• Title/Summary/Keyword: Run-to-Run Control

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Design and Application of Accelerated Run-in Test for ECU Quality Improvement (ECU 품질 개선을 위한 Accelerated Run-in Test 설계 및 효과고찰)

  • Cho, Hyogeun
    • Transactions of the Korean Society of Automotive Engineers
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    • v.22 no.4
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    • pp.145-151
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    • 2014
  • Modern vehicle has a lot of ECU(Electronic Control Unit) products to control many parts such as engine, transmission, brake, body and so on. ECU quality is one of important factors related to vehicle quality and driver's safety. Based on Bath-tub curve which presents failure rate during product lifetime, we designed and applied Accelerated Run-in Test into manufacturing line by simulating stress amount to ECU and developing the required software and efficient test equipment for mass production. This test makes ECU products stressed through electrical and thermal stresses under excessive driving condition, which induce potential initial failure of components in the ECU during production. The outcome until these days proved that Acceleration Run-in Test have reduced initial failure rates and increased quality of ECU products in the field outstandingly.

Fault Detection of Reactive Ion Etching Using Time Series Support Vector Machine (Time Series Support Vector Machine을 이용한 Reactive Ion Etching의 오류검출 및 분석)

  • Park Young-Kook;Han Seung-Soo;Hong Sang-J.
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2006.05a
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    • pp.247-250
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    • 2006
  • Maximizing the productivity in reactive ion etching, early detection of process equipment anomaly became crucial in current high volume semiconductor manufacturing environment. To address the importance of the process fault detection for productivity, support vector machines (SVMs) is employed to assist the decision to determine process faults in real-time. SVMs for eleven steps of etching runs are established with data acquired from baseline runs, and they are further verified with the data from controlled (acceptable) and perturbed (unacceptable) runs. Then, each SVM is further utilized for the fault detection purpose utilizing control limits which is well understood in statistical process control chart. Utilizing SVMs, fault detection of reactive ion etching process is demonstrated with zero false alarm rate of the controlled runs on a run to run basis.

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Speed Control Characteristics of Capacitor-Run Single Phase Induction Motor Using TRIAC (TRIAC을 이용한 커패시터 운전형 단상 유도전동기의 속도제어 특성)

  • Lee, Seung-Yong;Yoon, Duck-Yong
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.61 no.9
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    • pp.1283-1288
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    • 2012
  • This paper presents speed control characteristics of capacitor-run SPIM(Single Phase Induction Motor) using TRIAC for comparing and analyzing four kinds of voltage control methods such as supply voltage control, main winding voltage control, auxiliary winding voltage control and auxiliary winding voltage control without starting capacitor. The computer simulations were performed using MATLAB Simulink to show control characteristics of four voltage control methods. And their control characteristics were conformed by experiments for capacitor-run 90W SPIM as a sample motor. The results of simulations and experiments show that supply voltage control method has fast dynamic response characteristics and main winding voltage control method has higher power efficiency and can be implemented at lower system cost.

A Study on Aerobic Composting of Food Waste with Controlling Temperature by Air Flow Rate (온도를 공기량으로 제어한 음식물 쓰레기 호기성 퇴비화에 관한 연구)

  • Hwang, Seon-Hyeon;Sin, Chang-Ho;Sin, Bu-Yeong;Jo, Mu-Hwan
    • KSBB Journal
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    • v.14 no.5
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    • pp.621-627
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    • 1999
  • A food waste composting apparatus of 450 L was designed for and tested with changing conditions of inlet air flow rate, agitation and inoculation. Agitation was done twice per day for 5 min and inlet air flow rate was set as 22.7 L/min for RUN 1. For RUN 2 and RUN 3, agitation was continuous, and inlet air flow rate was changed frequently as 10 L/min, 15 L/min and 20 L/min in order to maintain temp. above 5$0^{\circ}C$, and the concentration of $O_2$over 7 mol%. The compost of RUN3 was inoculated with 10 wt% of accomplished compost, and it was compared with RUN 1 and 2 to show the effect of inoculation. The composting rates of RUN 2 and RUN 3 were faster than that of RUN 1, because agitation was continuous and temperature was controlled in RUN 2 and RUN 3. Inoculated RUN 3 was better than RUN 1 and RUN 2 in the concentrations of $CO_2$and reduction of volatile solids. while the effect of inoculation on C/N ratios, pH change and the numbers of microoragnisms was not clearly appeared.

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An Accuracy Analysis of Run-test and RA(Reverse Arrangement)-test for Assessing Surface EMG Signal Stationarity (표면근전도 신호의 정상성 검사를 위한 Run-검증과 RA-검증의 정확도 분석)

  • Lee, Jin
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.63 no.2
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    • pp.291-296
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    • 2014
  • Most of the statistical signal analysis processed in the time domain and the frequency domain are based on the assumption that the signal is weakly stationary(wide sense stationary). Therefore, it is necessary to know whether the surface EMG signals processed in the statistical basis satisfy the condition of weak stationarity. The purpose of this study is to analyze the accuracy of the Run-test, modified Run-test, RA(reverse arrangement)-test, and modified RA-test for assessing surface EMG signal stationarity. Six stationary and three non-stationary signals were simulated by using sine wave, AR(autoregressive) modeling, and real surface EMG. The simulated signals were tested for stationarity using nine different methods of Run-test and RA-test. The results showed that the modified Run-test method2 (mRT2) classified exactly the surface EMG signals by stationarity with 100% accuracy. This finding indicates that the mRT2 may be the best way for assessing stationarity in surface EMG signals.

Run-to-Run Fault Detection of Reactive Ion Etching Using Support Vector Machine (Support Vector Machine을 이용한 Reactive ion Etching의 Run-to-Run 오류검출 및 분석)

  • Park Young-Kook;Hong Sang-Jeen;Han Seung-Soo
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.10 no.5
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    • pp.962-969
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    • 2006
  • To address the importance of the process fault detection for productivity, support vector machines (SVMs) is employed to assist the decision to determine process faults in real-time. The reactive ion etching (RIE) tool data acquired from a production line consist of 59 variables, and each of them consists of 10 data points per second. Principal component analysis (PCA) is first performed to accommodate for real-time data processing by reducing the dimensionality or the data. SVMs for eleven steps or etching m are established with data acquired from baseline runs, and they are further verified with the data from controlled (acceptable) and perturbed (unacceptable) runs. Then, each SVM is further utilized for the fault detection purpose utilizing control limits which is well understood in statistical process control chart. Utilizing SVMs, fault detection of reactive ion etching process is demonstrated with zero false alarm rate of the controlled runs on a run to run basis.

A Study on the Load Run Back Control of a Coal Fired Power Plant. (석탄화력 발전소의 LOAD RUN BACK에 관한 연구)

  • Song, Seong-Il;Hwang, Jae-Ho;Park, Hyung-Gu;Kim, Hueng-Rok
    • Proceedings of the KIEE Conference
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    • 1989.07a
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    • pp.94-97
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    • 1989
  • This work describes the imortance of the load run back control of a thermal power plant which has a serious effect on a power system, and shows the load run back tests results which was carried out at BORONG Thermal Power Plant, finally suggests what control circuits should be modified in the plant control system in order to prevent plant trip in case of auxiliary machine failure.

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A Prediction Method of Temperature Distribution on the Wafer for Real-Time Control in a Rapid Thermal Process System (실시간 제어를 위한 고속 열처리 공정에서 웨어퍼 온도 분포 추정 기법)

  • Sim, Yeong-Tae;Yi, Seok-Joo;Kim, Hagbae
    • Journal of Institute of Control, Robotics and Systems
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    • v.6 no.9
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    • pp.831-835
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    • 2000
  • The uniformity of themperature on a wafer is a wafer is one the most important parameters to conterol the RTF(Rapid Thermal Process) with proper input signals. It is impossible to achieve the uniformity of temperature without the exact estimation of temperature ar all points on the wafer. There fore, it is difficult to understand the internal dynamics as well as the structural complexities of the RTP, which is aprimary obstacle to measure the distributed temperatures on the wafer accurately. Furthermore, it is also hard to accomplish desirable estimation because only a few pyrometers are available in the general equipments. In the paper, a thermal model based on the chamber grometry of the AST SHS200 RTP system is developed to effectively control the thermal uniformity on the wafer. First of all, the estimation method of one-point measurement is developed, which is properly extended to the case of multi-point measurements. This thermal model is validated through simulation and experiments. The proposed work can be utilized to building a run-by -run or a real-time control of the RTP.

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Statistical design of Shewhart control chart with runs rules (런 규칙이 혼합된 슈와르트 관리도의 통계적 설계)

  • Kim, Young-Bok;Hong, Jung-Sik;Lie, Chang-Hoon
    • Journal of Korean Society for Quality Management
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    • v.36 no.3
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    • pp.34-44
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    • 2008
  • This research proposes a design method based on the statistical characteristics of the Shewhart control chart incorporated with 2 of 2 and 2 of 3 runs rules respectively. A Markov chain approach is employed in order to calculate the in-control and out-of-control average run lengths(ARL). Two different control limit coefficients for the Shewhart scheme and the runs rule scheme are derived simultaneously to minimize the out-of-control average run length subject to the reasonable in-control average run length. Numerical examples show that the statistical performance of the hybrid control scheme are superior to that of the original Shewhart control chart.

Design of the Modified Bounded Adjustment Scheme with Run Rules (런규칙을 사용한 개량된 경계선 수정계획의 설계)

  • 박창순;정윤준
    • Journal of Korean Society for Quality Management
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    • v.32 no.1
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    • pp.144-154
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    • 2004
  • The bounded adjustment is known to be more efficient than repeated adjustment when the cost is incurred for engineering process control. The procedure of the bounded adjustment is to adjust the process when the one-step predicted deviation exceeds the adjustment limit by the amount of the prediction. In this paper, two run rules are proposed and studied In order to improve the efficiency of the traditional bounded adjustment procedure. The efficiency is studied in terms of the standardized cost through Monte Carlo simulation when the procedure is operated with and without the run rules. The adjustment procedure operated with run rules turns out to be more robust for changes in the process and cost parameters.