• Title/Summary/Keyword: Scan Controller

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A Design of New Real Time Monitoring Embedded Controller using Boundary Scan Architecture (경계 주사 구조를 이용한 새로운 실시간 모니터링 실장 제어기 설계)

  • 박세현
    • Journal of Korea Multimedia Society
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    • v.4 no.6
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    • pp.570-578
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    • 2001
  • Boundary scan architecture test methodology was introduced to facilitate the testing of complex printed circuit board. The boundary scan architecture has a tremendous potential for real time monitoring of the operational status of a system without interference of normal system operation. In this paper, a new type of embedded controller for real time monitoring of the operational status of a system is proposed and designed by using boundary scan architecture. The proposed real time monitoring embedded controller consists of test access port controller and an embedded controller proposed real time monitoring embedded controller using boundary scan architecture can save the hard-wire resource and can easily interface with boundary scan architecture chip. Experimental results show that the real time monitoring using proposed embedded controller is more effective then the real time monitoring using host computer.

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Robust controller design and performance analysis of seeker scan-loop (탐색기 주사루프의 강인 제어기 설계와 성능분석)

  • Lee, Ho-Pyeong;Hwang, Hong-Yeon;Song, Chang-Seop
    • Journal of the Korean Society for Precision Engineering
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    • v.11 no.2
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    • pp.110-119
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    • 1994
  • The Robust Controller for scan-loop is designed using LQG/LTR Methodology. The design and analysis of spiral, rosette and conical scan patterns are discussed. The perfermance and robustness of the LQG/LTR controller are analyzed through experiments and cpmpared with those of the P-controller. Especially to improve the scan performance at large look angle, the cage coil output is linearized using a binomial equation. It is demonstrated that the scan-loop system by the LQG/LTR control is very robust to phase uncertainties.

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A decoupling controller design for the seeker scan loop with a spin-stabilized platform (자전 안정화형 탐색기 주사루프의 비연성 제어기 설계)

  • 유인억;이상정
    • Journal of the Korean Institute of Telematics and Electronics S
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    • v.35S no.5
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    • pp.35-41
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    • 1998
  • This paper presents a decoupling controller of the missile seeker scan loop with a spin-stabilized platform. A precise seeker motion with respect to the scan command is essential for the higher acquisition probability of the target. As the seeker scan loop is a deeply cross-coupled two input two output system, an accurate pointing or scanning for each axis to the target is very difficult, even though provided with the help of a high performance controller. When a decoupling control is applied to the seeker scan loop, the cross-coupling between two axes can be reduced to a remarkable amount. As a low order of controller is required for the real time operation, a PI controller with decoupling filter is suggested and compared with other controllers. A linearized dynamic model of seeker scan loop is used and validated through the comparison of experimental results of step responses.

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$H_{\infty}$ Control of Seeker Scan-Loop using LSDP (LSDP를 이용한 탐색기 주사루프의 $H_{\infty}$ 제어)

  • Lee, Ho-Pyeong;Song, Chang-Seop
    • Journal of the Korean Society for Precision Engineering
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    • v.12 no.1
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    • pp.78-86
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    • 1995
  • $H_{\infty}$ Controller of seeker scan-loop is designed using LSDP proposed by McFarlane. The performance and robustness of $H_{\infty}$ controller are analyzed using robustness theorems by Lehtomaki and compared with those of the LQG/LTR controller. Especially, structured singular value .mu. -test of Doyle is used to evaluate robust performance of seeker scan-loop. It is demonstated that seeker scan-loop by $H_{\infty}$ controller is very robust to model uncertainties described by additive and multiplicative perturbations.

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Two Degree of Freedom Robust Controller Design of a Seeker Scan-Loop (탐색기 주사루프의 2자유도 강인제어기 설계)

  • Lee, Ho-Pyeong;Song, Chang-Seop
    • Journal of the Korean Society for Precision Engineering
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    • v.12 no.10
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    • pp.157-165
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    • 1995
  • The new formulation of designing the two degree of freedom(TDF) robust controller is proposed using $H_{\infty}$optimization and model matching method. In this formulation the feedback controller and feedforward controller are designed in a single step using $H_{\infty}$optimization procedure. Roughly speaking, the feedback controller is designed to meet robust stability and disturbance rejection specifications, while the feedforward controller is used to improve the robust model matching properties of the closed loop system. The proposed formulation will be illustrated and evaluated on a seeker scan-loop. And the performances of TDF robust controller are compared with those of the $H_{\infty}$ controller designed using Loop Shaping Design Procedure proposed by McFarlane and Glover.lover.

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Two-degree-of freedom $H_{\infty}$ control of a seeker scan loop using normalized coprime factorization (정규화 소인수분해를 이용한 탐색기 주사루프의 2자유도 $H_{\infty}$ 제어)

  • Lee, H.P.
    • Journal of the Korean Society for Precision Engineering
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    • v.14 no.11
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    • pp.102-109
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    • 1997
  • A two-degree-of freedom (TDF) $H_{\infty}$controller for a seeker scan loop is presented for the purpose of improving scanning performances. The perturbed plant model is characterized via the normalized coprime factorization. The TDF $H_{\infty}$controller is designed based on the loop shaping design procedure and model matching approach, and its performances are evaluated and compared with those of a previous work. It is demonstrated that the proposed TDF $H_{\infty}$controller is more effective to the control of the seeker scan loop than the previous controller.oller.

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Design of High-Speed Image Processing System for Line-Scan Camera (라인 스캔 카메라를 위한 고속 영상 처리 시스템 설계)

  • 이운근;백광렬;조석빈
    • Journal of Institute of Control, Robotics and Systems
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    • v.10 no.2
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    • pp.178-184
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    • 2004
  • In this paper, we designed an image processing system for the high speed line-scan camera which adopts the new memory model we proposed. As a resolution and a data rate of the line-scan camera are becoming higher, the faster image processing systems are needed. But many conventional systems are not sufficient to process the image data from the line-scan camera during a very short time. We designed the memory controller which eliminates the time for transferring image data from the line-scan camera to the main memory with high-speed SRAM and has a dual-port configuration therefore the DSP can access the main memory even though the memory controller are writing the image data. The memory controller is implemented by VHDL and Xilinx SPARTAN-IIE FPGA.

A study on laser scan path generation for manufacturing 3-dimensional body using StereoLithography (StereoLithography로 3차원 형상가공을 위한 레이저 조사경로 생성에 관한 연구)

  • 안대건;김준안;이석희;백인환
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 1993.10a
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    • pp.687-692
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    • 1993
  • This paper deals with the generation of laser scan path for manufacturing 3-dimensional body using StereoLithography. The purpose of this study is to develop one module of the StersoLithography system(SLA) for Rapid Protyping and Manufacturing. AutoCAD system is used to supply CAD information from model. The X-Y controller which was made for a special purpose is used to test this system. The system software developed is composed of 3 main modules, the first module is calculating the boundary point os laser scan path. The scound module is generating final output file which is used to down load on the controller. The result of this study shows a good algorithm to generate laser scan path on the basis of simple mathematical background.

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Efficient AMBA Based System-on-a-chip Core Test With IEEE 1500 Wrapper (IEEE 1500 래퍼를 이용한 효과적인 AMBA 기반 시스템-온-칩 코아 테스트)

  • Yi, Hyun-Bean;Han, Ju-Hee;Kim, Byeong-Jin;Park, Sung-Ju
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.45 no.2
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    • pp.61-68
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    • 2008
  • This paper introduces an embedded core test wrapper for AMBA based System-on-Chip(SoC) test. The proposed test wrapper is compatible with IEEE 1500 and can be controlled by ARM Test Interface Controller(TIC). We use IEEE 1500 wrapper boundary registers as temporal registers to load test results as well as test patterns and apply a modified scan test procedure. Test time is reduced by simultaneously performing primary input insertion and primary output observation as well as scan-in and scan-out.

Development of Floationg Seal Inspection System Using Line Scan Camera (라인스캔 카메라를 이용한 Floating Seal 시각 검사 시스템의 개발)

  • Park, Chang-Mok;Wang, Gi-Nam
    • Journal of the Korean Society for Precision Engineering
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    • v.16 no.12
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    • pp.60-70
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    • 1999
  • An efficient automatic inspection system for Floating Seal is developed, The proposed system consists of a high resolution line scan camera, microcomputer, and PLC (Programmable Logic Controller). In order to perform rapid inspection, The ROI (Region of Interest) is extracted from the original image. There are types of defects; shape defects and surface defects. Each features of defects are captured by edge detect, segmentation, morphological operation, and threshold analysis. PLC controller is used to synchronize the whole system and store the inspection results temporarily to reduce the overhead of microcomputer. As a result, the system is being utilized successfully in a teal inspection line.

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