• Proceedings of the KIEE Conference
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• 2008.10b
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• pp.460-461
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• 2008

A new AC-PDP driving method was proposed to reduce the address period. The overlapped scan method can reduce the address period. However, this method has a narrow address voltage margin compared with conventional scan method in this paper, Slope overlapped scan method is presented. The proposed new overlapped scan method allows wider address voltage margin than conventional overlapped scan method.

• Journal of Korea Multimedia Society
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• v.21 no.11
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• pp.1271-1278
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• 2018

The NDT using ultrasonic is largely divided into A-Scan and C-Scan methods. Since A-Scan method is subject to subjective judgement by trained personnel, C-Scan method has been introduced, which presents the weld area in two dimensions by placing the transducers two dimensionally used in the A-Scan method. Therefore, it is necessary to develop equipment that can provide weld quality without the help of a welding expert and the presentation of effective C-Scan images. Thus, in this paper, the algorithms that express a low resolution 2-dimensional gray image formed by C-Scan method as a high-resolution color C-Scan image and automatically determine the weld quality from the generated C-Scan color image. The high resolution color C-Scan images proposed in this paper allow the exact shape of the weld point to be expressed, and an objective algorithm to use this image to automatically determine weld quality.

• Korean Journal of Digital Imaging in Medicine
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• v.17 no.1
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• pp.49-56
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• 2015

Temporal bone CT scan side skull fracture. In addition to the confirmation of the ossicles, such as fractures and dislocations, temporomandibular facial fractures, deformities surgery helps to establish a science plan. Cochlear implant surgery has been performed in the state before and after identifying purposes. Test methods are being implemented by the Conventional direct axial and Direct coronal scan, the basic method of Temporal bone CT. Helical scan is a fast Volumetric data obtained compared with the Conventional scan, the patient reduced the dose, and there are some advantages, such as reduced Beam hardening streak artifacts caused by dental fillings. This study is a comparative analysis by dose reduction for patients with a dose according to the conventional scan method and then effective from 2015 by helical scan method performed in 2014 through the retrospective survey, which was then optimized for the purpose of inspection.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.35C no.3
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• pp.1-15
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• 1998

In this paper, we propose a partial scan test method which can be applied to large VLSI designs. In this method, it is not necessary to hold neither scanned nor unscanned flip-flops during scan in, test application,or scan out. This test method requires almost identical design for testability modification and test wave form when compared to the full scan test method, and the method is applicable to large VLSI chips. The well known FAN algorithm has been modified to devise to sequential ATPG algorithm which is effective for the proposed test method. In addition, a partial scan algorithm which is effective for the proposed test method. In addition, a partial algorithm determined a maximal set of flip-flops which gives high fault coverage when they are unselected. The experimental resutls show that the proposed method allow as large as 20% flip-flops to remain unscanned without much decrease in the full scan fault coverage.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.35C no.12
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• pp.49-58
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• 1998

In this paper, we report new algorithms to select scan flip-flops for the no holding partial scan test method. The no holding partial scan test method is identical to the full scan test method except that some flip-flops are left unscanned. This test method does not hold scanned or unscanned flip-flops while shifting in test vectors, or applying them, or shifting out test results. The proposed algorithm allows a large number of flip-flops to be left unscanned while maintaining almost the complete full scan fault coverage.

• The Korean Journal of Nuclear Medicine Technology
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• v.19 no.2
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• pp.63-67
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• 2015

Purpose Among various causes that influence image quality degradation, various methods for decrease in Artifact occurred by respiration of patients are being used. Among them, this study intended to evaluate CTAC Shift correction method and additional scan compare to the Scan(Q static scan) using respiratory gated system. Materials and Methods This study was conducted on 10 patients, and used PET-CT Discovery 710 (GE Healthcare, MI, USA) and Varian's RPM system. 5.18 Mbq per kg of $^{18}F$-FDG was injected on patients, asked them to take a rest for 1 hour in the bed, and conducted test after urination. Images were visualized through Q static scan, CTAC Shift correction method, Additional scan based on the Whole body scan(WBS) with Artifact. Decrease in Artifact was compared in each image, conducted Gross Evalution, and measured changes of SUVmax. Results For image obtained through the CTAC Shift correction method through WBS with Artifact, 12~56%, Q static scan image showed 17~54% of change rate and Additional Scan showed -27~46% of change rate. In Blind Test, the CTAC Shift correction image showed the highest point with 4 points, Q static scan image showed 3.5 points, and Additional scan image showed 3.4 points. The standardized WBS scan through Oneway ANOVA and three types of Scan method showed significant difference(p<0.05), and did not show significant difference between the three Scan methods(p>0.05). However, the three Scan methods showed significant difference in Blind test. Conclusion Additional scan and Q static scan require more time than the CTAC Shift correction method, there is concern about excessive exposure to patients by CT rescan and Q static scan is difficult to apply on patients with inconsistent respiration or irregular respiration cycle due to pain. For CTAC Shift correction method, limited correction is possible and the range is limited as well. It is considered as a useful method of improving diagnostic value when hospitals use the system appropriately and develop various advantageous factors of each method.

• The Journal of the Korea Contents Association
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• v.5 no.4
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• pp.188-196
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• 2005

This paper presents a new test data compression and low power scan test method that can reduce test time and power consumption. A proposed method can reduce the scan-in power and test data volume using a modified scan cell reordering algorithm and hybrid adaptive encoding method. Hybrid test data compression method uses adaptively the Golomb codes and run-length codes according to length of runs in test data, which can reduce efficiently the test data volume compare to previous method. We apply a scan cell reordering technique to minimize the column hamming distance in scan vectors, which can reduce the scan-in power consumption and test data. Experimental results for ISCAS 89 benchmark circuits show that reduced test data and low power scan testing can be achieved in all cases. The proposed method showed an about a 17%-26% better compression ratio, 8%-22% better average power consumption and 13%-60% better peak power consumption than that of previous method.

• The KIPS Transactions:PartD
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• v.11D no.7 s.96
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• pp.1385-1398
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• 2004

This paper discusses an effective processing of subsequence matching under time warping in time-series databases. Time warping is a trans-formation that enables finding of sequences with similar patterns even when they are of different lengths. Through a preliminary experiment, we first point out that the performance bottleneck of Naive-Scan, a basic method for processing of subsequence matching under time warping, is on the CPU processing step. Then, we propose a novel method that optimizes the CPU processing step of Naive-Scan. The proposed method maximizes the CPU performance by eliminating all the redundant calculations occurring in computing the time warping distance between the query sequence and data subsequences. We formally prove the proposed method does not incur false dismissals and also is the optimal one for processing Naive-Scan. Also, we discuss the we discuss to apply the proposed method to the post-processing step of LB-Scan and ST-Filter, the previous methods for processing of subsequence matching under time warping. Then, we quantitatively verify the performance improvement ef-fects obtained by the proposed method via extensive experiments. The result shows that the performance of all the three previous methods im-proves by employing the proposed method. Especially, Naive-Scan, which is known to show the worst performance, performs much better than LB-Scan as well as ST-Filter in all cases when it employs the proposed method for CPU processing. This result is so meaningful in that the performance inversion among Nive- Scan, LB-Scan, and ST-Filter has occurred by optimizing the CPU processing step, which is their perform-ance bottleneck.

• Proceedings of the IEEK Conference
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• 2002.07a
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• pp.228-230
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• 2002

We present a new low power scan testing and test data compression method for System-On-a-Chip (SOC). The don't cares in unspecified scan vectors are mapped to binary values for low power and encoded by adaptive encoding method for higher compression. Also, the scan-in direction of scan vectors is determined for low power. Experimental results for full-scanned versions of ISCAS 89 benchmark circuits show that the proposed method has both low power and higher compression.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.8
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• pp.74-83
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• 2002

In order to design a huge VLSI system, the scan testing methodology by employing scan flip-flops(cells) is a popular method to test those If chips. In this case, the connection order of scan cells are not important, and hence the order can be determined in the very final stage of physical design such as cell placement. Using this fact, we propose, in this paper, a scan cell reordering method which minimizes the length of wires for scan chain connections. Especially, our reordering method is newly proposed method in the case when the scan cells are grouped according to their clock domains. In fact, the proposed reordering method reduces the wire length about 13.6% more than that by previously proposed reordering method. Our method may also be applicable for reordering scan chains that have various constraints on the scan cell locations due to the chain grouping.