• Superconductivity and Cryogenics
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• v.5 no.1
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• pp.10-17
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• 2003

For limitation and interruption of short circuit currents from low voltage to extra high voltage applications, the electrical equipment including fuses and circuit breakers, are widely used today. But in order to anticipate increasing needs for effective and competitive device for limiting the growing fault current in electrical power systems, fault current limitation technologies and fault current limitation devices are widely introduced and investigated in these days. Furthermore, the applications of high temperature superconducting materials (HTSC) into the current limiting devices are new approach for developing of novel and effective col-rent limitation electrical equipment. In this research, the necessities of current limitation technology and the developed and developing current limitation devices for power systems are introduced. Finally, the investigation of resistive type fault current limiters which is under development by LG and KEPCO were introduced.

• The Transactions of the Korean Institute of Electrical Engineers B
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• v.49 no.9
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• pp.584-589
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• 2000

We fabricated resistive superconducting fault current limiters (SFCL) based on YBCO thin films grown on a 2-inch diameter Al2O3 substrate. The current limiting element was 1 mm wide and 260mm long meander line prepared by standard photolithography. The minimum quench current of the current limiting element was about 8 Apeak. This SFCL sucessfully controlled the fault current below 14.3 Apeak at the voltage of 100 Apeak which is otherwise to increase up to 141 Apeak. The quench completion time was less than 3 msec. The temperature of the current limiting element rose to about 200 K in 3 cycles after fault. The SFCL showed reproducible quench during hundreds times of repeated experiments.

• Proceedings of the KIEE Conference
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• 2000.07c
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• pp.1877-1879
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• 2000

This paper deals with the change of the micro-structure of ZnO associated with lightning surge current and ageing test. In this work, a surge current generator which can produce 8/20 [${\mu}s$], 6 [kA] impulse current is designed and fabricated to simulate the lightning impulse current. The residual voltage and leakage current flowing to ZnO blocks are observed. Also a compensation circuit was used in resistive current measurement. The micro-structures of ZnO arrester block were significantly changed by lightning surge current and accelerated temperature ageing test.

• The Transactions of the Korean Institute of Electrical Engineers B
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• v.53 no.10
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• pp.597-601
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• 2004

A high bandwidth watt-converter, based on an inexpensive, commercially available, standard IC package, is described that covers a frequency ranges from DC to 100 kHz. The new resistive shunt for a wide-band frequency current measurement of the watt-converter was developed. The converter will use application in accurate power measurement under distorted and high frequency conditions. The advantages of the proposed watt-converter are its simplicity, low cost and fast response time.

• Transactions on Electrical and Electronic Materials
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• v.16 no.5
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• pp.290-292
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• 2015

We have reported about bipolar resistive switching effect on Poly[2-methoxy-5-(2-ethylhexyloxy)-1,4-phenylenevinylene]:Graphene oxide composite films, which are sandwiched between aluminum and indium tin oxide electrodes. In this case, I-V sweep curve showed a hysteretic behavior, which varied according to the polarity of the applied voltage bias. The device exhibited excellent switching characteristics, with the ON/OFF ratio being approximately two orders in magnitude. The device had good endurance (10⁵ cycles without degradation) and long retention time (5 × 10³ s) at room temperature. The bistable switching behavior varied according to the trapping and de-trapping of charges on GO sites; the carrier transport was described using the space-charge-limited current (SCLC) model.

• Proceedings of the Korea Concrete Institute Conference
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• 2000.10a
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• pp.517-522
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• 2000

In the past few years, the nondestructive inspection technology has greatly developed due to the increased necessity to gain a complete understanding of the bridge behavior. Especially, the deformations of bridges contain a lot of informations about its health state. By measuring these deformations it is possible to analyze the loading and aging behavior of the structure. However, the current methods (such as LVDT, dial gage, optical displacement tranceducer, etc) are often of changeable application on site and have the limitations of installation. In this paper, the classical beam theory was reviewed and the deflections of structure are estimated using measured strain which is easy to acquire. The applicability of this algorithm is verified by a preliminary steel beam test and two types of concrete beam tests. Also fiber optic sensors as well as resistive strain gages were installed in the concrete beams to establish the applicability of fiber optic sensors in the field of civil engineering.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.31A no.2
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• pp.60-66
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• 1994

The scattering problem by E-polarized plane wave with oblique incidence on a tapered resistive strip grating with infinite resistivity at strip-edges is analyzed by the method of moments in the spectral domain. Then the induced surface current density is expanded in a series of Ultraspherical polynomials of the zeroth order. The expansion coefficients are calculated numerically in the spectral domain, the numerical results of the geometricoptical reflection coefficient for the tapered resistivity in this paper are compared with those for the existing uniform resistivity. And the position of sharp variation points in the magnitude of the geometric-optical reflection coefficient can be moved by varying the incident angle and the strip spacing. It is found out that these sharp variation points are due to the transition of higher modes between the propagation mode and the evanescent mode.

• The Korean Journal of Food & Health Convergence
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• v.5 no.4
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• pp.19-23
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• 2019

In recent years, the Internet was a lot of information on the use of Tesla coils bifilar [1] in conjunction with induction cooker, for "free" electricity during power resistive load, including different incandescent lamps. With the development of scientific and technological progress, the demand for electricity in each year is increasing, and at the same time, the need to increase the capacity of electricity production, which entails large investments and, consequently, increase of prices for consumers. As before today, the search for free electric energy is an up-to-date and still open topic. The purpose of research - simplification of information on the possibility of using bifilar coils as an electric current source in conjunction with induction cooker. Consequently, it can be concluded from the above that the use of Tesla coils in combination with induction cooker has very low k.k.d. and it is not possible to obtain excessive electric energy using the Tesla coil under the connection schemes considered.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.08a
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• pp.379-379
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• 2011

차세대 저항메모리(resistive switching random access memory; ReRAM)의 개발을 위해 다양한 산화 물질들의 저항 변화 특성이 연구되고 있다. 본 연구에서는 저항 변화 물질로 잘 알려진 ZnO 박막을 이용하여 저항 변화 특성을 평가하였다. ZnO 박막은 Pt/Ti/$SiO_2$/Si 기판 위에 스퍼터링 시스템을 이용하여 약 50 nm 두께로 증착되었다. 증착된 박막 위에 전극을 evaporator를 이용하여 패턴닝함으로써 전극-반도체-전극 구조의 소자를 만들고 이의 전기적 특성을 평가하였다. Compliance current를 설정하여 저항 변화 특성을 측정한 결과 가해진 전압의 극성에 관계 없이 저항이 변화하는, dielectric breakdown에 의해 박막내 전도성 필라멘트라 불리는 전도성 길이 생성되었다가 joule-heating에 의해 필라멘트가 파열되는, 전형적인 unipolar 저항 변화특성이 나타났다. 다기능성 소자 개발을 위해 위 소자 구조를 투명한 고분자 기판위에 형성하고 표면에 초발수성 ZnO 나노막대 구조를 합성하였다. 그 결과 투명하면서 유연하고, 수분에도 안정적인 다기능성 저항 변화 소자 특성을 평가할 수 있었다. 본 결과를 바탕으로 필라멘트 이론에 기초한 저항 변화 메커니즘을 설명하는 모델이 제시되었다.

• Journal of the Korean Institute of Telematics and Electronics B
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• v.33B no.7
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• pp.70-79
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• 1996

To increase the functionality of the memories, previous studies have deifned faults models and proposed functional testing algorithms with low complexity. Although conventional testing depended strongly on functional (voltage) testing method, it couldn't detect short and open defects caused by gate oxide short and spot defect which can afect memory reliability. Therefore, IDDQ (quiescent power supply current) testing is required to detect defects and thus can obtain high reliability. In this paper, we consider resistive shorts on gate-source, gate-drain, and drain-source as well as opens in mOS FET and observe behavior of the memory by analyzing voltage at storge nodes of the memory and IDDQ resulting from PSPICE simulation. Finally, using this behavioral analysis, we propose a linear testing algorithm of complexity O(N) which can be applicable to both functional testing and IDDQ testing simultaneously to obtain high functionality and reliability.