterns and additional circuit in them reduced by this method.

• Journal of Fisheries and Marine Sciences Education
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• v.27 no.4
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• pp.1160-1171
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• 2015

The purpose of this study is to design and develop a computer based learning and test system, which supports not only testing learner's ability but also learning contents with giving feedback and hint. In order to design and develop a computer based learning and test system, Visual Basic dot Net software is used. The system works in three stages: sequential problem solving stage, randomized problem solving stage, and the challenge stage of pass/fail. The results of this study are as follows: (a) We propose the context of design for the computer based learning and test system. (b) We design and develop items display function with sequential and random algorithm in this system. (c) We design and develop pass/fail function by applying SPRT(Sequential Probability Ratio Testing) algorithm in the computer based learning and test system.

• Communications for Statistical Applications and Methods
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• v.8 no.2
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• pp.337-346
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• 2001

In this paper we consider the problem of identifying and testing the outliers in linear regression. first we consider the problem for testing the null hypothesis of no outliers. The test based on the ratio of two scale estimates is proposed. We show the asymptotic distribution of the test statistic by Monte Carlo simulation and investigate its properties. Next we consider the problem of identifying the outliers. A forward sequential procedure based on the suggested test is proposed and shown to perform fairly well. The forward sequential procedure is unaffected by masking and swamping effects because the test statistic is based on robust estimate.

• Journal of Korean Society for Quality Management
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• v.25 no.3
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• pp.22-38
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• 1997

In a traditional sequential acceptance sampling plan, it is assumed that the sampled items are independent each other. In this paper, stochastically dependent sequential acceptance sampling plans are dealt when there exists dependency between sampled items. Monte-Calro algorithm is used to find the acceptance and rejection probabilities of a lot. The number of defectives for the test to be accepted and rejected in probability ratio sequential test can be found by using these probabilities. The formula for measures of performance of these sampling plans is developed. Type I and II error probabilities are estimated by simulation. This research can be a, pp.ied to sequential sampling procedures in place of control charts where there is a recognized and necessary dependency during the production processes. Also, dependent multiple acceptance sampling plans can be derived by extending this sequential sampling procedure. As a numerical example, a Markov dependent process model is given, and the characteristics of the sampling plans are examined according to the change of the dependency factor.

• Journal of Korean Institute of Industrial Engineers
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• v.28 no.4
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• pp.351-359
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• 2002

In this paper, stochastically dependent single and sequential acceptance sampling plans are dealt when the process follows a Polya process model. A Monte-Cairo algorithm is used to find the acceptance and rejection probabilities of a lot. The number of defectives for the test to be accepted and rejected in a probability ratio sequential test can be found by using these probabilities. The formula to measure performance of these sampling plans is developed. Type I and II error probabilities are estimated by simulation. Dependent multiple acceptance sampling plans can be derived by extending the sequential sampling procedure. In numerical examples, single and sequential sampling plans of a Polya dependent process are examined and the characteristics are compared according to the change of the dependency factor.

• Journal of the Korean Data and Information Science Society
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• v.23 no.6
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• pp.1279-1287
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• 2012

We particularly emphasized how to determine the number of replications with sequential and multistage procedures. So, the t-test is used to achieve some predetermined level of accuracy efficiently with loss function in the case of normal, chi-squared, an exponential distributions. We provided that the relevance of procedures are sequential procedure, two-stage procedure, modified two-stage procedure, three-stage procedure and accelerated sequential procedure. Monte Carlo simulation is carried out to obtain the stopping sample size that minimizes the risk.

• Phonetics and Speech Sciences
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• v.2 no.2
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• pp.63-68
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• 2010

A new version of sequential probability ratio test (SPRT) which has been investigated in utterance-length control is proposed to obtain uniform response results in speaker verification (SV). Although SPRTs can obtain fast responses in SV tests, differences in the performance may occur depending on the compositions of consonants and vowels in the sentences used. In this paper, a fast sequential probability ratio test (FSPRT) method that shows consistent performances at all times regardless of the compositions of vocalized sentences for SV will be proposed. In generating frames, the FSPRT will first conduct SV test processes with only generated frames without any overlapping and if the results do not satisfy discrimination criteria, the FSPRT will sequentially use frames applied with overlapping. With the progress of processes as such, the test will not be affected by the compositions of sentences for SV and thus fast response outcomes and even consistent performances can be obtained. Experimental results show that the FSPRT has better performance to the SPRT method while requiring less complexity with equal error rates (EER).

• The Korean Journal of Applied Statistics
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• v.1 no.2
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• pp.66-81
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• 1987

A new nonparametric sequential testing procedure is proposed in the paper. Sequential observations are divided into equally sized groups and a nonparametric statistic, which is appropriate for testing the given hypotheses, is obtained from each group. Then Wald's sequential test is applied for the case where the log probability ratio statistic is replaced by the nonparametric statistic. The properties of such test are evaluated approximately by the Wiener process.

• The Korean Journal of Applied Statistics
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• v.3 no.1
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• pp.105-120
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• 1990

In this paper, a sequential test procedure is defined by using cumulative sum (CUSUM) of statistics. The properties as well as the efficiency of the CUSUM test are studied in comparison with the sequential probability ratio test (SPRT). It was shown that, the operating characteristic function and the average sample numbrer can be derived by Wald and Wiener process approximations. Also it was shown that the statistics used in the CUSUM test is determined to provide asymtotically equivalent efficiency compared to the SPRT. The efficiency of the CUSUM test and the SPRT are cpmpared by an example for some limited number of cases in the exponential distribution.

• The Transactions of the Korean Institute of Electrical Engineers
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• v.43 no.3
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• pp.504-514
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• 1994

Combinational automatic test pattern generators (CATPG) have already been commercialized because their algorithms are well known and practical, while sequential automatic test pattern generators(SATPG) have been regarded as impractical because they are computationally complex. A technique to use CATPG instead of SATPG for test generation of sequential circuits is proposed. Redesign of seauential circuits such as Level Sensitive Scan Design (LSSD) is inevitable to use CATPG. Various partial scan techniques has been proposed to avoid full scan such as LSSD. It ha sbeen reported that SATPG is required to use partial scan techniques. We propose a technique to use CATPG for a new partial scan technique, and propose a new CATPG algorithm for the partially scanned circuits. The partial scan technique can be another choice of design for testability because it is computationally advantageous.