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Statistical design of Shewhart control chart with runs rules  

Kim, Young-Bok (Dept. of Industrial Engineering, Seoul National University)
Hong, Jung-Sik (Dept. of Industrial & Information Systems Engineering, Seoul National University of Technology)
Lie, Chang-Hoon (Dept. of Industrial Engineering, Seoul National University)
Publication Information
Journal of Korean Society for Quality Management / v.36, no.3, 2008 , pp. 34-44 More about this Journal
Abstract
This research proposes a design method based on the statistical characteristics of the Shewhart control chart incorporated with 2 of 2 and 2 of 3 runs rules respectively. A Markov chain approach is employed in order to calculate the in-control and out-of-control average run lengths(ARL). Two different control limit coefficients for the Shewhart scheme and the runs rule scheme are derived simultaneously to minimize the out-of-control average run length subject to the reasonable in-control average run length. Numerical examples show that the statistical performance of the hybrid control scheme are superior to that of the original Shewhart control chart.
Keywords
Shewhart control chart; 2 of 2 runs rule; 2 of 3 runs rule; ARL;
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Times Cited By KSCI : 4  (Citation Analysis)
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