• 대한전자공학회논문지
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• 제24권5호
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• pp.896-904
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• 1987

In this paper, a design method for sequential circuit which is easy to have Built-in Self Test is kproposed using the functional advantages of multifunctional BILBO and LSSD. To achieve the hardware reduction, it is designed that a multifunctional BILBO has double operational functions of NLFSR and LFSR, when neccessary, and that test signal could be used as an input-output signal in the same line. By applying the proposed multifunctional BILBO to the sequential PLA, the test patterns and the additional circuit could be reduced in test operation and the propagation delay is vanished in normal operation, as we expected. Above them, the partitioned method for large scale sequential circuit is also suggested and it is observed that test patterns and additional circuit in them reduced by this method.

• 수산해양교육연구
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• 제27권4호
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• pp.1160-1171
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• 2015

The purpose of this study is to design and develop a computer based learning and test system, which supports not only testing learner's ability but also learning contents with giving feedback and hint. In order to design and develop a computer based learning and test system, Visual Basic dot Net software is used. The system works in three stages: sequential problem solving stage, randomized problem solving stage, and the challenge stage of pass/fail. The results of this study are as follows: (a) We propose the context of design for the computer based learning and test system. (b) We design and develop items display function with sequential and random algorithm in this system. (c) We design and develop pass/fail function by applying SPRT(Sequential Probability Ratio Testing) algorithm in the computer based learning and test system.

• Communications for Statistical Applications and Methods
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• 제8권2호
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• pp.337-346
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• 2001

In this paper we consider the problem of identifying and testing the outliers in linear regression. first we consider the problem for testing the null hypothesis of no outliers. The test based on the ratio of two scale estimates is proposed. We show the asymptotic distribution of the test statistic by Monte Carlo simulation and investigate its properties. Next we consider the problem of identifying the outliers. A forward sequential procedure based on the suggested test is proposed and shown to perform fairly well. The forward sequential procedure is unaffected by masking and swamping effects because the test statistic is based on robust estimate.

• 품질경영학회지
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• 제25권3호
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• pp.22-38
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• 1997

In a traditional sequential acceptance sampling plan, it is assumed that the sampled items are independent each other. In this paper, stochastically dependent sequential acceptance sampling plans are dealt when there exists dependency between sampled items. Monte-Calro algorithm is used to find the acceptance and rejection probabilities of a lot. The number of defectives for the test to be accepted and rejected in probability ratio sequential test can be found by using these probabilities. The formula for measures of performance of these sampling plans is developed. Type I and II error probabilities are estimated by simulation. This research can be a, pp.ied to sequential sampling procedures in place of control charts where there is a recognized and necessary dependency during the production processes. Also, dependent multiple acceptance sampling plans can be derived by extending this sequential sampling procedure. As a numerical example, a Markov dependent process model is given, and the characteristics of the sampling plans are examined according to the change of the dependency factor.

• 대한산업공학회지
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• 제28권4호
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• pp.351-359
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• 2002

In this paper, stochastically dependent single and sequential acceptance sampling plans are dealt when the process follows a Polya process model. A Monte-Cairo algorithm is used to find the acceptance and rejection probabilities of a lot. The number of defectives for the test to be accepted and rejected in a probability ratio sequential test can be found by using these probabilities. The formula to measure performance of these sampling plans is developed. Type I and II error probabilities are estimated by simulation. Dependent multiple acceptance sampling plans can be derived by extending the sequential sampling procedure. In numerical examples, single and sequential sampling plans of a Polya dependent process are examined and the characteristics are compared according to the change of the dependency factor.

• Journal of the Korean Data and Information Science Society
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• 제23권6호
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• pp.1279-1287
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• 2012

We particularly emphasized how to determine the number of replications with sequential and multistage procedures. So, the t-test is used to achieve some predetermined level of accuracy efficiently with loss function in the case of normal, chi-squared, an exponential distributions. We provided that the relevance of procedures are sequential procedure, two-stage procedure, modified two-stage procedure, three-stage procedure and accelerated sequential procedure. Monte Carlo simulation is carried out to obtain the stopping sample size that minimizes the risk.

• 말소리와 음성과학
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• 제2권2호
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• pp.63-68
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• 2010

A new version of sequential probability ratio test (SPRT) which has been investigated in utterance-length control is proposed to obtain uniform response results in speaker verification (SV). Although SPRTs can obtain fast responses in SV tests, differences in the performance may occur depending on the compositions of consonants and vowels in the sentences used. In this paper, a fast sequential probability ratio test (FSPRT) method that shows consistent performances at all times regardless of the compositions of vocalized sentences for SV will be proposed. In generating frames, the FSPRT will first conduct SV test processes with only generated frames without any overlapping and if the results do not satisfy discrimination criteria, the FSPRT will sequentially use frames applied with overlapping. With the progress of processes as such, the test will not be affected by the compositions of sentences for SV and thus fast response outcomes and even consistent performances can be obtained. Experimental results show that the FSPRT has better performance to the SPRT method while requiring less complexity with equal error rates (EER).

• 응용통계연구
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• 제1권2호
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• pp.66-81
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• 1987

이 연구에서는 새로운 방법의 비모수적 축차검정방법이 제시되었다. 먼저 축차적으로 얻어지는 관측치를 일정수의 집단으로 분류하고 각집단으로부터 주어진 가설에 적절한 비모수 통계량을 구하여 이것을 축차확률비검정에서 사용되는 로그확률비통계량에 대체하여 Wald의 축차검정을 수행하는 방법이다. 이러한 검정의 특성은 Wiener과정에 의해 근사적으로 규명되었다.

• 응용통계연구
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• 제3권1호
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• pp.105-120
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• 1990

이 논문에서는 통계량의 누적합을 이용하여 누적합 검정을 정의하고 그 특성에 대해 연구하였으며, 축차확률비 검정과의 상대효율을 정의하였다. 누적합 검정의 검사특성함수와 평균표본수는 Wald의 근사공식과 Wiener과정 근사에 의해 표현될 수 있음을 보였다. 또한 누적합 검정에서 축차확률비 검정과 점근적으로 동일한 효율성을 나타내는 통계량을 선정할 수 있음을 보였다. 관측값이 지수 분포를 할 때 누적합 검정과 축차확률비 검정의 효율을 예를 들어 비교해 보았다.

• 대한전기학회논문지
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• 제43권3호
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• pp.504-514
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• 1994

Combinational automatic test pattern generators (CATPG) have already been commercialized because their algorithms are well known and practical, while sequential automatic test pattern generators(SATPG) have been regarded as impractical because they are computationally complex. A technique to use CATPG instead of SATPG for test generation of sequential circuits is proposed. Redesign of seauential circuits such as Level Sensitive Scan Design (LSSD) is inevitable to use CATPG. Various partial scan techniques has been proposed to avoid full scan such as LSSD. It ha sbeen reported that SATPG is required to use partial scan techniques. We propose a technique to use CATPG for a new partial scan technique, and propose a new CATPG algorithm for the partially scanned circuits. The partial scan technique can be another choice of design for testability because it is computationally advantageous.