• Title/Summary/Keyword: Scanning height

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Narrow Resonant Double-Ridged Rectangular Waveguide Probe for Near-Field Scanning Microwave Microscopy

  • Kim, Byung-Mun;Son, Hyeok-Woo;Cho, Young-Ki
    • Journal of Electrical Engineering and Technology
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    • v.13 no.1
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    • pp.406-412
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    • 2018
  • In this paper, we propose a narrow resonant waveguide probe that can improve the measurement sensitivity in near-field scanning microwave microscopy. The probe consists of a metal waveguide incorporating the following two sections: a straight section at the tip of the probe whose cross-section is a double-ridged rectangle, and whose height is much smaller than the waveguide width; and a standard waveguide section. The advantage of the narrow waveguide is the same as that of the quarter-wave transformer section i.e., it achieves impedance-matching between the sample under test (SUT) and the standard waveguide. The design procedure used for the probe is presented in detail and the performance of the designed resonant probe is evaluated theoretically by using an equivalent circuit. The calculated results are compared with those obtained using the finite element method (Ansoft HFSS), and consistency between the results is demonstrated. Furthermore, the performance of the fabricated resonant probe is evaluated experimentally. At X-band frequencies, we have measured the one-dimensional scanning reflection coefficient of the SUT using the probe. The sensitivity of the proposed resonant probe is improved by more than two times as compared to a conventional waveguide cavity type probe.

Building Extraction and 3D Modeling from Airborne Laser Scanning Data

  • Lee, Jeong-Ho;Han, Soo-Hee;Byun, Young-Gi;Yu, Ki-Yun;Kim, Yong-Il
    • Korean Journal of Remote Sensing
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    • v.23 no.5
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    • pp.447-453
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    • 2007
  • The demand for more accurate and realistic 3D urban models has been increasing more and more. Many studies have been conducted to extract 3D features from remote sensing data such as satellite images, aerial photos, and airborne laser scanning data. In this paper a technique is presented to extract and reconstruct 3D buildings in urban areas using airborne laser scanning data. Firstly all points in a building were divided into some groups by height difference. From segmented laser scanning data of irregularly distributed points we generalized and regularized building boundaries which better approximate the real boundaries. Then the roof points which are subject to the same groups were classified using pre-defined models by least squares fitting. Finally all parameters of the roof surfaces were determined and 3D building models were constructed. Some buildings with complex shapes were selected to test our presented algorithms. The results showed that proposed approach has good potential for reconstructing complex buildings in detail using only airborne laser scanning data.

Derivation of aerosol vertical profiles in Seoul based on O4 measurements using UV scanning spectrometer

  • Lee, Hanlim;Hwang, JungBae;Son, Yoonhee
    • Korean Journal of Remote Sensing
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    • v.29 no.3
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    • pp.325-329
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    • 2013
  • This present study describes an application of UV scanning spectrometer $O_4$ data for retrieval of aerosol vertical profiles in Seoul during the measurement period that includes two Asian dust event days. The results show large variations of aerosol load in vertical and temporal scales. Large variations in aerosol were observed at 1 km in height during the daytime in the measurement period when the Asian dust events took place. The aerosol load, however, was found to be largest at the surface compared to those retrieved at the higher atmospheric layers. The results also clearly identified the diurnal patterns of aerosol vertical distributions. The aerosol load was high in the morning and noon whereas it was low in the afternoon. This study demonstrates that UV scanning spectrometer observations of the oxygen dimer can serve as a potential method for determination of atmospheric aerosol vertical distributions and optical properties.

Morphological Discretion of Basidiospores of the Puftball Mushroom Calostoma by Electron and Atomic Force Microscopy

  • Kim, Mi-Sun;Kim, Ki-Woo;Jung, Hack-Sung
    • Journal of Microbiology and Biotechnology
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    • v.17 no.10
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    • pp.1721-1726
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    • 2007
  • Comparative morphology among species of the genus Calostoma, including C. cinnabarina, C. ravenelii, and C. japonicum, was investigated by scanning electron microscopy and atomic force microscopy. Spore morphology of C. cinnabarina and C. ravenelii showed no dramatic differences by light microcopy and scanning electron microscopy. To differentiate these species, atomic force microscopy was employed. Quantitative analysis of the surface roughness of basidiospores revealed subtle differences in height fluctuation at the nanometer scale between the species of Calostoma. Basidiospores of C. cinnabarina had a relatively rougher surface than those of C. ravenelii at $2.0{\times}2.0\;{\mu}m^2$ scan areas.

Atomic-scale investigation of Epitaxial Graphene Grown on 6H-SiC(0001) Using Scanning Tunneling Microscopy and Spectroscopy

  • Lee, Han-Gil;Choe, Jeong-Heon;Kim, Se-Hun
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.02a
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    • pp.125-125
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    • 2012
  • Graphene was epitaxially grown on a 6H-SiC(0001) substrate by thermal decomposition of SiC under ultrahigh vacuum conditions. Using scanning tunneling microscopy (STM), we monitored the evolution of the graphene growth as a function of the temperature. We found that the evaporation of Si occurred dominantly from the corner of the step rather than on the terrace. A carbon-rich $(6{\sqrt{3}}{\times}6{\sqrt{3}})R30^{\circ}$ layer, monolayer graphene, and bilayer graphene were identified by measuring the roughness, step height, and atomic structures. Defect structures such as nanotubes and scattering defects on the monolayer graphene are also discussed. Furthermore, we confirmed that the Dirac points (ED) of the monolayer and bilayer graphene were clearly resolved by scanning tunneling spectroscopy (STS).

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Biomedical Applications of Stereoscopy for Three-Dimensional Surface Reconstruction in Scanning Electron Microscopes

  • Kim, Ki Woo
    • Applied Microscopy
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    • v.46 no.2
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    • pp.71-75
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    • 2016
  • The scanning electron microscope (SEM) offers two-dimensional (2D) micrographs of three-dimensional (3D) objects due to its inherent operating mechanisms. To overcome this limitation, other devices have been used for quantitative morphological analysis. Many efforts have been made on the applications of software-based approaches to 3D reconstruction and measurements by SEM. Based on the acquisition of two stereo images, a multi-view technique consists of two parts: (i) geometric calibration and (ii) image matching. Quantitative morphological parameters such as height and depth could be nondestructively measured by SEM combined with special software programs. It is also possible to obtain conventional surface parameters such as roughness and volume of biomedical specimens through 3D SEM surface reconstruction. There is growing evidence that conventional 2D SEM without special electron detectors can be transformed to 3D SEM for quantitative measurements in biomedical research.

Surface profiling by the phase shifting method in fiber-optical confocal scanning interference microscopes (광섬유 공초점 간섭 현미경과 위상 변위법을 결합한 표면 검색)

  • 김대찬;이승걸
    • Korean Journal of Optics and Photonics
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    • v.10 no.3
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    • pp.201-207
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    • 1999
  • The fiber-optical confocal scanning interference microscope with a simple configuration was constructed with a 4-port fiber-optic coupler, and the new method based on the phase shifting method was proposed for surface profiling by the system. In the method, the height of a specimen was determined from the phase of confocal beam. It was verified experimentally that the method was applicable to even the confocal interference microscope with a long-wavelength source and a low NA objective, and that the scanning time could be drastically reduced compared with the conventional method. Finally, it was found that our method is less sensitive to the variation of surface reflectivity than the conventional method.

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Design and Fabrication of a Step Height Certified Reference Material for Multi-probe Inspection Instruments (다중 프로브 검사 계측 장비를 위한 단차 표준 인증 물질의 설계 및 제작)

  • Maeng, Sae-Rom;Jin, Jong-Han;Buajarern, Jariya;Kim, Jae-Wan;Kim, Jong-Ahn;Kang, Chu-Shik
    • Journal of the Korean Society for Precision Engineering
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    • v.28 no.3
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    • pp.323-329
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    • 2011
  • Certified reference materials (CRMs) have been used to calibrate surface profilers for reliable measurements. In this paper, we present a newly designed step height CRM which has a step height pattern with two different widths and various special patterns for checking radial magnification, distortion of optical viewing systems, etc. Especially, it could be useful for multi-probe inspection instruments in the manufacturing lines. The fabrication was done by conventional optical lithography and dry etching process with optimized conditions. To verify the step height values, a white-light scanning interferometer was used with objective lenses having magnification of $10{\times}$ and $100{\times}$. CRMs with nominal step heights of $0.5\;{\mu}m$, $1\;{\mu}m$, $3\;{\mu}m$, $5\;{\mu}m$, $7\;{\mu}m$, and $10\;{\mu}m$ were fabricated and the uniformity of these CRMs was evaluated to be less than 3 nm ($1{\sigma}$).

A 3D Solder Paste Inspection System Using Multiple Slit Rays (다중 슬릿광을 이용한 3차원 Solder Paste 검사 시스템)

  • Cho, Tai-Hoon;Huh, Byoung-Hweh
    • Journal of Institute of Control, Robotics and Systems
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    • v.8 no.2
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    • pp.151-157
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    • 2002
  • A 3-dimenstional automatic solder paste inspection system is described that can be used to find defects occurring in solder paste printing process. This system extracts height and volume information very fast as well as area of solder paste printed, using multiple slit ray projection and Galvano-mirror scanning. Methods are presented on calibration of camera and slit projector, real-time image processing of multiple slit images, determination of reference height, and extraction of paste height information are proposed. Performance of the system was successfully demonstrated through field tests.