• Journal of Advanced Marine Engineering and Technology
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• 제32권8호
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• pp.1263-1268
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• 2008

In this paper, the low noise power amplifier for GaAs FET ATF-10136 is designed and fabricated with active bias circuit and self bias circuit. To supply most suitable voltage and current, active bias circuit is designed. Active biasing offers the advantage that variations in the pinch-off voltage($V_p$) and saturated drain current($I_{DSS}$) will not necessitate a change in either the source or drain resistor value for a given bias condition. The active bias network automatically sets a gate-source voltage($V_{gs}$) for the desired drain voltage and drain current. Using resistive decoupling circuits, a signal at low frequency is dissipated by a resistor. This design method increases the stability of the LNA, suitable for input stage matching and gate source bias. The LNA is fabricated on FR-4 substrate with active and self bias circuit, and integrated in aluminum housing. As a results, the characteristics of the active and self bias circuit LNA implemented more than 13 dB and 14 dB in gain, lower than 1 dB and 1.1 dB in noise figure, 1.7 and 1.8 input VSWR at normalized frequency $1.4{\sim}1.6$, respectively.

• Progress in Superconductivity
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• 제6권1호
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• pp.46-51
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• 2004

We fabricated a resistive type superconducting fault current limiter (SFCL) of 3-phase $6.6 kV_{rms}$ / rating, based on YBCO thin films grown on sapphire substrates with a diameter off inch. Each element of the SFCL was designed to have the rated voltage of $600 V_{rms}$ $/35A_{rms}$. The elements produced a single phase with 8${\times}$6 components connected in series and parallel. In addition, a NiCr shunt resistor of 23 $\Omega$ was connected in parallel to each of them for simultaneous quenches between the elements. Prior to investigating the performance of the 3 phase SFCL, we examined the quench characteristics for 8 elements connected in series. For all elements, simultaneous quenches and equal voltage distribution within 10% deviation from the average were obtained. Based on these results, performance of the SFCL for single line-to-ground faults was investigated. The SFCL successfully limited the fault current of $10 kA_{ rms}$ below 816 $A_{peak}$ within 0.12 msec right after the fault occurred. During the quench process, average temperature of all components did not exceed 250 K, and the SFCL was totally safe during the whole operation.

• 한국초전도학회:학술대회논문집
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• 한국초전도학회 1999년도 High Temperature Superconductivity Vol.IX
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• pp.214-217
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• 1999

We investigated the quench characteristics of meander line type resistive superconducting fault current limiters based on YBCO thin films grown on 2" diameter LaAlO$_3$ substrates. A gold layer was deposited onto the 0.4 ${\mu}$ m thick YBCO film to disperse the heat generated at hot spots, prior to patterning into 1 mm wide meander lines by photolithography. The limiters were tested with simulated fault currents of various amplitudes. The quench started at 10 A and was completed within 1 msec at the fault current of 65 A$_{peak}$. The dynamic quench characteristics were explained based on the heat conduction within the film and the heat transfer between the film and the surrounding liquid nitrogen. The heat transfer coefficient per unit area was estimated to be 3.0 W/cm$^2$K.

• 대한전기학회논문지:전기기기및에너지변환시스템부문B
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• 제52권7호
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• pp.327-334
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• 2003

We have investigated the quench behavior of the series connection of resistive type superconducting fault current limiter (SFCL) components based on YBCO films. Equal shunt resistors $R_s$ across individual SFCL components successfully produced simultaneous Quenches for 5 components in series, resulting in equal application of voltage to all components. If the two components having the highest and the lowest critical currents ($I_c$) quench safely, others quench altogether The highest shunt resistance is to guarantee the safe quenches of all components, leading to the equal voltage applications within the first half cycle after a fault in the short circuit test. The highest $R_s$ was found to be 28 ［$\Omega$］ for the components in the given quench environment. Considering the safe quenches and protection coordination, the optimal $R_s$ was suggested to be approximately a half of the highest $R_s$,, allowing wide selection of $R_s$ and $I_c$'s. This design provides a practical wav of connecting small SFCL components in series for high voltage application.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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• pp.255-255
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• 2016

Resistive random access memory (ReRAM)는 낮은 동작 전압, 빠른 동작 속도, 고집적화 등의 장점으로 인해 차세대 비휘발성 메모리 소자로써 많은 관심을 받고 있다. 최근에 ReRAM 절연막으로 NiOx, TiOx, AlOx TaOx, HfOx와 같은 binary metal oxide 물질들을 적용하는 연구가 활발히 진행되고 있다. 특히, HfOx는 안정적인 동작 특성을 나타낸다는 점에서 ReRAM 절연막 물질로 적합하다고 보고되고 있다. ReRAM 절연막을 형성할 때, 물리 기상 증착 방법 (PVD)이나 화학 기상 증착법 (CVD)과 같은 방법이 많이 이용된다. 이러한 증착 방법들은 고품질의 박막을 형성시킬 수 있는 장점이 있다. 하지만, 높은 온도에서의 공정과 고가의 진공 장비가 이용되기 때문에 경제적인 문제가 있으며, 기판 또는 금속에 플라즈마 손상으로 인한 문제가 발생할 수 있다. 따라서 이러한 문제점들을 개선하기 위해 용액 공정이 많은 관심을 받고 있다. 용액 공정은 공정과정이 간단할 뿐만 아니라 소자의 대면적화가 가능하고 공정온도가 낮으며 고가의 진공장비가 필요하지 않은 장점을 가진다. 따라서 본 연구에서는, 용액공정을 이용하여 HfOx 기반의 ReRAM 제작하였고 $25^{\circ}C$와 $85^{\circ}C$에서 ReRAM의 동작특성에 미치는 compliance current의 영향을 평가하였다. 실험 방법으로는, hafnium chloride (0.1 M)를 2-methoxyethanol에 충분히 용해시켜서 precursor를 제작하였다. 이후, p-type Si 기판 위에 습식산화를 통하여 300 nm 두께의 SiO2 절연층을 성장시킨 후, 하부전극을 형성하기 위해 electron beam evaporation을 이용하여 10/100 nm 두께의 Ti/Pt 전극을 증착하였다. 순차적으로, 제작된 산화물 precursor를 이용하여 Pt 위에 spin coating 방법으로 1000 rpm 10 초, 6000 rpm 30초의 조건으로 두께 35 nm의 HfOx 막을 증착하였다. 최종적으로, solvent 및 불순물을 제거하기 위해 $180^{\circ}C$의 온도에서 10 분 동안 열처리를 진행하였으며, 상부 전극을 형성하기 위해 electron beam evaporation을 이용하여 Ti와 Al을 각각 50 nm, 100 nm의 두께로 증착하였다. ReRAM 동작에서 compliance current가 미치는 영향을 평가하기 위하여 compliance current를 10mA에서 1mA까지 변화시키면서 측정한 결과, $25^{\circ}C$에서는 compliance current의 크기와 상관없이 일정한 메모리 윈도우와 우수한 endurance 특성을 얻는 것을 확인하였다. 한편, $85^{\circ}C$의 고온에서 측정한 경우에는 1mA의 compliance current를 적용하였을 때, $25^{\circ}C$에서 측정된 메모리 윈도우 크기를 비슷하게 유지하면서 더 우수한 endurance 특성을 얻는 것을 확인하였다. 결과적으로, 용액공정 방법으로 제작된 ReRAM을 측정하는데 있어서 compliance current를 줄이면 보다 우수한 endurance 특성을 얻을 수 있으며, ReRAM 소자의 전력소비감소에 효과적이라고 기대된다.

• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제55권5호
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• pp.257-262
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• 2006

To evaluate the change in protective levels of zinc oxide (ZnO) varistors after the surge absorption, this paper investigated the effects of the number of injection and amplitude of lightning surges on the life of ZnO varistors for low voltages. Leakage currents flowing through ZnO varistors subjected to the $8/20{\mu}s$ impulse currents under 60 Hz AC voltages were measured. The surge simulator system ECAT that can generate $8/20{\mu}s$ impulse currents with a peak short-circuit of 5 $[kA_p]$ was used. The ZnO varistor leakage current increases with exposure to impulse current, and the number of injection of $8/20{\mu}s$ impulse currents to breakdown was inversely proportional to the amplitude of the test current. Behaviors of ZnO varistor leakage currents were strongly dependent on the number of injection and amplitude of $8/20{\mu}s$ impulse currents. ZnO varistors degrade gradually when subjected to impulse current, and the resistive leakage current flowing through ZnO varistors subjected to the $8/20{\mu}s$ impulse currents under 60 Hz AC voltages was significantly increased after a certain number of injection that is dependent on the amplitude of the test impulse current. As a result, the life of ZnO varistors mainly depends on the amplitude and occurrence frequency of lightning surges.

• 대한전기학회논문지:전기기기및에너지변환시스템부문B
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• 제48권10호
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• pp.537-543
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• 1999

We fabricated a resistive superconducting fault current limiter (SFCL) of a meander type based on a YBCO film with the meander cross section of 5 $\times$ $10^{-6}$$cm^2$, and performed current limitation experiments. The film was coated quench current was 9.6 Apeak at 60 Hz, and the fast quench time was 0.63 msec. The resistance of the limiter continuously increased for three cycles dut to the temperature rise in the gold layer. The temperature of the current limiting element reached the room temperature in 11 msec, $150^{\circ}C$ in 54 msec after quench, and was saturated afterwards. For $45^{\circ}$and $90^{\circ}$faults the fast quench times were 0.56 msec and 0.26 msec, respectively. The quench time is believed to be reduced because the fault occurred when the current was either increasing or at the peak value. This limiter effectively limited the fault current to about 1/5 of the potential current with no SFCL right after the fault and to about 1/8.5 in three cycles. We confirmed that the gold layer effectively carried out the role of heat dissipation as the SFCL was quenched.

• 한국초전도학회:학술대회논문집
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• 한국초전도학회 2006년도 High Temperature Superconductivity Vol.XVI
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• pp.84-84
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• 2006

• 한국초전도저온공학회:학술대회논문집
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• 한국초전도저온공학회 2003년도 추계학술대회 논문집
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• pp.197-200
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• 2003

As the power system is more complex and power demands increase, the fault currents have the tendency of increasing gradually. In the near future it will happen that the fault currents exceed circuit breaker rating for some substations. In this paper, the resistive SFCL (Superconducting Fault Current Limiter) is installed at Bus-Tie location to reduce the fault current in korea power systems and evaluated technical and economical Impacts.

• 조명전기설비학회논문지
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• 제21권1호
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• pp.118-124
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• 2007

본 논문에서는 임펄스전류의 크기와 인가횟수가 ZnO바리스터의 수명에 미치는 영향에 관한 것으로 뇌임펄스전류가 ZnO바리스터의 성능에 미치는 영향을 분석하기 위하여 $8/20[{\mu}s]$임펄스전류가 인가되기 전후 ZnO바리스터의 상용주파수 교류전압에 대한 저항성 누설전류와 손실전력을 측정하였다. 그 결과 $8/20[{\mu}s]$임펄스전류의 인가횟수가 증가함에 파라 ZnO바리스터에 흐르는 저항성 누설전류는 증가하고 통과시간은 길어졌다. ZnO바리스터의 수명은 뇌임펄스전류의 크기와 인가횟수에 대해서 평가하는 것이 바람직하다.