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Design and Fabrication of a Step Height Certified Reference Material for Multi-probe Inspection Instruments  

Maeng, Sae-Rom (Center for Length, Division of Physical Metrology, KRISS)
Jin, Jong-Han (Center for Length, Division of Physical Metrology, KRISS)
Buajarern, Jariya (National Institute of Metrology)
Kim, Jae-Wan (Center for Length, Division of Physical Metrology, KRISS)
Kim, Jong-Ahn (Center for Length, Division of Physical Metrology, KRISS)
Kang, Chu-Shik (Center for Length, Division of Physical Metrology, KRISS)
Publication Information
Abstract
Certified reference materials (CRMs) have been used to calibrate surface profilers for reliable measurements. In this paper, we present a newly designed step height CRM which has a step height pattern with two different widths and various special patterns for checking radial magnification, distortion of optical viewing systems, etc. Especially, it could be useful for multi-probe inspection instruments in the manufacturing lines. The fabrication was done by conventional optical lithography and dry etching process with optimized conditions. To verify the step height values, a white-light scanning interferometer was used with objective lenses having magnification of $10{\times}$ and $100{\times}$. CRMs with nominal step heights of $0.5\;{\mu}m$, $1\;{\mu}m$, $3\;{\mu}m$, $5\;{\mu}m$, $7\;{\mu}m$, and $10\;{\mu}m$ were fabricated and the uniformity of these CRMs was evaluated to be less than 3 nm ($1{\sigma}$).
Keywords
Step Height; Certified Reference Material;
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Times Cited By KSCI : 3  (Citation Analysis)
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