• Title/Summary/Keyword: Sequential Test

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Malware Detector Classification Based on the SPRT in IoT

  • Jun-Won Ho
    • International journal of advanced smart convergence
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    • v.12 no.1
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    • pp.59-63
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    • 2023
  • We create a malware detector classification method with using the Sequential Probability Ratio Test (SPRT) in IoT. More specifically, we adapt the SPRT to classify malware detectors into two categories of basic and advanced in line with malware detection capability. We perform evaluation of our scheme through simulation. Our simulation results show that the number of advanced detectors is changed in line with threshold for fraction of advanced malware information, which is used to judge advanced detectors in the SPRT.

SPRT-based Collaboration Construction for Malware Detection in IoT

  • Jun-Won Ho
    • International journal of advanced smart convergence
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    • v.12 no.1
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    • pp.64-69
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    • 2023
  • We devise a collaboration construction method based on the SPRT (Sequential Probability Ratio Test) for malware detection in IoT. In our method, high-end IoT nodes having capable of detecting malware and generating malware signatures harness the SPRT to give a reward of malware signatures to low-end IoT nodes providing useful data for malware detection in IoT. We evaluate our proposed method through simulation. Our simulation results indicate that the number of malware signatures provided for collaboration is varied in accordance with the threshold for fraction of useful data.

Image Segmentation based on Statistics of Sequential Frame Imagery of a Static Scene (정지장면의 연속 프레임 영상 간 통계에 기반한 영상분할)

  • Seo, Su-Young;Ko, In-Chul
    • Spatial Information Research
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    • v.18 no.3
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    • pp.73-83
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    • 2010
  • This study presents a method to segment an image, employing the statistics observed at each pixel location across sequential frame images. In the acquisition and analysis of spatial information, utilization of digital image processing technique has very important implications. Various image segmentation techniques have been presented to distinguish the area of digital images. In this study, based on the analysis of the spectroscopic characteristics of sequential frame images that had been previously researched, an image segmentation method was proposed by using the randomness occurring among a sequence of frame images for a same scene. First of all, we computed the mean and standard deviation values at each pixel and found reliable pixels to determine seed points using their standard deviation value. For segmenting an image into individual regions, we conducted region growing based on a T-test between reference and candidate sample sets. A comparative analysis was conducted to assure the performance of the proposed method with reference to a previous method. From a set of experimental results, it is confirmed that the proposed method using a sequence of frame images segments a scene better than a method using a single frame image.

A sequential outlier detecting method using a clustering algorithm (군집 알고리즘을 이용한 순차적 이상치 탐지법)

  • Seo, Han Son;Yoon, Min
    • The Korean Journal of Applied Statistics
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    • v.29 no.4
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    • pp.699-706
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    • 2016
  • Outlier detection methods without performing a test often do not succeed in detecting multiple outliers because they are structurally vulnerable to a masking effect or a swamping effect. This paper considers testing procedures supplemented to a clustering-based method of identifying the group with a minority of the observations as outliers. One of general steps is performing a variety of t-test on individual outlier-candidates. This paper proposes a sequential procedure for searching for outliers by changing cutoff values on a cluster tree and performing a test on a set of outlier-candidates. The proposed method is illustrated and compared to existing methods by an example and Monte Carlo studies.

Sequential Loop Closing Identification of Hammerstein Models for Multiple-Input Multiple-Output Processes (다변수 Hammerstein 공정의 순차 확인법)

  • Park Ho Cheol;Koo Doe Gyoon;Lee Moon Yong;Lee Jietae
    • Journal of Institute of Control, Robotics and Systems
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    • v.10 no.12
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    • pp.1280-1286
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    • 2004
  • A lot of industrial chemical processes contain certain input nonlinearities even though they are controlled by several linear controllers. Here we investigate a sequential loop closing identification method for MIMO Hammerstein nonlinear processes with diagonal nonlinearities. The proposed method separates the identification of the nonlinear static function from that of the linear subsystem by using a relay feedback test and a triangular type signal test. From 2 n activations for n n MIMO nonlinear processes, we sequentially identify the whole range of the nonlinear static function as well as the transfer function matrix of the linear subsystem.

The Sequential Rectifying Inspection for the Constraint of Motor Vehicle Emission (자동차배출(自動車排出)가스 규제(規制)를 위한 수정(修正)된 축차검사계획(逐次檢査計劃))

  • Jo, Jae-Rip
    • Journal of Korean Society for Quality Management
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    • v.17 no.1
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    • pp.48-59
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    • 1989
  • The motor vehicle emission is expected to be constrained strongly in the future in accordance with the current policy as to prevention of air pollution. This paper establishes a sequential rectifying inspection plan which satisfies the standard motor vehicle emission for the automobile producers who are currently producting the automobiles with catalytic converts. This plan also considered the constraint of the effective motor vehicle emission by way of rectifying the certification test in the past. In order to evaluate the performance of the inspection plan, the recent certification test data have also been applied. The result of the application has proved that the rectified sequential inspection plan presented in this paper satisfies the standard motor vehicle emission and can be the optimal economic inspection plan. As a result the inspection plan given in this paper will be contributed to constrain the motor vehicle emission most effectively.

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Partial Scan Design based on Levelized Combinational Structure

  • Park, Sung-Ju
    • Journal of Electrical Engineering and information Science
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    • v.2 no.3
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    • pp.7-13
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    • 1997
  • To overcome the large hardware overhead attendant in the full scan design, the concept of partial scan design has emerged with the virtue of less area and testability close to full scan. Combinational Structure has been developed to avoid the use of sequential test generator. But the patterns sifted on scan register have to be held for sequential depth period upon the aid of the dedicated HOLD circuit. In this paper, a new levelized structure is introduced aiming to exclude the need of extra HOLD circuit. The time to stimulate each scan latch is uniquely determined on this structure, hence each test pattern can e applied by scan shifting and then pulsing a system clock like the full scan but with much les scan flip-flops. Experimental results show that some sequential circuits are levelized by just scanning self-loop flip-flops.

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Sequential patient recruitment monitoring in multi-center clinical trials

  • Kim, Dong-Yun;Han, Sung-Min;Youngblood, Marston Jr.
    • Communications for Statistical Applications and Methods
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    • v.25 no.5
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    • pp.501-512
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    • 2018
  • We propose Sequential Patient Recruitment Monitoring (SPRM), a new monitoring procedure for patient recruitment in a clinical trial. Based on the sequential probability ratio test using improved stopping boundaries by Woodroofe, the method allows for continuous monitoring of the rate of enrollment. It gives an early warning when the recruitment is unlikely to achieve the target enrollment. The packet data approach combined with the Central Limit Theorem makes the method robust to the distribution of the recruitment entry pattern. A straightforward application of the counting process framework can be used to estimate the probability to achieve the target enrollment under the assumption that the current trend continues. The required extension of the recruitment period can also be derived for a given confidence level. SPRM is a new, continuous patient recruitment monitoring tool that provides an opportunity for corrective action in a timely manner. It is suitable for the modern, centralized data management environment and requires minimal effort to maintain. We illustrate this method using real data from two well-known, multicenter, phase III clinical trials.

Test Generation for Sequential Circuits Based on Circuit Partitioning (회로 분할에 의한 순차회로의 테스트생성)

  • 최호용
    • Journal of the Korean Institute of Telematics and Electronics C
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    • v.35C no.4
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    • pp.30-37
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    • 1998
  • In this paper, we propose a test generation method for large scale sequential circuits based on circuit partitioning to increase the size of circuits that the implicit product machine traversal (IPMT) method can handle. Our method paratitions a circuit under test into subset circuits with only single output, and performs a partial scan design using the state transtition cost that represents a degree of the connectivity of the subset circuit. The IPMT method is applied to the partitioned partial scan circuits in test generation. Experimental results for ISCAS89 benchmark circuits with more thatn 50 flip-flops show that our method has generated test patterns with almost 100% fault coverage at high speed by use of 34%-73% scanned flip-flops.

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Design and Test of Sequential CMOS Domino Logic Array (순서 CMOS Domino Logic Array의 설계 및 테스트)

  • Park, J.K.;Kim, Y.H.;Jung, J.M.;Han, S.B.;Lim, I.C.
    • Proceedings of the KIEE Conference
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    • 1987.07b
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    • pp.1476-1480
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    • 1987
  • This paper proposes a design method for SCLA(sequential CMOS Domino Logic Array) using 1-level CMOS Domino Logic and Stable Shift Register Latch. Also an algorithm to generate a test sequence and a test procedure for the SCLA are presented. The SCLA has advantages of low power consumption, high density and high speed, and performs hazard-and race-free logic operation, because of using SSRL(Stable Shift Register Latch). By using the proposed test method, all of stuck-at, cross-point, stuck-on and stuck-open faults in SCLA are detected by short test sequence.

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