• Title/Summary/Keyword: Reliability Growth Model

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A Method of Reliability Growth Management Test Design for Continuous System (연속형 시스템의 신뢰성 성장 관리 시험 설계 방안)

  • Seo, Yang Woo;Yoon, Jung Hwan;Lee, Seung Sang;Um, Chun Sup
    • Journal of the Korean Society of Systems Engineering
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    • v.16 no.2
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    • pp.87-96
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    • 2020
  • In this paper we proposed the test design method of reliability growth management. First, we presented the process for establishing the reliability growth management test design considering the number of failures and the termination test time. Reliability growth analysis of continuous system was performed in accordance with the test design process presented. In case the reliability test result is not met with the reliability target value after more than three failures occurred, the required test times were analyzed that 1,725 hrs for one corrective action, 1,950 hrs for two corrective actions. If the number of failures is less than three, design a reliability demonstration test according to confidence level 80% and 90% was performed using RGA 11 Software. As a result, it is possible to establish the reliability growth management test design with sufficient use of available resources. The results of this study can be used when establishing a test design for assessment of reliability growth management of all continuous systems.

Generalization of the Testing-Domain Dependent NHPP SRGM and Its Application

  • Park, J.Y.;Hwang, Y.S.;Fujiwara, T.
    • International Journal of Reliability and Applications
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    • v.8 no.1
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    • pp.53-66
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    • 2007
  • This paper proposes a new non-homogeneous Poisson process software reliability growth model based on the coverage information. The new model incorporates the coverage information in the fault detection process by assuming that only the faults in the covered constructs are detectable. Since the coverage growth behavior depends on the testing strategy, the fault detection process is first modeled for the general testing strategy and then realized for the uniform testing. Finally the model for the uniform testing is empirically evaluated by applying it to real data sets.

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A Study of Software Quality Evaluation Using Error-Data (오류데이터를 이용한 소프트웨어 품질평가)

  • Moon, Wae-Sik
    • Journal of The Korean Association of Information Education
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    • v.2 no.1
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    • pp.35-51
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    • 1998
  • Software reliability growth model is one of the evaluation methods, software quality which quantitatively calculates the software reliability based on the number of errors detected. For correct and precise evaluation of reliability of certain software, the reliability model, which is considered to fit dose to real data should be selected as well. In this paper, the optimal model for specific test data was selected one of among five software reliability growth models based on NHPP(Non Homogeneous Poission Process), and in result reliability estimating scales(total expected number of errors, error detection rate, expected number of errors remaining in the software, reliability etc) could obtained. According to reliability estimating scales obtained, Software development and predicting optimal release point and finally in conducting systematic project management.

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Reliability Growth Analysis for Next-Generation High-speed Train (차세대 고속열차의 신뢰성 성장 분석)

  • Noh, Hee-Min;Kim, Seog-Won
    • Journal of the Korean Society for Railway
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    • v.18 no.3
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    • pp.186-193
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    • 2015
  • In this paper, a reliability growth analysis for a next-generation high-speed train was conducted. First, the high-speed train was decomposed into 6 sub-systems and main equipment of the high-speed train was derived from functional diagrams. Next, failure rates were calculated for each sub-system from the failure data obtained during commissioning tests. Then, reliability growth analysis was conducted for the high-speed train using the Duane model. The results show that activities to increase reliability were carried out throughout the test runs from the reliability growth results.

A Study on Software Reliability Growth Modeling with Fault Significance Levels (결함 중요도 단계를 고려한 소프트웨어 신뢰도 성장 모델에 관한 연구)

  • 신경애
    • Journal of the Korea Computer Industry Society
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    • v.3 no.7
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    • pp.837-844
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    • 2002
  • In general, software test is carried out to detect or repair errors in system during software development process. Namely, we can evaluate software reliability through collecting and removing the faults detected in testing phase. Software reliability growth model evaluates reliability of software mathematically. Many kinds of software reliability growth modeling which modeling the processes of detecting, revising and removing the faults detected in testing phase have been proposed in many ways. and, it is assumed that almost of these modeling have one typed detect and show the uniformed detection rate. In this study, significance levels of the faults detected in test phase are classified according to how they can affect on the whole system and then the fault detection capability of them is applied. From this point of view, We here by propose a software reliability growth model with faults detection capability according considering fault significance levels and apply some fault data to this proposed model and finally verify its validity by comparing and estimating with the existing modeling.

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A generalized form of software reliability growth (소프트웨어 신뢰도 성장모델의 일반형)

  • 유재년
    • Journal of the Korean Institute of Telematics and Electronics C
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    • v.35C no.5
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    • pp.11-16
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    • 1998
  • We analyze the software reliability growth models for the specified period from the viewpoint of theory of differential equations. we defien a genralized form of reliability growth models as follws: dN(t)/dt = b(t)f(N(t)), Where N(t) is the number of remaining faults and b(t) is the failure rate per software fault at time t. We show that the well-known three software reliability growth models - Goel - Okumoto, s-shaped, and Musa-Okumoto model- are special cases of the generalized form. We, also, extend the generalized form into an extended form being dN(t)/dt = b(t, .gamma.)f(N(t)), The genneralized form can be obtained if the distribution of failures is given. The extended form can be used to describe a software reliabilit growth model having weibull density function as a fault exposure rate. As an application of the generalized form, we classify three mentioned models according to the forms of b(t) and f(N(t)). Also, we present a case study applying the generalized form.

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Bayesian Approach for Software Reliability Growth Model with Random Cost

  • Kim Hee Soo;Shin Mi Young;Park Dong Ho
    • Proceedings of the Korean Reliability Society Conference
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    • 2005.06a
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    • pp.259-264
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    • 2005
  • In this paper, we generalize the software reliability growth model by assuming that the testing cost and maintenance cost are random and adopts the Bayesian approach to determine the optimal software release time. Numerical examples are provided to illustrate the Bayesian method for certain parametric models.

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Estimation of Software Reliability with Multiple Errors (다중오류들을 갖는 소프트웨어 신뢰성의 추정)

  • Lee, In-Suk;Jung, Won-Tae;Jeong, Hye-Jeong
    • Journal of Korean Society for Quality Management
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    • v.23 no.3
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    • pp.57-68
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    • 1995
  • In this paper, we consider possibility that the multiple errors occur in each testing stage. At present, software reliability modeling is considered as a part of software reliability quality assurance in software engineering. However they dealt with the software growth model for the single error debugging at each testing stage until now. Hence it is necessary to study software reliability with multiple errors debugging. Therefore we propose software reliability growth modeling and estimate the parameters in the proposed software reliability growth model for the multiple errors debugging at each testing stage.

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The Verification of the Reliability and Validity of Special Needs Education Assessment Tool (SNEAT) in Miyagi, Japan

  • HAN, Changwan;KOHARA, Aiko
    • Proceedings of the Korea Contents Association Conference
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    • 2016.05a
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    • pp.383-384
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    • 2016
  • The Special Needs Education Assessment Tool (SNEAT) were verified of reliability and validity. However, the reliability and validity has been verified is only Okinawa Prefecture, the national data has not been analyzed. Therefore, this study aimed to verify the reliability and construct validity of SNEAT in Miyagi Prefecture as part of the national survey. SNEAT using 55 children collected from the classes on independent activities of daily living for children with disabilities in Miyagi Prefecture between November and December 2015. Survey data were collected in a longitudinal prospective cohort study. The reliability of SNEAT was verified via the internal consistency method; the coefficient of Cronbach's ${\alpha}$ were over 0.7. The validity of SNEAT was also verified via the latent growth curve model. SNEAT is valid based on its goodness-of-fit values obtained using the latent growth curve model, where the values of comparative fit index (0.997), tucker-lewis index (0.996) and root mean square error of approximation (0.025) were within the goodness-of-fit range. These results indicate that SNEAT has high reliability and construct validity.

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The Comparative Study for Truncated Software Reliability Growth Model based on Log-Logistic Distribution (로그-로지스틱 분포에 근거한 소프트웨어 고장 시간 절단 모형에 관한 비교연구)

  • Kim, Hee-Cheul;Shin, Hyun-Cheul
    • Convergence Security Journal
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    • v.11 no.4
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    • pp.85-91
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    • 2011
  • Due to the large-scale application software syslmls, software reliability, software development has animportantrole. In this paper, software truncated software reliability growth model was proposed based on log-logistic distribution. According to fixed time, the intensity function, the mean value function, the reliability was estimated and the parameter estimation used to maximum likelihood. In the empirical analysis, Poisson execution time model of the existiog model in this area and the log-logistic model were compared Because log-logistic model is more efficient in tems of reliability, in this area, the log-logistic model as an alternative 1D the existiog model also were able to confim that you can use.